Jun Hayakawa, Shoji Ikeda, Katsuya Miura, Michihiko Yarnanouchi, Young Min Lee, Ryutaro Sasaki, Masahiko Ichimura, Kenchi Ito, Takayuki Kawahara, Riichiro Takemura, Toshiyasu Meguro, Fumihiro Matsukura, Hiromasa Takahashi, Hideyuki Matsuoka, Hideo Ohno
IEEE TRANSACTIONS ON MAGNETICS 44 7 1962 - 1967 2008年07月
[査読有り][通常論文] We investigated the effect of using a synthetic ferrimagnetic (SyF) free layer in MgO-based magnetic tunnel junctions (MTJs) on current-induced magnetization switching (CIMS), particularly for application to spin-transfer torque random access memory (SPRAM). The employed SyF free layer had a Co40Fe40B20/Ru/Co40Fe40B20 and Co20Fe60B20/Ru/Co20Fe60B20 structures, and the MTJs (100 x (150-300) nm(2)) were annealed at 300 degrees C. The use of SyF free layer resulted in low intrinsic critical current density (J(c0)) without degrading the thermal-stability factor (E/k(B)T, where E, k(B), and Tare the energy potential, the Boltzmann constant, and temperature, respectively). When the two CoFeB layers of a strongly antiferromagnetically coupled SyF free layer had the same thickness, J(c0) was reduced to 2-4 X 10(6) A/cm(2). This low J(c0) may be due to the decreased effective volume under the large spin accumulation at the CoFeB/Ru. The E/k(B)T was over 60, resulting in a retention time of over ten years and suppression of the write current dispersion for SPRAM. The use of the SyF free layer also resulted in a bistable (parallel/antiparallel) magnetization configuration at zero field, enabling the realization of CIMS without the need to apply external fields to compensate for the offset field.