西野 吉則 (ニシノ ヨシノリ)
| 電子科学研究所 光科学研究部門 | 教授 |
| 附属社会創造数学研究センター | 教授 |
Last Updated :2025/05/02
■研究者基本情報
Researchmap個人ページ
ホームページURL
研究者番号
- 40392063
J-Global ID
■経歴
経歴
- 2010年04月 - 現在
北海道大学, 電子科学研究所, 教授, 日本国 - 2015年10月 - 2017年09月
北海道大学, 電子科学研究所, 附属グリーンナノテクノロジー センター長, 日本国 - 2008年04月 - 2010年03月
理化学研究所, 石川Ｘ線干渉光学研究室, 専任研究員, 日本国 - 2005年04月 - 2008年03月
理化学研究所, 石川Ｘ線干渉光学研究室, 先任研究員, 日本国 - 2001年04月 - 2005年03月
理化学研究所, （石川）Ｘ線干渉光学研究室, 研究員, 日本国 - 2000年04月 - 2001年03月
高輝度光科学研究センター, 加速器部門, 研究員（技術担当）, 日本国 - 1998年05月 - 2000年07月
Deutsches Elektronen-Synchrotron (DESY), Hamburg Synchrotron Radiation Laboratory (HASYLAB), Guest Scientist, ドイツ連邦共和国 - 1997年10月 - 2000年03月
高輝度光科学研究センター, 加速器部門, 技師, 日本国 - 1996年04月 - 1997年09月
高輝度光科学研究センター, 情報システム部門, 技師, 日本国
学歴
■研究活動情報
論文
- Micro-liquid enclosure array and its semi-automated assembling system for x-ray free-electron laser diffractive imaging of samples in solution
Takashi Kimura, Akihiro Suzuki, Ying Yang, Yoshiya Niida, Akiko Nishioka, Masashi Takei, Jinjian Wei, Hideyuki Mitomo, Yasutaka Matsuo, Kenichi Niikura, Kuniharu Ijiro, Kensuke Tono, Makina Yabashi, Tetsuya Ishikawa, Tairo Oshima, Yoshitaka Bessho, Yasumasa Joti, Yoshinori Nishino
Review of Scientific Instruments, 91, 8, 083706, 083706, AIP Publishing, 2020年08月01日, ［査読有り］, ［最終著者, 責任著者］, ［国際共著］, ［国際誌］
英語, 研究論文（学術雑誌） - XFEL coherent diffraction imaging for weakly scattering particles using heterodyne interference
Chi-Feng Huang, Wei-Hau Chang, Ting-Kuo Lee, Yasumasa Joti, Yoshinori Nishino, Takashi Kimura, Akihiro Suzuki, Yoshitaka Bessho, Tsung-Tse Lee, Mei-Chun Chen, Shun-Min Yang, Yeukuang Hwu, Shih-Hsin Huang, Po-Nan Li, Peilin Chen, Yung-Chieh Tseng, Che Ma, Tsui-Ling Hsu, Chi-Huey Wong, Kensuke Tono, Tetsuya Ishikawa, Keng S. Liang
AIP Advances, 10, 5, 055219, 055219, AIP Publishing, 2020年05月01日, ［査読有り］, ［国際共著］, ［国際誌］
英語, 研究論文（学術雑誌） - Design of a liquid cell toward three-dimensional imaging of unidirectionally-aligned particles in solution using X-ray free-electron lasers
Akihiro Suzuki, Takashi Kimura, Ying Yang, Yoshiya Niida, Akiko Nishioka, Tatsuro Tachibana, Masashi Takei, Kensuke Tono, Makina Yabashi, Tetsuya Ishikawa, Tairo Oshima, Yoshitaka Bessho, Yasumasa Joti, Yoshinori Nishino
Physical Chemistry Chemical Physics, 22, 5, 2622, 2628, Royal Society of Chemistry (RSC), 2019年08月15日, ［査読有り］, ［最終著者, 責任著者］, ［国際共著］, ［国際誌］
英語, 研究論文（学術雑誌） - Simulation of single bio particles in XFEL coherent diffraction–master curve for photon counts estimation
Chi-Feng Huang, Keng S. Liang, Yeukuang Hwu, Ting-Kuo Lee, Yasumasa Joti, Yoshinori Nishino, Tetsuya Ishikawa
AIP Conference Proceedings, 2054, 050006, Author(s), 2019年01月16日, ［国際共著］, ［国際誌］
英語, 研究論文（国際会議プロシーディングス） - Development of Multilayer Focusing Mirror System for XFEL CDI Experiments of Biological Particles
Takahisa Koyama, Hirokatsu Yumoto, Takashi Kimura, Akihiro Suzuki, Takashi Kameshima, Yasumasa Joti, Kensuke Tono, Naoya Tani, Tatsuro Tachibana, Yusuke Konishi, Yoshitaka Bessho, Yoshinori Nishino, Makina Yabashi, Haruhiko Ohashi
Microscopy and Microanalysis, 24, S2, 298, 299, Cambridge University Press (CUP), 2018年08月10日, ［査読有り］, ［国際共著］, ［国際誌］
英語, 研究論文（学術雑誌） - Quantum valence criticality in a correlated metal
Kentaro Kuga, Yosuke Matsumoto, Mario Okawa, Shintaro Suzuki, Takahiro Tomita, Keita Sone, Yasuyuki Shimura, Toshiro Sakakibara, Daisuke Nishio-Hamane, Yoshitomo Karaki, Yasutaka Takata, Masaharu Matsunami, Ritsuko Eguchi, Munetaka Taguchi, Ashish Chainani, Shik Shin, Kenji Tamasaku, Yoshinori Nishino, Makina Yabashi, Tetsuya Ishikawa, Satoru Nakatsuji
Science Advances, 4, 2, eaao3547, eaao3547, American Association for the Advancement of Science (AAAS), 2018年02月23日, ［査読有り］, ［国際誌］
英語, 研究論文（学術雑誌）, A valence critical end point existing near the absolute zero provides a unique case for the study of a quantum version of the strong density fluctuation at the Widom line in the supercritical fluids. Although singular charge and orbital dynamics are suggested theoretically to alter the electronic structure significantly, breaking down the standard quasi-particle picture, this has never been confirmed experimentally to date. We provide the first empirical evidence that the proximity to quantum valence criticality leads to a clear breakdown of Fermi liquid behavior. Our detailed study of the mixed valence compound alpha-YbAlB4 reveals that a small chemical substitution induces a sharp valence crossover, accompanied by a pronounced non-Fermi liquid behavior characterized by a divergent effective mass and unusual T/B scaling in the magnetization. - Generation of apodized X-ray illumination and its application to scanning and diffraction microscopy
Krishna P. Khakurel, Takashi Kimura, Hiroki Nakamori, Takumi Goto, Satoshi Matsuyama, Tomoya Sasaki, Masashi Takei, Yoshiki Kohmura, Tetsuya Ishikawa, Kazuto Yamauchi, Yoshinori Nishino
Journal of Synchrotron Radiation, 24, 1, 142, 149, International Union of Crystallography (IUCr), 2017年01月01日, ［査読有り］, ［最終著者, 責任著者］, ［国際誌］
英語, 研究論文（学術雑誌）, X-ray science has greatly benefited from the progress in X-ray optics. Advances in the design and the manufacturing techniques of X-ray optics are key to the success of various microscopic and spectroscopic techniques practiced today. Here the generation of apodized X-ray illumination using a two-stage deformable Kirkpatrick–Baez mirror system is presented. Such apodized illumination is marked by the suppression of the side-lobe intensities of the focused beam. Thus generated apodized illumination was employed to improve the image quality in scanning X-ray fluorescence microscopy. Imaging of a non-isolated object by coherent X-ray diffractive imaging with apodized illumination in a non-scanning mode is also presented. - Nearly diffraction-limited X-ray focusing with variable-numerical-aperture focusing optical system based on four deformable mirrors
Satoshi Matsuyama, Hiroki Nakamori, Takumi Goto, Takashi Kimura, Krishna P. Khakurel, Yoshiki Kohmura, Yasuhisa Sano, Makina Yabashi, Tetsuya Ishikawa, Yoshinori Nishino, Kazuto Yamauchi
Scientific Reports, 6, 1, Springer Science and Business Media LLC, 2016年04月21日, ［査読有り］, ［国際誌］
英語, 研究論文（学術雑誌） - Yolk/Shell Assembly of Gold Nanoparticles by Size Segregation in Solution
Jinjian Wei, Kenichi Niikura, Takeshi Higuchi, Takashi Kimura, Hideyuki Mitomo, Hiroshi Jinnai, Yasumasa Joti, Yoshitaka Bessho, Yoshinori Nishino, Yasutaka Matsuo, Kuniharu Ijiro
Journal of the American Chemical Society, 138, 10, 3274, 3277, American Chemical Society (ACS), 2016年03月16日, ［査読有り］, ［責任著者］, ［国際共著］, ［国際誌］
英語, 研究論文（学術雑誌） - Extending the potential of x-ray free-electron lasers to industrial applications—an initiatory attempt at coherent diffractive imaging on car-related nanomaterials
Rikiya Yoshida, Hisao Yamashige, Masahide Miura, Takashi Kimura, Yasumasa Joti, Yoshitaka Bessho, Mayumi Kuramoto, Jian Yu, Krishna Khakurel, Kensuke Tono, Makina Yabashi, Tetsuya Ishikawa, Yoshinori Nishino
Journal of Physics B: Atomic, Molecular and Optical Physics, 48, 24, 244008, 244008, IOP Publishing, 2015年12月28日, ［査読有り］, ［最終著者, 責任著者］, ［国際誌］
英語, 研究論文（学術雑誌） - Temperature Dependence of Magnetically Active Charge Excitations in Magnetite across the Verwey Transition
M. Taguchi, A. Chainani, S. Ueda, M. Matsunami, Y. Ishida, R. Eguchi, S. Tsuda, Y. Takata, M. Yabashi, K. Tamasaku, Y. Nishino, T. Ishikawa, H. Daimon, S. Todo, H. Tanaka, M. Oura, Y. Senba, H. Ohashi, S. Shin
Physical Review Letters, 115, 25, American Physical Society (APS), 2015年12月17日, ［査読有り］, ［国際誌］
英語, 研究論文（学術雑誌） - Coherent diffraction imaging of non-isolated object with apodized illumination
Krishna P. Khakurel, Takashi Kimura, Yasumasa Joti, Satoshi Matsuyama, Kazuto Yamauchi, Yoshinori Nishino
Optics Express, 23, 22, 28182, 28182, The Optical Society, 2015年11月02日, ［査読有り］, ［最終著者, 責任著者］, ［国際誌］
英語, 研究論文（学術雑誌） - Synthesis of Janus-Like Gold Nanoparticles with Hydrophilic/Hydrophobic Faces by Surface Ligand Exchange and Their Self-Assemblies in Water
Ryo Iida, Hitoshi Kawamura, Kenichi Niikura, Takashi Kimura, Shota Sekiguchi, Yasumasa Joti, Yoshitaka Bessho, Hideyuki Mitomo, Yoshinori Nishino, Kuniharu Ijiro
Langmuir, 31, 14, 4054, 4062, American Chemical Society (ACS), 2015年04月14日, ［査読有り］, ［責任著者］, ［国際共著］, ［国際誌］
英語, 研究論文（学術雑誌） - Time-Resolved Coherent Diffraction of Ultrafast Structural Dynamics in a Single Nanowire
Marcus C. Newton, Mayu Sao, Yuta Fujisawa, Rena Onitsuka, Tomoya Kawaguchi, Kazuya Tokuda, Takahiro Sato, Tadashi Togashi, Makina Yabashi, Tetsuya Ishikawa, Tetsu Ichitsubo, Eiichiro Matsubara, Yoshihito Tanaka, Yoshinori Nishino
Nano Letters, 14, 5, 2413, 2418, American Chemical Society (ACS), 2014年05月14日, ［査読有り］, ［最終著者］, ［国際誌］
英語, 研究論文（学術雑誌） - Imaging live cell in micro-liquid enclosure by X-ray laser diffraction
Takashi Kimura, Yasumasa Joti, Akemi Shibuya, Changyong Song, Sangsoo Kim, Kensuke Tono, Makina Yabashi, Masatada Tamakoshi, Toshiyuki Moriya, Tairo Oshima, Tetsuya Ishikawa, Yoshitaka Bessho, Yoshinori Nishino
Nature Communications, 5, 1, Springer Science and Business Media LLC, 2014年01月07日, ［査読有り］, ［最終著者, 責任著者］, ［国際共著］, ［国際誌］
英語, 研究論文（学術雑誌） - Coherent x-ray zoom condenser lens for diffractive and scanning microscopy
Takashi Kimura, Satoshi Matsuyama, Kazuto Yamauchi, Yoshinori Nishino
Optics Express, 21, 8, 9267, 9267, The Optical Society, 2013年04月22日, ［査読有り］, ［最終著者, 責任著者］, ［国際誌］
英語, 研究論文（学術雑誌） - Time-resolved Bragg coherent X-ray diffraction revealing ultrafast lattice dynamics in nano-thickness crystal layer using X-ray free electron laser
Yoshihito TANAKA, Kiminori ITO, Takashi NAKATANI, Rena ONITSUKA, Marcus NEWTON, Takahiro SATO, Tadashi TOGASHI, Makina YABASHI, Tomoya KAWAGUCHI, Koki SHIMADA, Kazuya TOKUDA, Isao TAKAHASHI, Tetsu ICHITSUBO, Eiichiro MATSUBARA, Yoshinori NISHINO
Journal of the Ceramic Society of Japan, 121, 1411, 283, 286, Ceramic Society of Japan, 2013年03月01日, ［査読有り］, ［最終著者］, ［国際誌］
英語, 研究論文（学術雑誌） - Quantifying covalency and metallicity in correlated compounds undergoing metal-insulator transitions
Ashish Chainani, Ayako Yamamoto, Masaharu Matsunami, Ritsuko Eguchi, Munetaka Taguchi, Yasutaka Takata, Hidenori Takagi, Shik Shin, Yoshinori Nishino, Makina Yabashi, Kenji Tamasaku, Tetsuya Ishikawa
Physical Review B, 87, 4, American Physical Society (APS), 2013年01月09日, ［査読有り］, ［国際誌］
英語, 研究論文（学術雑誌） - Advances in X-ray scattering: from solution SAXS to achievements with coherent beams
Javier Pérez, Yoshinori Nishino
Current Opinion in Structural Biology, 22, 5, 670, 678, Elsevier BV, 2012年10月01日, ［査読有り］, ［招待有り］, ［最終著者, 責任著者］, ［国際共著］, ［国際誌］
研究論文（学術雑誌） - Fast microtomography using bright monochromatic x-rays
J. W. Jung, J. S. Lee, N. Kwon, S. J. Park, S. Chang, J. Kim, J. Pyo, Y. Kohmura, Y. Nishino, M. Yamamoto, T. Ishikawa, J. H. Je
Review of Scientific Instruments, 83, 9, 093704, 093704, AIP Publishing, 2012年09月13日, ［査読有り］, ［国際共著］, ［国際誌］
英語, 研究論文（学術雑誌） - Bonsu: the interactive phase retrieval suite
Marcus C. Newton, Yoshinori Nishino, Ian K. Robinson
Journal of Applied Crystallography, 45, 4, 840, 843, International Union of Crystallography (IUCr), 2012年08月01日, ［査読有り］, ［国際共著］, ［国際誌］
英語, 研究論文（学術雑誌）, Coherent X-ray diffraction imaging has received considerable attention as a nondestructive method for probing material structure at the nanoscale. However, tools for reconstructing and analysing data in both two and three dimensions have lagged somewhat behind.Bonsu , the interactive phase retrieval suite, is the first software package that allows real-time visualization of the reconstruction of phase information in both two and three dimensions. It comes complete with an inventory of algorithms and routines for data manipulation and reconstruction.Bonsu is open source, is designed around the Python language (with C++ bindings) and is largely platform independent.Bonsu is made available under version three of the GNU General Public License and can be found at https://code.google.com/p/bonsu/. - Chromosomes without a 30-nm chromatin fiber
Yasumasa Joti, Takaaki Hikima, Yoshinori Nishino, Fukumi Kamada, Saera Hihara, Hideaki Takata, Tetsuya Ishikawa, Kazuhiro Maeshima
Nucleus, 3, 5, 404, 410, Informa UK Limited, 2012年07月31日, ［査読有り］, ［国際誌］
英語, 研究論文（学術雑誌） - Photoemission Evidence for Valence Fluctuations and Kondo Resonance in YbAl2
Masaharu Matsunami, Ashish Chainani, Munetaka Taguchi, Ritsuko Eguchi, Yasutaka Takata, Masaki Oura, Makina Yabashi, Kenji Tamasaku, Yoshinori Nishino, Tetsuya Ishikawa, Masashi Kosaka, Shik Shin
Journal of the Physical Society of Japan, 81, 7, 073702, 073702, Physical Society of Japan, 2012年07月15日, ［査読有り］, ［国際誌］
英語, 研究論文（学術雑誌）, We use hard x-ray photoemission spectroscopy (HAXPES) to investigate the electronic structure of YbAl2, for which the Yb valence has not been consistently reported to date. The bulk sensitivity and the analytical simplicity provided by the Yb 3d core-level HAXPES allow a reliable determination of the mean valence of Yb ions. For YbAl2, it is evaluated to be +2.20, which remains nearly unchanged below 300 K. The Kondo resonance peak with an extremely high Kondo temperature (above 2000 K) is clearly identified in the valence-band spectra. The results indicate that a coherent Kondo state can be robust even in a nearly divalent system. - Human mitotic chromosomes consist predominantly of irregularly folded nucleosome fibres without a 30-nm chromatin structure
Yoshinori Nishino, Mikhail Eltsov, Yasumasa Joti, Kazuki Ito, Hideaki Takata, Yukio Takahashi, Saera Hihara, Achilleas S. Frangakis, Naoko Imamoto, Tetsuya Ishikawa, Kazuhiro Maeshima
EMBO JOURNAL, 31, 7, 1644, 1653, NATURE PUBLISHING GROUP, 2012年04月, ［査読有り］, ［筆頭著者］, ［国際共著］, ［国際誌］
英語, 研究論文（学術雑誌）, How a long strand of genomic DNA is compacted into a mitotic chromosome remains one of the basic questions in biology. The nucleosome fibre, in which DNA is wrapped around core histones, has long been assumed to be folded into a 30-nm chromatin fibre and further hierarchical regular structures to form mitotic chromosomes, although the actual existence of these regular structures is controversial. Here, we show that human mitotic HeLa chromosomes are mainly composed of irregularly folded nucleosome fibres rather than 30-nm chromatin fibres. Our comprehensive and quantitative study using cryo-electron microscopy and synchrotron X-ray scattering resolved the long-standing contradictions regarding the existence of 30-nm chromatin structures and detected no regular structure >11 nm. Our finding suggests that the mitotic chromosome consists of irregularly arranged nucleosome fibres, with a fractal nature, which permits a more dynamic and flexible genome organization than would be allowed by static regular structures. The EMBO Journal (2012) 31, 1644-1653. doi: 10.1038/emboj.2012.35; Published online 17 February 2012 - 4枚の高精度形状可変ミラーを用いたアダプティブ集光光学系の開発
松山智至, 木村隆志, 中森紘基, 今井将太, 香村芳樹, 玉作賢治, 矢橋牧名, 石川哲也, 西野吉則, 山内和人
プログラム予稿集 第11回X線結像光学シンポジウム, 2012, 403, 404, 公益社団法人 精密工学会, 2011年11月
日本語, 研究論文（その他学術会議資料等）, 本研究の目的は形状可変ミラー用いた硬X線集光光学系の開発である。現在X線集光に用いられている光学素子は集光径や焦点距離といったパラメータが固定であるのに対し、形状可変ミラーを用いた光学系ではこれらのパラメータを変更可能となる。本発表では、X線の集光状態をリアルタイムで計測可能なビームモニタを用いて形状可変ミラーの補正を行い、半値幅300nmの集光ビームを得た結果について示す。 - Single-nanometer focusing of hard x-rays by Kirkpatrick–Baez mirrors
Kazuto Yamauchi, Hidekazu Mimura, Takashi Kimura, Hirokatsu Yumoto, Soichiro Handa, Satoshi Matsuyama, Kenta Arima, Yasuhisa Sano, Kazuya Yamamura, Koji Inagaki, Hiroki Nakamori, Jangwoo Kim, Kenji Tamasaku, Yoshinori Nishino, Makina Yabashi, Tetsuya Ishikawa
Journal of Physics: Condensed Matter, 23, 39, 394206, 394206, IOP Publishing, 2011年10月05日, ［査読有り］, ［国際誌］
英語, 研究論文（学術雑誌）, We have constructed an extremely precise optical system for hard-x-ray nanofocusing in a synchrotron radiation beamline. Precision multilayer mirrors were fabricated, tested, and employed as Kirkpatrick-Baez mirrors with a novel phase error compensator. In the phase compensator, an at-wavelength wavefront error sensing method based on x-ray interferometry and an in situ phase compensator mirror, which adaptively deforms with nanometer precision, were developed to satisfy the Rayleigh criterion to achieve diffraction-limited focusing in a single-nanometer range. The performance of the optics was tested at BL29XUL of SPring-8 and was confirmed to realize a spot size of approximately 7 nm. - One-dimensional sub-10-nm hard X-ray focusing using laterally graded multilayer mirror
Hidekazu Mimura, Takashi Kimura, Hirokatsu Yumoto, Hikaru Yokoyama, Hiroki Nakamori, Satoshi Matsuyama, Kenji Tamasaku, Yoshinori Nishino, Makina Yabashi, Tetsuya Ishikawa, Kazuto Yamauchi
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 635, 1, S16, S18, ELSEVIER SCIENCE BV, 2011年04月, ［査読有り］
英語, 研究論文（学術雑誌）, Hard X-rays are high-energy photons with extremely short wavelengths of the order of atomic distances. Their short wavelengths allow hard X-rays to be focused to nanometer sizes. This concept is simple; however, it is technically difficult to implement. For this reason, many physicists have been investigating X-ray focusing. In this study, we produce a single-digit nanometer sized hard X-ray focal spot using an ultraprecise multilayer mirror. Such extremely narrow hard X-ray beams can be used to achieve extremely high spatial resolutions in various X-ray microscopy techniques. Coupled with the high pulse powers of X-ray free-electron lasers, such nanofocusing optics have the potential to exceed the Schwinger limit. (C) 2010 Elsevier B.V. All rights reserved. - Coherent diffraction microscopy at SPring-8: instrumentation, data acquisition and data analysis
Rui Xu, Sara Salha, Kevin S. Raines, Huaidong Jiang, Chien-Chun Chen, Yukio Takahashi, Yoshiki Kohmura, Yoshinori Nishino, Changyong Song, Tetsuya Ishikawa, Jianwei Miao
JOURNAL OF SYNCHROTRON RADIATION, 18, 2, 293, 298, WILEY-BLACKWELL, 2011年03月, ［査読有り］
英語, 研究論文（学術雑誌）, Since the first demonstration of coherent diffraction microscopy in 1999, this lensless imaging technique has been experimentally refined by continued developments. Here, instrumentation and experimental procedures for measuring oversampled diffraction patterns from non-crystalline specimens using an undulator beamline (BL29XUL) at SPring-8 are presented. In addition, detailed post-experimental data analysis is provided that yields high-quality image reconstructions. As the acquisition of high-quality diffraction patterns is at least as important as the phase-retrieval procedure to guarantee successful image reconstructions, this work will be of interest for those who want to apply this imaging technique to materials science and biological samples. - Role of Ti 3d Carriers in Mediating the Ferromagnetism of Co:TiO2 Anatase Thin Films
T. Ohtsuki, A. Chainani, R. Eguchi, M. Matsunami, Y. Takata, M. Taguchi, Y. Nishino, K. Tamasaku, M. Yabashi, T. Ishikawa, M. Oura, Y. Senba, H. Ohashi, S. Shin
PHYSICAL REVIEW LETTERS, 106, 4, 47602, AMER PHYSICAL SOC, 2011年01月, ［査読有り］
英語, 研究論文（学術雑誌）, We study the surface and bulk electronic structure of the room-temperature ferromagnet Co:TiO2 anatase films using soft-and hard-x-ray photoemission spectroscopy with probe sensitivities of similar to 1 and similar to 10 nm, respectively. We obtain direct evidence of metallic Ti3+ states in the bulk, which get suppressed to give a surface semiconductor, thus indicating the difference in electronic structure between surface and bulk. X-ray absorption and resonant photoemission spectroscopy reveal Ti3+ electrons at the Fermi level (E-F) and high-spin Co2+ electrons occurring away from E-F. The results show the importance of the charge neutrality condition: Co2+ + V-O(2-) + 2Ti(4+) <-> Co2+ + 2Ti(3+) (V-O is oxygen vacancy), which gives rise to the elusive Ti 3d carriers mediating ferromagnetism via the Co 3d-O 2p-Ti 3d exchange interaction pathway of the occupied orbitals. - Wavefield characterization of nearly diffraction-limited focused hard x-ray beam with size less than 10 nm
Takashi Kimura, Hidekazu Mimura, Soichiro Handa, Hirokatsu Yumoto, Hikaru Yokoyama, Shota Imai, Satoshi Matsuyama, Yasuhisa Sano, Kenji Tamasaku, Yoshiki Komura, Yoshinori Nishino, Makina Yabashi, Tetsuya Ishikawa, Kazuto Yamauchi
REVIEW OF SCIENTIFIC INSTRUMENTS, 81, 12, 123704, AMER INST PHYSICS, 2010年12月, ［査読有り］
英語, 研究論文（学術雑誌）, In situ wavefront compensation is a promising method to realize a focus size of only a few nanometers for x-ray beams. However, precise compensation requires evaluation of the wavefront with an accuracy much shorter than the wavelength. Here, we characterized a one-dimensionally focused beam with a width of 7 nm at 20 keV using a multilayer mirror. We demonstrate that the wavefront can be determined precisely from multiple intensity profiles measured around the beamwaist. We compare the phase profiles recovered from intensity profiles measured under the same mirror condition but with three different aperture sizes and find that the accuracy of phase retrieval is as small as lambda/12. (C) 2010 American Institute of Physics. [doi:10.1063/1.3509384] - High-resolution projection image reconstruction of thick objects by hard x-ray diffraction microscopy
Yukio Takahashi, Yoshinori Nishino, Ryosuke Tsutsumi, Nobuyuki Zettsu, Eiichiro Matsubara, Kazuto Yamauchi, Tetsuya Ishikawa
PHYSICAL REVIEW B, 82, 21, 214102, AMER PHYSICAL SOC, 2010年12月, ［査読有り］
英語, 研究論文（学術雑誌）, Hard x-ray diffraction microscopy enables us to observe thick objects at high spatial resolution. The resolution of this method is limited, in principle, by only the x-ray wavelength and the largest scattering angle recorded. As the resolution approaches the wavelength, the thickness effect of objects plays a significant role in x-ray diffraction microscopy. In this paper, we report high-resolution hard x-ray diffraction microscopy for thick objects. We used highly focused coherent x rays with a wavelength of similar to 0.1 nm as an incident beam and measured the diffraction patterns of a similar to 150-nm-thick silver nanocube at the scattering angle of similar to 3 degrees. We observed a characteristic contrast of the coherent diffraction pattern due to only the thickness effect and collected the diffraction patterns at nine incident angles so as to obtain information on a cross section of Fourier space. We reconstructed a pure projection image by the iterative phasing method from the patched diffraction pattern. The edge resolution of the reconstructed image was similar to 2 nm, which was the highest resolution so far achieved by x-ray microscopy. The present study provides us with a method for quantitatively observing thick samples at high resolution by hard x-ray diffraction microscopy. - One-dimensional Wolter optics with a sub-50 nm spatial resolution
S. Matsuyama, T. Wakioka, N. Kidani, T. Kimura, H. Mimura, Y. Sano, Y. Nishino, M. Yabashi, K. Tamasaku, T. Ishikawa, K. Yamauchi
OPTICS LETTERS, 35, 21, 3583, 3585, OPTICAL SOC AMER, 2010年11月, ［査読有り］
英語, 研究論文（学術雑誌）, We studied an imaging system consisting of an elliptical mirror and a hyperbolic mirror [i.e., one-dimensional (1D) Wolter optics] to realize an achromatic full-field hard x-ray microscopy with a resolution better than 50 nm. We report the performance of this 1D Wolter optical system when the mirrors were ultraprecisely figured by elastic emission machining. Experiments to form a demagnified image (demagnification factor of 385) of a 10 mu m slit were conducted at an x-ray energy of 11.5 keV at BL29XUL of SPring-8. The system could form a demagnified image with a resolution better than 50 nm over a 12.1 mu m field. (C) 2010 Optical Society of America - Femtosecond Snapshot Holography with Extended Reference Using Extreme Ultraviolet Free-Electron Laser
Yoshinori Nishino, Yoshihito Tanaka, Makoto Okada, Motohiro Okaya, Yoshihito Uozaki, Kimihiko Nozaki, Makina Yabashi, Mitsuru Nagasono, Kensuke Tono, Hiroaki Kimura, Haruhiko Ohashi, Shinji Matsui, Tetsuya Ishikawa, Eiichiro Matsubara
Applied Physics Express, 3, 10, 102701, 102701, IOP Publishing, 2010年10月08日, ［査読有り］
英語, 研究論文（学術雑誌）, Emerging free-electron lasers (FELs) at short wavelengths open a new possibility for ultrafast microscopy of transient phenomena at high spatial resolution due to the ultrashort pulse duration. As a first step, we performed sub-picosecond snapshot imaging with extreme ultraviolet FEL by adopting a recently proposed holographic technique, holography with extended reference by autocorrelation linear differential operation (HERALDO). We point out that HERALDO enables efficient single-shot phase-contrast imaging by carefully designing the aperture size of the reference without sacrificing spatial resolution. The successful reconstruction of a test pattern from a single-shot hologram demonstrates an effective method of taking phase-contrast sub-picosecond snapshots. (C) 2010 The Japan Society of Applied Physics - Elemental mapping of frozen-hydrated cells with cryo-scanning X-ray fluorescence microscopy
S. Matsuyama, M. Shimura, M. Fujii, K. Maeshima, H. Yumoto, H. Mimura, Y. Sano, M. Yabashi, Y. Nishino, K. Tamasaku, Y. Ishizaka, T. Ishikawa, K. Yamauchi
X-RAY SPECTROMETRY, 39, 4, 260, 266, JOHN WILEY & SONS LTD, 2010年07月, ［査読有り］
英語, 研究論文（学術雑誌）, Visualizing the elemental distributions of cells and tissues is of growing importance in biology and medical science because such data deepen our understanding of the behavior of metal-binding proteins and ions. Elemental mapping by X-ray fluorescence analysis with a hard X-ray nanobeam is very well suited for this purpose owing to its high sensitivity and high resolution. Using this technique, samples must be prepared without artifacts that are caused by treatments such as chemical fixation and staining procedures. In many studies of elemental mapping, sample preparation is not explicitly considered. To overcome this deficiency, we developed a cryo-scanning X-ray fluorescence microscope and installed it in the second experimental hutch of BL29XUL of SPring-8. We used it to observe frozen-hydrated cells that had been fixed by a quick-freezing technique to preserve elemental data of the living state at an X-ray energy of 11.5 keV. The distributions of K, Ca, Fe, Cu and Zn were successfully visualized. The distributions of these elements (especially those of K, Ca and Fe) differed from those in cells fixed with paraformaldehyde. Copyright (C) 2010 John Wiley & Sons, Ltd. - Evidence for a Correlated Insulator to Antiferromagnetic Metal Transition in CrN
P. A. Bhobe, A. Chainani, M. Taguchi, T. Takeuchi, R. Eguchi, M. Matsunami, K. Ishizaka, Y. Takata, M. Oura, Y. Senba, H. Ohashi, Y. Nishino, M. Yabashi, K. Tamasaku, T. Ishikawa, K. Takenaka, H. Takagi, S. Shin
PHYSICAL REVIEW LETTERS, 104, 23, 236404, AMER PHYSICAL SOC, 2010年06月, ［査読有り］
英語, 研究論文（学術雑誌）, We investigate the electronic structure of chromium nitride (CrN) across the first-order magneto-structural transition at T-N similar to 286 K. Resonant photoemission spectroscopy (PES) shows a gap in the 3d partial density of states at the Fermi level and an on-site Coulomb energy U similar to 4.5 eV, indicating strong electron-electron correlations. Bulk-sensitive high-resolution (6 meV) laser PES reveals a clear Fermi edge indicating an antiferromagnetic metal below T-N. Hard x-ray Cr 2p core-level PES shows T-dependent changes across T-N which originate from screening due to coherent states as substantiated by cluster model calculations using the experimentally observed U. Electrical resistivity confirms an insulator above T-N (E-g similar to 70 meV) becoming a disordered metal below T-N. Thus, CrN transforms from a correlated insulator to an antiferromagnetic metal, coupled to the magnetostructural transition. - Strong Valence Fluctuation in the Quantum Critical Heavy Fermion Superconductor beta-YbAlB4: A Hard X-Ray Photoemission Study
M. Okawa, M. Matsunami, K. Ishizaka, R. Eguchi, M. Taguchi, A. Chainani, Y. Takata, M. Yabashi, K. Tamasaku, Y. Nishino, T. Ishikawa, K. Kuga, N. Horie, S. Nakatsuji, S. Shin
PHYSICAL REVIEW LETTERS, 104, 24, 247201, AMER PHYSICAL SOC, 2010年06月, ［査読有り］
英語, 研究論文（学術雑誌）, Electronic structures of the quantum critical superconductor beta-YbAlB4 and its polymorph alpha-YbAlB4 are investigated by using bulk-sensitive hard x-ray photoemission spectroscopy. From the Yb 3d core level spectra, the values of the Yb valence are estimated to be similar to 2.73 and similar to 2.75 for alpha- and beta-YbAlB4, respectively, thus providing clear evidence for valence fluctuations. The valence band spectra of these compounds also show Yb2+ peaks at the Fermi level. These observations establish an unambiguous case of a strong mixed valence at quantum criticality for the first time among heavy fermion systems, calling for a novel scheme for a quantum critical model beyond the conventional Doniach picture in beta-YbAlB4. - Two-dimensional measurement of focused hard X-ray beam profile using coherent X-ray diffraction of isolated nanoparticle
Yukio Takahashi, Hideto Kubo, Ryosuke Tsutsumi, Shigeyuki Sakaki, Nobuyuki Zettsu, Yoshinori Nishino, Tetsuya Ishikawa, Kazuto Yamauchi
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 616, 2-3, 266, 269, ELSEVIER SCIENCE BV, 2010年05月, ［査読有り］
英語, 研究論文（学術雑誌）, A method for evaluating the two-dimensional photon density distribution in focused hard X-ray beams is proposed and demonstrated in a synchrotron experiment at SPring-8. A synchrotron X-ray beam of 11.8 key is focused to a similar to 1 mu m spot by Kirkpatrick-Baez mirrors. The two-dimensional intensity distribution of the focused beam is derived by monitoring the forward diffracted intensity from an isolated silver nanocube with an edge length of similar to 150 nm positioned in the beam waist, which is two-dimensionally scanned. Furthermore, the photon density of X-rays illuminated onto the nanocube is estimated by utilizing coherent X-ray diffraction microscopy. This method is useful for evaluating the photon density distribution of hard X-ray beams focused to a spot size of less than a few micrometers. (C) 2009 Elsevier B.V. All rights reserved. - Extended knife-edge method for characterizing sub-10-nm X-ray beams
Soichiro Handa, Takashi Kimura, Hidekazu Mimura, Hirokatsu Yumoto, Satoshi Matsuyama, Yasuhisa Sano, Kenji Tamasaku, Yoshinori Nishino, Makina Yabashi, Tetsuya Ishikawa, Kazuto Yamauchi
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 616, 2-3, 246, 250, ELSEVIER SCIENCE BV, 2010年05月, ［査読有り］
英語, 研究論文（学術雑誌）, We describe a method for characterizing sub-10-nm X-ray beams using knife-edge scanning with dark-field geometry. Beam profile measurement by the conventional dark-field method is simulated numerically, and the signal intensity is found to depend strongly on the incident angle of the beam components. A numerical procedure to correct the dependence and to determine the actual beam profile is presented. (C) 2009 Elsevier B.V. All rights reserved. - Three-Dimensional Electron Density Mapping of Shape-Controlled Nanoparticle by Focused Hard X-ray Diffraction Microscopy
Yukio Takahashi, Nobuyuki Zettsu, Yoshinori Nishino, Ryosuke Tsutsumi, Eiichiro Matsubara, Tetsuya Ishikawa, Kazuto Yamauchi
NANO LETTERS, 10, 5, 1922, 1926, AMER CHEMICAL SOC, 2010年05月, ［査読有り］
英語, 研究論文（学術雑誌）, Coherent diffraction microscopy using highly focused hard X-ray beams allows us to three-dimensionally observe thick objects with a high spatial resolution, also providing us with unique structural information, i.e., electron density distribution, not obtained by X-ray tomography with lenses, atom probe microscopy, or electron tomography. We measured high-contrast coherent X-ray diffraction patterns of a shape-controlled Au/Ag nanoparticle and successfully reconstructed a projection and a three-dimensional image of the nanoparticle with a single pixel (or a voxel) size of 4.2 nm in each dimension. The small pits on the surface and a hollow interior were clearly visible. The Au-rich regions were identified based on the electron density distribution, which provided insight into the formation of Au/Ag nanoboxes. - An experimental procedure for precise evaluation of electron density distribution of a nanostructured material by coherent x-ray diffraction microscopy
Yukio Takahashi, Hideto Kubo, Yoshinori Nishino, Hayato Furukawa, Ryosuke Tsutsumi, Kazuto Yamauchi, Tetsuya Ishikawa, Eiichiro Matsubara
REVIEW OF SCIENTIFIC INSTRUMENTS, 81, 3, 33707, AMER INST PHYSICS, 2010年03月, ［査読有り］
英語, 研究論文（学術雑誌）, We developed a coherent x-ray diffraction microscopy (CXDM) system that enables us to precisely evaluate the electron density of an isolated sample. This system enables us to determine the dose per surface unit of x rays illuminated onto an isolated sample by combining incident x-ray intensity monitoring and the CXDM of a reference sample. By using this system, we determined the dose of x rays illuminated onto a nanostructured island fabricated by focused-ion-beam chemical vapor deposition and derived the electron density distribution of such a nanostructured island. A projection image of the nanostructured island with a spatial resolution of 24.1 nm and a contrast resolution higher than 2.3x10(7) electrons/pixel was successfully reconstructed. - Anomalous State Sandwiched between Fermi Liquid and Charge Ordered Mott-Insulating Phases of Ti4O7
M. Taguchi, A. Chainani, M. Matsunami, R. Eguchi, Y. Takata, M. Yabashi, K. Tamasaku, Y. Nishino, T. Ishikawa, S. Tsuda, S. Watanabe, C. -T. Chen, Y. Senba, H. Ohashi, K. Fujiwara, Y. Nakamura, H. Takagi, S. Shin
PHYSICAL REVIEW LETTERS, 104, 10, 106401, AMER PHYSICAL SOC, 2010年03月, ［査読有り］
英語, 研究論文（学術雑誌）, The Magneli phase Ti4O7 exhibits two sharp jumps in resistivity with coupled structural transitions as a function of temperature at T-c1 similar to 142 K and T-c2 = 154 K. We have studied electronic structure changes across the two transitions using 7 eV laser, soft x-ray, and hard x-ray (HX) photoemission spectroscopy (PES). Ti 2p - 3d resonant PES and HX PES show a clear metallic Fermi edge and mixed valency above T-c2. The low temperature phase below T-c1 shows a clear insulating gap of similar to 100 meV. The intermediate phase between T-c1 and T-c2 indicates a pseudogap coexisting with remnant coherent states. HX PES and complementary calculations have confirmed the coherent screening in the strongly correlated intermediate phase. The results suggest the existence of a highly anomalous state sandwiched between the mixed-valent Fermi liquid and charge ordered Mott-insulating phase in Ti4O7. - Breaking the 10 nm barrier in hard-X-ray focusing
Hidekazu Mimura, Soichiro Handa, Takashi Kimura, Hirokatsu Yumoto, Daisuke Yamakawa, Hikaru Yokoyama, Satoshi Matsuyama, Kouji Inagaki, Kazuya Yamamura, Yasuhisa Sano, Kenji Tamasaku, Yoshinori Nishino, Makina Yabashi, Tetsuya Ishikawa, Kazuto Yamauchi
NATURE PHYSICS, 6, 2, 122, 125, NATURE PUBLISHING GROUP, 2010年02月, ［査読有り］
英語, 研究論文（学術雑誌）, Hard X-rays have exceptional properties that are useful in the chemical, elemental and structure analysis of matter. Although single-nanometre resolutions in various hard-X-ray analytical methods are theoretically possible with a focused hard-X-ray beam, fabrication of the focusing optics remains the main hurdle. Aberrations owing to imperfections in the optical system degrade the quality of the focused beam(1). Here, we describe an in situ wavefront-correction approach to overcome this and demonstrate an X-ray beam focused in one direction to a width of 7 nm at 20 keV. We achieved focal spot improvement of the X-ray nanobeam produced by a laterally graded multilayer mirror(2). A grazing-incidence deformable mirror(3) was used to restore the wavefront shape. Using this system, ideal focusing conditions are achievable even if hard-X-ray focusing elements do not achieve sufficient performance. It is believed that this will ultimately lead to single-nanometre spatial resolution in X-ray analytical methods. - Development of Hard X-ray Imaging Optics with Two Pairs of Elliptical and Hyperbolic Mirrors
S. Matsuyama, M. Fujii, T. Wakioka, H. Mimura, S. Handa, T. Kimura, Y. Nishino, K. Tamasaku, Y. Makina, T. Ishikawa, K. Yamauchi
SRI 2009: THE 10TH INTERNATIONAL CONFERENCE ON SYNCHROTRON RADIATION INSTRUMENTATION, 1234, 267, +, AMER INST PHYSICS, 2010年
英語, 研究論文（国際会議プロシーディングス）, To form a magnified hard X-ray image with a 50 nm resolution, we have studied total reflection mirror optics with two pairs of elliptical and hyperbolic mirrors, which is called "Advanced Kirkpatrick-Baez system". A designed optical system has 200x and 300x magnifications in vertical and horizontal directions. Also diffraction limit size in the optical system is 40 nm x 45 nm. We fabricated a pair of elliptical and hyperbolic mirrors for horizontal imaging with a figure accuracy of 2 nm using elastic emission machining (EEM), microstitching interferometry (MSI) and relative-angle-determinable stitching interferometry (RAM). One-dimensional tests for forming a demagnified image of a slit were carried out at an X-ray energy of 11.5 keV at BL29XUL (EH2) of SPring-8. As a result, a shape beam with a FWHM of 78 nm was observed. This demonstrates that we realized one-dimensional Wolter optics that has a spatial resolution of 78 nm. - Development of Achromatic X-ray Imaging System with 4 Aspherical Mirrors
S. Matsuyama, M. Fujii, T. Wakioka, H. Mimura, Y. Sano, Y. Nishino, M. Yabashi, K. Tamasaku, T. Ishikawa, K. Yamauchi
Extended Abstracts of Second International Symposium on Atomically Controlled Fabrication Technology, 2009年11月
英語 - Development of a Mirror Manipulator for Advanced Kirkpatrick-Baez Optics
M. Fujii, S. Matsuyama, T. Wakioka, H. Mimura, Y. Sano, Y. Nishino, M. Yabashi, K. Tamasaku, T. Ishikawa, K. Yamauchi
Extended Abstracts of Second International Symposium on Atomically Controlled Fabrication Technology, 2009年11月
英語 - Novel Scheme of Figure-Error Correction for X-ray Nanofocusing Mirror
Soichiro Handa, Hidekazu Mimura, Hirokatsu Yumoto, Takashi Kimura, Satoshi Matsuyama, Yasuhisa Sano, Kazuya Yamamura, Kenji Tamasaku, Yoshinori Nishino, Makina Yabashi, Tetsuya Ishikawa, Kazuto Yamauchi
Japanese Journal of Applied Physics, 48, 9, 096507, 096507, IOP Publishing, 2009年09月24日, ［査読有り］
英語, 研究論文（学術雑誌）, To improve the performance of an X-ray nanobeam, we demonstrate the in situ determination and correction of the figure error of an elliptical mirror. The phase error profile on the mirror surface, which represents the figure error, is numerically reconstructed from the X-ray intensity distribution measured at the focal plane. The figure error is corrected by depositing a Pt film on the surface with subnanometer thickness controllability. Results of focusing experiments and subsequent analysis show a great improvement in focusing performance. (C) 2009 The Japan Society of Applied Physics - High-resolution diffraction microscopy using the plane-wave field of a nearly diffraction limited focused x-ray beam
Yukio Takahashi, Yoshinori Nishino, Ryosuke Tsutsumi, Hideto Kubo, Hayato Furukawa, Hidekazu Mimura, Satoshi Matsuyama, Nobuyuki Zettsu, Eiichiro Matsubara, Tetsuya Ishikawa, Kazuto Yamauchi
PHYSICAL REVIEW B, 80, 5, 54103, AMER PHYSICAL SOC, 2009年08月, ［査読有り］
英語, 研究論文（学術雑誌）, X-ray waves in the center of the beam waist of nearly diffraction limited focused x-ray beams can be considered to have amplitude and phase that are both almost uniform, i.e., they are x-ray plane waves. Here we report the results of an experimental demonstration of high-resolution diffraction microscopy using the x-ray plane wave of the synchrotron x-ray beam focused using Kirkpatrik-Baez mirrors. A silver nanocube with an edge length of similar to 100 nm is illuminated with the x-ray beam focused to a similar to 1 mu m spot at 12 keV. A high-contrast symmetric diffraction pattern of the nanocube is observed in the forward far field. An image of the nanocube is successfully reconstructed by an iterative phasing method and its half-period resolution is 3.0 nm. This method does not only dramatically improve the spatial resolution of x-ray microscopy but also is a key technology for realizing single-pulse diffractive imaging using x-ray free-electron lasers. - Wavefront Control System for Phase Compensation in Hard X-ray Optics
Takashi Kimura, Soichiro Handa, Hidekazu Mimura, Hirokatsu Yumoto, Daisuke Yamakawa, Satoshi Matsuyama, Kouji Inagaki, Yasuhisa Sano, Kenji Tamasaku, Yoshinori Nishino, Makina Yabashi, Tetsuya Ishikawa, Kazuto Yamauchi
Japanese Journal of Applied Physics, 48, 7, 072503, 072503, IOP Publishing, 2009年07月21日, ［査読有り］
英語, 研究論文（学術雑誌）, A highly precise adaptive optical system that can be used in the hard X-ray region was developed. To achieve highly precise control of the wavefront shape, we discussed an optical system with a bendable mirror of deformation accuracy better than 0.4 nm RMS. Using the system, we demonstrated the controllability of the wavefront of a 15 nm hard X-ray nanobeam. The intensity profile of the wavefront-modified beam was in good agreement with the wave-optically calculated profile. (C) 2009 The Japan Society of Applied Physics DOI: 10.1143/JJAP.48.072503 - Spectroscopic Evidence for Competing Reconstructions in Polar Multilayers LaAlO3/LaVO3/LaAlO3
M. Takizawa, Y. Hotta, T. Susaki, Y. Ishida, H. Wadati, Y. Takata, K. Horiba, M. Matsunami, S. Shin, M. Yabashi, K. Tamasaku, Y. Nishino, T. Ishikawa, A. Fujimori, H. Y. Hwang
PHYSICAL REVIEW LETTERS, 102, 23, 236401, AMER PHYSICAL SOC, 2009年06月, ［査読有り］
英語, 研究論文（学術雑誌）, We have studied the valence redistribution of V in LaAlO3/LaVO3/LaAlO3 trilayers, which are composed of only polar layers grown on SrTiO3 (001) substrates, by core-level photoemission spectroscopy. We have found that the V valence is intermediate between V3+ and V4+ for thin LaAlO3 cap layers, decreases with increasing cap-layer thickness, and finally recovers the bulk value of V3+ at similar to 10 unit-cell thickness. In order to interpret these results, we propose that the atomic reconstruction of the polar LaAlO3 surface competes with the purely electronic V valence change so that the polar catastrophe is avoided at the cost of minimum energy. - Observation of electromigration in a Cu thin line by in situ coherent x-ray diffraction microscopy
Yukio Takahashi, Yoshinori Nishino, Hayato Furukawa, Hideto Kubo, Kazuto Yamauchi, Tetsuya Ishikawa, Eiichiro Matsubara
JOURNAL OF APPLIED PHYSICS, 105, 12, 124911, AMER INST PHYSICS, 2009年06月, ［査読有り］
英語, 研究論文（学術雑誌）, Electromigration (EM) in a 1-mu m-thick Cu thin line was investigated by in situ coherent x-ray diffraction microscopy (CXDM). Characteristic x-ray speckle patterns due to both EM-induced voids and thermal deformation in the thin line were observed in the coherent x-ray diffraction patterns. Both parts of the voids and the deformation were successfully visualized in the images reconstructed from the diffraction patterns. This result not only represents the first demonstration of the visualization of structural changes in metallic materials by in situ CXDM but is also an important step toward studying the structural dynamics of nanomaterials using x-ray free-electron lasers in the near future. (C) 2009 American Institute of Physics. [DOI: 10.1063/1.3151855] - Feasibility study of high-resolution coherent diffraction microscopy using synchrotron x rays focused by Kirkpatrick-Baez mirrors
Yukio Takahashi, Yoshinori Nishino, Hidekazu Mimura, Ryosuke Tsutsumi, Hideto Kubo, Tetsuya Ishikawa, Kazuto Yamauchi
JOURNAL OF APPLIED PHYSICS, 105, 8, 83106, AMER INST PHYSICS, 2009年04月, ［査読有り］
英語, 研究論文（学術雑誌）, High-flux coherent x rays are necessary for the improvement of the spatial resolution in coherent x-ray diffraction microscopy (CXDM). In this study, high-resolution CXDM using Kirkpatrick-Baez (KB) mirrors is proposed, and the mirrors are designed for experiments of the transmission scheme at SPring-8. Both the photon density and spatial coherence of synchrotron x rays focused by the KB mirrors are investigated by wave optical simulation. The KB mirrors can produce nearly diffraction-limited two-dimensional focusing x rays of similar to 1 mu m in size at 8 keV. When the sample size is less than similar to 1 mu m, the sample can be illuminated with full coherent x rays by adjusting the cross-slit size set between the source and the mirrors. From the estimated photon density at the sample position, the feasibility of CXDM with a sub-1-nm spatial resolution is suggested. The present ultraprecise figuring process enables us to fabricate mirrors for carrying out high-resolution CXDM experiments. - Trace element mapping of a single cell using a hard x-ray nanobeam focused by a Kirkpatrick-Baez mirror system
S. Matsuyama, M. Shimura, H. Mirnura, M. Fujii, H. Yumoto, Y. Sano, M. Yabashi, Y. Nishino, K. Tamasaku, T. Ishikawa, K. Yamauchi
X-RAY SPECTROMETRY, 38, 2, 89, 94, WILEY-BLACKWELL, 2009年03月, ［査読有り］
英語, 研究論文（学術雑誌）, To visualize the distributions of trace elements in biological samples such as tissues and cells at high spatial resolution, we developed a scanning x-ray fluorescence microscope (SXFM) at SPring-8, using a Kirkpatrick-Baez mirror optics that enables achromatic and highly efficient focusing. To evaluate performance regarding its application to biological samples, the SXFM was used at x-ray energy of 15 keV to observe NIH/3T3 cells in which adenosine triphosphate (ATP) synthase beta (specifically localized at the mitochondria) were labeled with gold colloidal particles. Various elemental distributions were visualized at the single-cell level, including those for P, S, Cl, Ca, Fe, Cu, Zn and Au, and we obtained high-resolution elemental distribution maps by magnifying the labeled single mitochondrion. Maximum spatial resolution achieved in the experiments was sub-100 nm. Copyright (C) 2008 John Wiley & Sons, Ltd. - Structure and photoemission spectroscopy of strain-controlled metal-insulator transition in NdNiO3 thin films
R. Eguchi, Y. Okamoto, Z. Hiroi, S. Shin, A. Chainani, Y. Tanaka, M. Matsunami, Y. Takata, Y. Nishino, K. Tamasaku, M. Yabashi, T. Ishikawa
JOURNAL OF APPLIED PHYSICS, 105, 5, 56103, AMER INST PHYSICS, 2009年03月, ［査読有り］
英語, 研究論文（学術雑誌）, We study epitaxial NdNiO3 thin films on NdGaO3(001) single-crystal substrates grown using a pulsed-laser deposition method. The films show a clear first-order metal-insulator transition (MIT) at T-MI similar to 240 K, which is significantly higher than T-MI similar to 190 K in bulk NdNiO3. The x-ray reciprocal space map shows in-plane tensile and out-of-plane compressive strain, stabilizing the more distorted NdNiO3 thin films with the higher transition temperature. Hard x-ray photoemission shows changes across the MIT and the bandwidth-controlled charge-transfer gap opens due to the reduced p-d hybridization in the low-temperature insulating phase. - Three-Dimensional Visualization of a Human Chromosome Using Coherent X-Ray Diffraction
Yoshinori Nishino, Yukio Takahashi, Naoko Imamoto, Tetsuya Ishikawa, Kazuhiro Maeshima
Physical Review Letters, 102, 1, 18101, American Physical Society (APS), 2009年01月05日, ［査読有り］
英語, 研究論文（学術雑誌）, Coherent x-ray diffraction microscopy is a lensless phase-contrast imaging technique with high image contrast. Although electron tomography allows intensive study of the three-dimensional structure of cellular organelles, it has inherent difficulty with thick objects. X rays have the unique benefit of allowing noninvasive analysis of thicker objects and high spatial resolution. We observed an unstained human chromosome using coherent x-ray diffraction. The reconstructed images in two or three dimensions show an axial structure, which has not been observed under unstained conditions. - Stitching interferometric measurement system for hard x-ray nanofocusing mirrors
Hirokatsu Yumoto, Hidekazu Mimura, Soichiro Handa, Takashi Kimura, Satoshi Matsuyama, Yasuhisa Sano, Makina Yabashi, Yoshinori Nishino, Kenji Tamasaku, Tetsuya Ishikawa, Kazuto Yamauchi
9TH INTERNATIONAL CONFERENCE ON X-RAY MICROSCOPY, 186, IOP PUBLISHING LTD, 2009年, ［査読有り］
英語, 研究論文（国際会議プロシーディングス）, We have developed an advanced type of relative angle determinable stitching interferometry (RADSI) for hard x-ray nanofocusing mirrors. The surface metrology system consists of two types of optical interferometers. One is a microscope Michelson interferometer, which measures the local figure profile of the mirror surface, and the other is a large-area Fizeau interferometer, which determines the stitching angles between neighboring shots using a flat mirror. The surface figure profile of each of the one-shots and the stitching angles are measured at the same time. Precise measurement of local surface area and the stitching angles of 1 x 10(-8) rad order were achieved using the developed system. To demonstrate the accuracy of the developed measurement system, we measured an elliptically figured mirror for hard x-ray nanofocusing. The mirror's surface shape has a curvature radius of a few meters. As a result, measurement reproducibility and reliability of less than PV 3 nm was achieved by using a 25 urn focusing mirror. - Development of incident x-ray flux monitor for coherent x-ray diffraction microscopy
Yukio Takahashi, Hideto Kubo, Hayato Furukawa, Kazuto Yamauchi, Eiichiro Matsubara, Tetsuya Ishikawa, Yoshinori Nishino
9TH INTERNATIONAL CONFERENCE ON X-RAY MICROSCOPY, 186, 012060, IOP PUBLISHING LTD, 2009年, ［査読有り］
英語, 研究論文（国際会議プロシーディングス）, An incident x-ray flux monitor for coherent x-ray diffraction microscopy was developed. The intensities of x-rays passing through the sample were measured using an x-ray photodiode, with the simultaneous measurement of the x-ray diffraction intensities of the sample. As a result of the normalization of the x-ray diffraction intensities by the incident x-ray flux determined from the monitor, the fluctuation of the speckle intensities was successfully suppressed. - Visualization of Cells and Cell Organelles Using Coherent X-Ray Diffraction
Nishino Yoshinori, Maeshima Kazuhiro, Imamoto Naoko, Hirohata Ryuta, Matsubara Eiichiro, Takahashi Yukio, Miao Jianwei, Ishikawa Tetsuya
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 65, S73, 2009年, ［査読有り］ - Nanostructure analysis by coherent hard X-ray diffraction
Yoshinori Nishino, Yukio Takahashi, Hideto Kubo, Hayato Furukawa, Kazuto Yamauchi, Kazuhiro Maeshima, Naoko Imamoto, Ryuta Hirohata, Eiichiro Matsubara, Tetsuya Ishikawa
9TH INTERNATIONAL CONFERENCE ON X-RAY MICROSCOPY, 186, 1, 3, IOP PUBLISHING LTD, 2009年, ［査読有り］
英語, 研究論文（国際会議プロシーディングス）, We report our recent activities on x-ray diffraction microscopy. We have been developing hardware and software instruments for efficient recording of high-quality coherent diffraction data. By using the microscope system developed, we carried out coherent diffraction measurement for various samples in materials science and biology, and succeeded in three-dimensional reconstruction revealing the internal structure. - Nanostructure Anaysis using Coherent X-ray Diffraction
Yoshinori NISHINO
Nihon Kessho Gakkaishi, 51, 4, 239, 244, 2009年, ［査読有り］
Yoshinori NISHINO, 2009, 'Nanostructure Anaysis using Coherent X-ray Diffraction', <i>Nihon Kessho Gakkaishi</i>, vol. 51, no. 4, pp. 239-244 - Three-Dimensional Visualization of a Human Chromosome Using Coherent X-ray Diffraction
Kazuhiro MAESHIMA, Yoshinori NISHINO
Seibutsu Butsuri, 49, 6, 298, 300, 2009年, ［査読有り］
Kazuhiro MAESHIMA, Yoshinori NISHINO, 2009, 'Three-Dimensional Visualization of a Human Chromosome Using Coherent X-ray Diffraction', <i>Seibutsu Butsuri</i>, vol. 49, no. 6, pp. 298-300 - Combining photoemission and optical spectroscopies for reliable valence determination in YbS and Yb metal
M. Matsunami, A. Chainani, M. Taguchi, R. Eguchi, Y. Ishida, Y. Takata, H. Okamura, T. Nanba, M. Yabashi, K. Tamasaku, Y. Nishino, T. Ishikawa, Y. Senba, H. Ohashi, N. Tsujii, A. Ochiai, S. Shin
PHYSICAL REVIEW B, 78, 19, 195118, AMER PHYSICAL SOC, 2008年11月, ［査読有り］
英語, 研究論文（学術雑誌）, Hard x-ray photoemission and optical spectroscopies have been performed on YbS and Yb metal to determine the precise f-electron occupation. A comparison of the photoemission spectra with the energy-loss functions in bulk and surface, obtained from optical reflectivity, enables us to distinguish between the energy-loss satellite of Yb2+ peak and the Yb3+ multiplet. The results clearly indicate a purely divalent Yb state except for the surface of YbS which is altered by oxidation. We demonstrate that the present method is highly reliable in identifying the electronic structure and the mean valence in f-electron systems. - Element-specific hard x-ray diffraction microscopy
Yukio Takahashi, Hideto Kubo, Hayato Furukawa, Kazuto Yamauchi, Eiichiro Matsubara, Tetsuya Ishikawa, Yoshinori Nishino
PHYSICAL REVIEW B, 78, 9, 92105, AMER PHYSICAL SOC, 2008年09月, ［査読有り］
英語, 研究論文（学術雑誌）, An element-specific coherent x-ray imaging technique using anomalous x-ray scattering in the hard x-ray region was first demonstrated. Coherent x-ray diffraction patterns of a sample composed of 500-nm-thick Ni and Cu layers were measured at incident x-ray energies around the Ni K absorption edge. Non-centersymmetric diffraction patterns due to anomalous scattering phenomenon in the hard x-ray region were observed. Symmetricity of the diffraction pattern was quantitatively analyzed by numerically simulating the x-ray wave field behind the sample position using the Rytov approximation. By calculating the difference between the intensities of reconstructed images of different energies, an image of the Ni layers could be derived although it was not enough to identify precisely. This method is widely applicable to nondestructive analysis of nanometer-scale elemental distribution of materials buried within thick and high-Z samples. - Focusing mirror for x-ray free-electron lasers
Hidekazu Mimura, Shinya Morita, Takashi Kimura, Daisuke Yamakawa, Weimin Lin, Yoshihiro Uehara, Satoshi Matsuyama, Hirokatsu Yumoto, Haruhiko Ohashi, Kenji Tamasaku, Yoshinori Nishino, Makina Yabashi, Tetsuya Ishikawa, Hitoshi Ohmori, Kazuto Yamauchi
REVIEW OF SCIENTIFIC INSTRUMENTS, 79, 8, 83104, AMER INST PHYSICS, 2008年08月, ［査読有り］
英語, 研究論文（学術雑誌）, We present the design, fabrication, and evaluation of a large total-reflection mirror for focusing x-ray free-electron laser beams to nanometer dimensions. We used an elliptical focusing mirror made of silicon that was 400 mm long and had a focal length of 550 trim. Electrolytic in-process dressing grinding was used for initial-step figuring and elastic emission machining was employed for final figuring and surface smoothing. A figure accuracy with a peak-to-valley height of 2 nm was achieved across the entire area. Characterization of the focused beam was performed at BL29XUL of SPring-8. The focused beam size was 75 nm at 15 keV, which is almost equal to the theoretical size. (C) 2008 American Institute of Physics. - Photoemission evidence for a Mott-Hubbard metal-insulator transition in VO(2)
R. Eguchi, M. Taguchi, M. Matsunami, K. Horiba, K. Yamamoto, Y. Ishida, A. Chainani, Y. Takata, M. Yabashi, D. Miwa, Y. Nishino, K. Tamasaku, T. Ishikawa, Y. Senba, H. Ohashi, Y. Muraoka, Z. Hiroi, S. Shin
PHYSICAL REVIEW B, 78, 7, 75115, AMER PHYSICAL SOC, 2008年08月, ［査読有り］
英語, 研究論文（学術雑誌）, The temperature (T)-dependent metal-insulator transition (MIT) in VO(2) is investigated using bulk sensitive hard-x-ray (similar to 8 keV) valence-band, core-level, and V 2p-3d resonant photoemission spectroscopies (PESs). The valence-band and core-level spectra are compared with full-multiplet cluster model calculations including a coherent screening channel. Across the MIT, V 3d spectral weight transfer from the coherent (3d(1)(C) under bar final) states at Fermi level to the incoherent (3d(0)+3d(1)(L) under bar final) states, corresponding to the lower Hubbard band, leads to gap formation. The spectral shape changes in V 1s and V 2p core levels as well as the valence band are nicely reproduced from cluster model calculations, providing electronic structure parameters. Resonant PES finds that the 3d(1)(L) under bar states resonate across the V 2p-3d threshold in addition to the 3d(0) and 3d(1)(C) under bar states. The results support a Mott-Hubbard transition picture for the first-order MIT in VO(2). - 3D view of mesoscopic internal structure by coherent hard X-ray diffraction
Nishino Yoshinori, Takahashi Yukio, Maeshima Kazuhiro, Imamoto Naoko, Matsubara Eiichiro, Ishikawa Tetsuya
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 64, C118, 2008年08月, ［査読有り］ - Coherent x-ray diffraction measurements of Cu thin lines
Yukio Takahashi, Hayato Furukawa, Hideto Kubo, Kazuto Yamauchi, Yoshinori Nishino, Tetsuya Ishikawa, Eiichiro Matsubara
Surface and Interface Analysis, 40, 6-7, 1046, 1049, Wiley, 2008年06月, ［査読有り］
英語, 研究論文（学術雑誌）, 1-mu m-thick Cu thin lines with adjacent connections, which simulate via structures in large-scale integration circuits, were fabricated on Si3N4 membranes by both electron-beam evaporation and a focused ion beam for coherent x-ray diffraction measurements. A direct current was applied to a Cu thin line to prepare an electromigration sample. In the scanning electron microscope image of the electromigration sample, a roughness of a few hundred nanometers was observed on the surface around the via structures. Coherent x-ray diffraction patterns of both the thin line and electromigration samples were measured using synchrotron x-rays at SPring-8. Characteristic diffraction patterns resulting from both the shape of the Cu thin lines and the defects around the via structures formed by the application of the current were observed. Copyright (C) 2008 John Wiley & Sons, Ltd. - Trace element mapping using a high-resolution scanning X-ray fluorescence microscope equipped with a Kirkpatrick-Baez mirror system
S. Matsuyama, H. Mimura, K. Katagishi, H. Yumoto, S. Handa, M. Fujii, Y. Sano, M. Shimura, M. Yabashi, Y. Nishino, K. Tamasaku, T. Ishikawa, K. Yamauchi
SURFACE AND INTERFACE ANALYSIS, 40, 6-7, 1042, 1045, WILEY-BLACKWELL, 2008年06月, ［査読有り］
英語, 研究論文（学術雑誌）, We have developed a scanning X-ray fluorescence microscope (SXFM) using Kirkpatrick-Baez mirror optics, which enables achromatic and highly efficient focusing, at BL29XUL of SPring-8. The SXFM enables observations of multielement distributions inside a sample with high resolution and high sensitivity. Previously, we have reported the high spatial resolution of a newly developed SXFM. In the present paper, we focus on the high sensitivity of the SXFM. By observations of fine test patterns using the X-ray beam probe having a size of 100 x 100 nm(2) and an energy of 15 keV, the lower detection limit for the visualization of elemental distributions was investigated. As a result, the lower detection limits were found to be 0.009 fg (gallium) and 0.012 fg (tungsten). Copyright (C) 2008 John Wiley & Sons, Ltd. - Temperature dependence of the exchange stiffness in FePd(001) thin films: Deviation from the empirical law A(T)proportional to M(S)(2) at intermediate temperatures
M. Mulazzi, A. Chainani, Y. Takata, Y. Tanaka, Y. Nishino, K. Tamasaku, T. Ishikawa, T. Takeuchi, Y. Ishida, Y. Senba, H. Ohashi, S. Shin
PHYSICAL REVIEW B, 77, 22, 224425, AMER PHYSICAL SOC, 2008年06月, ［査読有り］
英語, 研究論文（学術雑誌）, We study the temperature dependence of the exchange stiffness A(T) of a thin FePd(001) film, which exhibits well-ordered magnetic stripe domains. We employed two different methods: (i) applying an exact micromagnetic model of the nucleation point and (ii) a detailed analysis of the temperature dependence of the saturation magnetization. The experimental data needed as input for the theoretical model are the stripe domain width and the nucleation field, and these were obtained as a function of temperature using soft x-ray magnetic scattering and superconducting quantum interference device (SQUID) magnetometry, respectively. The temperature independence of the domain width is very important from the point of view of the energetics of the FePd film, i.e., the number of magnetic domains remains constant per unit area. From this experimental finding we infer that the exchange stiffness must vary as a function of the temperature. We show that the A(T) dependence obtained with the two procedures are consistent but different from the phenomenological law A(T)proportional to M(S)(2)(T), normally assumed to be valid in the temperature range examined (T=50-250 K), an intermediate temperature range for which there is no known expression of the magnetization as a function of the temperature. We have also investigated the Fe 3s core level and valence band of FePd using hard x-ray photoemission spectroscopy. The Fe 3s spectra exhibit negligible changes in the temperature range investigated, while small changes occurring over large energy scales are observed in the valence-band spectra. Based on the lack of consistency of the magnetometry and scattering results compared to local-moment theories, these results favor an itinerant magnetism picture for FePd. - Revisiting the valence-band and core-level photoemission spectra of NiO
M. Taguchi, M. Matsunami, Y. Ishida, R. Eguchi, A. Chainani, Y. Takata, M. Yabashi, K. Tamasaku, Y. Nishino, T. Ishikawa, Y. Senba, H. Ohashi, S. Shin
PHYSICAL REVIEW LETTERS, 100, 20, 206401, AMER PHYSICAL SOC, 2008年05月, ［査読有り］
英語, 研究論文（学術雑誌）, We have reexamined the valence-band (VB) and core-level electronic structure of NiO by means of hard and soft x-ray photoemission spectroscopies. The spectral weight of the lowest energy state was found to be enhanced in the bulk sensitive Ni 2p core-level spectrum. A configuration-interaction model including a bound state screening has shown agreement with the core-level spectrum and off- and on-resonance VB spectra. These results identify the lowest energy states in the core-level and VB spectra as the Zhang-Rice (ZR) doublet bound states, consistent with the spin-fermion model and recent ab initio calculations within dynamical mean-field theory. The results indicate that the ZR character first ionization (the lowest hole-addition) states are responsible for transport properties in NiO and doped NiO. - Electronic structure of semiconducting CeFe(4)P(12): Strong hybridization and relevance of single-impurity Anderson model
M. Matsunami, K. Horiba, M. Taguchi, K. Yamamoto, A. Chainani, Y. Takata, Y. Senba, H. Ohashi, M. Yabashi, K. Tamasaku, Y. Nishino, D. Miwa, T. Ishikawa, E. Ikenaga, K. Kobayashi, H. Sugawara, H. Sato, H. Harima, S. Shin
PHYSICAL REVIEW B, 77, 16, 165126, AMER PHYSICAL SOC, 2008年04月, ［査読有り］
英語, 研究論文（学術雑誌）, Semiconducting skutterudite CeFe(4)P(12) is investigated by synchrotron x-ray photoemission spectroscopy (PES) and x-ray absorption spectroscopy (XAS). Ce 3d core-level PES and 3d-4f XAS, in combination with single-impurity Anderson model (SIAM) calculations, confirm features due to f(0), f(1), and f(2) configurations. The Ce 3d-4f resonant-PES spectra provide the Ce 4f density of states (DOS), which indicates the absence of a Kondo resonance at the Fermi level, but can still be explained by SIAM with a small gap in non-f DOS. While Ce 4f partial DOS from band structure calculations is consistent with the main Ce 4f DOS, the importance of SIAM for core-level PES and XAS spectra quantifies the mixed valence for semiconducting CeFe(4)P(12), derived from strong hybridization between non-f conduction and Ce 4f DOS. - Nanoscale Imaging of Mineral Crystals inside Biological Composite Materials Using X-Ray Diffraction Microscopy
Huaidong Jiang, Damien Ramunno-Johnson, Changyong Song, Bagrat Amirbekian, Yoshiki Kohmura, Yoshinori Nishino, Yukio Takahashi, Tetsuya Ishikawa, Jianwei Miao
Physical Review Letters, 100, 3, 38103, American Physical Society (APS), 2008年01月24日, ［査読有り］
英語, 研究論文（学術雑誌）, We for the first time applied x-ray diffraction microscopy to the imaging of mineral crystals inside biological composite materials-intramuscular fish bone-at the nanometer scale resolution. We identified mineral crystals in collagen fibrils at different stages of mineralization. Based on the experimental results and biomineralization analyses, we suggested a dynamic model to account for the nucleation and growth of mineral crystals in the collagen matrix. The results obtained from this study not only further our understanding of the complex structure of bone, but also demonstrate that x-ray diffraction microscopy will become an important tool to study biological materials. - Hard x-ray photoemission study of LaAlO(3)/LaVO(3) multilayers
Hiroki Wadati, Yasushi Hotta, Atsushi Fujimori, Tomofumi Susaki, Harold Y. Hwang, Yasutaka Takata, Koji Horiba, Masaharu Matsunami, Shik Shin, Makina Yabashi, Kenji Tamasaku, Yoshinori Nishino, Tetsuya Ishikawa
PHYSICAL REVIEW B, 77, 4, 45122, AMER PHYSICAL SOC, 2008年01月, ［査読有り］
英語, 研究論文（学術雑誌）, We have studied the electronic structure of multilayers composed of a band insulator LaAlO(3) (LAO) and a Mott insulator LaVO(3) (LVO) by means of hard x-ray photoemission spectroscopy, which has a probing depth as large as similar to 60 A. The Mott-Hubbard gap of LVO remained open at the interface, indicating that the interface is insulating unlike the LaTiO(3)/SrTiO(3) multilayers. We found that the valence of V in LVO was partially converted from V(3+) to V(4+) only at the interface on the top side of the LVO layer and that the amount of V(4+) increased with LVO layer thickness. We suggest that the electronic reconstruction to eliminate the polarity catastrophe inherent in the polar heterostructure is the origin of the highly asymmetric valence change at the LAO/LVO interfaces. - Direct determination of the wave field of an x-ray nanobeam
Hidekazu Mimura, Hirokatsu Yumoto, Satoshi Matsuyama, Soichiro Handa, Takashi Kimura, Yasuhisa Sano, Makina Yabashi, Yoshinori Nishino, Kenji Tamasaku, Tetsuya Ishikawa, Kazuto Yamauchi
PHYSICAL REVIEW A, 77, 1, 15812, AMER PHYSICAL SOC, 2008年01月, ［査読有り］
英語, 研究論文（学術雑誌）, We present a remarkably accurate method for determining the wave field of an x-ray nanobeam. The intensity profile of a beam was directly measured over a range of three orders of magnitude while its phase distribution was successfully recovered using an iterative algorithm. The evolution of the wave field along the beam propagation direction was precisely simulated, and there was good agreement with the experimental results. - Recoil effect of photoelectrons in the Fermi edge of simple metals
Takata, Y., Kayanuma, Y., Oshima, S., Tanaka, S., Yabashi, M., Tamasaku, K., Nishino, Y., Matsunami, M., Eguchi, R., Chainani, A., Oura, M., Takeuchi, T., Senba, Y., Ohashi, H., Shin, S., Ishikawa, T.
Physical Review Letters, 101, 13, 1, 4, 2008年, ［査読有り］
研究論文（学術雑誌） - Fabrication of a 400-mm-long mirror for focusing X-ray free-electron lasers to sub-100 nm
Hidekazu Mimura, Shinya Morita, Takashi Kimura, Daisuke Yamakawa, Weimin Lin, Yoshihiro Uehara, Hirokatsu Yumoto, Satoshi Matsuyama, Yoshinori Nishino, Kenji Tamasaku, Haruhiko Ohashi, Makina Yabashi, Tetsuya Ishikawa, Hitoshi Ohmori, Kazuto Yamauchi
ADVANCES IN X-RAY/EUV OPTICS AND COMPONENTS III, 7077, SPIE-INT SOC OPTICAL ENGINEERING, 2008年, ［査読有り］
英語, 研究論文（国際会議プロシーディングス）, We describe the fabrication of a long mirror for focusing X-ray free electron lasers to nanometer dimension, for the production of high photon density beams. The focusing mirror has an elliptical curved shape with a length of 400 mm and focal length of 550 mm. Electrolytic in-process dressing grinding is used for first-step figuring and elastic emission machining is employed for final figuring and surface smoothing. Figure accuracy with a peak-to-valley height of 2 nm is achieved. A focusing test was performed at BL29XUL of SPring-8 and found the focused beam size to be approximately 75 nm at 15 keV, very similar to the theoretical value. - Development of adaptive mirror for wavefront correction of hard X-ray nanobeam
Takashi Kimura, Soichiro Handa, Hidekazu Mimura, Hirokatsu Yumoto, Daisuke Yamakawa, Satoshi Matsuyama, Yasuhisa Sano, Kenji Tamasaku, Yoshinori Nishino, Makina Yabashi, Tetsuya Ishikawa, Kazuto Yamauchi
ADVANCES IN X-RAY/EUV OPTICS AND COMPONENTS III, 7077, SPIE-INT SOC OPTICAL ENGINEERING, 2008年, ［査読有り］
英語, 研究論文（国際会議プロシーディングス）, We present the development of a phase compensator for wavefront control of X-rays. The optical device is a 150 mm-long total reflection mirror, the shape of which can be curved by adjusting the bias voltages of 36 piezoelectric ceramic plates attached to the mirror. The mirror surface was smoothed and made flat by elastic emission machining. To achieve a high degree of the accuracy in the controllability of a curved line, a Fizeau interferometer is placed in front of the mirror surface to monitor its shape in the experiment. We will apply this device to the optical system for the realization of sub-10-nm hard X-ray focusing. - Electronic structures of Fe(3-x)M(x)O(4) (M=Mn,Zn) spinel oxide thin films investigated by X-ray photoemission spectroscopy and X-ray magnetic circular dichroism
Junichi Takaobushi, Mizue Ishikawa, Shigenori Ueda, Eiji Ikenaga, Jung-Jin Kim, Masaaki Kobata, Yukiharu Takeda, Yuji Saitoh, Makina Yabashi, Yoshinori Nishino, Daigo Miwa, Kenji Tamasaku, Tetsuya Ishikawa, Issei Satoh, Hidekazu Tanaka, Keisuke Kobayashi, Tomoji Kawai
PHYSICAL REVIEW B, 76, 20, 205108, AMER PHYSICAL SOC, 2007年11月, ［査読有り］
英語, 研究論文（学術雑誌）, We fabricated Fe(3-x)M(x)O(4) (M=Mn,Zn) thin film by pulsed laser deposition technique and investigated their electronic structure by hard x-ray photoemission spectroscopy (HX-PES) and x-ray magnetic circular dichroism (XMCD). HX-PES and XMCD revealed that the solid solution system of Fe(3-x)M(x)O(4) (M=Mn,Zn) is the best candidate for tunable ferromagnetic oxide semiconductor judging from systematic change of Fe, Mn core-level spectra, and valence band spectra by substitution. We present a model to explain modulation of electric and magnetic properties and electronic structure evolution caused by strongly correlated electron. - Bulk screening in core-level photoemission from Mott-Hubbard and charge-transfer systems (vol 71, art no 155102, 2005)
M. Taguchi, A. Chainani, N. Kamakura, K. Horiba, Y. Takata, M. Yabashi, K. Tamasaku, Y. Nishino, D. Miwa, T. Ishikawa, S. Shin, E. Ikenaga, T. Yokoya, K. Kobayashi, T. Mochiku, K. Hirata, K. Motoya
PHYSICAL REVIEW B, 76, 16, 169901, AMER PHYSICAL SOC, 2007年10月, ［査読有り］
英語 - How is it possible to obtain buried interface information through very thick films using a hard-X-ray PEEM?
Toyohiko Kinoshita, Eiji Ikenaga, Jungjin Kim, Shigenori Ueda, Masaaki Kobata, James R. Harries, Kenya Shimada, Akihiro Ino, Kenji Tamasaku, Yoshinori Nishino, Tetsuya Ishikawa, Keisuke Kobayashi, Wolfgang Drube, Christof Kunz
SURFACE SCIENCE, 601, 20, 4754, 4757, ELSEVIER SCIENCE BV, 2007年10月, ［査読有り］
英語, 研究論文（学術雑誌）, We analyze the excitation of secondary electrons by hard-X-rays in subsurface layers. By studying core-excited photoelectron lines and their plasmon satellites in photoemission spectra, we show how electrons excited by hard-X-rays can carry information from deep regions deep within the sample to the surface. It is believed that the decay of high-energy photoelectrons via plasmon-loss is strongly related to the production of secondary electrons. For high-energy electrons, however, the momentum transfer to plasmons is small compared to the electron's initial momentum, so the lateral position on the surface from which the secondary electrons are emitted is close to that of the atom initially excited by the hard-X-rays. This explains why the spatial resolution of hard-X-ray photoelectron emission microscope (HX-PEEM) images is good even if the buried interface is covered by a film with a thickness many times the inelastic mean free path of the primary electrons. This argument explains well recent HX-PEEM results. (c) 2007 Elsevier B.V. All rights reserved. - Methods for obtaining superresolution images in coherent x-ray diffraction microscopy
Yukio Takahashi, Yoshinori Nishino, Tetsuya Ishikawa
PHYSICAL REVIEW A, 76, 3, 33822, AMER PHYSICAL SOC, 2007年09月, ［査読有り］
英語, 研究論文（学術雑誌）, Coherent x-ray diffraction microscopy (CXDM) using an x-ray free electron laser (XFEL) is expected to open up a new frontier of structural studies in materials science and biology, while radiation damage of samples under the extremely intense x rays is a matter of considerable concern. Two superresolution methods for CXDM proposed in this paper offer solutions of the problems by numerical data analysis. Promising results for future applications of CXDM with XFEL were obtained in a numerical simulation. - Coherent x-ray diffraction pattern of a SnZn cast alloy
Y. Takahashi, Y. Nishino, T. Ishikawa, E. Matsubara
Journal of Physics: Conference Series, 83, 1, Institute of Physics Publishing, 2007年06月01日, ［査読有り］
英語, 研究論文（学術雑誌）, A coherent x-ray diffraction pattern of a Sn-Zn eutectic alloy particle prepared by a gas-atomized method was measured. Noncentrosymmetric speckle patterns resulting from submicron-sized Zn- and Sn-rich regions in the Sn-Zn alloy were observed. © 2007 IOP Publishing Ltd. - 3-D X-ray diffraction imaging with nanoscale resolution using incoherent radiation
Andrei Y. Nikulin, Ruben A. Dilanian, Nadia A. Zatsepin, Brian M. Gable, Barry C. Muddle, Alexei Y. Souvorov, Yoshinori Nishino, Tetsuya Ishikawa
NANO LETTERS, 7, 5, 1246, 1250, AMER CHEMICAL SOC, 2007年05月, ［査読有り］
英語, 研究論文（学術雑誌）, A novel approach to X-ray diffraction data analysis for nondestructive determination of the shape of nanoscale particles and clusters in three-dimensions is illustrated with representative examples of composite nanostructures. The technique is insensitive to the X-ray coherence, which allows 3-D reconstruction of a modal image without tomographic synthesis and in situ analysis of large (over a several cubic millimeters) volume of material with a spatial resolution of few nanometers, rendering the approach suitable for laboratory facilities. - Electronic structure of 3d(1) configuration vanadium oxides studied by soft X-ray and hard X-ray photoemission spectroscopy
R. Eguchi, M. Taguchi, M. Matsunami, K. Horiba, K. Yamamoto, A. Chainani, Y. Takata, M. Yabashi, D. Miwa, Y. Nishino, K. Tamasaku, T. Ishikawa, Y. Senba, H. Ohashi, I. H. Inoue, Y. Muraoka, Z. Hiroi, S. Shin
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 156, 421, 425, ELSEVIER SCIENCE BV, 2007年05月, ［査読有り］
英語, 研究論文（学術雑誌）, We investigate the electronic structure of 3d(1) configuration vanadium oxides (VO2, SrVO3 and CaVO3) using soft X-ray (SX) and hard X-ray (HX) photoemission spectroscopy (PES). The valence band spectra of VO2 in SX- and HX-PES clearly show the opening of a gap at E-F across the metal-insulator transition. Spectral changes in the V 2p and O 1s core levels were also observed. In addition, 3d(1) configuration correlated metals SrVO3 and CaVO3 are typical materials whose valence band spectra are compared with dynamical mean-field theory. The V 2p and V 1s core level HX-PES of SrVO3 and CaVO3 show clear additional well-screened features. These features originate from bulk screening by a coherent band at EF. These spectra are nicely reproduced by a cluster model calculation, indicating a difference of the parameter V* for the interaction strength between the central V 3d orbitals and the coherent band. (c) 2007 Elsevier B.V. All rights reserved. - Study of adsorption states for lubricant molecule using hard X-ray photoemission spectroscopy
E. Ikenaga, M. Kobata, J.J. Kim, A. Wakabayashi, Y. Nishino, K. Tamasaku, Y. Sakane, T. Ishikawa, S. Komiya, K. Kobayashi
Journal of Electron Spectroscopy and Related Phenomena, 156-158, 336, 339, Elsevier BV, 2007年05月, ［査読有り］
英語, 研究論文（学術雑誌）, The adsorption states for lubricant molecules have been investigated using hard X-ray (hv = 7.95 keV) photoemission spectroscopy (HX-PES). This method has the advantage for the organic molecules to be able to measure damage few. Being aware of the fact that P atoms exist only in cyclotriphosphazene base, we measured the take-off angle dependence of the P1s spectra. Each spectrum consists from two peaks, that is, substrate NiP peak and cyclotriphosphazene P peak. The cyclotriphosphazene P peak rapidly disappears with increasing take-off angle. We have also measured C1s spectra. Combining these experimental results, we have found that the adsorption state of cyclotriphosphazene end group is undergoing. (c) 2007 Elsevier B.V. All rights reserved. - Electronic structure of ferromagnetic semiconductor Ge1-xMnxTe investigated by hard X-ray photoemission spectroscopy
S. Senba, Y. Fukuma, H. Sato, K. Goto, H. Asada, T. Koyanagi, M. Taniguchi, E. Ikenaga, J. J. Kim, S. Ueda, M. Kobata, D. Miwa, Y. Nishino, K. Tamasaku, T. Ishikawa, K. Kobayashi
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 156, LXXXIX, LXXXIX, ELSEVIER SCIENCE BV, 2007年05月, ［査読有り］
英語 - Approach for three-dimensional observation of mesoscopic precipitates in alloys by coherent x-ray diffraction microscopy
Yukio Takahashi, Yoshinori Nishino, Tetsuya Ishikawa, Eiichiro Matsubara
APPLIED PHYSICS LETTERS, 90, 18, 184105, AMER INST PHYSICS, 2007年04月, ［査読有り］
英語, 研究論文（学術雑誌）, An approach for evaluating three-dimensional spatial distribution of precipitates buried within a bulk alloy by coherent x-ray diffraction microscopy (CXDM) is proposed. In this study, the outer shape and the internal structure of the micrometer-sized sample in a precipitation-hardened aluminum alloy are observed by CXDM. A high-electron-density region resulting from precipitates is clearly visualized, implying that the precipitates distribute inhomogeneously in the Al matrix at several tens of nanometer scale. This is the important result toward in situ observation of the formation of internal structures in metallic materials on the nanomesoscale by CXDM with x-ray free electron lasers. (c) 2007 American Institute of Physics. - High-resolution photoemission study of the hybridization gap in the Kondo semiconductor CeRhAs
K. Shimada, M. Higashiguchi, M. Arita, H. Namatame, M. Taniguchi, S.-i. Fujimori, Y. Saitoh, A. Fujimori, Y. Takata, S. Shin, K. Kobayashi, E. Ikenaga, M. Yabashi, K. Tamasaku, Y. Nishino, D. Miwa, T. Ishikawa, T. Sasakawa, T. Takabatake
JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, 310, 2, E57, E58, ELSEVIER SCIENCE BV, 2007年03月, ［査読有り］
英語, 研究論文（学術雑誌）, We have examined the electronic states of the Kondo semiconductor CeRhAs and the semimetal CeRhSb by means of high- resolution photoemission spectroscopy using tunable photon energies from hv = 40 up to 5948 eV. On the basis of the photon- energy dependence of the photoionization cross- section, we have elucidated the p - d - f hybridized states in these compounds. (c) 2006 Elsevier B. V. All rights reserved. - Hard X-ray and soft X-ray photoemission study of vanadium oxides
R. Eguchi, Y. Takata, M. Matsunami, K. Horiba, K. Yamamoto, M. Taguchi, A. Chainani, M. Yabashi, D. Miwa, Y. Nishino, K. Tamasaku, T. Ishikawa, Y. Senba, H. Ohashi, I. H. Inoue, S. Shin
JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, 310, 2, E289, E291, ELSEVIER SCIENCE BV, 2007年03月, ［査読有り］
英語, 研究論文（学術雑誌）, We study the electronic structure of Mott-Hubbard systems SrVO3 and CaVO3 with photoemission spectroscopy (PES) using hard Xrays (HX) (hv similar to 8 keV) and soft X-rays (SX) (hv similar to 900 eV). In HX-PES results, the V 2p core levels of SrVO3 and CaVO3 show clear additional intensity, which are not observed in SX-PES. These features originate from bulk screening by coherent states at Fermi level as observed in other 3d transition metal oxides. From the comparison between SrVO3 and CaVO3 in HX-PES, the intensity in SrVO3 is nearly similar to CaVO3. The results suggest screening from coherent states is more efficient in HX-PES compared to SX-PES. (c) 2006 Elsevier B.V. All rights reserved. - Phase retrieval from exactly oversampled diffraction intensity through deconvolution
Changyong Song, Damien Ramunno-Johnson, Yoshinori Nishino, Yoshiki Kohmura, Tetsuya Ishikawa, Chien-Chun Chen, Ting-Kuo Lee, Jianwei Miao
PHYSICAL REVIEW B, 75, 1, 12102, AMERICAN PHYSICAL SOC, 2007年01月, ［査読有り］
英語, 研究論文（学術雑誌）, We have shown that, when the linear oversampling ratio >= 2, exactly oversampled diffraction patterns can be directly obtained from measured data through deconvolution. By using computer simulations and experimental data, we have demonstrated that exact oversampling of diffraction patterns distinctively improves the quality of phase retrieval. Furthermore, phase retrieval based on the exact sampling scheme is independent of the oversampling ratio, which can significantly reduce the radiation dosage to the samples. We believe that the present work will contribute to high-quality image reconstruction of materials science samples and biological structures using x-ray diffraction microscopy. - Efficient focusing of hard x rays to 25 nm by a total reflection mirror
Hidekazu Mimura, Hirokatsu Yumoto, Satoshi Matsuyama, Yasuhisa Sano, Kazuya Yamamura, Yuzo Mori, Makina Yabashi, Yoshinori Nishino, Kenji Tamasaku, Tetsuya Ishikawa, Kazuto Yamauchi
APPLIED PHYSICS LETTERS, 90, 5, 51903, AMER INST PHYSICS, 2007年01月, ［査読有り］
英語, 研究論文（学術雑誌）, Nanofocused x rays are indispensable because they can provide high spatial resolution and high sensitivity for x-ray nanoscopy/spectroscopy. A focusing system using total reflection mirrors is one of the most promising methods for producing nanofocused x rays due to its high efficiency and energy-tunable focusing. The authors have developed a fabrication system for hard x-ray mirrors by developing elastic emission machining, microstitching interferometry, and relative angle determinable stitching interferometry. By using an ultraprecisely figured mirror, they realized hard x-ray line focusing with a beam width of 25 nm at 15 keV. The focusing test was performed at the 1-km-long beamline of SPring-8. (c) 2007 American Institute of Physics. - Recoil effects of photoelectrons in a solid
Takata, Y., Kayanuma, Y., Yabashi, M., Tamasaku, K., Nishino, Y., Miwa, D., Harada, Y., Horiba, K., Shin, S., Tanaka, S., Ikenaga, E., Kobayashi, K., Senba, Y., Ohashi, H., Ishikawa, T.
Physical Review B - Condensed Matter and Materials Physics, 75, 23, 1, 4, 2007年, ［査読有り］
研究論文（学術雑誌） - Reflective optics for sub-10nm hard X-ray focusing
H. Mimura, S. Matsuyama, H. Yumoto, S. Handa, T. Kimura, Y. Sano, K. Tamasaku, Y. Nishino, M. Yabashi, T. Ishikawa, K. Yamauchi
ADVANCES IN X-RAY/EUV OPTICS AND COMPONENTS II, 6705, SPIE-INT SOC OPTICAL ENGINEERING, 2007年, ［査読有り］
英語, 研究論文（国際会議プロシーディングス）, Nanofocused X-rays are indispensable because they can provide high spatial resolution and high sensitivity for X-ray nanoscopy/spectroscopy. A focusing system with reflective optics is one of the most promising methods for producing nanofocused X-rays due to its high efficiency and beams size. So, far we realize efficient hard X-ray focusing with a beam size of 25nm. Our next project is realization of sub-10nm hard X-ray focusing. Here, we describe the design of the graded multilayer mirror and evaluation method for hard X-ray focused beam. - Hard X-ray photoemission spectroscopy using excitation energies of up to 10 keV for materials science
J. J. Kim, E. Ikenaga, M. Kobata, M. Yabashi, K. Kobayashi, Y. Nishino, D. Miwa, K. Tamasaku, T. Ishikawa
SYNCHROTRON RADIATION INSTRUMENTATION, PTS 1 AND 2, 879, 1407, +, AMER INST PHYSICS, 2007年, ［査読有り］
英語, 研究論文（国際会議プロシーディングス）, Hard X-ray photoemission spectroscopy has been shown to be a powerful tool for investigating the bulk sensitive chemical and electronic states of solid materials. Mgh energy resolution and high throughput have been achieved using the highly brilliant undulator X-rays available at SPring-8 along with an electron analyzer optimized for high electron kinetic energy. Here, we report the performance and characteristics of hard X-ray photoemission spectroscopy of photoelectron excitation energies of up to 10 keV. - Hard X-ray photoelectron spectroscopy on ultra shallow plasma-doped silicon layers
M. Kobata, E. Ikenaga, J. J. Kim, M. Yabashi, K. Kobayashi, D. Miwa, Y. Nishino, K. Tamasaku, T. Ishikawa, C. G. Jin, Y. Sasaki, K. Okashita, H. Tamura, H. Ito, B. Mizuno, T. Okumura
PHYSICS OF SEMICONDUCTORS, PTS A AND B, 893, 1491, +, AMER INST PHYSICS, 2007年, ［査読有り］
英語, 研究論文（国際会議プロシーディングス）, Recently, we have shown that hard X-ray photoemission spectroscopy (HX-PES) using undulator X-rays at SPring-8 is quite feasible with both high resolution and high throughput. Here we report an application of HX-PES to the characterization of electronic and chemical states of ultra shallow plasma doped samples. We found that the shift in chemical binding energy by impurity activation can be measured with high accuracy. The binding energy of Si Is changes according to the shift in Fermi level as the carrier concentration varies. Thus, the active carrier concentration of ultra-shallow junction region can be measured by non-destructive HX-PES with high accuracy. - Hard x-ray wavefront measurement and control for hard x-ray nanofocusing
Soichiro Handa, Hidekazu Mimura, Satoshi Matsuyama, Hirokatsu Yumoto, Takashi Kimura, Yasuhisa Sano, Kenji Tamasaku, Yoshinori Nishino, Makina Yabashi, Tetsuya Ishikawa, Kazuto Yamauchi
ADVANCES IN METROLOGY FOR X-RAY AND EUV OPTICS II, 6704, SPIE-INT SOC OPTICAL ENGINEERING, 2007年, ［査読有り］
英語, 研究論文（国際会議プロシーディングス）, Extremely high surface figure accuracy is required for hard x-ray nanofocusing mirrors to realize an ideal spherical wavefront in a reflected x-ray beam. We performed the figure correction of an elliptically figured mirror by a differential deposition technique on the basis of the wavefront phase error, which was calculated by a phase-retrieval method using only intensity profile on the focal plane. The measurements of the intensity profiles were performed at the 1-km-long beamline at SPring-8. The two measurements before and after the figure correction indicate that the beamwaist structure around the focal point is greatly improved. - Fabrication of ultraprecisely figured mirror for nano focusing hard-x-ray
Hirokatsu Yumoto, Hidekazu Mimura, Satoshi Matsuyama, Souichiro Handa, Kazuya Yamamura, Yasuhisa Sano, Katsuyoshi Endo, Yuzo Mori, Makina Yabashi, Yoshinori Nishino, Kenji Tamasaku, Tetsuya Ishikawa, Kazuto Yamauchi
TOWARDS SYNTHESIS OF MICRO - /NANO - SYSTEMS, 5, 295, +, SPRINGER-VERLAG LONDON LTD, 2007年, ［査読有り］
英語, 研究論文（国際会議プロシーディングス）, We developed a novel at-wavelength metrology for the surface figure of hard x-ray focusing mirrors. The metrology, which evaluates the wave-front error of the focusing beam, is based on the numerical calculation of intensity distribution profiles around the focal point. We demonstrated the at-wavelength metrology of a total reflection mirror. The recovered phase error profile of the test mirror using the at-wavelength metrology was in good agreement with the profile measured using an optical interferometer. This result indicates the effectiveness of the developed metrology. This technique is expected to be applied to manufacturing processes for realizing diffraction-limited nano focusing optics. - Sensitive Depiction of Biomedical Tissue by Refraction Based Computed Tomography Using Synchrotron Radiation
E. Hashimoto, A. Maksimenko, H. Sugiyama, K. Hirano, K. Hyodo, D. Shimao, Y. Nishino, T. Ishikawa, T. Yuasa, M. Ando
IFMBE Proc., 14, 1, 1376, 1379, 2007年, ［査読有り］
英語, 研究論文（国際会議プロシーディングス） - High Quality Image of Biomedical Object by X-ray Refraction Based Contrast Computed Tomography
E. Hashimoto, A. Maksimenko, H. Sugiyama, K. Hirano, D. Shimao, Y. Nishino, T. Ishikawa, T. Yuasa, S. Ichihara, Y. Arai, M. Ando
AIP Conf. Proc., 879, 1979, 1983, 2007年, ［査読有り］
英語, 研究論文（国際会議プロシーディングス） - Fe3-xZnxO4 thin film as tunable high Curie temperature ferromagnetic semiconductor
Junichi Takaobushi, Hidekazu Tanaka, Tomoji Kawai, Shigenori Ueda, Jung-Jin Kim, Masaaki Kobata, Eiji Ikenaga, Makina Yabashi, Keisuke Kobayashi, Yoshinori Nishino, Daigo Miwa, Kenji Tamasaku, Tetsuya Ishikawa
APPLIED PHYSICS LETTERS, 89, 24, 242507, AMER INST PHYSICS, 2006年12月, ［査読有り］
英語, 研究論文（学術雑誌）, Epitaxial ferri(ferro)magnetic Fe3-xZnxO4 thin films (x=0-0.9) were prepared using a pulsed-laser deposition technique. The electrical conductivity and magnetic properties of Fe3-xZnxO4 thin film were systematically modulated for the entire range of Zn substitution. Anomalous Hall coefficient measurements revealed the presence of spin-polarized carriers at room temperature. Valence band spectra obtained by hard x-ray photoemission spectroscopy revealed that the density of states near the Fermi level was reduced with an increasing Zn concentration of x. These results indicate that this system will serve as a tunable ferromagnetic semiconductor with a strong electron correlation. (c) 2006 American Institute of Physics. - Three-DimensionalGaN−Ga2O3Core Shell Structure Revealed by X-Ray Diffraction Microscopy
Jianwei Miao, Chien-Chun Chen, Changyong Song, Yoshinori Nishino, Yoshiki Kohmura, Tetsuya Ishikawa, Damien Ramunno-Johnson, Ting-Kuo Lee, Subhash H. Risbud
Physical Review Letters, 97, 21, 215503, American Physical Society (APS), 2006年11月21日, ［査読有り］
英語, 研究論文（学術雑誌）, In combination of direct phase retrieval of coherent x-ray diffraction patterns with a novel tomographic reconstruction algorithm, we, for the first time, carried out quantitative 3D imaging of a heat-treated GaN particle with each voxel corresponding to 17x17x17 nm(3). We observed the platelet structure of GaN and the formation of small islands on the surface of the platelets, and successfully captured the internal GaN-Ga2O3 core shell structure in three dimensions. This work opens the door for nondestructive and quantitative imaging of 3D morphology and 3D internal structure of a wide range of materials at the nanometer scale resolution that are amorphous or possess only short-range atomic organization. - Ir 4f hard X-ray photoemission spectrum of CuIr(2)rS(4)
Y. Taguchi, K. Yamamoto, K. Mimura, K. Ichikawa, K. Kitamoto, O. Aita, H. Ishibashi, Y. Takata, K. Horiba, S. Shin, M. Yabashi, K. Tamasaku, Y. Nishino, D. Miwa, T. Ishikawa, E. Ikenaga, K. Kobayashi
RADIATION PHYSICS AND CHEMISTRY, 75, 11, 2072, 2075, PERGAMON-ELSEVIER SCIENCE LTD, 2006年11月, ［査読有り］
英語, 研究論文（学術雑誌）, We have measured Ir 4f core-level photoemission spectra using an excitation photon energy of 6 keV for single crystalline CuIr2S4 at 250 and 200 K across the metal-insulator transition temperature of about 226 K. The Ir 417 spin-orbit doublet shifts by about 0.25eV towards higher binding energy with decreasing temperature. Tails and satellites around 1 and 13 eV, respectively, higher in binding energy than the peaks of Ir 4f doublets are observed in the 250-K spectrum, but they almost disappear at 200 K. The peak analysis here done indicates that the Ir 4f spectrum at 200 K consists of two components 0.2 eV apart corresponding to the charge separation of Ir ions in CuIr2S4. (c) 2006 Elsevier Ltd. All rights reserved. - Development of scanning x-ray fluorescence microscope with spatial resolution of 30 nm using Kirkpatrick-Baez mirror optics
S. Matsuyama, H. Mimura, H. Yumoto, Y. Sano, K. Yamamura, M. Yabashi, Y. Nishino, K. Tamasaku, T. Ishikawa, K. Yamauchi
REVIEW OF SCIENTIFIC INSTRUMENTS, 77, 10, 103102, AMER INST PHYSICS, 2006年10月, ［査読有り］
英語, 研究論文（学術雑誌）, We developed a high-spatial-resolution scanning x-ray fluorescence microscope (SXFM) using Kirkpatrick-Baez mirrors. As a result of two-dimensional focusing tests at BL29XUL of SPring-8, the full width at half maximum of the focused beam was achieved to be 50 x 30 nm(2) (VxH) under the best focusing conditions. The measured beam profiles were in good agreement with simulated results. Moreover, beam size was controllable within the wide range of 30 - 1400 nm by changing the virtual source size, although photon flux and size were in a trade-off relationship. To demonstrate SXFM performance, a fine test chart fabricated using focused ion beam system was observed to determine the best spatial resolution. The element distribution inside a logo mark of SPring-8 in the test chart, which has a minimum linewidth of approximately 50 - 60 nm, was visualized with a spatial resolution better than 30 nm using the smallest focused x-ray beam. (c) 2006 American Institute of Physics. - First application of X-ray refraction-based computed tomography to a biomedical object
Eiko Hashimoto, Anton Maksimenko, Hiroshi Sugiyama, Kazuyuki Hyodo, Daisuke Shimao, Yoshinori Nishino, Tetsuya Ishikawa, Masami Ando
ZOOLOGICAL SCIENCE, 23, 9, 809, 813, ZOOLOGICAL SOC JAPAN, 2006年09月, ［査読有り］
英語, 研究論文（学術雑誌）, We have developed X-ray refraction-based computed tomography (CT) that is able to visualize soft tissue in between hard tissue. The experimental system consists of Si(220) diffraction double-crystals and is called the DEI (diffraction-enhanced imaging) method, in which the object is located between the crystals and a CCD camera to acquire data as 360 X-ray images. The X-ray energy used was 17.5 keV. The algorithm used to reconstruct CT images was developed by A. Malksimenko and colleagues. We successfully visualized articular cartilage and the distribution of bone marrow, which are inner structures. Our method has much higher contrast compared to the conventional absorption-based CT system. - Development of mirror manipulator for hard-x-ray nanofocusing at sub-50-nm level
S. Matsuyama, H. Mimura, H. Yumoto, H. Hara, K. Yamamura, Y. Sano, K. Endo, Y. Mori, M. Yabashi, Y. Nishino, K. Tamasaku, T. Ishikawa, K. Yamauchi
REVIEW OF SCIENTIFIC INSTRUMENTS, 77, 9, 93107, AMER INST PHYSICS, 2006年09月, ［査読有り］
英語, 研究論文（学術雑誌）, X-ray focusing using Kirkpatrick-Baez (KB) mirrors is promising owing to their capability of highly efficient and energy-tunable focusing. We report the development of a mirror manipulator which enables KB mirror alignment with a high degree of accuracy. Mirror alignment tolerances were estimated using two types of simulators. On the basis of the simulation results, the mirror manipulator was developed to achieve an optimum KB mirror setup. As a result of focusing tests at BL29XUL of SPring-8, the beam size of 48x36 nm(2) (VxH) was achieved in the full width at half maximum at an x-ray energy of 15 keV. Spatial resolution tests showed that a scanning x-ray microscope equipped with the KB focusing system could resolve line-and-space patterns of 80 nm linewidth in a high visibility of 60%. (c) 2006 American Institute of Physics. - Hard X-ray photoemission spectroscopy of pyrochlore molybdenum oxides R2Mo2O7 (R = Sm, Tb)
M. Sawada, A. Kimura, K. Miyoshi, J. Takeuchi, M. Arita, K. Shimada, H. Namatame, M. Taniguchi, T. Ishikawa, K. Tamasaku, Y. Nishino, D. Miwa, Y. Takata, S. Shin, K. Kobayashi, E. Ikenaga, M. Yabashi, M. Awaji, A. Takeuchi
PHYSICA B-CONDENSED MATTER, 383, 1, 152, 154, ELSEVIER SCIENCE BV, 2006年08月, ［査読有り］
英語, 研究論文（学術雑誌）, We have carried out hard X-ray photoemission spectroscopy (HXPES) for pyrochlore molybdenum oxides Sm2Mo2O7 and Tb2Mo2O7 single crystals with excitation energy of 5.95 keV, in order to investigate electronic structures and correlations in the bulk. The Mo 3d core spectra show complex features, in contrast to an ordinary doublet spectral feature derived from the spin-orbit interaction, indicating significant electron correlation in the valence band. While an intense peak structure at similar to 0.5eV is observed in the valence band of Sm2Mo2O7, the peak is broadened and shifted way in Tb2Mo2O7, which suggests the difference of the electron correlation energy depending on the rare-earth site. (c) 2006 Elsevier B.V. All rights reserved. - At-wavelength figure metrology of hard x-ray focusing mirrors
Hirokatsu Yumoto, Hidekazu Mimura, Satoshi Matsuyama, Soichiro Handa, Yasuhisa Sano, Makina Yabashi, Yoshinori Nishino, Kenji Tamasaku, Tetsuya Ishikawa, Kazuto Yamauchi
REVIEW OF SCIENTIFIC INSTRUMENTS, 77, 6, 63712, AMER INST PHYSICS, 2006年06月, ［査読有り］
英語, 研究論文（学術雑誌）, We have developed an at-wavelength wave-front metrology of a grazing-incidence focusing optical systems in the hard x-ray region. The metrology is based on numerical retrieval from the intensity profile around the focal point. We demonstrated the at-wavelength metrology and estimated the surface figure error on a test mirror. An experiment for measuring the focusing intensity profile was performed at the 1-km-long beamline (BL29XUL) of SPring-8. The obtained results were compared with the profile measured using an optical interferometer and were confirmed to be in good agreement with it. This technique is a potential method of characterizing wave-front aberrations on elliptical mirrors for sub-10-nm focusing. (c) 2006 American Institute of Physics. - Nanoresolution profiling of metal-metal interfaces from x-ray Fraunhofer diffraction data
AV Darahanau, AY Nikulin, RA Dilanian, BC Muddle, A Souvorov, Y Nishino, T Ishikawa
APPLIED PHYSICS LETTERS, 88, 26, 263113, AMER INST PHYSICS, 2006年06月, ［査読有り］
英語, 研究論文（学術雑誌）, High-angular-resolution Fraunhofer diffraction data were collected from several samples with interfaces between dissimilar metals using synchrotron x-radiation. The refractive index profile in the vicinity of the interface of each sample was reconstructed with spatial resolution of about 80 nm by the phase retrieval x-ray diffractometry technique, using only limited a priori knowledge of the sample. These studies have demonstrated the viability of the technique as a nondestructive method of characterization of internal interfaces within multiphase materials. (c) 2006 American Institute of Physics. - Hard X-ray photoemission spectroscopy for intrinsic electronic structure of strongly correlated electron systems
K. Horiba, M. Taguchi, A. Chainani, Y. Takata, N. Kamakura, S. Shin, M. Yabashi, K. Tamasaku, Y. Nishino, D. Miwa, T. Ishikawa, E. Ikenaga, M. Awaji, A. Takeuchi, K. Kobayashi
PHYSICA B-CONDENSED MATTER, 378-80, 1152, 1153, ELSEVIER SCIENCE BV, 2006年05月, ［査読有り］
英語, 研究論文（学術雑誌）, In order to clarify the intrinsic bulk electronic structure of strongly-correlated electron systems, we have realized hard X-ray photoemission spectroscopy with high energy-resolution at BL29XUL in SPring-8. The total energy resolution of 75 meV was achieved at the excitation energy of 5.95 keV. Large probing depth of about 100 angstrom enables us to probe intrinsic bulk electronic structure free from surface condition. The importance and capability of this technique are demonstrated by the drastic difference in the Cu 2p core-level spectra of Nd1.85Ce0.15CuO4 crystals obtained using soft and hard X-rays. (c) 2006 Elsevier B.V. All rights reserved. - Nearly perfect large-area quartz: 4 meV resolution for 10 keV photons over 10 cm(2)
JP Sutter, AQR Baron, D Miwa, Y Nishino, K Tamasaku, T Ishikawa
JOURNAL OF SYNCHROTRON RADIATION, 13, 3, 278, 280, BLACKWELL PUBLISHING, 2006年05月, ［査読有り］
英語, 研究論文（学術雑誌）, The perfection of two commercial top-grade quartz crystal wafers has been investigated using Bragg reflection at theta(B) = 89.77 degrees of a 2.0 meV bandwidth beam of 9.979 keV X-rays by the (7 (4) over bar(3) over bar4) lattice planes. Topographic images show small defect concentrations (<= 5 cm(-2)). Energy scan widths are below 3 meV over 8 mm x 8 mm areas and 4 meV over the whole wafer (similar to 11 cm(2)). This suggests that quartz can be a useful optical material. - High resolution hard X-ray photoemission using synchrotron radiation as an essential tool for characterization of thin solid films
J. J. Kim, E. Ikenaga, M. Kobata, A. Takeuchi, M. Awaji, H. Makino, P. P. Chen, A. Yamamoto, T. Matsuoka, D. Miwa, Y. Nishino, T. Yamamoto, T. Yao, K. Kobayashi
APPLIED SURFACE SCIENCE, 252, 15, 5602, 5606, ELSEVIER SCIENCE BV, 2006年05月, ［査読有り］
英語, 研究論文（学術雑誌）, Recently, we have shown that hard X-ray photoemission spectroscopy using undulator X-rays at SPring-8 is quite feasible with both high resolution and high throughput. Here we report an application of hard X-ray photoemission spectroscopy to the characterization of electronic and chemical states of thin solid films, for which conventional PES is not applicable. As a typical example, we focus on the problem of the scatter in the reported band-gap values for InN. We show that oxygen incorporation into the InN film strongly modifies the valence and plays a crucial role in the band gap problem. The present results demonstrate the powerful applicability of high resolution photoemission spectroscopy with hard X-rays from a synchrotron source. (c) 2005 Elsevier B.V. All rights reserved. - Electronic structure of strained(La0.85Ba0.15)MnO3thin films with room-temperature ferromagnetism investigated by hard x-ray photoemission spectroscopy
Hidekazu Tanaka, Yasutaka Takata, Koji Horiba, Munetaka Taguchi, Ashish Chainani, Shik Shin, Daigo Miwa, Kenji Tamasaku, Yoshinori Nishino, Tetsuya Ishikawa, Eiji Ikenaga, Mitsuhiro Awaji, Akihisa Takeuchi, Tomoji Kawai, Keisuke Kobayashi
Physical Review B, 73, 9, 94403, American Physical Society (APS), 2006年03月06日, ［査読有り］
英語, 研究論文（学術雑誌）, We report the bulk sensitive hard x-ray (hν=5.95 keV) core level photoemission spectroscopy to investigate the intrinsic electronic structure of strained (La0.85 Ba0.15) Mn O3 thin films. In a 20 nm thick well-strained film with strongly enhanced ferromagnetism, a new sharp satellite peak appeared at the low energy site of the Mn 2 p3 2 main peak
whereas, a broader signal was observed for the unstrained film with 300 nm thickness. Cluster calculations revealed that the intensity corresponded to the density of the state at the Fermi level relating to the magnitude of the ferromagnetic order. The satellite intensity also agreed quantitatively with the square of the magnetization. © 2006 The American Physical Society. - Quantitative image reconstruction of GaN quantum dots from oversampled diffraction intensities alone (vol 95, pg 085503, 2005)
JW Miao, Y Nishino, Y Kohmura, B Johnson, CY Song, SH Risbud, T Ishikawa
PHYSICAL REVIEW LETTERS, 96, 11, 119902, AMERICAN PHYSICAL SOC, 2006年03月, ［査読有り］
英語 - High-spatial-resolution scanning X-ray fluorescence microscope with Kirkpatrick-Baez mirrors
Satoshi Matsuyama, Hidekazu Mimura, Mari Shimura, Hirokatsu Yumoto, Keiko Katagishi, Soichiro Handa, Akihiko Shibatani, Yasuhis Sano, Kazuya Yamamura, Yoshinori Nishino, Kenji Tamasaku, Makina Yabashi, Tetsuya Ishikawa, Kazuto Yamauchi
ADVANCES IN X-RAY/EUV OPTICS, COMPONENTS, AND APPLICATIONS, 6317, SPIE-INT SOC OPTICAL ENGINEERING, 2006年, ［査読有り］
英語, 研究論文（国際会議プロシーディングス）, We developed a high-spatial-resolution scanning X-ray fluorescence microscope (SXFM) with Kirkpatrick-Baez mirrors. As a result of focusing tests at 15 keV, the focused beam having a FWHM of 30 x 50 nm(2) was achieved. Additionally, the size was controllable within the wide range of 30 similar to 1400 nm merely by adjusting the X-ray source size. The observation of a fine test chart suggests that SXFM enables us to visualize the element distribution inside the pattern at a spatial resolution better than 30 run. We applied the SXFM to observe intracellular elemental distributions at a single-cell level, so that we could acquire element distribution maps with a spatial resolution of sub-100 nm and lower detection limit of 0.01 fg. - Wave-optical simulations for designing and evaluating hard x-ray reflective optics
H. Mimura, S. Matsuyama, H. Yumoto, S. Handa, A. Shibatani, K. Katagishi, Y. Sano, Y. Nishino, M. Yabashi, K. Tamasaku, T. Ishikawa, K. Yamauchi
ADVANCES IN X-RAY/EUV OPTICS, COMPONENTS, AND APPLICATIONS, 6317, SPIE-INT SOC OPTICAL ENGINEERING, 2006年, ［査読有り］
英語, 研究論文（国際会議プロシーディングス）, Focusing methods using mirror optics are intensively studied in the field of X-ray microscopy because mirror optics has useful features such as high photon efficiency and no chromatic aberrations. Employing a wave-optical method, we investigated the relationship between the nature of figure errors on the mirror surface and optics performances. We also evaluated glancing angle sensitivity to focused beam and beamwaist stuructures. Obtained results showed unprecedented degrees of surface figure accuracy such as higher than 4 nm was required to realize nearly diffraction limited nanobeam. This simulation can also give important information for align KB mirrors setup. Keyword: coherent X-ray, hard X-ray focusing, wave-optical simulation. - Application of x-ray computed tomography based on the refraction contrast to biomedicine
E. Hashimoto, A. Maksimenko, H. Sugiyama, K. Hyodo, D. Shimao, T. Yuasa, Y. Nishino, T. Ishikawa, K. Mori, Y. Arai, K. Hirano, M. Ando
Proc. SPIE, 6142, 614213, 2006年, ［査読有り］
英語, 研究論文（国際会議プロシーディングス） - Effect of distorted illumination waves on coherent diffraction microscopy
Yoshiki Kohmura, Yoshinori Nishino, Tetsuya Ishikawa, Jianwei Miao
Journal of Applied Physics, 98, 12, 123105, 123105, AIP Publishing, 2005年12月15日, ［査読有り］
英語, 研究論文（学術雑誌）, Coherent diffraction microscopy requires a well-defined illumination wave such as a plane wave on a specimen. Experimentally, a small pinhole or a focused beam is often used to reduce the illumination area but they unavoidably distort the waves. The distortion of the illumination wave causes artifacts in the phase retrieval of oversampled diffraction patterns. Using computer simulations, we searched for the conditions where strong artifacts arise by changing the Fresnel number, pinhole size, alignment error and photon statistics. The experimental setup with Fresnel number of around 1 and smaller than 1 realized a small reconstruction error when the pinhole radius is larger than a few times the specimen size. These conditions are suitable for the rotation of specimens for the three-dimensional (3D) observations. Such investigation will have an impact in the design of coherent diffraction microscopes for the 3D characterization of nanoscale materials and biological systems using the third generation synchrotron radiation and future x-ray free-electron lasers. (c) 2005 American Institute of Physics. - Evidence for suppressed screening on the surface of high temperature La2-xSrxCuO4 and Nd2-xCexCuO4 superconductors
M Taguchi, A Chainani, K Horiba, Y Takata, M Yabashi, K Tamasaku, Y Nishino, D Miwa, T Ishikawa, T Takeuchi, K Yamamoto, M Matsunami, S Shin, T Yokoya, E Ikenaga, K Kobayashi, T Mochiku, K Hirata, J Hori, K Ishii, F Nakamura, T Suzuki
PHYSICAL REVIEW LETTERS, 95, 17, 177002, AMER PHYSICAL SOC, 2005年10月, ［査読有り］
英語, 研究論文（学術雑誌）, Hard x-ray photoemission spectroscopy (PES) of Cu core electronic states, with a probing depth of similar to 60 angstrom, is used to show that the Zhang-Rice singlet feature is present in La2CuO4 but is absent in Nd2CuO4. Hole and electron doping in La2-xSrxCuO4 (LSCO) and Nd2-xCexCuO4 (NCCO) result in new well-screened features which are missing in soft x-ray PES. Impurity Anderson model calculations establish screening from doped states as its origin, which is strongly suppressed within 15 angstrom of the surface. Complemented with x-ray absorption spectroscopy, the small chemical-potential shift in core levels (similar to 0.2 eV) are shown to be consistent with modifications of valence and conduction band states spanning the band gap (similar to 1 eV) upon hole and electron doping in LSCO and NCCO. - Quantitative Image Reconstruction of GaN Quantum Dots from Oversampled Diffraction Intensities Alone
Jianwei Miao, Yoshinori Nishino, Yoshiki Kohmura, Bart Johnson, Changyong Song, Subhash H. Risbud, Tetsuya Ishikawa
Physical Review Letters, 95, 8, 85503, American Physical Society (APS), 2005年08月17日, ［査読有り］
英語, 研究論文（学術雑誌）, The missing data problem, i.e., the intensities at the center of diffraction patterns cannot be experimentally measured, is currently a major limitation for wider applications of coherent diffraction microscopy. We report here that, when the missing data are confined within the centrospeckle, the missing data problem can be reliably solved. With an improved instrument, we recorded 27 oversampled diffraction patterns at various orientations from a GaN quantum dot nanoparticle and performed quantitative image reconstruction from the diffraction intensities alone. This work in principle clears the way for single-shot imaging experiments using x-ray free electron lasers. - Diffraction-limited two-dimensional hard-x-ray focusing at the 100 nm level using a Kirkpatrick-Baez mirror arrangement
S Matsuyama, H Mimura, H Yumoto, K Yamamura, Y Sano, K Endo, Y Mori, Y Nishino, K Tamasaku, T Ishikawa, M Yabashi, K Yamauchi
REVIEW OF SCIENTIFIC INSTRUMENTS, 76, 8, 83114, AMER INST PHYSICS, 2005年08月, ［査読有り］
英語, 研究論文（学術雑誌）, The spatial resolution of scanning x-ray microscopy depends on the beam size of focused x rays. Recently, nearly diffraction-limited line focusing has been achieved using elliptical mirror optics at the 100 nm level. To realize such focusing two-dimensionally in a Kirkpatrick-Baez system, the required accuracies of the mirror aligners in this system were estimated using optical simulators based on geometrical or wave-optical theories. A focusing unit fulfilling the required adjustment accuracies was constructed. The relationships between alignment errors and focused beam profiles were quantitatively examined at the 1 km long beamline (BL29XUL) of SPring-8 to be in good agreement with the simulation results. (c) 2005 American Institute of Physics. - Application of quantitative X-ray phase retrieval from Fraunhofer diffraction data to nano-resolution profiling of materials
AV Darahanau, AY Nikulin, A Souvorov, Y Nishino, BC Muddle, T Ishikawa
OPTICS COMMUNICATIONS, 251, 1-3, 100, 108, ELSEVIER SCIENCE BV, 2005年07月, ［査読有り］
英語, 研究論文（学術雑誌）, X-ray Fraunhofer diffraction data have been collected from a series of weakly thickness-modulated samples using a synchrotron source. Three different areas of a linear Fresnel zone structure etched in a silicon wafer each 10 mu m wide were studied. Each area studied included different numbers of zones, ranging from 6 to 20. An X-ray phase retrieval technique was used to profile the complex refractive index within the areas examined. The zone structure thickness profiles were mapped with a spatial resolution of 100 nm. (c) 2005 Elsevier B.V. All rights reserved. - Hard-X-ray photoelectron spectroscopy of NaxCoO2 center dot yH(2)O
A Chainani, T Yokoya, Y Takata, K Tamasaku, M Taguchi, T Shimojima, N Kamakura, K Horiba, S Tsuda, S Shin, D Miwa, Y Nishino, T Ishikawa, M Yabashi, K Kobayashi, H Namatame, M Taniguchi, K Takada, T Sasaki, H Sakurai, E Takayama-Muromachi
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 547, 1, 163, 168, ELSEVIER SCIENCE BV, 2005年07月, ［査読有り］
英語, 研究論文（学術雑誌）, We study the bulk electronic structure of Na(x)CoO(2 center dot)yH(2)O using Hard X-ray (HX, hv = 5.95KeV) synchrotron photoelectron spectroscopy (PES). The Co 2p core level spectra show well-separated Co3+ and Co4+ ions. Cluster calculations suggest low spin Co3+ and Co4+ character, and a moderate on-site Coulomb correlation energy U-dd similar to 3-5.5 eV. Photon-dependent valence band PES identifies Co 3d and 0 2p derived states, in near agreement with band structure calculations. We discuss the importance of HX-PES for studying correlated transition metal oxides. (c) 2005 Elsevier B.V. All rights reserved. - Development of hard X-ray photoelectron spectroscopy at BL29XU in SPring-8
Y Takata, M Yabashi, K Tamasaku, Y Nishino, D Miwa, T Ishikawa, E Ikenaga, K Horiba, S Shin, M Arita, K Shimada, H Namatame, M Taniguchi, H Nohira, T Hattori, S Sodergren, B Wannberg, K Kobayashi
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 547, 1, 50, 55, ELSEVIER SCIENCE BV, 2005年07月, ［査読有り］
英語, 研究論文（学術雑誌）, We have realized hard X-ray (HX) photoelectron spectroscopy (PES) with high-throughput and high-energy-resolution for core level and valence band studies using high-energy and high-brilliance synchrotron radiation at BL29XU in SPring-8. Large escape depth of high-energy photoelectrons enables us to probe intrinsic bulk states almost free from surface condition. By use of a newly developed electron energy analyzer and well-focused X-rays, high-energy resolution of 75 meV (E/Delta E = 79, 000) was realized for 5.95 keV photoelectrons. (c) 2005 Elsevier B.V. All rights reserved. - Fabrication of elliptically figured mirror for focusing hard x rays to size less than 50 nm
H Yumoto, H Mimura, S Matsuyama, H Hara, K Yamamura, Y Sano, K Ueno, K Endo, Y Mori, M Yabashi, Y Nishino, K Tamasaku, T Ishikawa, K Yamauchi
REVIEW OF SCIENTIFIC INSTRUMENTS, 76, 6, 63708, AMER INST PHYSICS, 2005年06月, ［査読有り］
英語, 研究論文（学術雑誌）, In this study, we designed, fabricated, and evaluated a hard x-ray focusing mirror having an ideally focused beam with a full width at half maximum in the intensity profile of 36 nm at an x-ray energy of 15 keV. The designed elliptically curved shape was fabricated by a computer-controlled fabrication system using plasma chemical vaporization machining and elastic emission machining, on the basis of surface profiles accurately measured by combining microstitching interferometry with relative angle determinable stitching interferometry. A platinum-coated surface was employed for hard x-ray focusing with a large numerical aperture. Line-focusing tests on the fabricated elliptical mirror are carried out at the 1-km-long beamline of SPring-8. A full width at half maximum of 40 nm was achieved in the focused beam intensity profile under the best focus conditions. (c) 2005 American Institute of Physics. - A novel probe of intrinsic electronic structure: hard X-ray photoemission spectroscopy
Y Takata, K Tamasaku, Y Nishino, D Miwa, M Yabashi, E Ikenaga, K Horiba, M Arita, K Shimada, H Namatame, H Nohira, T Hattori, S Sodergren, B Wannberg, M Taniguchi, S Shin, T Ishikawa, K Kobayashi
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 144, 1063, 1065, ELSEVIER SCIENCE BV, 2005年06月, ［査読有り］
英語, 研究論文（学術雑誌）, We have realized hard X-ray (HX) photoemission spectroscopy (PES) with high throughput and high-energy resolution for core level and valence band studies using high-energy and high-brilliance synchrotron radiation at SPring-8. This is a brand new method because large escape depth of high-energy photoelectrons enables us to probe intrinsic bulk states free from surface condition. By use of a newly developed electron energy analyzer and well-focused X-rays, high-energy resolution of 75 meV (E/Delta E = 79,000) was realized for 5.95 keV photoelectrons. (c) 2005 Elsevier B.V. All rights reserved. - Hard X-ray core level photoemission of vanadium oxides
N Kamakura, M Taguchi, K Yamamoto, K Horiba, A Chainani, Y Takata, E Ikenaga, H Namatame, M Taniguchi, M Awaji, A Takeuchi, K Tamasaku, Y Nishino, D Miwa, T Ishikawa, Y Ueda, K Kobayashi, S Shin
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 144, 841, 843, ELSEVIER SCIENCE BV, 2005年06月, ［査読有り］
英語, 研究論文（学術雑誌）, We have studied vanadium oxides corresponding to formally 3d(0) (V2O5), 3d(1) (VO2), and 3d(2) (V2O3) configurations and compare them with mixed valent Na0.33V2O5, using hard X-ray core level photoemission spectroscopy (PES), which enables to probe bulk electronic states due to large escape depth of high kinetic energy photoelectrons. The quasi-one-dimensional mixed-valence compound Na0.33V2O5 and three-dimensional V2O3 undergo metal-insulator (MI) transition at T-MI = 135 and 160 K, respectively. The observed V 2p core level spectra of V2O5 and VO2 show a single peak with chemical shifts corresponding to the V5+ and V4+ while two components (V5+ and V4+) are observed in Na0.33V2O5. Metallic V2O3 shows a bulk character additional peak at low binding energy in the V 2p core levels. We also study the V 1s core level spectra of these compounds, which are possible only using hard X-rays and confirm the systematics in valence states of vanadium oxides. The temperature dependence of the low binding energy peak in V 1s spectra across the MI transition in V2O3 suggests an additional screening channel available in the Mott-Hubbard correlated metal phase. (c) 2005 Elsevier B.V. All rights reserved. - Electronic structure of the Ga1-xCrxN studied by high-energy photoemission spectroscopy
JJ Kim, H Makino, T Yao, Y Takata, K Kobayashi, T Yamamoto, T Hanada, MW Cho, E Ikenaga, A Yabashi, D Miwa, Y Nishino, K Tamasaku, T Ishikawa, S Shin
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 144, 561, 564, ELSEVIER SCIENCE BV, 2005年06月, ［査読有り］
英語, 研究論文（学術雑誌）, Valence band spectra of Ga1-xCrxN have been investigated by high-energy photoemission spectroscopy at the photon energy of 5.95 keV Cr doping does introduce a novel electronic structure in the bandgap and causes some change in valence band structure. Based on the first-principle calculation, Cr-associated electronic levels in the bandgap, are assigned to nonbonding and antibonding d states while the change of the valence band suggests that the Ga 4s originated states are significantly modified through hybridization with the Cr 3d orbital. The present result evidences that the Ga valence electrons are considerably modified through the interaction with the second nearest-neighbour Cr atoms. (c) 2005 Elsevier B.V. All rights reserved. - Hard X-ray photoemission study of Mn 2p core-levels of La1-xSrxMnO3 thin films
K Horiba, M Taguchi, N Kamakura, K Yamamoto, A Chainani, Y Takata, E Ikenaga, H Namatame, A Taniguchi, A Awaji, A Takeuchi, D Miwa, Y Nishino, K Tamasaku, T Ishikawa, H Kumigashira, M Oshima, M Lippmaa, M Kawasaki, H Koinuma, K Kobayashi, S Shin
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 144, 557, 559, ELSEVIER SCIENCE BV, 2005年06月, ［査読有り］
英語, 研究論文（学術雑誌）, In order to clarify the intrinsic bulk electronic structure of La1-xSrxMnO3 (LSMO) thin films, we have performed high-energy (hv = 5.95 keV) synchrotron photoemission spectroscopy (PES) of Mn 2p core-levels. In sharp contrast with the previous soft X-ray PES (h v = 800-1486.6 eV), the high-energy PES spectra exhibit a clear additional peak at the low binding-energy side of the Mn 2p(3/2) peak. To check for surface sensitivity, we measured take-off-angle dependence of Mn 2p core-levels. The results indicate that this additional peak originates from the bulk electronic structure. The peak shows a noticeable increase in the metallic phase of LSMO for x = 0.2 and 0.4, indicating that the origin of this peak is strongly related to the metallic physical properties of LSMO thin films. A single ion (MO6) cluster calculation including charge transfer from doping-induced states reproduces the new bulk-derived feature observed in Mn 2p core-levels. (c) 2005 Elsevier B.V. All rights reserved. - Temperature-induced valence transition in EuNi2(Si0.20Ge0.80)(2) studied by hard X-ray photoemission spectroscopy
K Yamamoto, N Kamakura, M Taguchi, A Chainani, Y Takata, K Horiba, S Shin, E Ikenaga, K Mimura, M Shiga, H Wada, H Namatame, M Taniguchi, M Awaji, A Takeuchi, Y Nishino, D Miwa, K Tamasaku, T Ishikawa, K Kobayashi
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 144, 553, 555, ELSEVIER SCIENCE BV, 2005年06月, ［査読有り］
英語, 研究論文（学術雑誌）, The temperature-induced mixed valence transition in EuNi2(Si0.20Ge0.8)(2) has been investigated by hard X-ray (5940 eV) photoemission spectroscopy (HX-PES) for fractured surfaces, with a probing depth larger than 5 nm. The Eu 3d core-level states are studied below and above the critical valence transition temperature, T-v = 80 K. The FIX-PES spectra at 40 and 120 K show the mixed valence transition, with clear changes in the divalent and trivalent Eu 3d chemically shifted features. The Eu 3d HX-PES spectra indicate a mean valence of 2.70 +/- 0.03 at 40 K which changes to 2.40 +/- 0.03 at 120 K, in good accordance with the results of bulk Eu-III-edge X-ray absorption spectroscopy measurements. (c) 2005 Elsevier B.V. All rights reserved. - Element array by scanning X-ray fluorescence microscopy after Cis-diamminedichloro-platinum(II) treatment
M Shimura, A Saito, S Matsuyama, T Sakuma, Y Terui, K Ueno, H Yumoto, K Yamauchi, K Yamamura, H Mimura, Y Sano, M Yabashi, K Tamasaku, K Nishio, Y Nishino, K Endo, K Hatake, Y Mori, Y Ishizaka, T Ishikawa
CANCER RESEARCH, 65, 12, 4998, 5002, AMER ASSOC CANCER RESEARCH, 2005年06月, ［査読有り］
英語, 研究論文（学術雑誌）, Minerals are important for cellular functions, such as transcription and enzyme activity, and are also involved in the metabolism of anticancer chemotherapeutic compounds. Profiling of intracellular elements in individual cells could help in understanding the mechanism of drug resistance in tumors and possibly provide a new strategy of anticancer chemotherapy. Using a recently developed technique of scanning X-ray fluorescence microscopy (SXFM), we analyzed intracellular elements after treatment with cis-diamminedichloro-platinum(II) (CDDP), a platinum-based anticancer agent. The images obtained by SXFM (element array) revealed that the average Pt content of CDDP-resistant cells was 2.6 times less than that of sensitive cells, and the zinc content was inversely correlated with the intracellular Pt content. Data suggested that Zn-related detoxification is responsible for resistance to CDDP. Of Zn-related excretion factors, glutathione was highly correlated with the amount of Zn. The combined treatment of CDDP and a Zn(II) chelator resulted in the incorporation of thrice more Pt with the concomitant down-regulation of glutathione. We propose that the generation of an element array by SXFM opens up new avenues in cancer biology and treatment. - Element array by scanning X-ray fluorescence microscopy after Cis-diamminedichloro-platinum(II) treatment
M Shimura, A Saito, S Matsuyama, T Sakuma, Y Terui, K Ueno, H Yumoto, K Yamauchi, K Yamamura, H Mimura, Y Sano, M Yabashi, K Tamasaku, K Nishio, Y Nishino, K Endo, K Hatake, Y Mori, Y Ishizaka, T Ishikawa
CANCER RESEARCH, 65, 12, 4998, 5002, AMER ASSOC CANCER RESEARCH, 2005年06月, ［査読有り］
英語, 研究論文（学術雑誌）, Minerals are important for cellular functions, such as transcription and enzyme activity, and are also involved in the metabolism of anticancer chemotherapeutic compounds. Profiling of intracellular elements in individual cells could help in understanding the mechanism of drug resistance in tumors and possibly provide a new strategy of anticancer chemotherapy. Using a recently developed technique of scanning X-ray fluorescence microscopy (SXFM), we analyzed intracellular elements after treatment with cis-diamminedichloro-platinum(II) (CDDP), a platinum-based anticancer agent. The images obtained by SXFM (element array) revealed that the average Pt content of CDDP-resistant cells was 2.6 times less than that of sensitive cells, and the zinc content was inversely correlated with the intracellular Pt content. Data suggested that Zn-related detoxification is responsible for resistance to CDDP. Of Zn-related excretion factors, glutathione was highly correlated with the amount of Zn. The combined treatment of CDDP and a Zn(II) chelator resulted in the incorporation of thrice more Pt with the concomitant down-regulation of glutathione. We propose that the generation of an element array by SXFM opens up new avenues in cancer biology and treatment. - Relative angle determinable stitching interferometry for hard x-ray reflective optics
Hidekazu Mimura, Hirokatsu Yumoto, Satoshi Matsuyama, Kazuya Yamamura, Yasuhisa Sano, Kazumasa Ueno, Katsuyoshi Endo, Yuzo Mori, Makina Yabashi, Kenji Tamasaku, Yoshinori Nishino, Tetsuya Ishikawa, Kazuto Yamauchi
Review of Scientific Instruments, 76, 4, 045102, 045102, AIP Publishing, 2005年04月, ［査読有り］
英語, 研究論文（学術雑誌）, Metrology plays an important role in surface figuring with subnanometer accuracy. We have developed relative angle determinable stitching interferometry for the surface figuring of elliptical mirrors, in order to realize hard x-ray nanofocusing. In a stitching system, stitching angles are determined not by the general method using a common area between neighboring shots, but by the new method using the mirror's tilt angles measured at times when profile data are acquired. The high measurement accuracy of approximately 4 nm (peak-to-valley) was achieved in the measurement of a cylindrical surface having the same curvature as the elliptically designed shape to enable hard x-ray nanofocusing. (C) American Institute of Physics. - Bulk screening in core-level photoemission from Mott-Hubbard and charge-transfer systems
M Taguchi, A Chainani, N Kamakura, K Horiba, Y Takata, M Yabashi, K Tamasaku, Y Nishino, D Miwa, T Ishikawa, S Shin, E Ikenaga, T Yokoya, K Kobayashi, T Mochiku, K Hirata, K Motoya
PHYSICAL REVIEW B, 71, 15, 155102, AMERICAN PHYSICAL SOC, 2005年04月, ［査読有り］
英語, 研究論文（学術雑誌）, We report bulk-sensitive hard x-ray (h nu=5.95 keV) core-level photoemission spectroscopy (PES) of single crystal V1.98Cr0.02O3 and the high-T-c cuprate Bi2Sr2CaCu2O8+delta (Bi2212). V1.98Cr0.02O3 exhibits low binding energy "satellites" to the V 2p "main lines" in the metallic phase, which are suppressed in the antiferromagnetic insulator phase. In contrast, the Cu 2p spectra of Bi2212 do not show temperature-dependent features, but a comparison with soft x-ray PES indicates a large increase in the 2p(5)3d(9) satellites or 3d(9) weight in the bulk. Cluster model calculations, including a full multiplet structure and a screening channel derived from the coherent band at the Fermi energy, give very satisfactory agreement with the experiments. - Nano-resolution profiling of micro-structures using quantitative X-ray phase retrieval from Fraunhofer diffraction data
AV Darahanau, AY Nikulin, A Souvorov, Y Nishino, BC Muddle, T Ishikawa
PHYSICS LETTERS A, 335, 5-6, 494, 498, ELSEVIER SCIENCE BV, 2005年02月, ［査読有り］
英語, 研究論文（学術雑誌）, X-ray Fraunhofer diffraction data have been collected from a series of weakly thickness-modulated samples using a synchrotron source. Three different 10 mum wide areas of a linear Fresnel zone structure etched in a silicon wafer were studied. Each studied area included different number of zones, ranging from 6 to 20. Phase retrieval X-ray diffractometry technique was used for the experimental data analysis. The zone structure thickness profiles were mapped with a spatial resolution of 100 nm. (C) 2005 Elsevier B.V. All rights reserved. - Hard X-ray diffraction-limited nanofocusing with Kirkpatrick-Baez mirrors
H Mimura, S Matsuyama, H Yumoto, H Hara, K Yamamura, Y Sano, M Shibahara, K End, Y Mori, Y Nishino, K Tamasaku, M Yabashi, T Ishikawa, K Yamauchi
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 44, 16-19, L539, L542, INST PURE APPLIED PHYSICS, 2005年, ［査読有り］
英語, 研究論文（学術雑誌）, Nanofocused X-ray beams are necessary for nanometer-scale spatial microscopy analysis. X-ray focusing using a Kirkpatrick-Baez setup with two total reflection mirrors is a promising method, allowing highly efficient and energy-tuneable focusing. In this paper, we report the development of ultraprecise mirror optics and the realization of a nanofocused hard-X-ray beam. Fabricated mirrors having a figure accuracy of 2 nm peak to valley height give ideal diffraction-limited focusing at the hard X-ray region. The focal size, defined as the full width at half maximum in the intensity profile, was 36 nm x 48 nm at an X-ray energy of 15 keV. - Surface figuring and measurement methods with spatial resolution close to 0.1mm for X-ray mirror fabrication
H. Mimura, H. Yumoto, S. Matsuyama, K. Yamamura, Y. Sano, K. Endo, Y. Mori, Y. Nishino, M. Yabashi, K. Tamasaku, T. Ishikawa, K. Yamauchi
Proceedings of SPIE - The International Society for Optical Engineering, 5921, 1, 8, 2005年, ［査読有り］
英語, 研究論文（国際会議プロシーディングス）, We developed the computer-controlled figuring system having controllability of removal depths with nanometer accuracy and spatial resolutions close to 0.1mm. In this system, Elastic Emission Machining (EEM) using nozzle-type EEM head and Microstitching Interferometry (MSI) are employed as a machining method and a figure measurement method. In EEM, very small stationary spot profiles ware obtained, selecting small circle nozzle aperture of a 0.15 mm diameter. Surface figuring is performed with controlling scanning speeds of sample stages, so that a measured profile turned into designed one. MSI, which was developed on the basis of interferometric stitching technologies, has reproducibility at subnanometer level and with spatial resolution of 0.03 mm. In this study, we demonstrated computer controlled figuring, focusing on removal of high frequency figurer errors. Figure accuracy of 0.2 nm (RMS) was achieved in a cross-section profile with a length of 90mm. - Hard X-ray nano-focusing at 40nm level using K-B mirror optics for nanoscopy/spectroscopy
Satoshi Matsuyama, Hidekazu Mimura, Hirokatsu Yumoto, Hideyuki Hara, Kazuya Yamamura, Yasuhisa Sano, Katsuyoshi Endo, Yuzo Mori, Yoshinori Nishino, Kenji Tamasaku, Makina Yabashi, Tetsuya Ishikawa, Kazuto Yamauchia
Proceedings of SPIE - The International Society for Optical Engineering, 5918, 1, 8, 2005年, ［査読有り］
英語, 研究論文（国際会議プロシーディングス）, X-ray focusing techniques using Kirkpatrick and Baez mirrors are promising due to their capability of highly efficient and energy-tunable focusing. We have been developing a hard-X-ray focusing system using K-B mirrors for an X-ray microscope. Here, we report the development of a mirror manipulator and focusing tests using the manipulator. Mirror alignment tolerances were estimated using two types of simulators: a ray-trace simulator and a wave-optical simulator. On the basis of the simulation results, the mirror manipulator was developed achieving optimum K-B mirrors setup. The focal size was achieved to be 48 x 36nm2 (V x H) in FWHM at 1km long beamline of SPring-8. The obtained spatial resolution test results indicate that a scanning microscope with the focused beam can resolve the line-and-space patterns of 80nm line width in a high visibility of 60%. - 3D microscopy provides the first deep view
JW Miao, CY Song, Y Nishino, Y Kohmura, B Johnson, T Ishikawa
Transducers '05, Digest of Technical Papers, Vols 1 and 2, 1304, 1305, IEEE, 2005年, ［査読有り］
英語, 研究論文（国際会議プロシーディングス）, Coherent X-ray diffraction microscopy has recently been developed to image nanostructures and biological systems in two and three dimensions. A highest resolution of 7 rim has been achieved. We anticipate this 3D imaging technique will find broad applications in the burgeoning field of nanoscience and technology. - Nature of the well screened state in hard X-ray Mn 2p core-level photoemission measurements of La1-xSrxMnO3 films
K Horiba, M Taguchi, A Chainani, Y Takata, E Ikenaga, D Miwa, Y Nishino, K Tamasaku, M Awaji, A Takeuchi, M Yabashi, H Namatame, M Taniguchi, H Kumigashira, M Oshima, M Lippmaa, M Kawasaki, H Koinuma, K Kobayashi, T Ishikawa, S Shin
PHYSICAL REVIEW LETTERS, 93, 23, 236401, AMERICAN PHYSICAL SOC, 2004年12月, ［査読有り］
英語, 研究論文（学術雑誌）, Using hard x-ray (HX; hnu=5.95 keV) synchrotron photoemission spectroscopy (PES), we study the intrinsic electronic structure of La1-xSrxMnO3 (LSMO) thin films. Comparison of Mn 2p core-levels with soft x-ray (SX; hnusimilar to1000 eV) PES shows a clear additional well-screened feature only in HX PES. Takeoff-angle dependent data indicate its bulk (greater than or equal to20 Angstrom) character. The doping and temperature dependence track the ferromagnetism and metallicity of the LSMO series. Cluster model calculations including charge transfer from doping-induced states show good agreement, confirming this picture of bulk properties reflected in Mn 2p core-levels using HX PES. - Valence transition of YbInCu4 observed in hard x-ray photoemission spectra
H Sato, K Shimada, M Arita, K Hiraoka, K Kojima, Y Takeda, K Yoshikawa, M Sawada, M Nakatake, H Namatame, M Taniguchi, Y Takata, E Ikenaga, S Shin, K Kobayashi, K Tamasaku, Y Nishino, D Miwa, M Yabashi, T Ishikawa
PHYSICAL REVIEW LETTERS, 93, 24, 246404, AMERICAN PHYSICAL SOC, 2004年12月, ［査読有り］
英語, 研究論文（学術雑誌）, Yb 3d and valence-band photoemission spectra of the first-order valence-transition compound YbInCu4 have been measured with hard x ray at an excitation energy of 5.95 keV. Abrupt changes are clearly observed in both spectra around the transition temperature T-V=42 K, in comparison with ultraviolet and soft x-ray photoemission (VUV-PES and SX-PES) spectra. From the Yb 3d spectra, the Yb valence has been estimated to be similar to2.90 from 220 down to 50 K and similar to2.74 at 30-10 K. We propose that Yb 3d hard x-ray photoemission spectroscopy is a very powerful method to estimate the valence of Yb with high accuracy. On the other hand, the Yb2+ 4f-derived peaks in the valence-band spectra exhibit a remarkable enhancement below T-V. The shape of the valence-band spectra is different from those of the VUV-PES and SX-PES spectra above T-V, reflecting the In 5s and 5p contributions. - Hard X-ray core-level photoemission of V2O3
N Kamakura, M Taguchi, A Chainani, Y Takata, K Horiba, K Yamamoto, K Tamasaku, Y Nishino, D Miwa, E Ikenaga, M Awaji, A Takeuchi, H Ohashi, Y Senba, H Namatame, M Taniguchi, T Ishikawa, K Kobayashi, S Shin
EUROPHYSICS LETTERS, 68, 4, 557, 563, E D P SCIENCES, 2004年11月, ［査読有り］
英語, 研究論文（学術雑誌）, We study the Mott-Hubbard metal-insulator transition in single-crystal V2O3 usinghard X-ray (HX : hv = 5940 eV) core-level photoemission spectroscopy ( PES). HX-PES enables a bulk probe of the electronic structure in the paramagnetic metallic and antiferromagnetic insulating phases. Metallic V2O3 shows additional features at low binding energy to the main peak of V 1s, 2p, and 3s core levels, which vanish in the insulating phase. The low-binding-energy features in the metallic phase are also observed using soft X-rays (SX : hv = 1450 eV), but with a reduced relative intensity compared to the HX-PES spectrum. A model cluster calculation including core hole screening by coherent states at the Fermi level, reproduces the low-binding-energy features in the metallic phase. The O 1s core level also shows spectral changes: the asymmetric line shape in the metallic phase transforms to a symmetric line shape in the insulating phase, consistent with the metal-insulator transition. The results indicate screening by coherent states is more effective in the bulk compared to the surface. HX-PES is, thus, a reliable probe of the electronic-structure changes across the metal-insulator transition in strongly correlated electron systems. - Hybridization of Cr 3d-N 2p-Ga 4s in the wide band-gap diluted magnetic semiconductor Ga1-xCrxN
JJ Kim, H Makino, K Kobayashi, Y Takata, T Yamamoto, T Hanada, MW Cho, E Ikenaga, M Yabashi, D Miwa, Y Nishino, K Tamasaku, T Ishikawa, S Shin, T Yao
PHYSICAL REVIEW B, 70, 16, 161315, AMER PHYSICAL SOC, 2004年10月, ［査読有り］
英語, 研究論文（学術雑誌）, We observed that Cr doping introduces an electronic state in the band gap in Ga1-xCrxN by using hard x-ray photoemission spectroscopy. Based on first-principles calculations, the electronic state is interpreted to be dominantly Ga 4s originated states. The chemical effect of Cr up to the second-nearest-neighbor Ga atoms has also been observed in the core-level spectra of Ga 2p(3/2). The present results evidence that the Ga valence electrons are strongly affected by the second-nearest-neighbor Cr atoms through Cr 3d-Ga 4s hybridization. - Hard X-ray photoemission spectroscopy of temperature-induced valence transition in EuNi2(Si0.2Ge0.80)(2)
K Yamamoto, M Taguchi, N Kamakura, K Horiba, Y Takata, A Chainani, S Shin, E Ikenaga, K Mimura, M Shiga, H Wada, H Namatame, M Taniguchi, M Awaji, A Takeuchi, Y Nishino, D Miwa, T Ishikawa, K Kobayashi
JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 73, 10, 2616, 2619, PHYSICAL SOC JAPAN, 2004年10月, ［査読有り］
英語, 研究論文（学術雑誌）, We investigate the temperature-induced mixed valence transition in EuNi2(Si0.20Ge0.80)(2) using Hard X-ray (5940 eV) photoemission spectroscopy (HX-PES), with a probing depth larger than 5 nm. The Eu 3d, Ni 2p and Ge 2p core-level states are studied below and above the critical valence transition temperature, T-v = 80 K. HX-PES spectra at 40 K and 120 K show the mixed valence transition, with clear changes in the divalent and trivalent Eu 3d chemically shifted features, and negligible changes in the Ni 2p and Ge 2p states. The Eu 3d spectral shapes match very well with the results of the atomic calculations of the Eu2+ and Eu3+ configurations, confirming intra-atomic multiplet features. The Eu 3d HX-PES spectra indicate a mean valence of 2.70 +/- 0.03 at 40 K which changes to 2.40 +/- 0.03 at 120 K, in good accord with the results of bulk Eu L-edge X-ray absorption spectroscopy measurements. - Hybridization of Cr 3d-N 2p-Ga 4s in the wide band-gap diluted magnetic semiconductor Ga1-xCrxN [20]
J. J. Kim, H. Makino, K. Kobayashi, Y. Takata, T. Yamamoto, T. Hanada, M. W. Cho, E. Ikenaga, M. Yabashi, D. Miwa, Y. Nishino, K. Tamasaku, T. Ishikawa, S. Shin, T. Yao
Physical Review B - Condensed Matter and Materials Physics, 70, 16, 1, 4, 2004年10月, ［査読有り］
英語, 研究論文（学術雑誌）, We observed that Cr doping introduces an electronic state in the band gap in Ga1-xCrxN by using hard x-ray photoemission spectroscopy. Based on first-principles calculations, the electronic state is interpreted to be dominantly Ga 4s originated states. The chemical effect of Cr up to the second-nearest-neighbor Ga atoms has also been observed in the core-level spectra of Ga 2p3/2. The present results evidence that the Ga valence electrons are strongly affected by the second-nearest-neighbor Cr atoms through Cr 3d-Ga 4s hybridization. - An X-ray BBB Michelson interferometer
JP Sutter, T Ishikawa, U Kuetgens, G Materlik, Y Nishino, A Rostomyan, K Tamasaku, M Yabashi
JOURNAL OF SYNCHROTRON RADIATION, 11, 5, 378, 385, BLACKWELL MUNKSGAARD, 2004年09月, ［査読有り］
英語, 研究論文（学術雑誌）, A new X-ray Michelson interferometer based on the BBB interferometer of Bonse and Hart and designed for X-rays of wavelength similar to1 Angstrom was described in a previous paper. Here, a further test carried out at the SPring-8 1 km beamline BL29XUL is reported. One of the BBB's mirrors was displaced by a piezo to introduce the required path-length difference. The resulting variation of intensity with piezo voltage as measured by an avalanche photodiode could be ascribed to the phase variation resulting from the path-length change, with a small additional contribution from the change of the position of the lattice planes of the front mirror relative to the rest of the crystal. This 'Michelson fringe' interpretation is supported by the observed steady movement across the output beam of the interference fringes produced by a refractive wedge when the piezo voltage was ramped. The front-mirror displacement required for one complete fringe at the given wavelength is only 0.675 Angstrom; therefore, a quiet environment is vital for operating this device, as previous experiments have shown. - Hard X-ray photoemission spectroscopy of YbInCu4
H Sato, K Shimada, M Arita, Y Takeda, M Sawada, M Nakatake, K Yoshikawa, H Namatame, Y Takata, K Kobayashi, E Ikenega, S Shin, M Yabashi, D Miwa, Y Nishino, K Tamasaku, T Ishikawa, K Hiraoka, K Kojima, M Taniguchi
PHYSICA B-CONDENSED MATTER, 351, 3-4, 298, 300, ELSEVIER SCIENCE BV, 2004年09月, ［査読有り］
英語, 研究論文（学術雑誌）, Yb 3d and valence-band photoemission spectra of YbInCu4 have been measured at hv = 5.95 keV. Abrupt changes are observed in both spectra, reflecting the valence transition at Tv = 42 K. The Yb valence estimated from the Yb 3d spectra is zsimilar to2.90 at 220-50K and sharply decreases to zsimilar to2.74 at 30-10K. (C) 2004 Elsevier B.V. All rights reserved. - Temperature dependence of the electronic states of Kondo semiconductor YbB12
Y Takeda, M Arita, M Higashiguchi, K Shimada, M Sawada, H Sato, M Nakatake, H Namatame, M Taniguchi, F Iga, T Takabatake, K Takata, E Ikenaga, M Yabashi, D Miwa, Y Nishino, K Tamasaku, T Ishikawa, S Shin, K Kobayashi
PHYSICA B-CONDENSED MATTER, 351, 3-4, 286, 288, ELSEVIER SCIENCE BV, 2004年09月, ［査読有り］
英語, 研究論文（学術雑誌）, The temperature dependences of the Yb 4f and 3d states of Kondo semiconductor YbB12 single crystal have been studied by high-resolution photoemission spectroscopy taken at hv = 100 and 5951 eV. The Yb2+ 4f(7/2) state at the Fermi level is enhanced on cooling. With improved energy resolution, we discover an additional quasi-particle peak at 15 meV that developes below 60 K. From the Yb 3d spectrum at 22 K, the Yb valence is estimated to be similar to2.88. (C) 2004 Elsevier B.V. All rights reserved. - Image quality improvement in a hard X-ray projection microscope using total reflection mirror optics
H Mimura, K Yamauchi, K Yamamura, A Kubota, S Matsuyama, Y Sano, K Ueno, K Endo, Y Nishino, K Tamasaku, M Yabashi, T Ishikawa, Y Mori
JOURNAL OF SYNCHROTRON RADIATION, 11, 4, 343, 346, BLACKWELL MUNKSGAARD, 2004年07月, ［査読有り］
英語, 研究論文（学術雑誌）, A new figure correction method has been applied in order to fabricate an elliptical mirror to realize a one-dimensionally diverging X-ray beam having high image quality. Mutual relations between figure errors and intensity uniformities of diverging X-ray beams have also been investigated using a wave-optical simulator and indicate that figure errors in relatively short spatial wavelength ranges lead to high-contrast interference fringes. By using a microstitching interferometer and elastic emission machining, figure correction of an elliptical mirror with a lateral resolution close to 0.1 mm was carried out. A one-dimensional diverging X-ray obtained using the fabricated mirror was observed at SPring-8 and evaluated to have a sufficiently flat intensity distribution. - Bulk electronic structure of Na0.35CoO2 center dot 1.3H(2)O
Chainani, A, Yokoya, T, Takata, Y, Tamasaku, K, Taguchi, M, Shimojima, T, Kamakura, N, Horiba, K, Tsuda, S, Shin, S, Miwa, D, Nishino, Y, Ishikawa, T, Yabashi, M, Kobayashi, K, Namatame, H, Taniguchi, M, Takada, K, Sasaki, T, Sakurai, H, Takayama-Muromachi, E
Physical Review B, 69, 18, 180508, 2004年05月, ［査読有り］ - Bulk electronic structure of Na0.35CoO2 center dot 1.3H(2)O
A Chainani, T Yokoya, Y Takata, K Tamasaku, M Taguchi, T Shimojima, N Kamakura, K Horiba, S Tsuda, S Shin, D Miwa, Y Nishino, T Ishikawa, M Yabashi, K Kobayashi, H Namatame, M Taniguchi, K Takada, T Sasaki, H Sakurai, E Takayama-Muromachi
PHYSICAL REVIEW B, 69, 18, AMER PHYSICAL SOC, 2004年05月, ［査読有り］
英語, 研究論文（学術雑誌）, High-energy (hnu=5.95 keV) synchrotron photoemission spectroscopy (PES) is used to study bulk electronic structure of Na0.35CoO2.1.3H(2)O, the layered superconductor. In contrast to three-dimensional doped Co oxides, Co 2p core level spectra show well-separated Co3+ and Co4+ ions. Cluster calculations suggest low-spin Co3+ and Co4+ character, and a moderate on-site Coulomb correlation energy U(dd)similar to3-5.5 eV. Photon dependent valence band PES identifies Co 3d and O 2p derived states, in near agreement with band-structure calculations. - Bulk electronic structure of Na
0.35 CoO2 ·1. 3H2 O
A. Chainani, T. Yokoya, Y. Takata, K. Tamasaku, M. Taguchi, T. Shimojima, N. Kamakura, K. Horiba, S. Tsuda, S. Shin, S. Shin, D. Miwa, Y. Nishino, T. Ishikawa, M. Yabashi, K. Kobayashi, H. Namatame, M. Taniguchi, K. Takada, K. Takada, T. Sasaki, T. Sasaki, H. Sakurai, E. Takayama-Muromachi
Physical Review B - Condensed Matter and Materials Physics, 69, 18, 1, 180508, 2004年05月, ［査読有り］
英語, 研究論文（学術雑誌）, High-energy (hv = 5.95 keV) synchrotron photoemission spectroscopy (PES) is used to study bulk electronic structure of Na0.35CoO2· 1.3H2O, the layered superconductor. In contrast to three-dimensional doped Co oxides, Co 2p core level spectra show well-separated Co3+and Co4+ions. Cluster calculations suggest low-spin Co3+and Co4+character, and a moderate on-site Coulomb correlation energy Udd∼3-5.5 eV. Photon dependent valence band PES identifies Co 3d and O 2p derived states, in near agreement with band-structure calculations. - Fabrication technology for hard X-ray reflective optics
Y. Mori, K. Yamuchi, K. Yamamura, H. Mimura, Y.Sano, S. Matsuyama, K. Endo, Y. Nishino, K. Tamasaku, M. Yabashi, T. Ishikawa
Proceedings of Second International Workshop on Metrology for X-ray Optics, 2004年03月
英語, 研究論文（その他学術会議資料等） - Wave-optical and ray-tracing analysis to establish a compact two-dimensional focusing unit using K-B mirror arrangement
S Matsuyama, H Mimura, K Yamamura, H Yumoto, Y Sano, K Endo, Y Mori, M Yabashi, K Tamasaku, Y Nishino, T Ishikawa, K Yamauchi
ADVANCES IN MIRROR TECHNOLOGY FOR X-RAY, EUV LITHOGRAPHY, LASER, AND OTHER APPLICATIONS II, 5533, 181, 191, SPIE-INT SOC OPTICAL ENGINEERING, 2004年, ［査読有り］
英語, 研究論文（国際会議プロシーディングス）, The spatial resolution of the scanning X-ray microscopy apparently depends on the beam size of the focused X-ray. Recently, highly accurate elliptical mirrors were reported to be fabricated, and nearly diffraction-limited line focusing was achieved. In this study, to realize diffraction-limited and 2-dimentional focusing with such highly accurate mirrors, accuracies to be realized in mirror alignings, for example, adjusting the glancing angle and the in-plane rotation, were estimated by employing two types of simulators. They are appropriately based on geometrical or wave-optical theories. They are alternatively employed according to the degree of accuracy required in the mirror alignment. A focusing unit with the adjusting mechanism fulfilling the required alignment accuracies was constructed, and the relationships between the alignment errors and focused beam profiles were quantitatively examined at the 1km-long beamline (BL29XUL) of SPring-8. Obtained results were in good agreement with the calculated results. Additionally, the alignment accuracy to be realized in the K-B unit equipping mirrors of larger NA (numerical aperture) was calculated to realize sufficient performances in focusing. - Fabrication technology of ultraprecise mirror optics to realize hard X-ray nanobeam
K Yamauchi, K Yamamura, H Mimura, Y Sano, S Matsuyama, H Yumoto, K Ueno, M Shibahara, K Endo, M Yabashi, K Tamasaku, Y Nishino, T Ishikawa, Y Mori
ADVANCES IN MIRROR TECHNOLOGY FOR X-RAY, EUV LITHOGRAPHY, LASER, AND OTHER APPLICATIONS II, 5533, 116, 123, SPIE-INT SOC OPTICAL ENGINEERING, 2004年, ［査読有り］
英語, 研究論文（国際会議プロシーディングス）, In our previous study, we realized a hard X-ray focused beam having a 180nmx90nm focal size using fabricated elliptical mirrors. In this study, to realize a smaller focal size, more steeply curved elliptical mirrors with platinum-coated surfaces were fabricated. We showed that aspheric quality mirrors can be manufactured with recently developed machining methods. We carried out line focusing tests on the elliptical mirror at the 1-km-long beamline of SPring-8. A full width at half maximum of 40 rim. was achieved in the focal beam profile under the best focusing conditions. Keyword: ultraprecision machining, X-ray mirror, plasma CVM (chemical vaporization machining), EEM (elastic emission machining), coherent X-ray, hard X-ray focusing, microstitching interferomatory - pi XAFS for silicon powder: Hard x-ray absorption spectroscopy for light elements
Y Nishino, T Ishikawa
SYNCHROTRON RADIATION INSTRUMENTATION, 705, 1078, 1081, AMER INST PHYSICS, 2004年, ［査読有り］
英語, 研究論文（国際会議プロシーディングス）, piXAFS (photon interference x-ray absorption fine structure) is a structure in x-ray absorption spectra due to incident photon interference. Fourier analysis of piXAFS provides radial distribution of atoms in the absorber. piXAFS extends in a wide photon energy range across absorption edges, and therefore it is possible to carry out x-ray absorption spectroscopy for light elements with hard x-rays. It is of great advantage because measurements can be performed comfortably in air. We successfully measured piXAFS for silicon powder in the hard x-ray region. - Microstitching interferometry for nano focusing mirror optics
H Mimura, H Yumoto, S Matsuyama, K Yamamura, Y Sano, K Ueno, K Endo, Y Mori, M Yabashi, K Tamasaku, Y Nishino, T Ishikawa, K Yamauchi
ADVANCES IN MIRROR TECHNOLOGY FOR X-RAY, EUV LITHOGRAPHY, LASER, AND OTHER APPLICATIONS II, 5533, 171, 180, SPIE-INT SOC OPTICAL ENGINEERING, 2004年, ［査読有り］
英語, 研究論文（国際会議プロシーディングス）, Metrology plays more important role than machining in surface figuring at sub-nanometer accuracy. The microstitching interferometry based on a microscopic interferometer having peak-to-valley (p-v) height accuracy of sub-nanometer order and lateral resolution higher than 20 gm was developed to measure surface figures of X-ray mirror optics. In addition, the relative angle determinable stitching interferometry was also developed to measure surface profiles of elliptical mirrors to realize hard X-ray nanofocusing. By combining the two interferometies, the absolute measurement accuracy of approximately 3 nm (peak-to-valley) was achieved in the measurement of a cylindrical surface having the same curvature as the elliptically designed shape to enable nanofocusing. - Image reconstruction of nanostructured nonperiodic objects only from oversampled hard x-ray diffraction intensities
Y Nishino, JW Miao, T Ishikawa
PHYSICAL REVIEW B, 68, 22, 220101, AMER PHYSICAL SOC, 2003年12月, ［査読有り］
英語, 研究論文（学術雑誌）, X-ray-diffraction microscopy images nanocrystals and nonperiodic objects by directly reconstructing from oversampled diffraction intensities. Successful image reconstruction of nonperiodic objects has so far required additional experiments to supplement the missing data in the diffraction intensities. Reconstruction only from diffraction data is desirable. We show that image reconstruction of nonperiodic objects can be done without any supplemental experiments by applying a modified hybrid input-output algorithm to experimental hard x-ray-diffraction data of a nanostructured pattern. - Direct determination of the absolute electron density of nanostructured and disordered materials at sub-10-nm resolution
J Miao, JE Amonette, Y Nishino, T Ishikawa, KO Hodgson
PHYSICAL REVIEW B, 68, 1, AMER PHYSICAL SOC, 2003年07月, ［査読有り］
英語, 研究論文（学術雑誌）, We report the development of a novel experimental approach to the direct determination of the absolute electron density of nanostructured and disordered materials. By calibrating the incident coherent x-ray flux and the diffraction pattern intensity and using the oversampling method, we have directly determined the absolute electron density of a porous silica particle at similar to9-nm resolution. This general approach can be used for the quantitative characterization of nanocrystals and noncrystalline materials at nanometer or better resolution. - Imaging whole Escherichia coli bacteria by using single-particle x-ray diffraction
JW Miao, KO Hodgson, T Ishikawa, CA Larabell, MA LeGros, Y Nishino
PROCEEDINGS OF THE NATIONAL ACADEMY OF SCIENCES OF THE UNITED STATES OF AMERICA, 100, 1, 110, 112, NATL ACAD SCIENCES, 2003年01月, ［査読有り］
英語, 研究論文（学術雑誌）, We report the first experimental recording, to our knowledge, of the diffraction pattern from intact Escherichia coli bacteria using coherent x-rays with a wavelength of 2 A. By using the oversampling phasing method, a real space image at a resolution of 30 nm was directly reconstructed from the diffraction pattern. An R factor used for characterizing the quality of the reconstruction was in the range of 5%, which demonstrated the reliability of the reconstruction process. The distribution of proteins inside the bacteria labeled with manganese oxide has been identified and this distribution confirmed by fluorescence microscopy images. Compared with lens-based microscopy, this diffraction-based imaging approach can examine thicker samples, such as whole cultured cells, in three dimensions with resolution limited only by radiation damage. Looking forward, the successful recording and reconstruction of diffraction patterns from biological samples reported here represent an important step toward the potential of imaging single biomolecules at near-atomic resolution by combining single-particle diffraction with x-ray free electron lasers. - Direct determination of the absolute electron density of nanostructured and disordered materials at sub-10-nm resolution
Jianwei Miao, Keith O. Hodgson, James E. Amonette, Yoshinori Nishino, Tetsuya Ishikawa, Keith O. Hodgson
Physical Review B - Condensed Matter and Materials Physics, 68, 1, 12201, 2003年, ［査読有り］
英語, 研究論文（学術雑誌）, We report the development of a novel experimental approach to the direct determination of the absolute electron density of nanostructured and disordered materials. By calibrating the incident coherent x-ray flux and the diffraction pattern intensity and using the oversampling method, we have directly determined the absolute electron density of a porous silica particle at ∼9-nm resolution. This general approach can be used for the quantitative characterization of nanocrystals and noncrystalline materials at nanometer or better resolution. © 2003 The American Physical Society. - Stability issues of the use of coherent x-rays
Y Nishino, T Kudo, M Suzuki, T Ishikawa
CRYSTALS, MULTILAYERS, AND OTHER SYNCHROTRON OPTICS, 5195, 94, 103, SPIE-INT SOC OPTICAL ENGINEERING, 2003年, ［査読有り］
英語, 研究論文（国際会議プロシーディングス）, The stability of synchrotron beamline optics is required in experiments using x-ray coherence. Especially the stability of a monochromator is important in considering a high heat load due to exposure to intense polychromatic x-rays. We developed MOSTAB (monochromator stabilization) modules and carried out performance tests using SPring-8 beamlines. We succeeded in the simultaneous stabilization of the monochromatic x-ray beam intensity and position with MOSTAB. An attempt was also made to stabilize the x-ray beam at the 1 km experimental station at SPring-8. - Imaging whole Escherichia coli bacteria by using single-particle x-ray diffraction
JW Miao, KO Hodgson, T Ishikawa, CA Larabell, MA LeGros, Y Nishino
PROCEEDINGS OF THE NATIONAL ACADEMY OF SCIENCES OF THE UNITED STATES OF AMERICA, 100, 1, 110, 112, NATL ACAD SCIENCES, 2003年01月, ［査読有り］
英語, 研究論文（学術雑誌）, We report the first experimental recording, to our knowledge, of the diffraction pattern from intact Escherichia coli bacteria using coherent x-rays with a wavelength of 2 A. By using the oversampling phasing method, a real space image at a resolution of 30 nm was directly reconstructed from the diffraction pattern. An R factor used for characterizing the quality of the reconstruction was in the range of 5%, which demonstrated the reliability of the reconstruction process. The distribution of proteins inside the bacteria labeled with manganese oxide has been identified and this distribution confirmed by fluorescence microscopy images. Compared with lens-based microscopy, this diffraction-based imaging approach can examine thicker samples, such as whole cultured cells, in three dimensions with resolution limited only by radiation damage. Looking forward, the successful recording and reconstruction of diffraction patterns from biological samples reported here represent an important step toward the potential of imaging single biomolecules at near-atomic resolution by combining single-particle diffraction with x-ray free electron lasers. - Photon interference effect in x-ray absorption spectra over a wide energy range
Y. Nishino, T. Ishikawa, M. Suzuki, N. Kawamura, P. Kappen, P. Korecki, N. Haack, G. Materlik
Physical Review B - Condensed Matter and Materials Physics, 66, 11, 1131031, 1131034, 2002年09月15日, ［査読有り］
英語, 研究論文（学術雑誌）, We consider fundamental structures in x-ray absorption spectra over a wide energy range. We formulate the elastic scattering in addition to the photoelectric absorption in recently reported photon interference x-ray absorption fine structure (πXAFS). The simulations show excellent agreement with experimental x-ray absorption spectra for platinum and tungsten powders far above and below the L absorption edges. πXAFS can be as big as in the order of 10% of XAFS, and cannot be easily neglected in detailed analysis of XAFS and related phenomena. - Two-energy twin image removal in atomic-resolution x-ray holography
Nishino, Y, Ishikawa, T, Hayashi, K, Takahashi, Y, Matsubara, E
Physical Review B, 66, 9, 92105, 2002年09月01日, ［査読有り］ - Photon interference effect in x-ray absorption spectra over a wide energy range
Y Nishino, T Ishikawa, M Suzuki, N Kawamura, P Kappen, P Korecki, N Haack, G Materlik
PHYSICAL REVIEW B, 66, 11, 113103, AMERICAN PHYSICAL SOC, 2002年09月, ［査読有り］
英語, 研究論文（学術雑誌）, We consider fundamental structures in x-ray absorption spectra over a wide energy range. We formulate the elastic scattering in addition to the photoelectric absorption in recently reported photon interference x-ray absorption fine structure (piXAFS). The simulations show excellent agreement with experimental x-ray absorption spectra for platinum and tungsten powders far above and below the L absorption edges. piXAFS can be as big as in the order of 10% of XAFS, and cannot be easily neglected in detailed analysis of XAFS and related phenomena. - Two-energy twin image removal in atomic-resolution x-ray holography
Y Nishino, T Ishikawa, K Hayashi, Y Takahashi, E Matsubara
PHYSICAL REVIEW B, 66, 9, AMER PHYSICAL SOC, 2002年09月, ［査読有り］
英語, 研究論文（学術雑誌）, We propose a two-energy twin image removal algorithm for atomic-resolution x-ray holography. The validity of the algorithm is shown in a theoretical simulation and in an experiment of internal detector x-ray holography using a ZnSe single crystal. The algorithm, compared to the widely used multiple-energy algorithm, allows efficient measurement of holograms, and is especially important when the available x-ray energies are fixed. It enables twin image free holography using characteristic x rays from laboratory generators and x-ray pulses of free-electron lasers. - Photon interference x-ray absorption fine structure
Nishino, Y, Troger, L, Korecki, R, Materlik, G
Physical Review B, 64, 20, 201101, 2001年11月15日, ［査読有り］ - Photon interference x-ray absorption fine structure
Y Nishino, L Troger, P Korecki, G Materlik
PHYSICAL REVIEW B, 64, 20, AMER PHYSICAL SOC, 2001年11月, ［査読有り］
英語, 研究論文（学術雑誌）, We report about a fine structure in x-ray absorption spectra, named photon interference x-ray absorption fine structure (pi XAFS). pi XAFS is due to the interference of x-rays inside the sample and extends across absorption edges. Using a platinum foil pi XAFS was measured in a high precision absorption experiment. Excellent agreement with a theoretical pi XAFS simulation is achieved in the energy range for above an absorption edge where photoelectron XAFS is negligible. pi XAFS provides a method for determination of atomic structure on short- and long-range order scale. - Parametric down conversion of X-rays, recent experiments
B Adams, Y Nishino, DV Novikov, G Materlik, DM Mills
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 467, 2, 1019, 1020, ELSEVIER SCIENCE BV, 2001年07月, ［査読有り］
英語, 研究論文（学術雑誌）, Parametric down conversion of X-ray photons in diamond crystals was detected in six experiments, all using the phase matching scheme first employed in the X-ray regime by Eisenberger and McCall (Eisenberger and McCall, Phys. Rev. Lett. 26 (1971) 684). The conversion events were detected by a combination of time correlation spectroscopy and energy discrimination. The time correlation spectra gave a direct comparison of the conversion rate over the accidental coincidence rate. (C) 2001 Elsevier Science B.V. All rights reserved. - Parametric down conversion of X-rays, recent experiments
B Adams, Y Nishino, DV Novikov, G Materlik, DM Mills
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 467, 1019, 1020, ELSEVIER SCIENCE BV, 2001年07月, ［査読有り］
英語, 研究論文（学術雑誌）, Parametric down conversion of X-ray photons in diamond crystals was detected in six experiments, all using the phase matching scheme first employed in the X-ray regime by Eisenberger and McCall (Eisenberger and McCall, Phys. Rev. Lett. 26 (1971) 684). The conversion events were detected by a combination of time correlation spectroscopy and energy discrimination. The time correlation spectra gave a direct comparison of the conversion rate over the accidental coincidence rate. (C) 2001 Elsevier Science B.V. All rights reserved. - Theory of photon interference X-ray absorption fine structure
Y Nishino, G Materlik
JOURNAL OF SYNCHROTRON RADIATION, 8, 2, 204, 206, MUNKSGAARD INT PUBL LTD, 2001年03月, ［査読有り］
英語, 研究論文（学術雑誌）, The theory of photon interference x-ray absorption fine structure (pi XAFS) is described. Due to coherent x-ray scattering from atoms, a spatial variation of the x-ray intensity is produced inside the sample. The intensity at the x-ray absorbing atom changes according to the incident energy. Thus pi XAFS in extended absorption spectra is produced. It extends in a wide energy range over absorption edges. For powders the pi XAFS formula has equivalent form as the EXAFS formula, and the Fourier transform provides distances of neighboring atoms from the absorbing atom. Due to a long mean free path of the photon, pi XAFS for powders contains sharp structures. They are explained as a crystal grain orientation averaging of the x-ray standing wave effect. - Measurements of photon interference X-ray absorption fine structure (pi XAFS)
L Troger, P Kappen, Y Nishino, N Haack, G Materlik
JOURNAL OF SYNCHROTRON RADIATION, 8, 2, 105, 109, MUNKSGAARD INT PUBL LTD, 2001年03月, ［査読有り］
英語, 研究論文（学術雑誌）, Experimental data are presented which demonstrate the existence of a fine structure in extended X-ray absorption spectra due to interference effects in the initial photon state (pi XAFS). Interference occurs between the incident electromagnetic wave and its coherently scattered waves from neighboring atoms. Using fine platinum and tungsten powders as well as polycrystalline platinum foil, pi XAFS was measured in high-precision absorption experiments at beamline X1 at HASYLAB/DESY over a wide energy range. pi XAFS is observed below and above absorption-edge positions in both transmission and total-electron-yield detection. Based on experimental data it is shown that pi XAFS is sensitive to geometric atomic structure. Fourier-transformed pi XAFS data carry information, comparable with that of EXAFS, about the short-range-order structure of the sample. Sharp structures occur in pi XAFS when a Bragg backscattering condition of the incident X-rays is fulfilled. They allow precise measurement of long-range-order structural information. Measured data are compared with simulations based on pi XAFS theory. Although pi XAFS structures are similarly observed in two detection techniques, the importance of scattering off the sample for the measurements needs to be investigated further. Disentangling pi XAFS, multielectron photoexcitations and atomic XAFS in high-precision measurements close to absorption edges poses a challenge for future studies. - Measurements of photon interference X-ray absorption fine structure (pi XAFS)
L Troger, P Kappen, Y Nishino, N Haack, G Materlik
JOURNAL OF SYNCHROTRON RADIATION, 8, 105, 109, MUNKSGAARD INT PUBL LTD, 2001年03月, ［査読有り］
英語, 研究論文（学術雑誌）, Experimental data are presented which demonstrate the existence of a fine structure in extended X-ray absorption spectra due to interference effects in the initial photon state (pi XAFS). Interference occurs between the incident electromagnetic wave and its coherently scattered waves from neighboring atoms. Using fine platinum and tungsten powders as well as polycrystalline platinum foil, pi XAFS was measured in high-precision absorption experiments at beamline X1 at HASYLAB/DESY over a wide energy range. pi XAFS is observed below and above absorption-edge positions in both transmission and total-electron-yield detection. Based on experimental data it is shown that pi XAFS is sensitive to geometric atomic structure. Fourier-transformed pi XAFS data carry information, comparable with that of EXAFS, about the short-range-order structure of the sample. Sharp structures occur in pi XAFS when a Bragg backscattering condition of the incident X-rays is fulfilled. They allow precise measurement of long-range-order structural information. Measured data are compared with simulations based on pi XAFS theory. Although pi XAFS structures are similarly observed in two detection techniques, the importance of scattering off the sample for the measurements needs to be investigated further. Disentangling pi XAFS, multielectron photoexcitations and atomic XAFS in high-precision measurements close to absorption edges poses a challenge for future studies. - A novel experimental technique for atomic X-ray holography
B Adams, Y Nishino, G Materlik
JOURNAL OF SYNCHROTRON RADIATION, 7, 4, 274, 279, WILEY-BLACKWELL, 2000年07月, ［査読有り］
英語, 研究論文（学術雑誌）, A new experimental technique for reciprocal X-ray holography has been developed. The experimental set-up makes it possible to measure a reciprocal hologram without unwanted mixture of the X-ray fluorescence holography signal. The data are recorded during continuous rotation of the sample, and are accumulated over many revolutions. Thus the sensitivity to fluctuations of the source characteristics is reduced. A very high resolution over a large angular range is also achieved, which allows recording of X-ray standing-wave shapes near Bragg angles. The reconstruction of the measured hologram of a Cu(3)Au crystal gives positions of the nearest and next-nearest neighbours of a fluorescing Cu atom. - A novel experimental technique for atomic X-ray holography
B Adams, Y Nishino, G Materlik
JOURNAL OF SYNCHROTRON RADIATION, 7, 274, 279, WILEY-BLACKWELL, 2000年07月, ［査読有り］
英語, 研究論文（学術雑誌）, A new experimental technique for reciprocal X-ray holography has been developed. The experimental set-up makes it possible to measure a reciprocal hologram without unwanted mixture of the X-ray fluorescence holography signal. The data are recorded during continuous rotation of the sample, and are accumulated over many revolutions. Thus the sensitivity to fluctuations of the source characteristics is reduced. A very high resolution over a large angular range is also achieved, which allows recording of X-ray standing-wave shapes near Bragg angles. The reconstruction of the measured hologram of a Cu(3)Au crystal gives positions of the nearest and next-nearest neighbours of a fluorescing Cu atom. - Holographies and EXAFS in quantum electrodynamics (vol 60, pg 15074, 1999)
Nishino, Y, Materlik, G
Physical Review B, 61, 21, 14845, 14845, 2000年06月01日, ［査読有り］ - Holographies and EXAFS in quantum electrodynamics (vol 60, pg 15074, 1999)
Y Nishino, G Materlik
PHYSICAL REVIEW B, 61, 21, 14845, 14845, AMER PHYSICAL SOC, 2000年06月, ［査読有り］
英語 - Atom-resolving x-ray holography
B Adams, T Hiort, G Materlik, Y Nishino, DV Novikov
X-RAY AND INNER-SHELL PROCESSES, 506, 549, 564, AMER INST PHYSICS, 2000年, ［査読有り］
英語, 研究論文（国際会議プロシーディングス）, The current state of atomic resolution x-ray holography is discussed on the basis of theory and experimental results. X-ray holography is theoretically described in quantum theory. Presently-used experimental implementations are shown together with the data analysis used. Reconstructions of experimental and simulated holograms are compared for a Cu3Au crystal structure. Rigorous experimental realizations of pure direct and reciprocal x-ray holography methods are demonstrated, and future developments and applications of the method are suggested. - Holographies and EXAFS in quantum electrodynamics
Y Nishino, G Materlik
PHYSICAL REVIEW B, 60, 22, 15074, 15083, AMER PHYSICAL SOC, 1999年12月, ［査読有り］
英語, 研究論文（学術雑誌）, We calculate the cross section of the photoionization process consistently in the framework of quantum electrodynamics, including the initial-state photon interaction and the final-state photoelectron interaction with neighboring atoms. The obtained photoionization cross section explains multiple energy x-ray holography (MEXH), photoelectron holography, and extended x-ray absorption fine structure (EXAFS). In EXAFS, the contribution of the initial-state photon interaction is found to oscillate with energy and can disturb the EXAFS signal. It becomes non-negligible at higher energies. At 1 keV above the absorption edge, it can be in comparable order of the EXAFS signal. The hologram functions of MEXH and x-ray fluorescence holography are consistent with those in classical electrodynamics. [S0163-1829(99)02546-1]. - Holographies and EXAFS in quantum electrodynamics
Y Nishino, G Materlik
PHYSICAL REVIEW B, 60, 22, 15074, 15083, AMER PHYSICAL SOC, 1999年12月, ［査読有り］
英語, 研究論文（学術雑誌）, We calculate the cross section of the photoionization process consistently in the framework of quantum electrodynamics, including the initial-state photon interaction and the final-state photoelectron interaction with neighboring atoms. The obtained photoionization cross section explains multiple energy x-ray holography (MEXH), photoelectron holography, and extended x-ray absorption fine structure (EXAFS). In EXAFS, the contribution of the initial-state photon interaction is found to oscillate with energy and can disturb the EXAFS signal. It becomes non-negligible at higher energies. At 1 keV above the absorption edge, it can be in comparable order of the EXAFS signal. The hologram functions of MEXH and x-ray fluorescence holography are consistent with those in classical electrodynamics. [S0163-1829(99)02546-1]. - X-ray fluorescence holography in theory and experiment
B Adams, T Hiort, E Kossel, G Materlik, Y Nishino, DV Novikov
PHYSICA STATUS SOLIDI B-BASIC RESEARCH, 215, 1, 757, 771, WILEY-V C H VERLAG GMBH, 1999年09月, ［査読有り］
英語, 研究論文（学術雑誌）, The current state of atomic resolution X-ray holography is discussed on the basis of theoretical simulations and experimental results. The dependence of the spatial resolution on photon energy and angular scan ranges are studied, and presently-used experimental implementations are described together with the data analysis used. Reconstructions of simulated and experimental holograms are compared for a Cu3Au crystal structure. Rigorous experimental realizations of pure direct and reciprocal X-ray holography methods are demonstrated, and future developments and applications of the method are suggested. - X-ray fluorescence holography in theory and experiment
B Adams, T Hiort, E Kossel, G Materlik, Y Nishino, DV Novikov
PHYSICA STATUS SOLIDI B-BASIC RESEARCH, 215, 1, 757, 771, WILEY-V C H VERLAG GMBH, 1999年09月, ［査読有り］
英語, 研究論文（学術雑誌）, The current state of atomic resolution X-ray holography is discussed on the basis of theoretical simulations and experimental results. The dependence of the spatial resolution on photon energy and angular scan ranges are studied, and presently-used experimental implementations are described together with the data analysis used. Reconstructions of simulated and experimental holograms are compared for a Cu3Au crystal structure. Rigorous experimental realizations of pure direct and reciprocal X-ray holography methods are demonstrated, and future developments and applications of the method are suggested. - Hadron-nucleon scattering lengths from QCD sum rules
Y Kondo, O Morimatsu, Y Nishino
AUSTRALIAN JOURNAL OF PHYSICS, 50, 1, 221, 231, C S I R O PUBLICATIONS, 1997年, ［査読有り］
英語, 研究論文（学術雑誌）, Hadron-nucleon scattering lengths are studied by the QCD sum rule. First we explain our motivation and present the formulation for calculating hadron-nucleon scattering lengths by the QCD sum rule, where the relation between the hadron mass in the nuclear medium and the hadron-nucleon scattering length is also clarified. Secondly we discuss two applications, the pion-nucleon scattering lengths and the nucleon-nucleon scattering lengths. In the case of the pion-nucleon scattering length we show that the results of the QCD sum rule are consistent with the low-energy theorem. In the case of the nucleon-nucleon scattering lengths we show that the results of the QCD sum rule are in qualitative agreement with experiment. - Pion-nucleon and kaon-nucleon scattering lengths in QCD sum rules
Y Kondo, O Morimatsu, Y Nishino
PHYSICAL REVIEW C, 53, 4, 1927, 1935, AMERICAN PHYSICAL SOC, 1996年04月, ［査読有り］
英語, 研究論文（学術雑誌）, The pion-nucleon and kaon-nucleon scattering lengths are studied in the QCD sum rule. We show that the leading and next-to-leading order terms of the operator product expansion (OPE) give rise to the Tomozawa-Weinberg and sigma terms, respectively in the pion-nucleon and kaon-nucleon scattering lengths. We discuss phenomenological contributions which should be added to the experimental scattering lengths to be compared with the theoretical calculation by the OPE: we estimate the Lambda(1405) contribution in the kaon-nucleon channel by using the effective coupling strength determined by the analysis of the scattering data. We also estimate the continuum contribution above the threshold in the pion-nucleon channel by using the nonlinear sigma model. It turns out that the results of the QCD sum rule for the pion-nucleon scattering lengths are consistent with those of the low energy theorem and therefore with experiments and those for the kaon-nucleon scattering lengths differ from the results of naive partial conservation of axial-vector current-plus-current-algebra approach by the contribution from Lambda(1405). - Pion-nucleon and kaon-nucleon scattering lengths in QCD sum rules
Y Kondo, O Morimatsu, Y Nishino
PHYSICAL REVIEW C, 53, 4, 1927, 1935, AMERICAN PHYSICAL SOC, 1996年04月, ［査読有り］
英語, 研究論文（学術雑誌）, The pion-nucleon and kaon-nucleon scattering lengths are studied in the QCD sum rule. We show that the leading and next-to-leading order terms of the operator product expansion (OPE) give rise to the Tomozawa-Weinberg and sigma terms, respectively in the pion-nucleon and kaon-nucleon scattering lengths. We discuss phenomenological contributions which should be added to the experimental scattering lengths to be compared with the theoretical calculation by the OPE: we estimate the Lambda(1405) contribution in the kaon-nucleon channel by using the effective coupling strength determined by the analysis of the scattering data. We also estimate the continuum contribution above the threshold in the pion-nucleon channel by using the nonlinear sigma model. It turns out that the results of the QCD sum rule for the pion-nucleon scattering lengths are consistent with those of the low energy theorem and therefore with experiments and those for the kaon-nucleon scattering lengths differ from the results of naive partial conservation of axial-vector current-plus-current-algebra approach by the contribution from Lambda(1405). - The second moment of the structure function for pseudoscalar mesons in QCD sum rules
Nishino, Y
International Journal of Modern Physics E-Nuclear Physics, 5, 1, 121, 129, 1996年03月, ［査読有り］ - The second moment of the structure function for pseudoscalar mesons in QCD sum rules
Y Nishino
INTERNATIONAL JOURNAL OF MODERN PHYSICS E-NUCLEAR PHYSICS, 5, 1, 121, 129, WORLD SCIENTIFIC PUBL CO PTE LTD, 1996年03月, ［査読有り］
英語, 研究論文（学術雑誌）, We calculate the second moment M(2)(S) of the flavor-singlet structure function F-2(S) for the pion and the kaon in the framework of the QCD sum rule, and investigate how the results depend on their flavor structure (quark contents). Our calculations give similar values of M(2)(S) for these two mesons as a result of the cancellation among several non-small factors.
その他活動・業績
- X線自由電子レーザーを用いた自動車用ナノマテリアルの無損傷イメージング
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西野 吉則, 鈴木 明大, 木村 隆志, 城地 保昌, 別所 義隆, 超精密, 24, 5, 6, 2019年09月30日, ［招待有り］, ［筆頭著者, 責任著者］
日本語, 記事・総説・解説・論説等（学術雑誌） - Recent progresses and Future Prospects in XFEL‐Based Coherent Diffractive Imaging at SACLA
SUZUKI Akihiro, KIMURA Takashi, JOTI Yasumasa, BESSHO Yoshitaka, NISHINO Yoshinori, Abstracts. RIES-Hokudai International Symposium, 19th, 133, 2018年12月11日
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西野吉則, 鈴木明大, 木村隆志, 城地保昌, 別所義隆, 光量子工学研究 第6回 理研シンポジウム 平成30年, 7‐8, 2018年11月19日
日本語 - X線自由電子レーザーによる溶液試料のナノ観察 (X線自由電子レーザー)
西野 吉則, 鈴木 明大, 木村 隆志, 城地 保昌, 別所 義隆, 光学 = Japanese journal of optics : publication of the Optical Society of Japan, 47, 10, 413, 417, 2018年10月10日, ［筆頭著者, 責任著者］
日本光学会, 日本語 - X線自由電子レーザーを用いた環境制御ナノイメージング
西野吉則, 鈴木明大, 木村隆志, 城地保昌, 別所義隆, 精密工学会学術講演会講演論文集, 2018, 0, 665, 666, 2018年09月05日
<p>Ｘ線自由電子レーザー（XFEL）はフェムト秒という極めて短いパルス幅を持つため，試料がXFEL照射による損傷を顕著に受ける前に，Ｘ線回折過程が完了する．この，いわゆる「破壊前の回折」の原理を用いると，XFELでは試料損傷のないイメージングが可能となる．我々は，環境を制御した溶液中の試料を，XFELを用いて損傷なく観察するパルス状コヒーレントX線溶液散乱（PCXSS）法の独自構築を進めている．</p>, 公益社団法人 精密工学会, 日本語 - Controlled Environment Nano‐Imaging Free From Radiation Damage by X‐ray Laser Diffraction
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湯本 博勝, 小西 祐輔, 別所 義隆, 西野 吉則, 矢橋 牧名, 大橋 治彦, 小山 貴久, 木村 隆志, 鈴木 明大, 亀島 敬, 城地 保昌, 登野 健介, 谷 直哉, 橘 健朗, 精密工学会学術講演会講演論文集, 2018, 0, 605, 606, 2018年03月15日X線自由電子レーザー施設SACLAにおける高分解能コヒーレント回折顕微鏡のための試料照明用光学系として，4keV用多層膜ミラーによる超高密度集光ビームの実現を目指した．1nm(RMS)の再現性をもつ非接触プローブ走査型の形状計測装置を開発し，数値制御非球面加工装置を用いて本光学系の楕円筒面形状ミラー基板を作製した．SACLAで集光ビームを評価した結果，100nm集光サイズを実現した．
, 公益社団法人 精密工学会, 日本語 - パルス状コヒーレントX線溶液散乱計測用マイクロ流路型環境セルアレイの開発
木村隆志, 鈴木明大, 西野吉則, 城地保昌, 別所義隆, 精密工学会大会学術講演会講演論文集, 2018, 0, 607, 608, 2018年03月01日
<p>液体混合で生じる様々な反応現象をその場で直接捉えることを可能にする、X線自由電子レーザー(XFEL)とマイクロ流路型環境セルアレイを組み合わせた新たなイメージング技術の開発について講演を行う。XFELから発振されるフェムト秒のX線レーザーシングルパルスによる破壊計測に対応した、新たな環境セルアレイのデザインと作製方法を開発するとともに、XFEL施設SACLAを利用したナノ粒子イメージングの基礎検討を行った。</p>, 公益社団法人 精密工学会, 日本語 - コヒーレントＸ線回折による電荷密度波物質の研究
吉田 力矢, 後藤 遼平, 松浦 徹, 丹田 聡, 香村 芳樹, 田中 良和, 西野 吉則, SPring-8/SACLA利用研究成果集, 6, 1, 60, 64, 2018年01月25日, ［査読有り］, ［最終著者, 責任著者］ - X‐ray laser imaging of thermoresponsive gold nanoparticles in solution
SUZUKI Akihiro, KIMURA Takashi, IIDA Ryo, MITOMO Hideyuki, JOTI Yasumasa, BESSHO Yoshitaka, NIIKURA Ken‐ichi, IJIRO Kuniharu, NISHINO Yoshinori, Abstracts. RIES-Hokudai International Symposium, 18th, 114‐115, 2017年12月13日
英語 - Lipid bilayer chambers to observe membrane proteins by pulsed coherent X‐ray solution scattering
TANI Naoya, KIMURA Takashi, SUZUKI Akihiro, JOTI Yasumasa, BESSHO Yoshitaka, NISHINO Yoshinori, Abstracts. RIES-Hokudai International Symposium, 18th, 116‐117, 2017年12月13日
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英語 - 超微細インクジェットを利用した微量混合液体試料のX線自由電子レーザーイメージング技術の開発
木村隆志, 鈴木明大, 西野吉則, 城地保昌, 別所義隆, 精密工学会大会学術講演会講演論文集, 2017, 0, 839, 840, 2017年09月05日
フェムト秒の超短パルスであるX線自由電子レーザーを利用したイメージングでは、液中における試料構造を、固定化せずそのまま高分解能観察することが可能である。本研究では、超微細インクジェット装置により吐出・混合したピコリットル微量溶液試料のX線自由電子レーザーによる計測を試み、DNAリンカーを介して結合した液中ナノ粒子を10 nmに迫る高空間分解能でイメージングすることに成功した。, 公益社団法人 精密工学会, 日本語 - X線レーザー回折イメージングのための脂質二重膜マイクロチャンバーの開発
谷直哉, 木村隆志, 鈴木明大, 西野吉則, 城地保昌, 別所義隆, 精密工学会大会学術講演会講演論文集, 2017, 0, 841, 842, 2017年09月05日
フェムト秒の超短パルスを持つX線自由電子レーザーを用いたイメージングでは、生体内の環境に近い溶液中の試料を放射線の損傷を受けずにナノメートル分解能での測定が可能である。本研究では活性を維持した膜タンパク質の観察を目的に、脂質二重膜マイクロチャンバー構造をX線自由電子レーザー測定用溶液試料ホルダ内に作製し、チャンバー内に埋め込んだ膜タンパク質の活性評価を行った結果について発表を行う。, 公益社団法人 精密工学会, 日本語 - SACLAを用いた環境制御ナノイメージング
西野吉則, 木村隆志, 鈴木明大, 城地保昌, 別所義隆, レーザー研究, 45, 8, 508, 508, 2017年08月01日
Laser Society of Japan, 日本語 - SACLAを用いたコヒーレントイメージング
西野 吉則, 木村 隆志, 鈴木 明大, 城地 保昌, 別所 義隆, 日本結晶学会誌, 59, 1, 18, 23, 2017年03月05日, ［筆頭著者, 責任著者］
The Crystallographic Society of Japan - X線自由電子レーザーを用いた環境制御ナノイメージング
西野吉則, 木村隆志, 鈴木明大, 大島泰郎, 城地保昌, 別所義隆, 高分子学会予稿集(CD-ROM), 65, 2, ROMBUNNO.2H08, 2016年08月24日
日本語 - ナノバイオイメージング 1分子から細胞までの先端手法 X線レーザーで生きた細胞を観る
西野 吉則, 木村 隆志, 鈴木 明大, 城地 保昌, 大島 泰郎, 別所 義隆, バイオイメージング, 25, 2, 74, 74, 2016年08月
日本バイオイメージング学会, 日本語 - X線自由電子レーザーと進展するその応用 X線レーザー回折による生きた細胞のナノイメージング
西野吉則, 木村隆志, 城地保昌, 別所義隆, Optronics, 409, 48, 52, 2016年01月10日
日本語 - X線レーザー回折イメージングによる溶液中試料の反応解析に向けたサンプルホルダーの改良
丸岡篤史, 木村隆志, 城地保昌, 別所義隆, 別所義隆, 西野吉則, 日本放射光学会年会・放射光科学合同シンポジウム予稿集, 29th, 73, 2016年01月09日
日本語 - 生物試料イメージング実験における測定効率の向上
後藤遼平, 木村隆志, 城地保昌, 大島泰郎, 別所義隆, 西野吉則, 日本放射光学会年会・放射光科学合同シンポジウム予稿集, 29th, 73, 2016年01月09日
日本語 - 形状可変ミラーによる二段KBミラー集光光学系を用いた任意サイズ硬X線集光ビームの形成
後藤拓実, 中森紘基, 中森紘基, 松山智至, 木村隆志, KHAKUREL Krishna Prasad, 佐野泰久, 香村芳樹, 西野吉則, 石川哲也, 山内和人, 日本放射光学会年会・放射光科学合同シンポジウム予稿集, 29th, 52, 2016年01月09日
日本語 - X線自由電子レーザーによる溶液中試料ダイナミクス計測の試み
木村隆志, 後藤遼平, 丸岡篤史, 城地保昌, 大島泰郎, 別所義隆, 西野吉則, 日本放射光学会年会・放射光科学合同シンポジウム予稿集, 29th, 97, 2016年01月09日
日本語 - X線レーザー回折による生きた細胞のナノイメージング (特集 X線自由電子レーザーと進展するその応用)
西野 吉則, 木村 隆志, 城地 保昌, Optronics : 光技術コーディネートジャーナル, 35, 1, 48, 52, 2016年01月
オプトロニクス社, 日本語 - Novel Design of Environmental Cells: Towards 3D Imaging in Solution by X‐ray Laser Diffraction
SUZUKI Akihiro, TACHIBANA Tatsuro, TANI Naoya, JOTI Yasumasa, BESSHO Yoshitaka, KIMURA Takashi, NISHINO Yoshinori, Abstracts. RIES-Hokudai International Symposium, 17th, 126‐127, 2016年
英語 - In‐solution observation of DNA‐hybridization by using X‐ray free‐electron lasers
MARUOKA Atsushi, KIMURA Takashi, JOTI Yasumasa, BESSHO Yoshitaka, NISHINO Yoshinori, Abstracts. RIES-Hokudai International Symposium, 17th, 92‐93, 2016年
英語 - Imaging Living Bacteria Cell‐Cycle Using X‐ray Free‐Electron Lasers
GOTO Ryohei, KIMURA Takashi, SUZUKI Akihiro, YANG Ying, JOTI Yasumasa, OSHIMA Tairo, BESSHO Yoshitaka, NISHINO Yoshinori, Abstracts. RIES-Hokudai International Symposium, 17th, 61‐62, 2016年
英語 - Imaging of Self‐Assembled Au Nanoparticle Structure in Solution by Femtosecond X‐ray Laser
KIMURA Takashi, JOTI Yasumasa, BESSHO Yasutaka, NISHINO Yoshinori, Abstracts. RIES-Hokudai International Symposium, 17th, 81, 2016年
英語 - Temperature Dependence of Magnetically Active Charge Excitations in Magnetite across the Verwey Transition
Taguchi M., Chainani A., Ueda S., Matsunami M., Ishida Y., Eguchi R., Tsuda S., Takata Y., Yabashi M., Tamasaku K., Nishino Y., Ishikawa T., Daimon H., Todo S., Tanaka H., Oura M., Senba Y., Ohashi H., Shin S., 2015年12月17日
We study the electronic structure of bulk single crystals and epitaxial films of Fe3O4. Fe 2p core level spectra show clear differences between hard x-ray (HAX) and soft x-ray photoemission spectroscopy (PES). The bulk-sensitive spectra exhibit temperature (T) dependence across the Verwey transition, which is missing in the surface-sensitive spectra. By using an extended impurity Anderson full-multiplet model-and in contrast to an earlier peak assignment-we show that the two distinct Fe species (A and B site) and the charge modulation at the B site are responsible for the newly found double peaks in the main peak above TV and its T-dependent evolution. The Fe 2p HAXPES spectra show a clear magnetic circular dichroism (MCD) in the metallic phase of magnetized 100-nm-thick films. The model calculations also reproduce the MCD and identify the contributions from magnetically distinct A and B sites. Valence band HAXPES shows a finite density of states at EF for the polaronic half metal with a remnant order above TV and a clear gap formation below TV. The results indicate that the Verwey transition is driven by changes in the strongly correlated and magnetically active B-site electronic states, consistent with resistivity and optical spectra., American Physical Society, 英語 - 最先端のX線イメージング技術が拓く生命科学研究の新しい世界 X線自由電子レーザーを用いた放射線損傷のない生細胞ナノイメージング
西野 吉則, 木村 隆志, 城地 保昌, 大島 泰郎, 別所 義隆, 日本生化学会大会・日本分子生物学会年会合同大会講演要旨集, 88回・38回, [4W21, 7], 2015年12月
(公社)日本生化学会, 英語 - In‐situ X線透視撮影によるリチウムイオン電池の断面方向電解液濃度分布解析
古田典利, 向山真登, 山重寿夫, 野中敬正, 吉田力矢, 西野吉則, 電池討論会講演要旨集, 56th, 48, 2015年11月10日
日本語 - X線自由電子レーザーを用いた生きた細胞のナノイメージング : フェムト秒の発光時間のX線で生きた細胞の一瞬の姿を映し出す (特集 国際光年にあたっての「光と生物の分子化学」)
西野 吉則, 化学と工業 = Chemistry & chemical industry, 68, 11, 1018, 1020, 2015年11月
日本化学会, 日本語 - 国際光年にあたっての「光と生物の分子化学」3 X線自由電子レーザーを用いた生きた細胞のナノイメージング フェムト秒の発光時間のX線で生きた細胞の一瞬の姿を映し出す
西野吉則, 化学と工業, 68, 11, 1018, 1020, 2015年11月01日
日本語 - Fe3O4のFe2p内殻硬X線光電子分光における磁気円二色性の理論
田口宗孝, CHAINANI A, 上田茂典, 松波雅治, 石田行章, 江口律子, 津田俊輔, 矢橋牧名, 玉作賢治, 西野吉則, 石川哲也, 大門寛, 東堂栄, 田中秀和, 大浦正樹, 仙波泰徳, 大橋治彦, 辛埴, 日本物理学会講演概要集(CD-ROM), 70, 2, ROMBUNNO.18ACE-8, 2015年09月24日
日本語 - X線自由電子レーザーを用いた環境を制御したナノイメージング
西野吉則, 木村隆志, WEI Jinjian, 飯田良, 新倉謙一, 三友秀之, 居城邦治, 城地保昌, 別所義隆, 高分子学会予稿集(CD-ROM), 64, 2, ROMBUNNO.1J17, 2015年08月25日
日本語 - 形状可変ミラーを用いた二段Kirkpatrick‐Baezミラー集光光学系による硬X線集光ビームの形成―開口数制御による任意集光ビーム径の実現―
後藤拓実, 中森紘基, 中森紘基, 松山智至, 木村隆志, KHAKUREL Krishna Prasad, 佐野泰久, 香村芳樹, 西野吉則, 石川哲也, 山内和人, 精密工学会大会学術講演会講演論文集, 2015, ROMBUNNO.L32, 2015年08月20日
日本語 - Imaging live cells by X‐ray laser diffraction
NISHINO Yoshinori, KIMURA Takashi, JOTI Yasumasa, BESSHO Yoshitaka, 生物物理(Web), 55, Supplement 1-2, 1SGP-03 (WEB ONLY), 2015年08月18日
英語 - Imaging live cells by X-ray laser diffraction
Yoshinori Nishino, Takashi Kimura, Yasumasa Joti, Yoshitaka Bessho, SPring-8 Research Frontiers, 2014, 126, 127, 2015年08月05日, ［招待有り］, ［筆頭著者］ - X線自由電子レーザーによる生きた細胞のナノイメージング
西野吉則, 木村隆志, 吉田力矢, 于健, 城地保昌, 別所義隆, 日本蛋白質科学会年会プログラム・要旨集, 15th, 21, 2015年05月26日
日本語 - 高輝度軟X線・X線光源による分子科学・生命科学の展開 X線・軟X線顕微鏡技術開発の最前線と生命科学への応用
西野吉則, CSJ Current Review, 18, 129-133,I(4), 2015年03月30日
日本語 - 硬X線集光用形状可変ミラーによる二段KBミラー集光光学系の開発
後藤拓実, 中森紘基, 松山智至, 木村隆志, KHAKUREL Krishna Prasad, 佐野泰久, 香村芳樹, 石川哲也, 西野吉則, 山内和人, 精密工学会大会学術講演会講演論文集, 2015, ROMBUNNO.R31, 2015年03月01日
日本語 - Development of non‐interferometric, single‐shot quantitative phase imaging.
KHAKUREL Krishna Prasad, KIMURA Takashi, JOTI Yasumasa, MATSUYAMA Satoshi, YAMAUCHI Kazuto, NISHINO Yoshinori, 日本放射光学会年会・放射光科学合同シンポジウム予稿集, 28th, 116, 2015年01月10日
英語 - Simulating XFEL diffraction patterns of biomolecular complexes for pulsed coherent X‐ray solution scattering
YU Jian, JOTI Yasumasa, KIMURA Takashi, BESSHO Yoshitaka, NISHINO Yoshinori, 日本放射光学会年会・放射光科学合同シンポジウム予稿集, 28th, 65, 2015年01月10日
英語 - 多様な溶液内生物試料イメージングへ向けたパルス状コヒーレントX線溶液散乱法の高度化
佐々木智也, 木村隆志, 城地保昌, 別所義隆, 西野吉則, 日本放射光学会年会・放射光科学合同シンポジウム予稿集, 28th, 65, 2015年01月10日
日本語 - 二次元格子配置試料に対するパルス状コヒーレントX線溶液散乱の試み
山本耕平, 城地保昌, 木村隆志, 別所義隆, 西野吉則, 日本放射光学会年会・放射光科学合同シンポジウム予稿集, 28th, 65, 2015年01月10日
日本語 - パルス状コヒーレントX線溶液散乱法によるSACLAでの溶液中試料イメージング実験
木村隆志, 城地保昌, 別所義隆, 西野吉則, 日本放射光学会年会・放射光科学合同シンポジウム予稿集, 28th, 57, 2015年01月10日
日本語 - グラフェン隔膜環境セルを用いたコヒーレントX線イメージング
高畠雄輝, 木村隆志, 山崎憲慈, 前原洋祐, 城地保昌, 別所義隆, 郷原一寿, 西野吉則, 日本放射光学会年会・放射光科学合同シンポジウム予稿集, 28th, 66, 2015年01月10日
日本語 - Si単結晶薄膜におけるピコ秒格子歪み分布の解析
西森一喜, NEWTON Marcus, 小川奏, 富樫格, 矢橋牧名, 河口智也, 境田真志, 高橋功, 市坪哲, 松原英一郎, 西野吉則, 田中義人, 日本放射光学会年会・放射光科学合同シンポジウム予稿集, 28th, 66, 2015年01月10日
日本語 - 形状可変ミラーを用いた二段Kirkpatrick-Baezミラー集光光学系による硬X線集光ビームの形成
後藤 拓実, 中森 紘基, 松山 智至, 木村 隆志, Khakurel Krishna, 佐野 泰久, 香村 芳樹, 西野 吉則, 石川 哲也, 山内 和人, 精密工学会学術講演会講演論文集, 2015, 0, 703, 704, 2015年
本研究の目的は，開口数可変機構をもつ硬X線集光光学系の開発である．本光学系は4枚の高精度形状可変ミラーにより構成される二段のKBミラー光学系であり，ミラーの形状を変形することで開口数を制御し任意の集光径を作り出すことができる．本発表では，SPring-8において本光学系を構築し，10 keVのX線を用いて二次元集光実験を行い，3つの異なるサイズのX線集光ビームを形成した結果について報告する．, 公益社団法人 精密工学会, 日本語 - 18aCE-8 Fe_3O_4のFe 2p内殻硬X線光電子分光における磁気円二色性の理論
田口 宗孝, チャイナニ アシシ, 上田 茂典, 松波 雅治, 石田 行章, 江口 律子, 津田 俊輔, 矢橋 牧名, 玉作 賢治, 西野 吉則, 石川 哲也, 大門 寛, 東堂 栄, 田中 秀和, 大浦 正樹, 仙波 泰徳, 大橋 治彦, 辛 埴, 日本物理学会講演概要集, 70, 0, 2015年
一般社団法人 日本物理学会, 日本語 - 硬X線集光用形状可変ミラーによる二段KBミラー集光光学系の開発
後藤 拓実, 中森 紘基, 松山 智至, 木村 隆志, Khakurel Krishna, 佐野 泰久, 香村 芳樹, 石川 哲也, 西野 吉則, 山内 和人, 精密工学会学術講演会講演論文集, 2015, 0, 1047, 1048, 2015年
第三世代放射光施設の稼動により，高輝度・高可干渉性を有するX線が利用可能となった．この優れたX線を活用する技術が集光技術であり，高感度分析には必要不可欠なものとなっている．現在，我々は集光光学素子として形状可変ミラーを用いて，従来にはない光学パラメータ可変機構を持つ集光光学系の開発を行っている．本発表では，4枚の形状可変ミラーを用いて二段集光光学系を構築し，集光実験を行った結果について報告する．, 公益社団法人 精密工学会, 日本語 - Numerical simulation of XFEL diffraction patterns of biological macromolecules in solution for PCXSS
YU Jian, JOTI Yasumasa, KIMURA Takashi, BESSHO Yoshitaka, NISHINO Yoshinori, Abstracts. RIES-Hokudai International Symposium, 16th, 68, 69, 2015年
英語 - Damage Free Imaging of Samples in Solution by X‐ray Free‐Electron Laser Diffraction
KIMURA Takashi, JOTI Yasumasa, BESSHO Yasutaka, NISHINO Yoshinori, Abstracts. RIES-Hokudai International Symposium, 16th, 136, 137, 2015年
英語 - X線自由電子レーザーを用いた放射線損傷のない生細胞ナノイメージング
NISHINO Yoshinori, KIMURA Takashi, JOCHI Yasumasa, OSHIMA Tairo, BESSHO Yoshitaka, 日本生化学会大会(Web), 88th, 4W21-7 (WEB ONLY), 2015年
英語 - X‐ray Laser Diffraction In‐Solution Imaging Using Environmental Cell Array Chips with Graphene Windows
TAKABATAKE Yuki, KIMURA Takashi, YAMAZAKI Kenji, MAEHARA Yosuke, WEI Jinjian, NIIKURA Kenichi, IJIRO Kuniharu, JOTI Yasumasa, BESSHO Yositaka, GOHARA Kazutoshi, NISHINO Yoshinori, Abstracts. RIES-Hokudai International Symposium, 16th, 81, 82, 2015年
英語 - Nano‐patterning of organic samples for signal enhancement Using in X‐ray laser diffraction imaging
SASAKI Tomoya, YAMAMOTO Kohei, KIMURA Takashi, UCHIHASHI Takayuki, ANDO Toshio, JOTI Yasumasa, BESSHO Yoshitaka, NISHINO Yoshinori, Abstracts. RIES-Hokudai International Symposium, 16th, 126, 127, 2015年
英語 - X線レーザー回折による生きた細胞のスナップショットイメージング
西野吉則, 木村隆志, 城地保昌, 別所義隆, 高分子学会予稿集(CD-ROM), 63, 2, ROMBUNNO.1J05, 2014年09月03日
日本語 - Irregular organization in the human chromosomes revealed by X‐ray scattering
MAESHIMA Kazuhiro, NISHINO Yoshinori, JOTI Yasumasa, SPring-8 Research Frontiers, 2013, 32, 33, 2014年08月
英語 - 時間分解X線回折法によるレーザ超音波発生過程の研究 : X線自由電子レーザを用いたブラッグコヒーレントX線回折法の開発とその展望 (特集 LU2013(2)レーザ超音波とその応用)
田中 義人, 西野 吉則, 松原 英一郎, 非破壊検査, 63, 4, 170, 177, 2014年04月
日本非破壊検査協会, 日本語 - LU2013II―レーザ超音波とその応用―時間分解X線回折法によるレーザ超音波発生過程の研究―X線自由電子レーザを用いたブラッグコヒーレントX線回折法の開発とその展望―
田中義人, 西野吉則, 松原英一郎, 非破壊検査, 63, 4, 170, 177, 2014年04月01日
日本語 - Si単結晶薄膜におけるピコ秒過渡的格子歪みの解析
鬼塚怜奈, 西森一喜, NEWTON Marcus, 小川奏, 佐藤尭洋, 富樫格, 矢橋牧名, 境田真志, 徳田一弥, 河口智也, 高橋功, 市坪哲, 松原英一郎, 西野吉則, 田中義人, 日本放射光学会年会・放射光科学合同シンポジウム予稿集, 27th, 84, 2014年01月11日
日本語 - VO2ナノワイヤにおける超高速相転移のX線レーザー回折イメージングに向けた検討
藤澤勇太, NEWTON Marcus C, 田中義人, 西野吉則, 日本放射光学会年会・放射光科学合同シンポジウム予稿集, 27th, 84, 2014年01月11日
日本語 - XFELによる相変化記録材料のピコ秒高速格子変形の観察
徳田一弥, 河口智也, 境田真志, 佐藤尭洋, 小川奏, 富樫格, 矢橋牧名, 市坪哲, 松永利之, 田中義人, 西野吉則, 山田昇, 松原英一郎, 日本放射光学会年会・放射光科学合同シンポジウム予稿集, 27th, 114, 2014年01月11日
日本語 - 溶液試料の構造解析のための環境セルアレイの開発
川村仁志, 大村隆志, 城地保昌, 別所義隆, 西野吉則, 日本放射光学会年会・放射光科学合同シンポジウム予稿集, 27th, 94, 2014年01月11日
日本語 - 金ナノ結晶中の制御されたひずみのコヒーレントX線回折イメージングに向けた検討
佐尾真侑, NEWTON Marcus, 田中義人, 西野吉則, 日本放射光学会年会・放射光科学合同シンポジウム予稿集, 27th, 141, 2014年01月11日
日本語 - Observation of the metal‐insulator transition dynamics of vanadium dioxide by using coherent X‐rays
FUJISAWA Yuta, YOSHIDA Rikiya, NEWTON Marcus C, TANAKA Yoshihito, TANAKA Yoshikazu, MURAOKA Yuji, OTSUKA Tsubasa, NISHINO Yoshinori, Abstracts. RIES-Hokudai International Symposium, 15th, 61, 62, 2014年
英語 - Injection of Live Cells by Superfine Inkjet Printer and its Application to X‐ray Laser Diffraction Imaging
SAO Mayu, KIMURA Takashi, JOTI Yasumasa, BESSHO Yasutaka, NISHINO Yoshinori, Abstracts. RIES-Hokudai International Symposium, 15th, 125, 126, 2014年
英語 - Development of non‐interferometric single‐shot quantitative phase imaging
KHAKUREL Krishna Prasad, KIMURA Takashi, JOTI Yasumasa, MATSUYAMA Satoshi, YAMAUCHI Kazuto, NISHINO Yoshinori, Abstracts. RIES-Hokudai International Symposium, 15th, 77, 78, 2014年
英語 - Simulating XFEL diffraction patterns of biomolecular complexes for pulsed coherent X‐ray solution scattering
YU Jian, JOTI Yasumasa, KIMURA Takashi, BESSHO Yoshitaka, NISHINO Yoshinori, Abstracts. RIES-Hokudai International Symposium, 15th, 163, 2014年
英語 - Development of Micro‐Liquid Enclosure Array for Live Cell Imaging by X‐ray Laser Diffraction
KIMURA Takashi, JOTI Yasumasa, BESSHO Yasutaka, NISHINO Yoshinori, Abstracts. RIES-Hokudai International Symposium, 15th, 81, 82, 2014年
英語 - フェムト秒X線レーザーによる溶液中の生きた細胞観察
木村 隆志, 城地 保昌, 別所 義隆, 西野 吉則, 応用物理, 83, 10, 830, 833, 2014年
<p>新世代のX線光源であるX線自由電子レーザー（XFEL）による観察では，高ピーク輝度・超短パルスという特徴から，放射線損傷の影響を回避した自然な状態の構造を捉えることができる．微量な溶液試料を封じ込めるマイクロ液体封入アレイとXFELによる計測を組み合わせた，生きた細菌の高分解能イメージングについて紹介する．</p>, 公益社団法人 応用物理学会, 日本語 - ヒトゲノムDNAの不規則で柔軟な収納原理
前島 一博, 城地 保昌, 西野 吉則, 高田 英昭, 鎌田 福美, 日原 さえら, 生物物理, 53, 1, 4, 10, 2013年01月25日
How is 2-m-long genomic DNA organized into a mitotic chromosome or nucleus? The nucleosome fiber has long been assumed to be folded into a 30-nm chromatin fiber, and further helically folded larger fiber. However, when we observed frozen hydrated human mitotic cells using cryoelectron microscopy (cryo-EM), no higher-order structures including 30-nm chromatin fibers were found. To further investigate the bulk structure of mitotic chromosomes, we performed small-angle X-ray scattering (SAXS) at SPring-8. No structural feature larger than 11 nm was detected, even on a chromosome-diameter scale (~1 μm). We also found a similar scattering pattern in interphase nuclei of HeLa cells in the range up to ~275 nm. Our findings suggest a common structural feature in interphase and mitotic chromatins: compact and irregular folding of nucleosome fibers occurs without a 30-nm chromatin structure.<br>, 一般社団法人 日本生物物理学会, 日本語 - SACLAを用いたSi単結晶薄膜の超高時間分解BraggコヒーレントX線回折測定
中谷貴司, 伊藤基巳紀, 鬼塚怜奈, NEWTON Marcus, 佐藤尭洋, 富樫格, 矢橋牧名, 島田康気, 徳田一弥, 河口智也, 高橋功, 市坪哲, 松原英一郎, 西野吉則, 田中義人, 日本放射光学会年会・放射光科学合同シンポジウム予稿集, 26th, 107, 2013年01月12日
日本語 - X線自由電子レーザー施設SACLAがついに始動 X線イメージングの最先端
西野 吉則, 生物試料分析, 36, 1, 3, 3, 2013年01月
(NPO)生物試料分析科学会, 日本語 - Direct Observation of Picosecond Lattice Deformation of Ge2Sb2Te5 by X‐ray Free‐Electron Laser
TOKUDA Kazuya, KAWAGUCHI Tomoya, SAKAIDA Masashi, SATO Takahiro, TOGASHI Tadashi, OGAWA Kanade, YABASHI Makina, ICHITSUBO Tetsu, MATSUNAGA Toshiyuki, TANAKA Yoshihito, NISHINO Yoshinori, YAMADA Noboru, MATSUBARA Eiichiro, Proceedings of the Symposium on Phase Change Oriented Science, 25th, 10, 13, 2013年
英語 - Single Particle Three‐Dimensional Structural Modeling by Pulsed Coherent X‐ray Solution Scattering
KHAKUREL Krishna Prasad, KIMURA Takashi, NISHINO Yoshinori, Abstracts. RIES-Hokudai International Symposium, 14th, 150, 151, 2013年
英語 - Development of Pulsed Coherent X‐ray Solution Scattering for Measurement of Specimens in Liquid.
KIMURA Takashi, KAWAMURA Hitoshi, JOTI Yasumasa, BESSHO Yasutaka, NISHINO Yoshinori, Abstracts. RIES-Hokudai International Symposium, 14th, 90, 91, 2013年
英語 - 回折限界下で集光径可変なミラー集光光学系の開発
松山智至, 木村隆志, 中森紘基, 今井将太, 香村芳樹, 玉作賢治, 矢橋牧名, 石川哲也, 西野吉則, 山内和人, 日本放射光学会年会・放射光科学合同シンポジウム予稿集, 25th, 113, 2012年01月06日
日本語 - Time Resolved Imaging with Coherent X‐ray Diffraction (TRICXD)
NEWTON Name Marcus C, TANAKA Yoshihito, NISHINO Yoshinori, Abstracts. RIES-Hokudai International Symposium, 13th, 90, 91, 2012年
英語 - Development of Structure Analysis Method for Non‐crystallized Sample using Focused X‐ray Free Electron Laser
KIMURA Takashi, KAWAMURA Hitoshi, BESSHO Yasutaka, JOTI Yasumasa, NISHINO Yoshinori, Abstracts. RIES-Hokudai International Symposium, 13th, 88, 89, 2012年
英語 - 当院における高次脳機能障害患者の自宅退院への要因
國塚裕太, 鷹塀勇哉, 立石理江, 西野吉則, 溝口聡, 大河内則之, 藤井良憲, 全国回復期リハビリテーション病棟連絡協議会研究大会プログラム・抄録集, 19th, 289, 2012年
日本語 - SPring‐8/SACLAでのXFEL:生体試料イメージング手法の開発
別所義隆, 城地保昌, 木村隆志, 澁谷明美, 北村彩, 上田雅美, 和田明, 竹内昌治, 阪口利文, 仁田原翔太, 玉腰雅忠, 森屋利幸, 大島泰郎, 西野吉則, 日本分子生物学会年会プログラム・要旨集(Web), 35th, 1P-0677 (WEB ONLY), 2012年
日本語 - X-ray Diffraction Limit Workshop Series Workshop 1-Diffraction Microscopy, Holography and Ptychography using Coherent Beams 報告
西野 吉則, 放射光, 24, 5, 273, 274, 2011年09月30日
日本語 - X線自由電子レーザーSACLA実験用マルチポートCCDの開発
亀島敬, 桐原陽一, 小野峻, 初井宇記, 工藤統吾, 小林和生, 堀米利夫, 大沢仁志, 矢橋牧名, 西野吉則, 石川哲也, 日本物理学会講演概要集, 66, 2, 15, 2011年08月24日
日本語 - 重い電子系価揺動物質α‐YbAlB4の鉄ドープ誘起量子臨界現象
久我健太郎, O’FARRELL E. C. T, 松本洋介, 中辻知, 大川万里生, 高田恭孝, 松波雅治, 江口律子, 田口宗孝, CHAINANI Ashish, 辛埴, 西野吉則, 玉作賢治, 矢橋牧名, 石川哲也, 木内陽子, 日本物理学会講演概要集, 66, 2, 495, 2011年08月24日
日本語 - How is a long strand of genomic DNA organized into a chromosome?
MAESHIMA Kazuhiro, NISHINO Yoshinori, JOTI Yasumasa, ITO Kazuki, ELTSOV Mikhail, ISHIKAWA Tetsuya, 生物物理, 51, Supplement 1, S34, 2011年08月15日
英語 - コヒーレントX線イメージング
西野 吉則, 計測と制御 = Journal of the Society of Instrument and Control Engineers, 50, 5, 314, 319, 2011年05月10日
計測自動制御学会, 日本語 - 二次元硬X線 Sub-10nm 集光システムの構築
木村 隆志, 三村 秀和, 横山 光, 今井 将太, 湯本 博勝, 松山 智至, 香村 芳樹, 西野 吉則, 玉作 賢治, 矢橋 牧名, 石川 哲也, 山内 和人, 放射光, 24, 2, 102, 103, 2011年03月31日
日本語 - XFEL用Multi‐Port CCD検出器の放射線耐性評価
小野峻, 亀島敬, 桐原陽一, 初井宇記, 工藤統吾, 小林和生, 堀米利夫, HOLLAND Andrew, HOLLAND Karen, 大沢仁志, 矢橋牧名, 西野吉則, 石川哲也, 応用物理学関係連合講演会講演予稿集(CD-ROM), 58th, ROMBUNNO.26P-EA-16, 2011年03月09日
日本語 - X線自由電子レーザー実験用マルチポートCCDの開発 III
亀島敬, 桐原陽一, 初井宇記, 工藤統吾, 小林和生, 堀米利失, HOLLAND Andrew, HOLLAND Karen, 大沢仁志, 矢橋牧名, 西野吉則, 石川哲也, 日本物理学会講演概要集, 66, 1, 29, 2011年03月03日
日本語 - 重い電子系価数揺動物質α‐YbAlB4の鉄ドープ誘起の磁性と価数変化
久我健太郎, 松本洋介, 中辻知, 大川万里生, 高田恭孝, 松波雅治, 江口律子, 田口宗孝, CHAINANI Ashish, SHIN S, 西野吉則, 玉作賢治, 矢橋牧名, 石川哲也, 木内陽子, 日本物理学会講演概要集, 66, 1, 582, 2011年03月03日
日本語 - KBミラー集光X線を用いた高分解能走査型回折顕微法の開発
鈴木明大, 高橋幸生, 堤良輔, 西野吉則, 松原英一郎, 山内和人, 石川哲也, 日本放射光学会年会・放射光科学合同シンポジウム予稿集, 24th, 144, 2011年01月07日
日本語 - XFEL用クライオ試料照射装置を用いたX線回折実験
中迫雅由, 山本雅貴, 西野吉則, 高山裕貴, 坂本啓太, 児玉渉, 鈴木茂之, 松井夕花, 米倉功治, 眞木さおり, 引間孝明, 高橋幸夫, 久保秀人, 堤良輔, 榊茂之, 日本放射光学会年会・放射光科学合同シンポジウム予稿集, 24th, 62, 2011年01月07日
日本語 - 色収差のない結像型硬X線顕微鏡構築のためのAdvanced Kirkpatrick‐Baezミラー光学系の開発
木谷直隆, 松山智至, 脇岡敏之, 中森紘基, 三村秀和, 木村隆志, 佐野泰久, 西野吉則, 玉作賢治, 香村芳樹, 矢橋牧名, 石川哲也, 山内和人, 日本放射光学会年会・放射光科学合同シンポジウム予稿集, 24th, 146, 2011年01月07日
日本語 - 二次元硬X線Sub‐10nm集光システムの構築
木村隆志, 三村秀和, 横山光, 今井将太, 湯本博勝, 松山智至, 香村芳樹, 西野吉則, 玉作賢治, 矢橋牧名, 石川哲也, 山内和人, 日本放射光学会年会・放射光科学合同シンポジウム予稿集, 24th, 83, 2011年01月07日
日本語 - 硬X線集光用多層膜ミラーの開発
横山光, 三村秀和, 木村隆志, 今井将太, 湯本博勝, 松山智至, 香村芳樹, 西野吉則, 玉作賢治, 矢橋牧名, 石川哲也, 山内和人, 日本放射光学会年会・放射光科学合同シンポジウム予稿集, 24th, 83, 2011年01月07日
日本語 - 高分解能コヒーレントX線回折顕微法によるAu/Agナノボックス粒子の三次元電子密度マッピング
堤良輔, 高橋幸生, 是津信行, 鈴木明大, 西野吉則, 松原英一郎, 石川哲也, 山内知人, 日本放射光学会年会・放射光科学合同シンポジウム予稿集, 24th, 144, 2011年01月07日
日本語 - 極紫外自由電子レーザーによるコヒーレントイメージング
岡谷基弘, 西野吉則, 田中義人, 伊藤基巳紀, 岡田真, 野崎公彦, 魚崎嘉仁, 魚崎嘉仁, 大路祐介, 松下雄多, 西岡達矢, 矢橋牧名, 永園充, 富樫格, 大橋治彦, 松井真二, 石川哲也, 松原英一郎, 日本放射光学会年会・放射光科学合同シンポジウム予稿集, 24th, 161, 2011年01月07日
日本語 - 試料厚さの効果を考慮した高分解能コヒーレントX線回折顕微法
高橋幸生, 堤良輔, 西野吉則, 是津信行, 松原英一郎, 山内和人, 石川哲也, 日本放射光学会年会・放射光科学合同シンポジウム予稿集, 24th, 67, 2011年01月07日
日本語 - XFEL用Multi‐Port CCD検出器の開発 II
亀島敬, 桐原陽一, 初井宇記, 工藤統吾, 小林和生, 堀米利夫, 大沢仁志, 矢橋牧名, 西野吉則, 石川哲也, 日本放射光学会年会・放射光科学合同シンポジウム予稿集, 24th, 69, 2011年01月07日
日本語 - 軟X線・硬X線光電子分光によるFeGeの電子状態の研究
稲葉豪志, 大槻匠, CHAINANI A, 田口宗孝, 松波雅治, 江口律子, 高田恭孝, 中村元彦, 西野吉則, 玉作賢治, 矢橋牧名, 石川哲也, 大浦正樹, 大橋治彦, 仙波泰徳, 金澤直也, 小野瀬佳文, 十倉好紀, 辛埴, 日本放射光学会年会・放射光科学合同シンポジウム予稿集, 24th, 86, 2011年01月07日
日本語 - 波動光学シミュレーションを用いたAdvanced Kirkpatrick‐Baezミラー光学系の検討
中森紘基, 松山智至, 脇岡敏之, 木谷直隆, 三村秀和, 佐野泰久, 西野吉則, 香村芳樹, 玉作賢治, 矢橋牧名, 石川哲也, 山内和人, 日本放射光学会年会・放射光科学合同シンポジウム予稿集, 24th, 146, 2011年01月07日
日本語 - 硬X線集光用高精度形状可変ミラーの作製と評価
今井将太, 木村隆志, 三村秀和, 横山光, 湯本博勝, 松山智至, 香村芳樹, 西野吉則, 玉作賢治, 矢橋牧名, 石川哲也, 山内和人, 日本放射光学会年会・放射光科学合同シンポジウム予稿集, 24th, 83, 2011年01月07日
日本語 - Sm0.45Sr0.55MnO3の内殻及び共鳴光電子分光
小島太郎, 高田恭孝, CHAINANI A, 大槻匠, 松波雅治, 江口律子, 稲葉豪志, 大浦正樹, 辛埴, 西野吉則, 玉作賢治, 矢橋牧名, 仙波泰徳, 大橋治彦, 石川哲也, 富岡泰秀, 十倉好紀, 日本放射光学会年会・放射光科学合同シンポジウム予稿集, 24th, 89, 2011年01月07日
日本語 - コヒーレントイメージングの現状と展望
西野吉則, 田中義人, 伊藤基巳紀, 高橋幸生, 三村秀和, 松山智至, 前島一博, 志村まり, 城地保昌, 苙口友隆, 別所義隆, 竹内昌治, 岡田真, 岡谷基弘, 野崎公彦, 大路祐介, 松下雄多, 堤良輔, 矢橋牧名, 永園充, 富樫格, 大橋治彦, 松井真二, 松原英一郎, 山内和人, 石川哲也, 日本放射光学会年会・放射光科学合同シンポジウム予稿集, 24th, 50, 2011年01月07日
日本語 - 24aEC-7 極端紫外線自由電子レーザーを用いたフェムト秒ホログラフィー(24aEC 領域1,領域10合同シンポジウム:短波長自由電子レーザーによる物質科学の展開-EUV-FELによる成果からXFEL利用に向けて-,領域10(誘電体,格子欠陥,X線・粒子線,フォノン))
西野 吉則, 日本物理学会講演概要集, 66, 0, 2011年
一般社団法人日本物理学会, 日本語 - 22aGC-13 重い電子系価揺動物質α-YbAlB_4の鉄ドープ誘起量子臨界現象(22aGC 量子臨界,領域8(強相関系:高温超伝導,強相関f電子系など))
久我 健太郎, O'Farrell E. C. T, 松本 洋介, 中辻 知, 大川 万里生, 高田 恭孝, 松波 雅治, 江口 律子, 田口 宗孝, Chainani Ashish, 辛 埴, 西野 吉則, 玉作 賢治, 矢橋 牧名, 石川 哲也, 木内 陽子, 日本物理学会講演概要集, 66, 0, 2011年
一般社団法人日本物理学会, 日本語 - 24aEC-7 極端紫外線自由電子レーザーを用いたフェムト秒ホログラフィー(24aEC 領域1,領域10合同シンポジウム 主題: 短波長自由電子レーザーによる物質科学-EUV-FELによる成果からXFEL利用に向けて,領域1(原子・分子,量子エレクトロニクス,放射線物理))
西野 吉則, 日本物理学会講演概要集, 66, 0, 2011年
一般社団法人日本物理学会, 日本語 - 16aSE-9 X線自由電子レーザーSACLA実験用マルチポートCCDの開発(16aSE 半導体検出器・飛跡検出器,素粒子実験領域)
亀島 敬, 桐原 陽一, 小野 峻, 初井 宇記, 工藤 統吾, 小林 和生, 堀米 利夫, 大沢 仁志, 矢橋 牧名, 西野 吉則, 石川 哲也, 日本物理学会講演概要集, 66, 0, 2011年
一般社団法人日本物理学会, 日本語 - 25pGL-7 極端紫外線自由電子レーザーを用いたフェムト秒ホログラフィー(25pGL 領域1,領域10,ビーム物理領域合同シンポジウム:短波長自由電子レーザーによる物質科学の展開-EUV-FELによる成果からXFEL利用に向けて-,領域10(誘電体,格子欠陥,X線・粒子線,フォノン))
西野 吉則, 日本物理学会講演概要集, 66, 0, 2011年
一般社団法人日本物理学会, 日本語 - 26aEC-4 重い電子系価数揺動物質α-YbAlB_4の鉄ドープ誘起の磁性と価数変化(26aEC Yb系,領域8(強相関系:高温超伝導,強相関f電子系など))
久我 健太郎, 松本 洋介, 中辻 知, 大川 万里生, 高田 恭孝, 松波 雅治, 江口 律子, 田口 宗孝, Chainani Ashish, 辛 埴, 西野 吉則, 玉作 賢治, 矢橋 牧名, 石川 哲也, 木内 陽子, 日本物理学会講演概要集, 66, 0, 2011年
一般社団法人日本物理学会, 日本語 - 25pGL-7 極端紫外線自由電子レーザーを用いたフェムト秒ホログラフィー(25pGL 領域1,領域10,ビーム物理領域合同シンポジウム:短波長自由電子レーザーによる物質科学の展開---EUV-FELによる成果からXFEL利用に向けて---,領域1(原子・分子,量子エレクトロニクス,放射線物理))
西野 吉則, 日本物理学会講演概要集, 66, 0, 2011年
一般社団法人日本物理学会, 日本語 - 25pGL-7 極端紫外線自由電子レーザーを用いたフェムト秒ホログラフィー(25pGL 領域1,領域10,ビーム物理領域 合同シンポジウム:短波長自由電子レーザーによる物質科学の展開-EUV-FELによる成果からXFEL利用に向けて-,ビーム物理領域)
西野 吉則, 日本物理学会講演概要集, 66, 0, 2011年
一般社団法人日本物理学会, 日本語 - Femto‐second Three‐Dimensional Imaging of Ultra‐Fast Strain dynamics in Nanocrystals
NEWTON Marcus C, SOEDA Kei, NISHINO Yoshinori, Abstracts. RIES-Hokudai International Symposium, 12th, 72, 73, 2011年
英語 - Development of Pulsed Coherent X‐ray Solution Scattering using Focused X‐ray Free‐Electron Laser
KIMURA Takashi, NAGASE Chie, MORI Arata, NISHINO Yoshinori, Abstracts. RIES-Hokudai International Symposium, 12th, 70, 71, 2011年
英語 - Exploring the Nanoworld using Coherent X‐rays
NISHINO Yoshinori, NEWTON Marcus C, KIMURA Takashi, Abstracts. RIES-Hokudai International Symposium, 12th, 15, 17, 2011年
英語 - Development of Coherent X-ray Diffraction Apparatus with Kirkpatrick-Baez Mirror Optics
Y. Takahashi, R. Tsutsumi, Y. Nishino, H. Mimura, S. Matsuyama, T. Ishikawa, K. Yamauchi, 10TH INTERNATIONAL CONFERENCE ON X-RAY MICROSCOPY, 1365, 231, 234, 2011年
To realize coherent x-ray diffraction microscopy with higher spatial resolution, it is necessary to increase the density of x-ray photons illuminated onto the sample. In this study, we developed a coherent x-ray diffraction apparatus with Kirkpatrick-Baez mirror optics. By using mirrors fabricated by elastic emission machining, a high-density coherent x-ray beam was produced. In a demonstration experiment using a silver nanocube as a sample, a high-contrast coherent x-ray diffraction pattern was observed over a wide-q range. This proves that both the density and the degree of coherence of the focused beam were high., AMER INST PHYSICS, 英語 - Element-specific high-resolution diffraction microscopy using focused hard X-ray beam
Takahashi Y, Nishino Y, Tsutsumi R, Zettsu N, Yamauchi K, Ishikawa T, Matsubara E, Diamond Light Source Proceedings,, 1, e136, 2011年 - FELを用いた材料科学現象の超高速コヒーレントイメージングに向けて
西野 吉則, 田中 義人, 松原 英一郎, 放射光, 23, 5, 322, 324, 2010年09月30日
日本放射光学会, 日本語 - EUV SASE‐FEL利用の展開 FELを用いた材料科学現象の超高速コヒーレントイメージングに向けて
西野吉則, 田中義人, 松原英一郎, 放射光, 23, 5, 322, 324, 2010年09月30日
日本語 - 高分解能コヒーレントX線回折顕微法による金属ナノ粒子の三次元電子密度マッピング
高橋幸生, 是津信行, 堤良輔, 山内和人, 西野吉則, 石川哲也, 松原英一郎, 日本金属学会講演概要, 147th, 243, 2010年09月25日
日本語 - X線自由電子レーザー実験用マルチポートCCDの開発 II
亀島敬, 桐原陽一, 初井宇記, 工藤統吾, 小林和生, 堀米利夫, 大沢仁志, 矢橋牧名, 西野吉則, 石川哲也, 日本物理学会講演概要集, 65, 2, 20, 2010年08月18日
日本語 - FeGeの電子状態:軟X線・硬X線光電子分光
稲葉豪志, 大槻匠, CHAINANI A, 松波雅治, 江口律子, 高田恭孝, 中村元彦, 西野吉則, 玉作賢治, 矢橋牧名, 石川哲也, 大浦正樹, 大橋治彦, 仙波泰徳, 金澤直也, 小野瀬佳文, 十倉好紀, SHIN S, 日本物理学会講演概要集, 65, 2, 690, 2010年08月18日
日本語 - Sm0.45Sr0.55MnO3の硬X線・軟X線光電子分光
小島大郎, 小島大郎, 高田恭孝, CHAINANI A, 大槻匠, 松波雅治, 江口律子, 稲葉豪志, 大浦正樹, SHIN S, 西野吉則, 玉作賢治, 矢橋牧名, 仙波泰徳, 大橋治彦, 石川哲也, 富岡泰秀, 十倉好紀, 日本物理学会講演概要集, 65, 2, 691, 2010年08月18日
日本語 - How is a long strand of genomic DNA organized into a chromosome?
MAESHIMA Kazuhiro, NISHINO Yoshinori, ITO Kazuki, IMAMOTO Naoko, ELTSOV Mikhail, ISHIKAWA Tetsuya, 生物物理, 50, Supplement 2, S41-S42, 2010年08月15日
英語 - コヒーレントX線回折を用いたヒト染色体の三次元可視化
西野 吉則, 高橋 幸生, 今本 尚子, 石川 哲也, 前島 一博, 放射光, 23, 2, 81, 87, 2010年03月31日
日本放射光学会, 日本語 - Advanced Kirkpatrick-Baez ミラー光学系の開発
藤井 正輝, 松山 智至, 三村 秀和, 脇岡 敏之, 半田 宗一郎, 木村 隆志, 佐野 泰久, 西野 吉則, 玉作 賢治, 矢橋 牧名, 石川 哲也, 山内 和人, 放射光, 23, 2, 118, 119, 2010年03月31日
日本語 - 硬X線ナノ集光ビーム用波面誤差算出法の開発
木村 隆志, 三村 秀和, 半田 宗一郎, 湯本 博勝, 山川 大輔, 松山 智至, 佐野 泰久, 玉作 賢治, 西野 吉則, 矢橋 牧名, 石川 哲也, 山内 和人, 放射光, 23, 2, 119, 121, 2010年03月31日
日本放射光学会, 日本語 - 高分解X線ナノプローブ顕微鏡を用いた細胞内元素分布イメージング
志村まり, 前島一博, 松山智至, 松浦孝枝, 岡村匡史, 飯田豊, 萩原將太郎, 齋藤彰, 玉作賢治, 西野吉則, 湯本博勝, 三村秀和, 山内和人, 石川哲也, 石坂幸人, 日本薬学会年会要旨集, 130th, 1, 310, 2010年03月05日
日本語 - トキシコメタロミクスの新機軸 元素分析・イメージングと疾患・創薬のインキュベーション 高分解X線ナノプローブ顕微鏡を用いた細胞内元素分布イメージング
志村 まり, 前島 一博, 松山 智至, 松浦 孝枝, 岡村 匡史, 飯田 豊, 萩原 將太郎, 齋藤 彰, 玉作 賢治, 西野 吉則, 湯本 博勝, 三村 秀和, 山内 和人, 石川 哲也, 石坂 幸人, 日本薬学会年会要旨集, 130年会, 1, 310, 310, 2010年03月
(公社)日本薬学会, 日本語 - 硬X線光電子分光によるFe3O4の電子状態研究
田口宗孝, CHAINANI A, 松波雅治, 江口律子, 石田行章, 高田恭孝, 矢橋牧名, 玉作賢治, 西野吉則, 石川哲也, 東堂栄, SHIN S, 日本物理学会講演概要集, 65, 1, 749, 2010年03月01日
日本語 - X線自由電子レーザー実験マルチポートCCDの開発
亀島敬, 初井宇記, 工藤統吾, 堀米利夫, 大沢仁志, 矢橋牧名, 西野吉則, 石川哲也, 日本物理学会講演概要集, 65, 1, 30, 2010年03月01日
日本語 - 24aRC-7 FeGeの電子状態 : 軟X線・硬X線光電子分光(24aRC 光電子分光(超伝導・磁性・強相関),領域5(光物性))
稲葉 豪志, 大槻 匠, Chainani A, 松波 雅治, 江口 律子, 高田 恭孝, 中村 元彦, 西野 吉則, 玉作 賢治, 矢橋 牧名, 石川 哲也, 大浦 正樹, 大橋 治彦, 仙波 泰徳, 金澤 直也, 小野瀬 佳文, 十倉 好紀, 辛 埴, 日本物理学会講演概要集, 65, 0, 2010年
一般社団法人日本物理学会, 日本語 - 23aBE-5 X線自由電子レーザー実験用マルチポートCCDの開発(23aBE 半導体検出器,素粒子実験領域)
亀島 敬, 初井 宇記, 工藤 統吾, 堀米 利夫, 大沢 仁志, 矢橋 牧名, 西野 吉則, 石川 哲也, 日本物理学会講演概要集, 65, 0, 2010年
一般社団法人日本物理学会, 日本語 - 24aRC-10 Sm_<0.45>Sr_<0.55>MnO_3の硬X線・軟X線光電子分光(24aRC 光電子分光(超伝導・磁性・強相関),領域5(光物性))
小島 太郎, 高田 恭孝, Chainani A, 大槻 匠, 松波 雅治, 江口 律子, 稲葉 豪志, 大浦 正樹, 辛 埴, 西野 吉則, 玉作 賢治, 矢橋 牧名, 仙波 泰徳, 大橋 治彦, 石川 哲也, 富岡 泰秀, 十倉 好紀, 日本物理学会講演概要集, 65, 0, 2010年
一般社団法人日本物理学会, 日本語 - 13pSM-6 X線自由電子レーザー実験用マルチポートCCDの開発II(13pSM 素粒子実験領域,宇宙線・宇宙物理領域,実験核物理領域,ビーム物理領域合同 三次元LSI・飛跡検出器・γ/X線検出器・半導体検出器,素粒子実験領域)
亀島 敬, 桐原 陽一, 初井 宇記, 工藤 統吾, 小林 和生, 堀米 利夫, 大沢 仁志, 矢橋 牧名, 西野 吉則, 石川 哲也, 日本物理学会講演概要集, 65, 0, 2010年
一般社団法人日本物理学会, 日本語 - 21pHT-8 放射光や自由電子レーザーを用いたコヒーレント光イメージング(21pHT 領域10,領域9,領域1合同シンポジウム:原子分解能をもつX線・電子線ホログラフィー,領域10(誘電体,格子欠陥,X線・粒子線,フォノン))
西野 吉則, 日本物理学会講演概要集, 65, 0, 2010年
一般社団法人日本物理学会, 日本語 - 21aHK-3 硬X線光電子分光によるFe_3O_4の電子状態研究(21aHK 光電子分光(超伝導・磁性・強相関系)・MCD・X線発光,領域5(光物性))
田口 宗孝, Chainani A, 松波 雅治, 江口 律子, 石田 行章, 高田 恭孝, 矢橋 牧名, 玉作 賢治, 西野 吉則, 石川 哲也, 東堂 栄, 辛 埴, 日本物理学会講演概要集, 65, 0, 2010年
一般社団法人日本物理学会, 日本語 - 21pHT-8 放射光や自由電子レーザーを用いたコヒーレント光イメージング(21pHT 領域10,領域9,領域1合同シンポジウム:原子分解能をもつX線・電子線ホログラフィー,領域1(原子・分子,量子エレクトロニクス,放射線物理))
西野 吉則, 日本物理学会講演概要集, 65, 0, 2010年
一般社団法人日本物理学会, 日本語 - Three‐Dimensional Visualization of a Human Chromosome Using Coherent X‐Ray Diffraction
MAESHIMA Kazuhiro, NISHINO Yoshinori, SPring-8 Research Frontiers 2009, 46, 47, 2010年
英語 - Development of a one-dimensional Wolter mirror for an advanced Kirkpatrick-Baez mirror
S. Matsuyama, T. Wakioka, H. Mimura, T. Kimura, N. Kidani, Y. Sano, Y. Nishino, K. Tamasaku, M. Yabashi, T. Ishikawa, K. Yamauchi, ADVANCES IN X-RAY/EUV OPTICS AND COMPONENTS V, 7802, 780202, 2010年
To realize achromatic full-field hard X-ray microscopy with a resolution better than 100 nm, we studied an imaging system consisting of an elliptical mirror and a hyperbolic mirror. The figure accuracies of the elliptical and hyperbolic mirrors required to obtain diffraction-limited resolution were investigated using a wave-optical simulator, and then elliptical and hyperbolic mirrors were precisely fabricated, following the criterion of the figure accuracies. Experiments to form a demagnified image of a one-dimensional slit installed 45 m upstream were conducted using the imaging system at an X-ray energy of 11.5 keV at BL29XUL of SPring-8. The system could form a demagnified image with the best resolution of 78 nm. In addition, the field of view to obtain a resolution better than 200 nm was 4.2 micron., SPIE-INT SOC OPTICAL ENGINEERING, 英語 - Development of Hard X-ray Imaging Optics with Two Pairs of Elliptical and Hyperbolic Mirrors
S. Matsuyama, M. Fujii, T. Wakioka, H. Mimura, S. Handa, T. Kimura, Y. Nishino, K. Tamasaku, Y. Makina, T. Ishikawa, K. Yamauchi, SRI 2009: THE 10TH INTERNATIONAL CONFERENCE ON SYNCHROTRON RADIATION INSTRUMENTATION, 1234, 267, +, 2010年
To form a magnified hard X-ray image with a 50 nm resolution, we have studied total reflection mirror optics with two pairs of elliptical and hyperbolic mirrors, which is called "Advanced Kirkpatrick-Baez system". A designed optical system has 200x and 300x magnifications in vertical and horizontal directions. Also diffraction limit size in the optical system is 40 nm x 45 nm. We fabricated a pair of elliptical and hyperbolic mirrors for horizontal imaging with a figure accuracy of 2 nm using elastic emission machining (EEM), microstitching interferometry (MSI) and relative-angle-determinable stitching interferometry (RAM). One-dimensional tests for forming a demagnified image of a slit were carried out at an X-ray energy of 11.5 keV at BL29XUL (EH2) of SPring-8. As a result, a shape beam with a FWHM of 78 nm was observed. This demonstrates that we realized one-dimensional Wolter optics that has a spatial resolution of 78 nm., AMER INST PHYSICS, 英語 - KBミラー放射光集光X線を用いた高分解能コヒーレントX線回折顕微法の開発
堤良輔, 高橋幸生, 西野吉則, 久保英人, 榊茂之, 三村秀和, 松山智至, 是津信行, 石川哲也, 松原英一郎, 山内和人, 日本放射光学会年会・放射光科学合同シンポジウム予稿集, 23rd, 133, 2009年12月10日
日本語 - 硬X線ナノ集光ビーム用波面誤差算出法の開発
木村隆志, 三村秀和, 半田宗一郎, 湯本博勝, 山川大輔, 松山智至, 佐野泰久, 玉作賢治, 西野吉則, 矢橋牧名, 石川哲也, 山内和人, 日本放射光学会年会・放射光科学合同シンポジウム予稿集, 23rd, 63, 2009年12月10日
日本語 - Advanced Kirkpatrick‐Baezミラー光学系の開発
藤井正輝, 松山智至, 三村秀和, 脇岡敏之, 半田宗一郎, 木村隆志, 佐野泰久, 西野吉則, 玉作賢治, 矢橋牧名, 石川哲也, 山内和人, 日本放射光学会年会・放射光科学合同シンポジウム予稿集, 23rd, 136, 2009年12月10日
日本語 - 結像型X線顕微鏡のための4枚ミラー反射型結像光学系の開発
松山智至, 藤井正輝, 脇岡敏之, 木谷直隆, 三村秀和, 佐野泰久, 西野吉則, 玉作賢治, 矢橋牧名, 石川哲也, 山内和人, 日本放射光学会年会・放射光科学合同シンポジウム予稿集, 23rd, 104, 2009年12月10日
日本語 - KBミラー集光X線を用いたコヒーレントX線回折顕微法の応用
久保英人, 高橋幸生, 是津信行, 堤良輔, 榊茂之, 西野吉則, 石川哲也, 松原英一郎, 山内和人, 日本放射光学会年会・放射光科学合同シンポジウム予稿集, 23rd, 133, 2009年12月10日
日本語 - Yb化合物の光電子・光学スペクトルにおけるエネルギー損失
松波雅治, CHAINANI A, 田口宗孝, 江口律子, 高田恭孝, 岡村英一, 難波孝夫, 矢橋牧名, 玉作賢治, 西野吉則, 石川哲也, 仙波泰徳, 大橋治彦, 小檜山卓也, 小坂昌史, 海老原孝雄, 辛埴, 日本放射光学会年会・放射光科学合同シンポジウム予稿集, 23rd, 119, 2009年12月10日
日本語 - 高密度X線ナノビーム形成のための並列型Kirkpatrick‐Baezミラー光学系の開発
脇岡敏之, 松山智至, 藤井正輝, 木谷直隆, 三村秀和, 佐野泰久, 西野吉則, 玉作賢治, 矢橋牧名, 石川哲也, 山内和人, 日本放射光学会年会・放射光科学合同シンポジウム予稿集, 23rd, 136, 2009年12月10日
日本語 - パイロクロア酸化物の硬X線・軟X線光電子分光
江口律子, CHAINANI Ashish, 松波雅治, 高田恭孝, 大槻匠, 大浦正樹, 仙波泰徳, 大橋治彦, 辛埴, 矢橋牧名, 西野吉則, 玉作賢治, 石川哲也, 山浦淳一, 広井善二, 日本放射光学会年会・放射光科学合同シンポジウム予稿集, 23rd, 119, 2009年12月10日
日本語 - コヒーレントX線回折によるヒト染色体構造の3次元観察
前島 一博, 西野 吉則, 生物物理, 49, 6, 298, 299, 2009年12月
(一社)日本生物物理学会, 日本語 - 高分解能コヒーレントX線回折顕微法の開発と金ナノケージの電子密度分布観察
堤良輔, 高橋幸生, 是津信行, 久保英人, 山内和人, 西野吉則, 石川哲也, 松原英一郎, 日本金属学会講演概要, 145th, 532, 2009年09月15日
日本語 - コヒーレントX線回折によるナノ構造解析
西野 吉則, 日本結晶学会誌, 51, 4, 239, 244, 2009年08月31日
X-ray crystallography can routinely determine the atomic structure of crystalline materials. The method can be extended to non-crystalline materials by using coherent X-ray diffraction. In X-ray diffraction microscopy, coherent X-ray diffraction patterns are sampled finely enough to satisfy the oversampling condition for solving the phase problem, and the iterative phase retrieval method is used for the sample image reconstruction. Recently, we succeeded in three-dimensional visualization of an unstained human chromosome by X-ray diffraction microscopy. It is the first hard X-ray tomography for cellular organelles. The reconstructed images revealed the internal axial structure, demonstrating an excellent image-contrast of the method., 日本結晶学会, 日本語 - 重い電子系Yb(Al,Fe)B4におけるYb価数のFe置換依存性
大川万里生, 松波雅治, 石坂香子, 江口律子, 田口宗孝, CHAINANI Ashish, 高田恭孝, 矢橋牧名, 玉作賢治, 西野吉則, 石川哲也, 久我健太郎, 堀江直樹, 中辻知, SHIN S, 日本物理学会講演概要集, 64, 2, 563, 2009年08月18日
日本語 - 硬X線光電子分光によるCo:TiO2/LaTiO3二層膜の研究
大槻匠, CHAINANI A, 高田恭孝, 松波雅治, 江口律子, 西野吉則, 玉作賢治, 矢橋牧名, 石川哲也, 長谷川哲也, SHIN S, 日本物理学会講演概要集, 64, 2, 635, 2009年08月18日
日本語 - パイロクロア酸化物Cd2Os2O7及びCd2Re2O7の光電子分光
江口律子, CHAINANI Ashish, 松波雅治, 高田恭孝, 大槻匠, 大浦正樹, 仙波泰徳, 大橋治彦, 辛埴, 矢橋牧名, 西野吉則, 玉作賢治, 石川哲也, 山浦淳一, 広井善二, 日本物理学会講演概要集, 64, 2, 548, 2009年08月18日
日本語 - KBミラー集光放射光X線を用いた高分解能回折顕微法の実現可能性の検討
堤良輔, 高橋幸生, 三村秀和, 久保英人, 山内和人, 西野吉則, 石川哲也, 精密工学会関西地方定期学術講演会講演論文集, 2009, 65, 66, 2009年05月07日
日本語 - YbAl2の硬X線・軟X線光電子分光
松波雅治, CHAINANI A, 江口律子, 田口宗孝, 高田恭孝, 岡村英一, 難波孝夫, 矢橋牧名, 玉作賢治, 西野吉則, 石川哲也, 仙波泰徳, 大橋治彦, 辻井直人, 小檜山卓也, 小坂昌史, SHIN S, 日本物理学会講演概要集, 64, 1, 762, 2009年03月03日
日本語 - 重い電子系YbAlB4の光電子分光:電子構造と価数評価
大川万里生, 松波雅治, 石坂香子, 江口律子, 田口宗孝, CHAINANI Ashish, 高田恭孝, 矢橋牧名, 玉作賢治, 西野吉則, 石川哲也, 久我健太郎, 堀江直樹, 中辻知, SHIN S, 日本物理学会講演概要集, 64, 1, 652, 2009年03月03日
日本語 - 30aVA-5 YbAl_2の硬X線・軟X線光電子分光(30aVA 光電子分光(超電導・強相関・磁性),領域5(光物性))
松波 雅治, Chainani A, 江口 律子, 田口 宗孝, 高田 恭孝, 岡村 英一, 難波 孝夫, 矢橋 牧名, 玉作 賢治, 西野 吉則, 石川 哲也, 仙波 泰徳, 大橋 治彦, 辻井 直人, 小檜山 卓也, 小坂 昌史, 辛 埴, 日本物理学会講演概要集, 64, 0, 2009年
一般社団法人日本物理学会, 日本語 - 30aTD-5 重い電子系YbAlB_4の光電子分光 : 電子構造と価数評価(30aTD Yb化合物,領域8(強相関系:高温超伝導,強相関f電子系など))
大川 万里生, 松波 雅治, 石坂 香子, 江口 律子, 田口 宗孝, Chainani Ashish, 高田 恭孝, 矢橋 牧名, 玉作 賢治, 西野 吉則, 石川 哲也, 久我 健太郎, 堀江 直樹, 中辻 知, 辛 埴, 日本物理学会講演概要集, 64, 0, 2009年
一般社団法人日本物理学会, 日本語 - 27aPS-10 Hard X-ray photoelectron spectroscopy of doped Silicon
Chainani A, 高田 恭孝, 江口 律子, 大槻 匠, 松波 雅治, 西野 吉則, 玉作 賢治, 矢橋 牧名, 高橋 隆, 吉田 博, 石川 哲也, 辛 埴, 日本物理学会講演概要集, 64, 0, 647, 2009年
一般社団法人日本物理学会, 英語 - 26pXA-2 硬X線光電子分光によるCo:TiO_2/LaTiO_3二層膜の研究(光電子分光(表面・薄膜・低次元物質II),領域5,光物性)
大槻 匠, Chainani A, 高田 恭孝, 松波 雅治, 江口 律子, 西野 吉則, 玉作 賢治, 矢橋 牧名, 石川 哲也, 長谷川 哲也, 辛 埴, 日本物理学会講演概要集, 64, 0, 2009年
一般社団法人日本物理学会, 日本語 - 28aRL-5 重い電子系Yb(Al,Fe)B_4におけるYb価数のFe置換依存性(Yb化合物,領域8,強相関系:高温超伝導,強相関f電子系など)
大川 万里夫, 松波 雅治, 石坂 香子, 江口 律子, 田口 宗孝, Chainani Ashish, 高田 恭孝, 矢橋 牧名, 玉作 賢治, 西野 吉則, 石川 哲也, 久我 健太郎, 堀江 直樹, 中辻 知, 辛 埴, 日本物理学会講演概要集, 64, 0, 2009年
一般社団法人日本物理学会, 日本語 - 27pRK-2 パイロクロア酸化物Cd_2Os_2O_7及びCd_2Re_2O_7の光電子分光(パイロクロア,領域8,強相関系:高温超伝導,強相関f電子系など)
江口 律子, Chainani Ashish, 松波 雅治, 高田 恭孝, 大槻 匠, 大浦 正樹, 仙波 泰徳, 大橋 治彦, 辛 埴, 矢橋 牧名, 西野 吉則, 玉作 賢治, 石川 哲也, 山浦 淳一, 広井 善二, 日本物理学会講演概要集, 64, 0, 2009年
一般社団法人日本物理学会, 日本語 - コヒーレントX線回折顕微法によるエレクトロマイグレーションボイド生成過程のその場観察
古川隼人, 高橋幸生, 久保英人, 山内和人, 西野吉則, 石川哲也, 松原英一郎, 日本放射光学会年会・放射光科学合同シンポジウム予稿集, 22nd, 132, 2009年
日本語 - コヒーレントX線回折顕微法によるナノ構造物の電子密度分布定量評価法の開発
久保英人, 高橋幸生, 古川隼人, 山内和人, 西野吉則, 石川哲也, 松原英一郎, 日本放射光学会年会・放射光科学合同シンポジウム予稿集, 22nd, 133, 2009年
日本語 - Advanced Kirkpatrick‐Baezミラー光学系の開発
藤井正輝, 松山智至, 三村秀和, 脇岡敏之, 半田宗一郎, 木村隆志, 佐野泰久, 西野吉則, 玉作賢治, 矢橋牧名, 石川哲也, 山内和人, 日本放射光学会年会・放射光科学合同シンポジウム予稿集, 22nd, 134, 2009年
日本語 - 硬X線微小集光用多層膜ミラーの開発
半田宗一郎, 木村隆志, 三村秀和, 湯本博勝, 松山智至, 佐野泰久, 玉作賢治, 西野吉則, 矢橋牧名, 石川哲也, 山内和人, 日本放射光学会年会・放射光科学合同シンポジウム予稿集, 22nd, 74, 2009年
日本語 - K‐Bミラー集光コヒーレントX線回折顕微法の検討
堤良輔, 高橋幸生, 三村秀和, 西野吉則, 古川隼人, 久保英人, 石川哲也, 山内和人, 日本放射光学会年会・放射光科学合同シンポジウム予稿集, 22nd, 133, 2009年
日本語 - 硬X線ナノビーム用波面補正ミラーの開発
木村隆志, 半田宗一郎, 三村秀和, 湯本秀和, 山川大輔, 松山智至, 佐野泰久, 玉作賢治, 西野吉則, 矢橋牧名, 石川哲也, 山内和人, 日本放射光学会年会・放射光科学合同シンポジウム予稿集, 22nd, 74, 2009年
日本語 - フレネルミラーを用いたX線の可干渉性の評価
山川大輔, 三村秀和, 木村隆志, 松山智至, 佐野泰久, 玉作賢治, 西野吉則, 矢橋牧名, 石川哲也, 山内和人, 日本放射光学会年会・放射光科学合同シンポジウム予稿集, 22nd, 74, 2009年
日本語 - 高度好熱菌丸ごと一匹プロジェクト 走査型X線顕微鏡を用いた細胞イメージング
松山智至, 志村まり, 藤井正輝, 脇岡敏之, 三村秀和, 佐野泰久, 矢橋牧名, 西野吉則, 玉作賢治, 石川哲也, 山内和人, 高度好熱菌丸ごと一匹プロジェクト 第8回連携研究会 理研シンポジウム 平成21年, 9, 10, 2009年
日本語 - 高度好熱菌丸ごと一匹プロジェクト コヒーレントX線回折を用いたヒト染色体の三次元可視化
西野吉則, 高橋幸生, 今本尚子, 石川哲也, 前島一博, 高度好熱菌丸ごと一匹プロジェクト 第8回連携研究会 理研シンポジウム 平成21年, 8, 2009年
日本語 - コヒーレントX線回折顕微法による金属材料の電子密度分布定量評価法の開発
久保英人, 高橋幸生, 古川隼人, 山内和人, 西野吉則, 石川哲也, 松原英一郎, 日本金属学会講演概要, 143rd, 486, 2008年09月23日
日本語 - コヒーレントX線回折顕微法によるCu細線のボイド生成過程のその場観察
古川隼人, 高橋幸生, 久保英人, 山内和人, 西野吉則, 石川哲也, 松原英一郎, 日本金属学会講演概要, 143rd, 247, 2008年09月23日
日本語 - XFEL大型集光ミラーの高能率・高精度加工法の開発
森田 晋也, 三村 秀和, 林 偉民, 上原 嘉宏, 山形 豊, 木村 隆志, 山川 大輔, 湯本 博勝, 松山 智至, 西野 吉則, 精密工学会学術講演会講演論文集, 2008, 0, 427, 428, 2008年09月01日
本研究の目的は、ELID研削およびEEMにより、X線の回折限界集光が可能な大型X線集光ミラーを作製し、将来建設が予定されているX線自由電子レーザーのための集光システムを開発することである。本発表では、ELID研削工程において機上計測と離散的形状表現を用いて高精度かつ高能率な形状創成手法について述べる。, 公益社団法人 精密工学会 - K・Bミラー光学系によるXFELナノ集光システムの開発―大型X線集光ミラーの集光特性の評価―
三村秀和, 森田晋也, 木村隆志, 山川大輔, LIN W, 上原嘉宏, 松山智至, 湯本博勝, 大橋治彦, 西野吉則, 玉作賢治, 矢橋牧名, 石川哲也, 大森整, 山内和人, 精密工学会大会学術講演会講演論文集, 2008, ROMBUNNO.F18, 2008年09月01日
日本語 - Hard X‐ray Photoelectron Spectroscopy of Hg2Ru2O7 and Tl2Ru2O7
CHAINANI A, YAMAMOTO Ayako, MATSUNAMI Masaharu, EGUCHI Ritsuko, TAGUCHI Munetaka, TAKATA Yasutaka, YABASHI Makina, NISHINO Yoshinori, TAMASAKU Kenji, ISHIKAWA Tetsuya, TAKAGI Hidenori, SHIN Shik, 日本物理学会講演概要集, 63, 2, 478, 2008年08月25日
英語 - X線磁気回折のための斜め45度直線偏光制御技術の開発
酒井創一朗, 大隅寛幸, 森田健士, 米須尚, 有馬孝尚, 西野吉則, 玉作賢治, 田中義人, 石川哲也, 高田昌樹, 日本物理学会講演概要集, 63, 2, 431, 2008年08月25日
日本語 - Yb2+の系におけるX線・軟X線光電子分光
松波雅治, 田口宗孝, 江口律子, 石田行章, CHAINANI A, 高田恭孝, 矢橋牧名, 玉作賢治, 西野吉則, 石川哲也, 仙波泰徳, 大橋治彦, 岡村英一, 難波孝夫, 辻井直人, 落合明, 辛埴, 日本物理学会講演概要集, 63, 2, 512, 2008年08月25日
日本語 - 元素識別可能なコヒーレントX線回折顕微法の開発
久保英人, 高僑幸生, 古川隼人, 山内和人, 松原英一郎, 石川哲也, 西野吉則, 精密工学会関西地方定期学術講演会講演論文集, 2008, 17, 18, 2008年07月22日
日本語 - K‐BミラーによるX線自由電子レーザー集光システムの開発―大型X線集光ミラーの作製―
山川大輔, 木村隆志, 三村秀和, 松山智至, 山内和人, 森田晋也, 林偉民, 上原嘉宏, 大森整, 西野吉則, 玉作賢治, 矢橋牧名, 石川哲也, 湯本博勝, 大橋治彦, 精密工学会関西地方定期学術講演会講演論文集, 2008, 15, 16, 2008年07月22日
日本語 - ELID・EEMによるXFEL大型集光ミラーの作製
森田晋也, 三村秀和, LIN Weimin, 上原嘉宏, 木村隆志, 山川大輔, 湯本博勝, 石川哲也, 山内和人, 大森整, 松山智至, 西野吉則, 玉作賢治, 矢橋牧名, 大橋治彦, 精密工学会大会学術講演会講演論文集, 2008, C34, 2008年03月03日
日本語 - コヒーレントX線回折顕微法の材料科学応用に関する取組み
高橋幸生, 古川隼人, 久保英人, 山内和人, 西野吉則, 石川哲也, 松原英一郎, KEK Proceedings, 2007-18, 27, 30, 2008年03月
日本語 - X線磁気回折のための偏光回転技術の開発とLS分離への応用
大隅寛幸, 酒井創一朗, 森田健士, 米須尚, 有馬孝尚, 高田昌樹, 西野吉則, 玉作賢治, 石川哲也, 日本物理学会講演概要集, 63, 1, 423, 2008年02月29日
日本語 - Yb2+の系における硬X線光電子分光
松波雅治, 田口宗孝, 江口律子, 石田行章, CHAINANI A, 高田恭孝, 矢橋牧名, 玉作賢治, 西野吉則, 石川哲也, 岡村英一, 難波孝夫, 落合明, SHIN S, 日本物理学会講演概要集, 63, 1, 724, 2008年02月29日
日本語 - 充填型ホイスラー合金Co2MnGeの電子状態
宮本幸治, 木村昭夫, 伊折数幸, 坂本和昭, 井野明洋, 島田賢也, 有田将司, 仲武昌史, QIAO S, 生天目博文, 谷口雅樹, 玉作賢治, 西野吉則, 三輪大五, 小畠雅明, 石川哲也, 池永英司, 矢橋牧名, 小林啓介, 斉藤祐児, 土谷浩一, KEK Proceedings, 2007-14, 22, 2008年02月
日本語 - Ｋ・Ｂミラー光学系によるＸＦＥＬナノ集光システムの開発
三村 秀和, 森田 晋也, 木村 隆志, 山川 大輔, 林 偉民, 上原 嘉宏, 湯本 博勝, 松山 智至, 西野 吉則, 玉作 賢治, 精密工学会学術講演会講演論文集, 2008, 0, 425, 426, 2008年
本研究の目的は、ELID研削およびEEMにより、X線の回折限界集光が可能な大型X線集光ミラーを作製し、将来建設が予定されているX線自由電子レーザーのための集光システムを開発することである。本発表では、SPring-8でのX線集光特性の評価方法、評価結果について述べ、最後に作製されたX線ミラーの形状精度に関して考察する。, 公益社団法人 精密工学会 - 21aPS-83 Yb_<2+>の系における硬X線・軟X線光電子分光(21aPS 領域8ポスターセッション(f電子系等および低温),領域8(強相関系:高温超伝導,強相関f電子系など))
松波 雅治, 田口 宗孝, 江口 律子, 石田 行章, Chainani A, 高田 恭孝, 矢橋 牧名, 玉作 賢治, 西野 吉則, 石川 哲也, 仙波 泰徳, 大橋 治彦, 岡村 英一, 難波 孝夫, 辻井 直人, 落合 明, 辛 埴, 日本物理学会講演概要集, 63, 0, 2008年
一般社団法人日本物理学会, 日本語 - 20pPSB-35 Hard X-ray Photoelectron Spectroscopy of Hg_2Ru_2O_7 and Tl_2Ru_2O_7
チャイナニ アシシ, 山本 文子, 松波 雅治, 江口 律子, 田口 宗孝, 高田 恭孝, 矢橋 牧名, 西野 吉則, 玉作 賢治, 石川 哲也, 高木 英典, 辛 埴, 日本物理学会講演概要集, 63, 0, 2008年
一般社団法人日本物理学会, 英語 - 23aQG-8 X線磁気回折のための斜め45度直線偏光制御技術の開発(23aQG 磁気共鳴一般・実験技術開発・磁性一般,領域3(磁性,磁気共鳴))
酒井 創一朗, 大隅 寛幸, 森田 健士, 米須 尚, 有馬 孝尚, 西野 吉則, 玉作 賢治, 田中 義人, 石川 哲也, 高田 昌樹, 日本物理学会講演概要集, 63, 0, 2008年
一般社団法人日本物理学会, 日本語 - 24pYH-9 Yb^<2+>の系における硬X線光電子分光(光電子分光(表面・超薄膜・低次元物質),領域5,半導体,メゾスコピック系・局在)
松波 雅治, 田口 宗孝, 江口 律子, 石田 行章, Chainani A, 高田 恭孝, 矢橋 牧名, 玉作 賢治, 西野 吉則, 石川 哲也, 岡村 英一, 難波 孝夫, 落合 明, 辛 埴, 日本物理学会講演概要集, 63, 0, 2008年
1, 一般社団法人日本物理学会, 日本語 - 23aWL-3 X線磁気回折のための偏光回転技術の開発とLS分離への応用(23aWL 磁性共鳴一般,実験技術開発,磁性一般,領域3(磁性,磁気共鳴))
大隅 寛幸, 酒井 創一朗, 森田 健士, 米須 尚, 有馬 孝尚, 高田 昌樹, 西野 吉則, 玉作 賢治, 石川 哲也, 日本物理学会講演概要集, 63, 0, 2008年
一般社団法人日本物理学会, 日本語 - SPring‐8 Research Frontiers 2007 Scientific Frontiers MATERIALS SCIENCE: STRUCTURE Mesoscopic Structure Analysis of Metallic Materials by Coherent X‐ray Diffraction Microscopy
TAKAHASHI Yukio, NISHINO Yoshinori, ISHIKAWA Tetsuya, MATSUBARA Eiichiro, SPring-8 Research Frontiers 2007, 70, 71, 2008年
英語 - 高度好熱菌丸ごと一匹プロジェクト 硬X線ナノビームを用いた細胞イメージング
松山智至, 藤井正輝, 三村秀和, 脇岡敏之, 志村まり, 西野吉則, 玉作賢治, 石川哲也, 山内和人, 高度好熱菌丸ごと一匹プロジェクト 第7回連携研究会 理研シンポジウム 平成20年, 18, 2008年
日本語 - Cu細線のコヒーレントX線回折測定
古川隼人, 高橋幸生, 久保英人, 西野吉則, 山内和人, 石川哲也, 松原英一郎, 日本放射光学会年会・放射光科学合同シンポジウム予稿集, 21st, 84, 2007年12月20日
日本語 - 元素識別コヒーレントX線回折顕微法の開発
久保英人, 高橋幸生, 古川隼人, 西野吉則, 山内和人, 石川哲也, 松原英一郎, 日本放射光学会年会・放射光科学合同シンポジウム予稿集, 21st, 84, 2007年12月20日
日本語 - KBミラー光学系によるXFELナノ集光システムの開発―400mmX線集光ミラーの作製と評価―
三村秀和, 森田晋也, 木村隆志, 山川大輔, 林偉民, 上原嘉宏, 湯本博勝, 松山智至, 西野吉則, 玉作賢治, 大橋治彦, 矢橋牧名, 石川哲也, 大森整, 山内和人, 日本放射光学会年会・放射光科学合同シンポジウム予稿集, 21st, 97, 2007年12月20日
日本語 - 硬X線反射用多層膜ミラーの開発
半田宗一郎, 玉作賢治, 三村秀和, 湯本博勝, 木村隆志, 松山智至, 佐野泰久, 西野吉則, 矢橋牧名, 石川哲也, 山内和人, 日本放射光学会年会・放射光科学合同シンポジウム予稿集, 21st, 66, 2007年12月20日
日本語 - 硬X線集光ミラーのためのスティッチング干渉法に基づく高精度表面形状計測法の開発
湯本博勝, 三村秀和, 木村隆志, 半田宗一郎, 松山智至, 佐野泰久, 西野吉則, 玉作賢治, 矢橋牧名, 石川哲也, 山内和人, 日本放射光学会年会・放射光科学合同シンポジウム予稿集, 21st, 66, 2007年12月20日
日本語 - KBミラー光光学系におけるX線集光状態維持システム
山川大輔, 三村秀和, 木村隆志, 湯本博勝, 松山智至, 佐野泰久, 玉作賢治, 西野吉則, 矢橋牧名, 石川哲也, 山内和人, 日本放射光学会年会・放射光科学合同シンポジウム予稿集, 21st, 132, 2007年12月20日
日本語 - Kirkpatrick‐Baezミラー光学系を搭載した走査型蛍光X線顕微鏡による細胞内元素分布の観察
藤井正輝, 松山智至, 志村まり, 三村秀和, 前島一博, 片岸恵子, 湯本博勝, 半田宗一郎, 佐野泰久, 西野吉則, 玉作賢治, 矢橋牧名, 石川哲也, 山内和人, 日本放射光学会年会・放射光科学合同シンポジウム予稿集, 21st, 86, 2007年12月20日
日本語 - YbSの硬X線光電子分光
松波雅治, 田口宗孝, 江口律子, 石田行章, CHAINANI A, 高田恭孝, 矢橋牧名, 玉作賢治, 西野吉則, 石川哲也, 岡村英一, 難波孝夫, 落合明, 辛埴, 日本放射光学会年会・放射光科学合同シンポジウム予稿集, 21st, 100, 2007年12月20日
日本語 - コヒーレントX線回折顕微法によるナノスケール内部構造の3Dイメージング
西野 吉則, 高橋 幸生, 石川 哲也, 松原 英一郎, まてりあ : 日本金属学会会報, 46, 12, 827, 2007年12月01日
公益社団法人 日本金属学会, 日本語 - コヒーレントX線回折顕微法の空間分解能向上のための新たな試み
高橋幸生, 西野吉則, 古川隼人, 久保英人, 山内和人, 松原英一郎, 石川哲也, 日本金属学会講演概要, 141st, 423, 2007年09月19日
日本語 - コヒーレントX線回折顕微法による物質構造変化の動画化に向けた基礎研究
古川隼人, 高橋幸生, 久保英人, 西野吉則, 山内和人, 石川哲也, 松原英一郎, 日本金属学会講演概要, 141st, 466, 2007年09月19日
日本語 - 元素識別コヒーレントX線回折顕微法の開発
久保英人, 高橋幸生, 古川隼人, 西野吉則, 山内和人, 石川哲也, 松原英一郎, 日本金属学会講演概要, 141st, 466, 2007年09月19日
日本語 - Characterization of beryllium and CVD diamond for synchrotron radiation beamline windows and x-ray beam monitor
S. Goto, S. Takahashi, T. Kudo, M. Yabashi, K. Tamasaku, Y. Nishino, T. Ishikawa, Advances in X-Ray/EUV Optics and Components II, 6705, 2007年09月13日
We characterized beryllium foils and CVD diamond films/plates for synchrotron radiation beamline windows and x-ray beam monitor especially in coherent x-ray applications. Sub-micron-resolution imaging with a zooming tube was performed using spatially coherent x-rays at 1-km beamline 29XU of SPring-8. We found that the speckles observed in the conventional powder and ingot beryllium foils were due to voids with diameter of several to ten-several microns. The physical vapor deposition (PVD) eliminated the voids and the PVD beryllium showed the best performance with no speckles. We characterized a commercially available polycrystalline CVD diamond window and CVD films as well as beryllium foils. Polished thin diamond film showed rather uniform transmission image. We found dark spots at in-line image due to Bragg diffraction from grains for thicker CVD diamond window., SPIE, 英語 - クライオ走査型蛍光X線顕微鏡による急速凍結された細胞の元素分布測定
片岸恵子, 松山智至, 志村まり, 三村秀和, 湯本博勝, 半田宗一郎, 木村隆志, 佐野泰久, 西野吉則, 玉作賢治, 矢橋牧名, 石川哲也, 山内和人, 応用物理学会学術講演会講演予稿集, 68th, 3, 1313, 2007年09月04日
日本語 - 超高精度ミラーによる硬X線ナノビーム形成とその応用
三村秀和, 松山智至, 湯本博勝, 半田宗一郎, 片岸恵子, 木村隆志, 佐野泰久, 山村和也, 稲垣耕司, 玉作賢治, 西野吉則, 矢橋牧名, 石川哲也, 山内和人, 日本物理学会講演概要集, 62, 2, 989, 2007年08月21日
日本語 - Study of adsorption states for lubricant molecule using hard X-ray photoemission spectroscopy
E. Ikenaga, J. J. Kim, M. Kobata, D. Miwa, Y. Nishino, A. Wakabayashi, Y. Sakane, K. Tamasaku, T. Ishikawa, S. Komiya, K. Kobayashi, JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 156, LXXXIII, LXXXIII, 2007年05月
ELSEVIER SCIENCE BV, 英語, 研究発表ペーパー・要旨（国際会議） - Electronic structure of 3d(1) configuration vanadium oxides studied by soft X-ray and hard X-ray photoemission spectroscopy
R. Eguchi, M. Taguchi, K. Horiba, M. Matsunami, K. Yamamoto, Y. Takata, A. Chainani, M. Yabashi, D. Miwa, Y. Nishino, K. Tamasaku, T. Ishikawa, Y. Senba, H. Ohashi, I. H. Inoue, Y. Muraoka, Z. Hiroi, S. Shin, JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 156, XCVII, XCVIII, 2007年05月
ELSEVIER SCIENCE BV, 英語, 研究発表ペーパー・要旨（国際会議） - 硬X線光電子分光を用いたFe3-xMxO4(M=Zn,Mn)薄膜の電子構造評価
鷹尾伏純一, 石川瑞恵, 佐藤一成, 田中秀和, 川合知二, 上田茂典, KIM J.‐J, 小畠雅明, 池永英司, 小林啓介, 西野吉則, 三論大吾, 玉作賢治, 応用物理学関係連合講演会講演予稿集, 54th, 2, 655, 2007年03月27日
日本語 - Sensitive Depiction of Biomedical Tissue by Refraction Based Computed Tomography Using Synchrotron Radiation
E. Hashimoto, A. Maksimenko, H. Sugiyama, Keiichi Hirano, K. Hyodo, D. Shimao, Y. Nishino, T. Ishikawa, T. Yuasa, M. Ando, WORLD CONGRESS ON MEDICAL PHYSICS AND BIOMEDICAL ENGINEERING 2006, VOL 14, PTS 1-6, 14, 1376, +, 2007年
We applied the recently developed X-ray refraction based computed tomography to a biomedical object. The algorithm used in this study to reconstruct CT images has been invented in our group. The X-ray data was acquired by DEI (diffraction enhanced imaging) which comprises a double crystal arrangement of highly perfect silicon crystals.
The ability of Refraction Based contrast CT to depict lung disease was tested by observing human lung cancer with synchrotron X-rays. Reconstructed images of lung cancer show much detail than absorption-based CT., SPRINGER-VERLAG BERLIN, 英語 - 22pTC-2 コヒーレントX線による回折顕微法(領域10シンポジウム主題:X線・電子線による回折イメージングの最前線,領域10,誘電体,格子欠陥,X線・粒子線,フォノン物性)
西野 吉則, 日本物理学会講演概要集, 62, 0, 2007年
一般社団法人日本物理学会, 日本語 - 22pTC-3 超高精度ミラーによる硬X線ナノビーム形成とその応用(領域10シンポジウム主題:X線・電子線による回折イメージングの最前線,領域10,誘電体,格子欠陥,X線・粒子線,フォノン物性)
三村 秀和, 松山 智至, 湯本 博勝, 半田 宗一郎, 片岸 恵子, 木村 隆志, 佐野 泰久, 山村 和也, 稲垣 耕司, 玉作 賢治, 西野 吉則, 矢橋 牧名, 石川 哲也, 山内 和人, 日本物理学会講演概要集, 62, 0, 2007年
一般社団法人日本物理学会, 日本語 - 18pZA-9 (La,Ba)MnO_3の硬X線光電子分光 : 光電子スペクトルと磁性(光電子分光(超伝導体・強相関系),領域5,光物性)
上田 茂典, 田中 秀和, 金 正鎮, 小畠 雅明, 池永 英岡, 矢橋 牧名, 西野 吉則, 三輸 大五, 玉作 賢治, 石川 哲也, 川合 知二, 小林 啓介, 日本物理学会講演概要集, 62, 0, 2007年
一般社団法人日本物理学会, 日本語 - 19pWG-3 LaAlO_3/LaTiO_3界面の光電子分光(19pWG Ti系,領域8(強相関系:高温超伝導,強相関f電子系など))
滝沢 優, 和達 大樹, Hassink G.W.J, 高田 恭孝, 堀場 弘司, 松波 雅治, 辛 埴, 矢橋 牧名, 玉作 賢治, 西野 吉則, 石川 哲也, 須崎 友文, x G, 藤森 淳, Hwang H.Y, Blank D.H.A, 日本物理学会講演概要集, 62, 0, 2007年
一般社団法人日本物理学会, 日本語 - Hard X‐ray Focusing less than 50nm for Nanoscopy/spectroscopy
YAMAUCHI Kazuto, MIMURA Hidekazu, MATSUYAMA Satoshi, YUMOTO Hirokatsu, HANDA Soichiro, YAMAMURA Kazuya, SANO Yasuhisa, ENDO Katsuyoshi, MORI Yuzo, NISHINO Yoshinori, TAMASAKU Kenji, YABASHI Makina, ISHIKAWA Tetsuya, AIP Conference Proceedings, 879, Pt.1, 786, +, 2007年
X-ray focusing using a Kirkpatrick-Baez (KB) setup with two total reflection mirrors is a promising method, allowing highly efficient and energy-tunable focusing. Fabricated mirrors having a figure accuracy of 1 nm peak-to-valley height gave ideal diffraction-limited focusing of hard X-rays. The focal size, defined as the full width at half maximum of the intensity profile, was 36 run x 48 nm at an X-ray energy of 15 keV. Fluorescence X-ray microscopy with KB mirrors was also developed, targeting cell biological applications. The distribution of various elements in a single cell was successfully observed with high resolution. The developed microscopy is already used for various applications in the medical field. Our next main project is the realization of sub-10-nm-level hard X-ray focusing. At-wavelength metrology is being developed, in which a phase-retrieval simulator is coded for the determination of phase errors on mirror surfaces from only the intensity profiles of a focused beam., AMER INST PHYSICS, 英語 - High Resolution Hard X‐ray Photoemission Spectroscopy at SPring‐8: Basic Performance and Characterization
TAKATA Yasutaka, HORIBA Koji, MATSUNAMI Masaharu, SHIN Shik, YABASHI Makina, TAMASAKU Kenji, NISHINO Yoshinori, MIWA Daigo, ISIKAWA Tetsuya, IKENAGA Eiji, KOBAYASHI Keisuke, ARITA Masashi, SHIMADA Kenya, NAMATAME Hirofumi, TANIGUCHI Masaki, NOHIRA Hiroshi, HATTORI Takeo, SOEDERGREN Sven, WANNBERG Bjoern, AIP Conference Proceedings, 879, Pt.2, 1597, +, 2007年
Photoemission Spectroscopy (PES) is a powerful method to investigate electronic structure of materials. However, conventional vacuum ultraviolet (VUV) and soft x-ray (SX) PES is surface sensitive because of the short inelastic-mean-free-paths of photoelectrons. This requires us to prepare clean surface and sometimes obscures intrinsic bulk states. In order to realize bulk-sensitive or surface-insensitive PES, we have developed hard x-ray (HX) PES using high-brilliance synchrotron radiation at BL29XU in SPring-8. Large probing depth of high energy photoelectrons enables us to probe intrinsic bulk states almost free from surface condition. A combination of x-ray optics and an electron energy analyzer dedicated for HX-PES achieved the total instrumental energy resolution of 63 and 55 meV (FWHM) at 5.95 and 7.94 keV, respectively. A special arrangement of an analyzer and a sample was employed and increased photoelectron intensity drastically. We describe present performance of our apparatus and characterize HX-PES by showing typical spectra., AMER INST PHYSICS, 英語 - Fabrication of X‐ray Mirror for Hard X‐ray Diffraction Limited Nanofocusing
YUMOTO Hirokatsu, MIMURA Hidekazu, MATSUYAMA Satoshi, HANDA Soichiro, SHIBATANI Akihiko, KATAGISHI Keiko, YAMAMURA Kazuya, SANO Yasuhisa, ENDO Katsuyoshi, MORI Yuzo, YABASHI Makina, NISHINO Yoshinori, TAMASAKU Kenji, ISHIKAWA Tetsuya, YAMAUCHI Kazuto, AIP Conference Proceedings, 879, Pt.1, 967, +, 2007年
We designed, fabricated and evaluated a total-reflection mirror having a designed focal size of 28 mu at 15keV. Line-focus tests on the fabricated mirror were carried out at the 1-km-long beamline (BL29XUL) of SPring-8. Nearly diffraction-limited performance with a full width at half maximum spot size of 30 nm was realized at 15 keV. We are planning to fabricate multilayer-coated mirror for realizing sub-10-nm focusing in hard x-ray region. We suggest a novel method of at-wavelength metrology. Wave-front error on the mirror surface can be estimated by a phase retrieval method using the intensity profile around the focal point. By correcting the estimated wave-front errors, sub-10-nm focusing is potentially feasible., AMER INST PHYSICS, 英語 - Evaluation of In‐Vacuum Imaging Plate Detector for X‐Ray Diffraction Microscopy
NISHINO Yoshinori, TAKAHASHI Yukio, YAMAMOTO Masaki, ISHIKAWA Tetsuya, AIP Conference Proceedings, 879, Pt.2, 1376, +, 2007年
We performed evaluation tests of a newly developed in-vacuum imaging plate (IP) detector for x-ray diffraction microscopy. EP detectors have advantages over direct x-ray detection charge-coupled device (CCD) detectors, which have been commonly used in x-ray diffraction nticroscopy experiments, in the capabilities for a high photon count and for a wide area. The detector system contains two EPs to make measurement efficient by recording data with the one while reading or erasing the other. We compared speckled diffraction patterns of single particles taken with the IP and a direct x-ray detection CCD. The IP was inferior to the CCD in spatial resolution and in signal-to-noise ratio at a low photon count., AMER INST PHYSICS, 英語 - Monochromator Stabilization System at SPring‐8
KUDO Togo, TANIDA Hajime, INOUE Shinobu, HIRONO Toko, FURUKAKWA Yukito, NISHINO Yoshinori, SUZUKI Motohiro, ISHIKAWA Tetsuya, AIP Conference Proceedings, 879, Pt.1, 954, +, 2007年
A monochromator stabilization system with a semi-automatic tuning procedure has been developed. The system comprises an X-ray beam position/intensity monitor, a control electronics unit, a computer program that operates on a personal computer or workstation, a piezo translator attached to the first crystal of a double crystal monochromator, and a phase-sensitive detector as an optional component. The system suppressed the fluctuations of the photon beam intensity and the beam position by similar to 0.1% and similar to 1 mu m, respectively, at the sample locations in the beamlines of SPring-8 with a frequency of less than 10 Hz. The system with the phase-sensitive detector holds the peak of the rocking curve of the double crystal monochromator, which is effective in reducing the time required to perform the energy scan measurement., AMER INST PHYSICS, 英語 - Development of a Scanning X‐ray Fluorescence Microscope Using Size‐Controllable Focused X‐ray Beam from 50 to 1500nm
MATSUYAMA Satoshi, MIMURA Hidekazu, YUMOTO Hirokatsu, KATAGISHI Keiko, HANDA Soichiro, SHIBATANI Akihiko, SANO Yasuhisa, YAMAMURA Kazuya, ENDO Katsuyoshi, MORI Yuzo, NISHINO Yoshinori, TAMASAKU Kenji, YABASHI Makina, ISHIKAWA Tetsuya, YAMAUCHI Kazuto, AIP Conference Proceedings, 879, Pt.2, 1325, +, 2007年
In scanning X-ray microscopy, focused beam intensity and size are very important from the viewpoints of improvements of various performances such as sensitivity and spatial resolution. The K-B mirror optical system is considered to be the most promising method for hard X-ray focusing, allowing highly efficient and energy-tunable focusing. We developed focusing optical system using K-B mirrors where the focused beam size is controllable within the range of 50 - 1500 nm. The focused beam size and beam intensity can be adjusted by changing the source size, although beam intensity and size are in a trade-off relationship. This controllability provides convenience for microscopy application. Diffraction limited focal size is also achieved by setting the source size to 10 mu m. Intracellular elemental mappings at the single-cell level were performed to demonstrate the performance of the scanning X-ray fluorescence microscope equipped with the optical system at the BL29XUL of SPring-8. We will show magnified elemental images with spatial resolution of similar to 70 nm., AMER INST PHYSICS, 英語 - 肝癌モデルラットを用いた細胞の元素分析
志村まり, 前島一博, 鈴木美成, 松山智至, 岡村匡史, 片岸恵子, 飯田豊, 宮澤雅之, 玉作賢治, 西野吉則, 矢橋牧名, 湯本博勝, 三村秀和, 今本尚子, 石坂幸人, 山内和人, 石川哲也, 生化学, 4P-0924, 2007年
日本語 - At-wavelength形状計測法による硬X線ナノ集光鏡の開発
三村 秀和, 湯本 博勝, 半田 宗一郎, 松山 智至, 佐野 泰久, 西野 吉則, 玉作 賢治, 矢橋 牧名, 石川 哲也, 山内 和人, 精密工学会学術講演会講演論文集, 2006, 0, 207, 208, 2006年09月04日
硬X線集光ミラーで理想的な回折限界集光を実現するためには、サブナノメートルの形状精度がミラー表面に必要である。本研究グループでは、これを達成するためにコヒーレント硬X線を用いた、位相回復法に基づくミラー形状決定法を提案している。これは、集光強度プロファイルのみからミラー表面上の形状誤差を求めるものである。本発表では、本計測法の原理と実施例について報告する。, 公益社団法人 精密工学会 - 走査型蛍光X線顕微鏡を用いた細胞内元素分布の測定
片岸恵子, 松山智至, 志村まり, 三村秀和, 湯本博勝, 半田宗一郎, 芝谷昭彦, 佐野泰久, 西野吉則, 玉作賢治, 矢橋牧名, 石川哲也, 山内和人, 応用物理学会学術講演会講演予稿集, 67th, 3, 1183, 2006年08月29日
日本語 - 高分解能硬X線顕微鏡のためのミラーマニピュレータの開発 : 硬X線領域における50nm以下の回折限界集光の実現
松山 智至, 三村 秀和, 湯本 博勝, 原 英之, 山村 和也, 佐野 泰久, 西野 吉則, 玉作 賢治, 矢橋 牧名, 石川 哲也, 山内 和人, 精密工学会誌論文集, 72, 7, 884, 888, 2006年07月05日
To develop hard X-ray microscopy with high spatial resolution, development of focusing optical system is the most important. Kirkpatrick and Baez mirrors are promising focusing devices for X-ray due to their capability of highly efficient and energy-tunable focusing. However, it is difficult to adjust the alignment of two mirrors precisely in a short time because the mirrors have a multi-degree-of-freedom that should be adjusted. To align mirrors precisely and rapidly, relationships between mirror-positioning errors and focal sizes were investigated using two types of simulators: a ray-trace simulator and a wave-optical simulator. On the basis of the results, a mirror manipulator was developed achieving optimum K-B mirrors setup. Using the manipulator, hard-X-ray diffraction- limited focusing was realized with a size less than 50nm at 15keV at 1km long beamline of SPring-8., 公益社団法人精密工学会, 日本語 - 走査型蛍光X線顕微鏡を用いた細胞内元素分布の測定
片岸恵子, 松山智至, 三村秀和, 湯本博勝, 山村和也, 佐野泰久, 遠藤勝義, 森勇蔵, 西野吉則, 玉作賢治, 矢橋牧名, 石川哲也, 山内和人, 応用物理学関係連合講演会講演予稿集, 53rd, 2, 811, 2006年03月22日
日本語 - 光電子分光によるLaAlO3/LaVO3量子井戸構造の電子状態観測 2
和達大樹, 堀田育志, 滝沢優, 藤森淳, 椋木康滋, 須崎友文, HWANG Harold Y, 高田恭孝, 堀場弘司, 松波雅治, SHIN S, 矢橋牧名, 玉作賢治, 西野吉則, 三輪大五, 石川哲也, 応用物理学関係連合講演会講演予稿集, 53rd, 2, 645, 2006年03月22日
日本語 - 超高精度X線ミラーの作製とコヒーレントX線による評価
三村 秀和, 湯本 博勝, 松山 智至, 山村 和也, 佐野 泰久, 遠藤 勝義, 森 勇藏, 玉作 賢治, 矢橋 牧名, 西野 吉則, 精密工学会学術講演会講演論文集, 2006, 0, 233, 234, 2006年03月01日
本研究の目的は、コヒーレント硬X線光源に対応した超高精度X線ミラーの完成にある。SPring–8において、形状精度0.1nm(RMS)レベルに作製したミラーの評価を行った結果、平坦ミラーでは、均一な強度分布をもつ全反射光を実現し、集光ミラーでは、15keVにおいて36nm×48nmの世界最小のナノX線ビームを実現した。, 公益社団法人 精密工学会 - At-wavelength figure metrology of total reflection mirrors in hard x-ray region
Hirokatsu Yumoto, Flidekazu Mimura, Satoshi Matsuyama, Soichiro Handa, Akihiko Shibatani, Keiko Katagishi, Yasuhisa Sano, Makina Yabashi, Yoshinori Nishino, Kenji Tamasaku, Tetsuya Ishikawa, Kazuto Yamauchi, ADVANCES IN X-RAY/EUV OPTICS, COMPONENTS, AND APPLICATIONS, 6317, 2006年
We realized nearly diffraction-limited performance with a FWHM focal spot size of 25 nm at an x-ray energy of 15 keV at SPring-8. We explain performances of fabricated x-ray mirror, its fabrication technologies and future plan for realizing sub-10-nm focusing. We developed a novel method of at-wavelength metrology for evaluating the focusing hard x-ray beam in a grazing-incidence optical system. The metrology is based on the numerical retrieval method using the intensity distribution profile around the focal point. We demonstrated the at-wavelength metrology and estimated the surface figure error on a test mirror. An experiment for measuring the focusing intensity profile was performed at the 1-km-long beamline (BL29XUL) of SPring-8. The obtained results were compared with the profile measured by the optical interferometer and confirmed to be in good agreement with it. This technique has potential for characterizing wave-front aberration on elliptical mirrors for the sub-10-nm focusing., SPIE-INT SOC OPTICAL ENGINEERING, 英語 - Sensitive depiction of biomedical tissue by refraction based computed tomography using synchrotron radiation
E. Hashimoto, A. Maksimenko, H. Sugiyama, K. Hirano, K. Hyodo, D. Shimao, Y. Nishino, T. Ishikawa, T. Yuasa, M. Ando, Proc. of the World Congress on Medical Physics and Biomedical Engineering, 14, 1268, 1271, 2006年 - High Quality Image of Biomedical Object by X-ray Refraction Based Contrast Computed Tomography
Eiko Hashimoto, Anton Maksimenko, Hiroshi Sugiyama, Keiichi Hirano, Kazuyuki Hyodo, Daisuke Shimao, Yoshinori Nishino, Tetsuya Ishikawa, Tetsuya Yuasa, Shu Ichihara, Yoshinori Arai, Masami Ando, Nuclear Science and Techniques, 1, 3, 2006年 - 27aUE-10 光電子分光によるLaAlO_3/LaVO_3界面の電子状態の観測(27aUE 軌道秩序,領域8(強相関系:高温超伝導,強相関f電子系など))
和達 大樹, 堀田 育志, 滝沢 優, 藤森 淳, 椋木 康滋, 須崎 友文, Hwang Harold Y, 高田 恭孝, 堀場 弘司, 松波 雅治, 辛 埴, 矢橋 牧名, 玉作 賢治, 西野 吉則, 三輪 大五, 石川 哲也, 日本物理学会講演概要集, 61, 0, 2006年
一般社団法人日本物理学会, 日本語 - 25aPS-13 価数揺動f電子系の硬X線光電子分光(25aPS 領域5ポスターセッション,領域5(光物性))
松波 雅治, 高田 恭孝, 田口 宗孝, 堀場 弘司, 山本 和矢, 江口 律子, 竹内 智之, 石田 行章, Chainani A, 矢橋 牧名, 玉作 賢治, 西野 吉則, 三輪 大五, 石川 哲也, 國井 暁, 辻井 直人, 辛 埴, 日本物理学会講演概要集, 61, 0, 2006年
一般社団法人日本物理学会, 日本語 - 23pZR-18 VO_2薄膜の硬X線光電子分光(23pZR V系,領域8(強相関系:高温超伝導,強相関f電子系など))
江口 律子, 田口 宗孝, 堀場 弘司, 松波 雅治, 山本 和矢, 石田 行章, 高田 恭孝, Chainani A, 辛 埴, 村岡 祐治, 廣井 善二, 矢橋 牧名, 三輪 大五, 西野 吉則, 玉作 賢治, 石川 哲也, 仙波 泰徳, 大橋 治彦, 日本物理学会講演概要集, 61, 0, 2006年
一般社団法人日本物理学会, 日本語 - 28pRF-3 硬x線を用いた銅酸化物高温超伝導体のCu 1s内殻光電子分光(28pRF 光電子分光・逆光電子分光,領域5(光物性))
安斎 太陽, 山崎 健太郎, 加茂 剛, 山崎 達也, 井野 明洋, 有田 将司, 島田 賢也, 生天目 博文, 谷口 雅樹, 池永 英司, 小畠 雅明, 矢橋 牧名, 小林 啓介, 玉作 賢治, 西野 吉則, 三輪 大五, 石川 哲也, 相浦 義弘, 永崎 洋, 岩澤 英明, 齋藤 智彦, 石角 元志, 内田 慎一, 掛下 照久, 安達 成司, 田島 節子, 栗崎 宏美, 古賀 道郎, 石井 清隆, 伊藤 昌和, 鈴木 孝至, 日本物理学会講演概要集, 61, 0, 2006年
一般社団法人日本物理学会, 日本語 - 28pRF-12 光電子の反跳効果 : 実験(28pRF 光電子分光・逆光電子分光,領域5(光物性))
高田 恭孝, 堀場 弘司, 原田 慈久, 辛 埴, 矢橋 牧名, 玉作 賢治, 西野 吉則, 三輸 大吾, 石川 哲也, 池永 英司, 小林 啓介, 大橋 治彦, 仙波 泰徳, 田中 智, 萱沼 洋輔, 日本物理学会講演概要集, 61, 0, 2006年
一般社団法人日本物理学会, 日本語 - 28pRF-13 光電子の反跳効果 : 理論(28pRF 光電子分光・逆光電子分光,領域5(光物性))
萱沼 洋輔, 田中 智, 高田 恭孝, 堀場 弘司, 原田 慈久, 辛 埴, 矢橋 牧名, 玉作 賢治, 西野 吉則, 三輪 大吾, 石川 哲也, 池永 英司, 小林 啓介, 大橋 治彦, 仙波 泰徳, 日本物理学会講演概要集, 61, 0, 2006年
一般社団法人日本物理学会, 日本語 - 27aRF-5 硬X線内殻光電子分光によるマグネリ相化合物の電子状態研究(27aRF 軟X線発光・散乱,光電子分光・逆光電子分光,領域5(光物性))
田口 宗孝, 藤原 宏平, 堀場 弘司, Chainani A, 高田 恭孝, 矢橋 牧名, 玉作 賢治, 西野 吉則, 三輸 大五, 石川 哲也, 松波 雅治, 山本 和矢, 江口 律子, 津田 俊輔, 中村 吉伸, 高木 英典, 辛 埴, 日本物理学会講演概要集, 61, 0, 2006年
一般社団法人日本物理学会, 日本語 - 28aUE-7 バナジウム酸化物の軟X線及び硬X線光電子分光(28aUE モット転移,領域8(強相関系:高温超伝導,強相関f電子系など))
江口 律子, 堀場 弘司, 松波 雅治, 山本 和矢, 田口 宗孝, 高田 恭孝, Chainani A, 矢橋 牧名, 三輪 大五, 西野 吉則, 玉作 賢治, 石川 哲也, 仙波 泰徳, 大橋 治彦, 井上 公, 辛 埴, 日本物理学会講演概要集, 61, 0, 2006年
一般社団法人日本物理学会, 日本語 - 細胞内エレメントアレイ法の開発とその生物学及び医学領域における展開
石坂幸人, 志村まり, 斎藤彰, 三村秀和, 松山智至, 矢橋牧名, 玉作賢治, 西野吉則, 山内和人, 石川哲也, 日本分子生物学会年会講演要旨集, 28th, 551, 2005年11月25日
日本語 - X線回折顕微鏡における逐次的像再生
西野吉則, MIAO Jianwei, 香村芳樹, 高橋幸生, 山本雅貴, 小池邦昭, 戎崎俊一, 石川哲也, KEK Proceedings, 2005-6, 12, 15, 2005年10月
日本語 - 屈折原理にもとづくX線CTの生体試料への応用
橋本英子, MAKSIMENKO Anton, 杉山弘, 西野吉則, 石川哲也, 安藤正海, 応用物理学会学術講演会講演予稿集, 66th, 2, 576, 2005年09月07日
日本語 - 硬X線ナノ集光用超高精度楕円ミラーの作製と1次元集光性能の評価
湯本 博勝, 三村 秀和, 松山 智至, 原 英之, 山村 和也, 佐野 泰久, 上野 一匡, 遠藤 勝義, 森 勇藏, 西野 吉則, 玉作 賢治, 矢橋 牧名, 石川 哲也, 山内 和人, 精密工学会誌論文集, 71, 9, 1137, 1140, 2005年09月05日
数値制御PCVMと数値制御EEM, 新たに開発した形状計測システムRADSIによりX線集光ミラーを作製した. SPring-8において1次元集光特性の評価を行った結果, 15keVのX線で集光強度プロファイルのFWHMで回折限界に近い40nmを実現した., 公益社団法人精密工学会, 日本語 - 高濃度に酸素添加されたInNの電子状態
山本哲也, 牧野久雄, KIM J. J, CHEN P. P, 山本あき勇, 松岡隆志, 高田恭孝, 池永英司, 西野吉則, 応用物理学関係連合講演会講演予稿集, 52nd, 1, 383, 2005年03月29日
日本語 - 超高精度X線集光ミラーの作製と集光特性の評価
三村秀和, 松山智至, 湯本博勝, 原英之, 山村和也, 西野吉則, 玉作賢治, 矢橋牧名, 石川哲也, 精密工学会大会学術講演会講演論文集, 2005, O53, 2005年03月01日
日本語 - 26pXP-10 グラファイトの硬X線励起高分解能内殻光電子スペクトル(領域5, 領域3, 領域8合同招待講演,領域5(光物性))
高田 恭孝, 小林 啓介, 池永 英司, 堀場 弘司, 小畠 雅明, 矢橋 牧名, 玉作 賢治, 西野 吉則, 三輪 大五, 石川 哲也, 辛 埴, 日本物理学会講演概要集, 60, 0, 2005年
一般社団法人日本物理学会, 日本語 - 25aXQ-8 充填型ホイスラー合金Co_2MnGeの光電子分光(光電子分光・逆光電子分光,領域5(光物性))
宮本 幸治, 木村 昭夫, 伊析 数幸, 坂本 和昭, 井野 明洋, 島田 賢也, 有田 将司, 仲武 昌史, 喬 山, 生天目 博文, 谷口 雅樹, 玉作 賢治, 西野 吉則, 三輪 大五, 小畠 雅明, 石川 哲也, 池永 英司, 矢橋 牧名, 小林 啓介, 土谷 浩一, 日本物理学会講演概要集, 60, 0, 2005年
一般社団法人日本物理学会, 日本語 - 24pXP-4 鋼酸化物高温超伝導体のCu 1s内殻硬x線光電子分光(光電子分光,領域5(光物性))
山崎 健太郎, 加茂 剛, 井野 明洋, 有田 将司, 島田 賢也, 生天目 博文, 谷口 雅樹, 池永 英司, 小畠 雅明, 矢橋 牧名, 小林 啓介, 玉作 賢治, 西野 吉則, 三輪 大五, 石川 哲也, 掛下 照久, 内田 慎一, 安達 成司, 田島 節子, 栗崎 宏美, 古賀 道郎, 石井 清隆, 伊藤 昌和, 鈴木 孝至, 日本物理学会講演概要集, 60, 0, 2005年
一般社団法人日本物理学会, 日本語 - 24pXP-5 酸化物高温超電導体の内殻2p硬X線光電子分光における新しいスクリーニング効果(光電子分光,領域5(光物性))
田口 宗孝, Chainani A, 堀場 弘司, 高田 恭孝, 矢橋 牧名, 玉作 賢治, 西野 吉則, 三輪 大五, 石川 哲也, 松波 雅治, 山本 和夫, 竹内 智之, 辛 埴, 横谷 尚睦, 池永 英司, 小林 啓介, 茂筑 高士, 平田 和人, 堀 純也, 石井 清隆, 中村 文彦, 鈴木 孝至, 日本物理学会講演概要集, 60, 0, 2005年
一般社団法人日本物理学会, 日本語 - 24aPS-33 Y_<1-x>Ca_xTiO_3の光電子分光(領域5ポスターセッション,領域5(光物性))
有田 将司, 島田 賢也, 佐藤 仁, 沢田 正博, 仲武 昌史, 生天目 博文, 谷口 雅樹, 坪田 雅己, 竹村 征樹, 倉 宗一郎, 伊賀 文俊, 高畑 敏郎, 池永 英司, 高田 恭孝, 矢橋 牧名, 三輪 大五, 西野 吉則, 玉作 賢治, 石川 哲也, 辛 埴, 小林 啓介, 大和田 謙二, 稲見 俊哉, 竹田 幸治, 藤森 伸一, 斉藤 裕児, 日本物理学会講演概要集, 60, 0, 2005年
一般社団法人日本物理学会, 日本語 - 27pTA-8 光電子分光から見たCe系充填スクッテルダイト化合物の混成効果と電子状態(スクッテルダイト,領域8(強相関系:高温超伝導,強相関f電子系など))
松波 雅治, 堀場 弘司, 山本 和矢, 田口 宗孝, Chainani A, 高田 恭孝, 辛 埴, 池永 英司, 仙波 泰徳, 大橋 治彦, 三輪 大五, 西野 吉則, 玉作 賢冶, 菅原 仁, 佐藤 英行, 生天目 博文, 谷口 雅樹, 石川 哲也, 小林 啓介, 日本物理学会講演概要集, 60, 0, 2005年
一般社団法人日本物理学会, 日本語 - 硬X線ナノ集光のための高精度楕円体ミラーの作製と集光特性の評価
湯本博勝, 山内和人, 三村秀和, 松山智至, 山村和也, 佐野泰久, 西野吉則, 玉作賢治, 矢橋牧名, 応用物理学会学術講演会講演予稿集, 65th, 2, 602, 2004年09月01日
日本語 - ミラー集光系を用いたX線顕微鏡(ナノスコピー)の開発
松山智至, 山内和人, 三村秀和, 湯本博勝, 山村和也, 西野吉則, 玉作賢治, 矢橋牧名, 石川哲也, 応用物理学会学術講演会講演予稿集, 65th, 2, 605, 2004年09月01日
日本語 - 希薄磁性半導体Ga1-xCrxNのCr‐N‐Ga混成による長距離相互作用
KIM J J, 牧野久雄, 高田恭孝, 小林啓介, 山本哲也, 花田貴, 池永英司, 三輪大五, 西野吉則, 応用物理学関係連合講演会講演予稿集, 51st, 1, 506, 2004年03月28日
日本語 - 走査型X線顕微鏡のための楕円体ミラーを用いた二次元集光ユニットの開発
松山智至, 山内和人, 山村和也, 三村秀和, 佐野泰久, 玉作賢治, 矢橋牧名, 西野吉則, 石川哲也, 応用物理学関係連合講演会講演予稿集, 51st, 2, 747, 2004年03月28日
日本語 - 13aXC-10 硬 X 線光電子分光の高分解能化・高効率化(吸収分光・MCD・光電子分光, 領域 5)
高田 恭孝, 池永 英司, 堀場 弘司, 西野 吉則, 三輪 大吾, 玉作 賢治, 矢橋 牧名, 野平 博司, 服部 健雄, 有田 将司, 島田 賢也, 生天目 博文, 谷口 雅樹, 辛 埴, 石川 哲也, 小林 啓介, 日本物理学会講演概要集, 59, 0, 2004年
一般社団法人日本物理学会, 日本語 - 13pPSA-14 La_<1-x>Sr_xTiO_3 の硬 X 線内殻光電子分光(領域 5)
堀場 弘司, 竹内 智之, 田口 宗孝, Chainani A, 高田 恭孝, 池永 英司, 生天目 博文, 谷口 雅樹, 淡路 晃弘, 竹内 晃久, 三輪 大五, 西野 吉則, 玉作 賢治, 石川 哲也, 田口 康二郎, 十倉 好紀, 小林 啓介, 辛 埴, 日本物理学会講演概要集, 59, 0, 2004年
一般社団法人日本物理学会, 日本語 - 13aXC-11 R_2Mo_2O_7(R=Sm, Tb) の硬 X 線光電子分光(吸収分光・MCD・光電子分光, 領域 5)
沢田 正博, 木村 昭夫, 三好 清貴, 竹内 潤, 有田 将司, 竹田 孝治, 仲武 昌史, 佐藤 仁, 島田 賢也, 生天目 博文, 谷口 雅樹, 池永 英司, 矢橋 牧名, 小林 啓介, 石川 哲也, 玉作 賢治, 西野 吉則, 三輪 大五, 高田 恭孝, 辛 埴, 日本物理学会講演概要集, 59, 0, 2004年
一般社団法人日本物理学会, 日本語 - 13pRA-10 電子ドープ型銅酸化物高温超伝導体 Nd_<2-x>Ce_xCuO_4 の光電子分光(高温超伝導 : 光電子分光, 領域 8)
山崎 健太郎, 山崎 達也, 井野 明洋, 有田 将司, 島田 賢也, 生天目 博文, 谷口 雅樹, 栗崎 宏美, 古賀 道郎, 石井 清隆, 伊藤 昌和, 鈴木 孝至, 大和田 謙二, 稲見 俊哉, 竹田 幸治, 藤森 伸一, 斉藤 祐児, 矢橋 牧名, 小林 啓介, 池永 英司, 西野 吉則, 三輪 大五, 玉作 賢治, 石川 哲也, 高田 恭孝, 辛 埴, 日本物理学会講演概要集, 59, 0, 2004年
一般社団法人日本物理学会, 日本語 - 27aXQ-5 YbInCu_4の硬X線光電子分光(光電子分光)(領域5)
佐藤 仁, 島田 賢也, 有田 将司, 竹田 幸治, 澤田 正博, 仲武 昌史, 吉河 訓太, 谷口 雅樹, 生天目 博文, 平岡 耕一, 小島 健一, 高田 恭孝, 池永 英司, 小林 啓介, 辛 埴, 矢橋 牧名, 玉作 賢治, 西野 吉則, 三輪 大五, 石川 哲也, 日本物理学会講演概要集, 59, 0, 2004年
一般社団法人日本物理学会, 日本語 - 27aXQ-4 硬X線光電子分光による近藤半導体YbB_<12>のYb 4f電子状態の温度依存性(光電子分光)(領域5)
竹田 幸治, 有田 将司, 島田 賢也, 佐藤 仁, 沢田 正博, 仲武 昌史, 東口 光晴, 生天目 博文, 谷口 雅樹, 伊賀 文俊, 高畠 敏郎, 高田 恭孝, 池永 英司, 矢橋 牧名, 三輪 大五, 西野 吉則, 玉作 賢治, 石川 哲也, 辛 埴, 小林 啓介, 日本物理学会講演概要集, 59, 0, 2004年
一般社団法人日本物理学会, 日本語 - X 線回折顕微鏡による物質の構造解析 : X 線回折に基づく結晶構造解析法を空間的周期構造のない試料に拡張する試み
西野 吉則, Isotope news, 594, 2, 5, 2003年10月01日
日本語 - MOSTABによる放射光X線ビームの安定化
工藤 統吾, 西野 吉則, 鈴木 基寛, 谷田 肇, 古川 行人, 広野 等子, 石川 哲也, 放射光, 16, 3, 173, 177, 2003年05月31日
日本放射光学会, 日本語 - MOSTABによる放射光X線ビームの安定化
工藤統吾, 西野吉則, 鈴木基寛, 谷田肇, 古川行人, 広野等子, 石川哲也, 放射光, 16, 3, 173, 177, 2003年05月31日
日本放射光学会, 日本語 - 22pTR-6 水和ナトリウムコバルト酸化物超伝導体 Na_xCoO_2・yH_2O の電子状態
横谷 尚睦, 下志万 貴博, チャイナニアシシ, 高田 恭孝, 津田 俊輔, 竹内 智之, 鎌倉 望, 金高 和文, 木須 孝幸, 福島 昭子, 辛 埴, 玉作 賢治, 西野 吉則, 石川 哲也, 小林 啓介, 生天目 博文, 谷口 雅樹, 高田 和典, 佐々木 高義, 櫻井 裕也, 室町 英治, 日本物理学会講演概要集, 58, 0, 2003年
一般社団法人日本物理学会, 日本語 - 自由電子ビームによるコンプトン散乱を用いた光モニターの概念設計について
工藤統吾, 小林利明, 西野吉則, 日本放射光学会年会・放射光科学合同シンポジウム予稿集, 11th, 145, 1998年01月09日
日本語 - QCD和則によるπおよびK-N相互作用(K中間子-核子相互作用とK中間子凝縮,研究会報告)
近藤 良彦, 森松 治, 西野 吉則, 素粒子論研究, 91, 4, D52, D58, 1995年07月
素粒子論グループ 素粒子論研究 編集部, 日本語 - The Second Moment of The Structure Function for Pseudoscalar Mesons in QCD Sum Rules
西野 吉則, 素粒子論研究, 89, 6, F96, F98, 1994年09月
素粒子論グループ 素粒子論研究 編集部, 日本語
書籍等出版物
- 強光子場の化学 : 分子の超高速ダイナミクス
日本化学会, Ｘ線・軟Ｘ線顕微鏡技術開発の最前線と生命科学への応用
化学同人, 2015年03月30日, 9784759813784, v, 172p, 図版 [4] p, 日本語, ［共著］ - マイクロビームアナリシス・ハンドブック
日本学術振興会マイクロビームアナリシス第141委員会, Ｘ線・放射光利用による分析
オーム社, 2014年06月21日, 9784274504969, 25, 708p, 日本語, ［共著］ - Synchrotron Radiation and Structural Proteomics (Pan Stanford Series on Nanobiotechnology Volume 3)
Coherent X-ray Diffraction for High-Contrast Bioimaging
Jenny Stanford Publishing, 2011年11月14日, 9814267384, 300, ［共著］ - 放射光が解き明かす驚異のナノ世界 : 魔法の光が拓く物質世界の可能性
日本放射光学会, 「細胞の中の染色体を立体的に映し出す技術とは？」「世界を変えるＸ線レーザー」
講談社, 2011年09月20日, 9784062577373, 276p, 図版 [4] p, 日本語, ［共著］
共同研究・競争的資金等の研究課題
- Ｘ線レーザー回折による生細胞ダイナミクス
科学研究費助成事業 基盤研究(S)
2015年05月29日 - 2020年03月31日
西野 吉則, 鈴木 明大, 大島 泰郎, 木村 隆志
Ｘ線自由電子レーザー（XFEL）イメージングにより、未解明の部分が多い原核細胞の細胞分裂のナノダイナミクスや高度好熱菌の多倍性など、基礎微生物学に資する成果を得た。また、乳製品の加熱殺菌、金ナノ粒子を用いたがんのフォトサーマル治療、インフルエンザウィルス、ドラッグデリバリー、電気自動車用電池材料などに関連した幅広い応用研究を展開した。さらに、分子レベルのXFELイメージングに向けた技術開発にも取り組んだ。
日本学術振興会, 基盤研究(S), 北海道大学, 15H05737 - フェムト秒コヒーレントX線を活用した複雑系生体高分子の溶液構造可視化法の構築
科学研究費助成事業 挑戦的萌芽研究
2011年 - 2012年
西野 吉則, 城地 保昌, 別所 義隆, 竹内 昌治
我々が提案するパルス状コヒーレントX線溶液散乱法の基本概念を含むレビュー論文を出版した。制御された環境下での測定を可能にする試料ホルダとして環境セルを開発した。計算機シミュレーションにより、実験配置の検討やデータ解析アルゴリズムの開発を行った。X線自由電子レーザー施設SACLAを用いて、パルス状コヒーレントX線溶液散乱測定を行い、シングルショットでのコヒーレントX線回折パターン計測に成功した。
日本学術振興会, 挑戦的萌芽研究, 北海道大学, 23651126 - コヒーレントX線回折を用いたクライオバイオイメージング
科学研究費助成事業 基盤研究(B)
2010年 - 2012年
西野 吉則, 前島 一博
SPring-8でのX線散乱実験により、ヒト染色体構造に関して定説を覆す発見をした。定説の30nmクロマチン線維やクロマチン繊維の規則的折り畳みは存在せず、ヌクレオソーム線維が不規則に折り畳まれていることを示した。また、凍結水和生体試料では氷が広がっているため、X線回折顕微法の従来のデータ解析アルゴリズムが適用できないが、空間的に制限された照明を用いる新たな手法の提案によりこの問題を解決した。
日本学術振興会, 基盤研究(B), 北海道大学, 22310075 - コヒーレントX線回折顕微法による生物試料のナノ構造解析
科学研究費助成事業 基盤研究(B)
2007年 - 2009年
西野 吉則, 前島 一博, 高橋 幸生, 高橋 幸生
X線回折顕微法によって生体試料を観察する際に必要となる、顕微鏡装置、試料調製、データ測定、データ解析などに関わる研究を行った。この結果、エネルギーの高いX線を用いて、世界で初めて、細胞小器官を3次元的に観察するなど、世界をリードする研究成果を収めた。我々が可視化に成功した無染色のヒト染色体には、イメージコントラストを人為的に高める染色等をしない状態では初めて、軸状構造が観察されるなど、生物学的にも新たな知見を与えた。
日本学術振興会, 基盤研究(B), 独立行政法人理化学研究所, 19310084 - コヒーレントX線回折顕微鏡による金属材料中の3次元メゾ組織のその場観察
科学研究費助成事業 基盤研究(B)
2006年 - 2008年
松原 英一郎, 高橋 幸生, 西野 吉則, 奥田 浩司, 香村 芳樹, 市坪 哲
コヒーレントX線回折顕微鏡(CXDM : Coherent X-ray diffraction microscope)法を用いて、金属材料中のナノ組織観察の方法を確立することが本研究の目的である。軽量・高強度材料として実用上重要なアルミ基、マグネシウム基合金中の微細組織観察を通して、このCXDM法の金属材料に応用する場合の問題を明らかにし、それらを解決して、CXDM法を金属材料中の微細組織観察のための材料評価技術として確立する。CXDM法では、試料から得られるスペックルパターンと呼ばれる鋭い回折強度分布を精密に測定し、反復位相回復法を用いて回折プロファイルから試料の透過像を得る。この際に、位相回復を正確に行うために、オーバーサンプリング条件を満足する必要がある。ただ、現状での検出器の測定領域の大きさと位置分解能による制約から、測定試料の大きさは直径1μm程度に制限されている。この試料の物理的大きさに制限されないタイコグラフ法と呼ばれる手法についても実験的に調べた。
日本学術振興会, 基盤研究(B), 京都大学, 18360304 - X線導波路現象を利用したナノビーム集光素子開発と応用
科学研究費助成事業 萌芽研究
2004年 - 2005年
松原 英一郎, 林 好一, 西野 吉則, 竹中 久貴
X線導波路の特徴は、10〜100nmのサイズの干渉性の高いX線を発生することのできる微小X線源や、モノクロメーターのような分光器としての機能を有することである。ここではSi基板上に100nmのPMMAコア層をスピンコーティング法によって、さらにその上にスパッタ法によってSiクラッドを製膜した多層膜をX線導波路とした。計算機シミュレーションでは、効率よくX線を伝搬することのできるX線導波路の構造はエネルギーによって異なることを示しており、そのため、クラッド層の厚みは、0〜20nmの範囲において2nmステップで段階的に変化させた。本実験では、X線管球から放射される特性X線を分光させる目的でSi/PMMA/Siに対し白色X線を入射させ、X線導波路現象の観測を行った。WLβ線を最も効率よく伝搬させるためのクラッド層の厚みは、シミュレーションによって10nmと算出されたため、その試料に対して入射角度を調整し、伝搬X線を観測した。伝搬X線の出射角度依存性を詳細に調べた結果。TE0、1、2、3モードの導波路現象が生じていることが確認された。出射角度0°付近で観測されるTEOモードのエネルギーは9.75keVであり、WLβ線と一致し強度が増強されていることが判明した。MoKα線に対しても同様に分光が行えることも示された。
また、ペンタセン薄膜においても同様にX線導波路現象を観測した。伝搬X線のエネルギーから導き出される膜の構造(膜厚50m、密度1.35g/cm^3)は他の評価法のものと良い一致を示した。AFMでの形態観測によると、膜厚に対して非常に大きな凹凸が表面に存在していたが、本結果より、滑らかな界面を持つ薄膜だけでなく、粗い界面を持つ薄膜に対してもX線導波路現象が生じることが示された。
日本学術振興会, 萌芽研究, 16656192 - X線ルミネッセンスホログラフィー法の確立による蛍光材料の発光機構の解明
科学研究費助成事業 基盤研究(B)
2003年 - 2005年
松原 英一郎, 宍戸 統悦, 林 好一, 岸本 俊二, 西野 吉則
XAFSの測定手法の一つとして、蛍光X線の代わりにX線ルミネッセンスを検出する例が数多く見られる。一方、X線ホログラフィーの場合、蛍光X線検出によって通常測定するが、X線ルミネッセンスを用いることは皆無であった。我々は、X線ルミネセンスを用いた分析技術の新たな可能性を探るために、その発光強度のX線入射角依存性に着目し、蛍光X線ホログラフィーと同様な原子分解能ホログラム測定の可能性について検討した。平成16年度の実験において、サファイア基板上にZnOをエピタキシャル成長させたものを試料として用い、X線ルミネッセンス強度の入射角依存性を測定した。それより、X線ルミネッセンスのパターンは、Znの蛍光X線ホログラムと異なることが分かったが、本年度は、さらに一次元平均化処理を行うことによってX線定在波線を浮き立たせ、厳密にパターンの帰属を行った。その結果、X線ルミネッセンスの強度パターンは、基板であるサファイアからのホログラムと一致することが分かった。また、分光器によってX線ルミネッセンスのスペクトルを解析したところ、ZnO薄膜に比ベサファイア基板からの発光が支配的であることも上記結果を強く支持した。蛍光X線を用いる場合、Alなどの軽元素の蛍光X線を検出することは、大気中では吸収が大きいために困難であり、従って、軽元素の蛍光X線ホログラムの測定は通常行わないが、X線ルミネッセンスが検出できるケースでは、それを簡便に測定できることを本研究により示した。また、クライオストリームを用い、上記試料を冷却したところZnOの紫外発光(373nm)が増強した。その波長の光のみを分光器で選択し、X線ルミネッセンスホログラフィーの実験を行ったところ、ZnO薄膜に由来するホログラムを観測することができた。従って、発光波長を選別することにより、場所を特定してホログラムが測定できることも示された。
日本学術振興会, 基盤研究(B), 15360329
