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Sueoka Kazuhisa

Faculty of Information Science and Technology　Electronics for Informatics　Advanced ElectronicsProfessor
Institute for Frontier Education and Research on SemiconductorsProfessor
Education and Research Center for Mathematical and Data ScienceProfessor
Green Nanotechnology Research CenterProfessor

Researcher basic information

■ Degree
  • 博士（工学）, 北海道大学
■ URL
researchmap URLホームページURL■ Various IDs
J-Global ID■ Research Keywords and Fields
Research Keyword
  • STM
  • スピン偏極
  • 集束イオンビーム
  • モット・スピン検出器
  • スピン注入
  • 表面磁性
  • MFM
  • スピンエレクトロニクス
  • 磁気力顕微鏡
  • スピンプローブ
  • Feエピタキシャル
  • 円偏光エバネッセント光
  • 磁区
  • スピン緩和
  • スピン渦
  • 探針
  • スピン偏極走査型トンネル顕微鏡
  • 走査型トンネル顕微鏡
  • トンネル現象
  • 磁気抵抗効果
  • 狭ギャップ半導体
  • SP-STM
  • 強磁性体
  • スピン軌道相互作用
  • スピン
  • 交換相互作用
  • 原子間力顕微鏡
  • 交換相互作用力顕微鏡
  • 電子顕微鏡
  • その場計測
Research Field
  • Manufacturing Technology (Mechanical Engineering, Electrical and Electronic Engineering, Chemical Engineering), Electric and electronic materials
  • Nanotechnology/Materials, Crystal engineering
  • Nanotechnology/Materials, Applied physical properties
  • Nanotechnology/Materials, Metallic material properties
  • Nanotechnology/Materials, Nanostructural physics
  • Nanotechnology/Materials, Nanometer-scale chemistry
  • Manufacturing Technology (Mechanical Engineering, Electrical and Electronic Engineering, Chemical Engineering), Measurement engineering
  • Nanotechnology/Materials, Nano/micro-systems
  • Nanotechnology/Materials, Nanobioscience
  • Nanotechnology/Materials, Nanomaterials
  • Nanotechnology/Materials, Thin film/surface and interfacial physical properties
■ Educational Organization

Career

■ Career
Career
  • 2004 - 2010
    北海道大学 大学院・情報科学研究科, 教授
Position History
  • 大学院情報科学研究院副研究院長, 2019年4月1日 - 2020年3月31日
  • 大学院情報科学研究科副研究科長, 2014年4月1日 - 2016年3月31日
  • 大学院情報科学研究科副研究科長, 2018年4月1日 - 2019年3月31日

Research activity information

■ Papers
■ Other Activities and Achievements
  • Atomic force microscopy measurements of mechanical properties of single cells patterned by microcontact printing
    Ryosuke Takahashi; Satoshi Ichikawa; Agus Subagyo; Kazuhisa Sueoka; Takaharu Okajima, ADVANCED ROBOTICS, 28, 7, 449, 455, Apr. 2014
    English
  • Scanning tunneling microscopy study of an altered Fe3O 4(001) thin films surface by hydrogen adsorption
    Satoshi Hiura; Akira Ikeuchi; Soraya Shirini; Agus Subagyo; Kazuhisa Sueoka, e-Journal of Surface Science and Nanotechnology, 12, 0, 26, 30, 08 Feb. 2014
    The Surface Science Society of Japan, English
  • Scanning tunneling microscopy study of an altered Fe3O 4(001) thin films surface by hydrogen adsorption
    Satoshi Hiura; Akira Ikeuchi; Soraya Shirini; Agus Subagyo; Kazuhisa Sueoka, e-Journal of Surface Science and Nanotechnology, 12, 26, 30, 08 Feb. 2014
    English
  • Evaluation of Oxidized-Low-Density Lipoproteins Using Kelvin Force Microscopy
    Seiji Takeda; Futaba Ohkawa; Shu-Ping Hui; Toshihiro Sakurai; Shigeki Jin; Hirotoshi Fuda; Kazuhisa Sueoka; Hitoshi Chiba, IEEE SENSORS JOURNAL, 13, 9, 3449, 3453, Sep. 2013
    English
  • Defection of oxidized LDL using a carbon nanotube electrode
    武田 晴治; 惠 淑萍; 福田 慶介; 布田 博敏; 神 繁樹; 櫻井 俊宏; 石井 睦; 武笠 幸一; 末岡 和久; 千葉 仁志, 北海道醫學雜誌 = Acta medica Hokkaidonensia, 88, 4, 151, 151, 01 Sep. 2013
    Japanese
  • Temperature dependence of the dynamics of optical spin injection in self-assembled InGaAs quantum dots
    Takayuki Kiba; Xiao-jie Yang; Takafumi Yamamura; Yuki Kuno; Agus Subagyo; Kazuhisa Sueoka; Akihiro Murayama, APPLIED PHYSICS LETTERS, 103, 8, 082405-082405-5, Aug. 2013
    English
  • Noncontact Atomic Force Microscopy Observation of Fe3O4(001) Surface
    Mizuno Taichi; Hosoi Hirotaka; Subagyo Agus; Oishi Suguru; Ikeuchi Akira; Hiura Satoshi; Sueoka Kazuhisa, Jpn J Appl Phys, 51, 8, 08KB03, 08KB03-4, 25 Aug. 2012
    Fe3O4 is one of the important oxide materials and its surface structure should be well understood to enable application of this material. We report the first noncontact atomic force microscopy (NC-AFM) results for Fe3O4(001) thin films. The observed films were grown homoepitaxially on magnetite thin films substrate. A low-energy electron diffraction pattern shows the well-known (\sqrt{2}\times \sqrt{2})R45° reconstructed structure. The observed minimum step height is 0.21 nm, corresponding to the distance between the same planes. We obtain two types of atomic-scale NC-AFM images. One image shows bright protrusions along the [100] and [010] directions at intervals of 0.84 nm corresponding to a unit cell of the (\sqrt{2}\times \sqrt{2})R45° reconstructed structure. The other image shows a more detailed atomic structure with 0.6 and 0.3 nm corrugations., The Japan Society of Applied Physics, English
  • Atomically Resolved Observations of Antiphase Domain Boundaries in Epitaxial Fe3O4 Films on MgO(001) by Scanning Tunneling Microscopy
    Ikeuchi Akira; Hiura Satoshi; Mizuno Taichi; Kaji Eisaku; Subagyo Agus; Sueoka Kazuhisa, Jpn J Appl Phys, 51, 8, 08KB02, 08KB02-5, 25 Aug. 2012
    We have studied the surface atomic configurations around antiphase domain boundaries (APBs) in epitaxial magnetite (Fe3O4) thin films on MgO(001) by scanning tunneling microscopy (STM). The observed surface of the Fe3O4 films is the B-plane terminating surface with the (\sqrt{2}\times\sqrt{2})R45^{\circ} reconstruction. Several variations of APBs are observed by STM at atomic resolution. The observed APBs are categorized into a APBs labeled by three different phase shift vectors: in-plane 1/4[110], in-plane 1/2[100], and out-of-plane 1/4[101]. We discussed how these APBs appear on the surface. The proportions of the APBs with 1/4[110], 1/2[100], and 1/4[101] shifts are about 38, 1, and 61%, respectively, in our experiment., The Japan Society of Applied Physics, English
  • カーボンナノチューブセンサーの臨床検査化学への応用
    武田 晴治; 惠 淑萍; 櫻井 俊宏; 石井 睦; 武笠 幸一; 神 繁樹; 布田 博敏; 末岡 和久; 千葉 仁志, 臨床病理, 60, 7, 25 Jul. 2012
    Japanese
  • Detection of oxidized LDL using a carbon nanotube electrode
    Seiji Takeda; Shu-Ping Hui; Keisuke Fukuda; Hirotoshi Fuda; Shigeki Jin; Toshihiro Sakurai; Atsushi Ishii; Koichi Mukasa; Kazuhisa Sueoka; Hitoshi Chiba, SENSORS AND ACTUATORS B-CHEMICAL, 166, 833, 836, May 2012
    English
  • Calculation method of reflectance distributions for computer-generated holograms using the finite-difference time-domain method
    ICHIKAWA TSUBASA; SAKAMOTO YUJI; SUBAGYO AGUS; SUEOKA KAZUHISA, Appl Opt, 50, 34, H211, 01 Dec. 2011
    English
  • Direct observation of dynamic force propagation between focal adhesions of cells on microposts by atomic force microscopy
    Akinori Okada; Yusuke Mizutani; Agus Subagyo; Hirotaka Hosoi; Motonori Nakamura; Kazuhisa Sueoka; Koichi Kawahara; Takaharu Okajima, APPLIED PHYSICS LETTERS, 99, 26, 263703, Dec. 2011
    English
  • Spin-Polarized Tunneling between Optically Pumped GaAs(110) Surface and Spin-Polarized Tip
    Nobuyuki Ishida; Kazuhisa Sueoka, JAPANESE JOURNAL OF APPLIED PHYSICS, 50, 8, 08LB02.1-08LB02.3, 08LB02-3, Aug. 2011
    English
  • Spin-polarized tunneling between optically pumped GaAs(110) surface and spin-polarized tip (Special issue: Scanning probe microscopy)
    Ishida Nobuyuki; Sueoka Kazuhisa, Japanese journal of applied physics, 50, 8, 08LB02, 1〜3, Aug. 2011
    Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physics, English
  • 4. Interdisciplinary Research Project on Nanotechnology(Next-Generation Information Technology Based on Knowledge Discovery and Knowledge Federation: Hokkaido University Global COE Program and Research Projects on ICT in Hokkaido)
    SUEOKA Kazuhisa, The Journal of the Institute of Electronics, Information, and Communication Engineers, 92, 10, 828, 832, 01 Oct. 2009
    一般社団法人電子情報通信学会, Japanese
  • Influence of surface states on tunneling spectra of n-type GaAs(110) surfaces
    ISHIDA NOBUYUKI; SUEOKA KAZUHISA; FEENSTRA R. M, Phys Rev B Condens Matter Mater Phys, 80, 7, 075320.1-075320.8, Aug. 2009
    English
  • Scanning tunneling microscopy and spectroscopy on c(3√2×√ 2)R45°-C-reconstructed Cr(001) thin-film surfaces
    Hirofumi Oka; Kazuhisa Sueoka, Japanese Journal of Applied Physics, 47, 7, 6099, 6101, 18 Jul. 2008
    English
  • Scanning tunneling microscopy and spectroscopy on c(3√2×√ 2)R45°-C-reconstructed Cr(001) thin-film surfaces
    Hirofumi Oka; Kazuhisa Sueoka, Japanese Journal of Applied Physics, 47, 7, 6099, 6101, 18 Jul. 2008
    Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physics, English
  • Charge Ordering in a Magnetite Film Surface
    SUBAGYO A; SUEOKA K, Magnetics Japan, 3, 4, 174, 179, 01 Apr. 2008
    日本磁気学会, Japanese
  • Structural and electronic properties of the K/GaAs (110) surface
    Nobuyuki Ishida; Kazuhisa Sueoka, Physical Review B - Condensed Matter and Materials Physics, 77, 7, 073411.1-073411.4, 27 Feb. 2008
    English
  • Carbon-induced superstructure on cr(001) thin-film surfaces
    Hirofumi Oka; Akira Nakai; Kazuhisa Sueoka, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 46, 8B, 5602, 5606, Aug. 2007
    English
  • Spin-polarized scanning tunneling microscopy and spectroscopy study of c(2x2) reconstructed Cr(001) thin film surfaces
    H Oka; K Sueoka, JOURNAL OF APPLIED PHYSICS, 99, 8, 83021, 83023, Apr. 2006
    English
  • Spin-polarized scanning tunneling microscopy study on charge ordering of reconstructed Fe3O4(001) film surfaces
    Agus Subagyo; Kazuhisa Sueoka, Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 45, 3 B, 2255, 2258, 27 Mar. 2006
    English
  • Spin-Polarized Scanning Tunneling Microscopy Study on Charge Ordering of Reconstructed Fe3O4(001) Film Surfaces
    Subagyo Agus; Sueoka Kazuhisa, Jpn J Appl Phys, 45, 3, 2255, 2258, 15 Mar. 2006
    Fe3O4(001) film surfaces having a ($\sqrt{2} \times \sqrt{2}$)$R$45° reconstruction are studied by scanning tunneling microscopy (STM) and spin-polarized STM (SP-STM). The reconstruction is induced by ordered arrays of oxygen vacancy at B-terminated surfaces as revealed by STM. Fe cation rows having a wavelike structure oriented along the [110] direction with a separation of 0.6 nm are observed. A single Fe cation with a 0.3 nm periodicity within the cation rows is resolved. Instead of a single Fe cation, SP-STM imaged an alternation of high and low corrugations representing Fe3+–Fe3+ dimers and Fe2+–Fe2+ dimers, respectively. The resolving of Fe dimers having different spin states by SP-STM is due to the contribution of spin-polarized tunneling current. The Fe3+–Fe3+ and Fe2+–Fe2+ dimers have a separation of about 0.6 nm in the [110] direction, while in the [$1\bar{1}0$] direction these dimers alternate by about 0.65 and 0.55 nm. The separation is consistent with the wavelike row structure on the ($\sqrt{2}\times \sqrt{2}$)$R$45° reconstructed Fe3O4(001) film surfaces., Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physics
  • Magnetic field measurement using scanning magneto resistance microscope with spin-valve sensor
    T Takezaki; D Yagisawa; K Sueoka, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 45, 3B, 2251, 2254, Mar. 2006
    English
  • Connection of herringbone ridges on reconstructed Au(111) surfaces observed by scanning tunneling microscopy
    Hirofumi Oka; Kazuhisa Sueoka, Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 44, 7 B, 5430, 5433, 26 Jul. 2005
    公益社団法人 応用物理学会, English
  • Defect-induced charge freezing on epitaxial Fe3O 4(001) film surfaces studied by spin-polarized scanning tunneling microscopy
    Agus Subagyo; Kazuhisa Sueoka, Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 44, 7 B, 5447, 5450, 26 Jul. 2005
    公益社団法人 応用物理学会, English
  • Connection of herringbone ridges on reconstructed Au(111) surfaces observed by scanning tunneling microscopy
    H Oka; K Sueoka, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 44, 7B, 5430, 5433, Jul. 2005
    English
  • Defect-induced charge freezing on epitaxial Fe3O4(001) film surfaces studied by spin-polarized scanning tunneling microscopy
    A Subagyo; K Sueoka, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 44, 7B, 5447, 5450, Jul. 2005
    English
  • Reconstruction and charge ordering of epitaxial Fe3O4(001) films
    SUBAGYO AGUS; SUEOKA KAZUHISA; MUKASA KOICHI, J Magn Magn Mater, 290/291, Pt.2, 1037, 1039, Apr. 2005
    English
  • B-4 Surface acoustic wave imaging on periodic microstructures
    Muramoto Eiji; Wright Oliver B; Matsuda Osamu; Tomoda Motonobu; Takezaki Taiichi; Sueoka Kazuhisa, Proceedings of Symposium on Ultrasonic Electronics, 25, 11, 12, 27 Oct. 2004
    超音波エレクトロニクスの基礎と応用に関するシンポジウム運営委員会, Japanese
  • Fabrication and characterization of cantilevers for scanning magnetoresistance microscope VI
    TAKEZAKI T; YAGISAWA D; SUEOKA K, 日本応用磁気学会学術講演概要集 = Digest of ... annual conference on magnetics in Japan, 28, 390, 390, 21 Sep. 2004
    Japanese
  • Local observation of surface magnetic structures by using STM/STS
    OKA H; SUBAGYO Agus; SUEOKA K, 日本応用磁気学会学術講演概要集 = Digest of ... annual conference on magnetics in Japan, 28, 0, 149, 149, 21 Sep. 2004
    Japanese
  • Non-contact atomic force microscopy observation on GaAs(110) surface with tip-induced relaxation
    N Uehara; H Hosoi; K Sueoka; K Mukasa, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 43, 7B, 4676, 4678, Jul. 2004
    English
  • Self-assembled low-dimensional potassium structures on GaAs(110)
    N Ishida; A Subagyo; H Hosoi; K Sueoka; K Mukasa, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 43, 7B, 4557, 4560, Jul. 2004
    English
  • Self-assembled low-dimensional potassium structures on GaAs(110)
    N Ishida; A Subagyo; H Hosoi; K Sueoka; K Mukasa, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 43, 7B, 4557, 4560, Jul. 2004
    English
  • Reduced interface reaction during the epitaxial Fe growth on InAs for high efficiency spin injection
    Yoh Kanji; Ohno Hiroshi; Sueoka Kazuhisa; Ramsteiner Manfred E, Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 22, 3, 1432, 1435, May 2004
    We have investigated Fe/InAs interfaces for two different growth temperatures of Fe and the effect on the spin injection properties through an Fe/InAs junction. Secondary ion mass spectroscopy and transmission electron microscopy studies of the Fe/InAs interfaces revealed that Fe films grown at 175 °C clearly suffer from increased reaction and out-diffusion of semiconductor constituents compared to those grown at 23 °C. The lower temperature samples showed an increased degree of spin polarization of 18%–20% which translates to 36%–40% of spin injection efficiency assuming selection rules between heavy and light holes in the p-type InAs substrate. It is close to the spin polarization of 40%–45% in an Fe spin injector itself. ©2004 American Vacuum Society., American Vacuum Society, English
  • Non-Contact Atomic Force Microscopy Observation on GaAs(110) Surface with Tip-Induced Relaxation
    Uehara Nobutomo; Hosoi Hirotaka; Sueoka Kazuhisa; Mukasa Koichi, Japanese Journal of Applied Physics, 43, 7, 4676, 4678, 2004
    We investigate the tip-sample dependence of atomically resolved non-contact atomic force microscopy (NC-AFM) images of a GaAs(110) surface taken with a tip that can resolve the tip-sample interaction originating from the dangling bonds of Ga atoms and the valence charge distribution around As atoms. Comparing the NC-AFM images taken with various tip-sample distances with a theoretical investigation of tip-sample interactions on the surface, the tip-sample interaction near the As atoms and Ga atoms are experimentally distinguished, and it is suggested that observed NC-AFM images reflect the tip induced surface relaxation., 公益社団法人 応用物理学会
  • ナノテク・レクチャー スピントロニクス
    武笠 幸一; 末岡 和久, 電子材料, 42, 12, 77, 80, Dec. 2003
    工業調査会, Japanese
  • Surface Imaging of Magnetic Sample with Spin-SPM
    HOSOI Hirotaka; SUEOKA Kazuhisa; MUKASA Koichi, Ceramics Japan, 38, 10, 795, 798, 01 Oct. 2003
    日本セラミックス協会, Japanese
  • Fabrication and characterization of cantilevers for scanning magnetoresistance microscope V
    TAKEZAKI T.; NAKAMURA M.; SUEOKA K.; MUKASA K., 日本応用磁気学会学術講演概要集 = Digest of ... annual conference on magnetics in Japan, 27, 0, 480, 480, 01 Sep. 2003
    Japanese
  • Spin-Sensitive Scanning Probe Microscopy
    SUEOKA Kazuhisa; MUKASA Koich, IEICE technical report. Electron devices, 102, 723, 23, 28, 10 Mar. 2003
    Scanning probe microscopy is a widely spreading surface observation tool which has a variety of applications for from basis surface science to biochemistry. SPM is also applicable to observe surface magnetic structures. Spin polarized tunneling enables scanning tunneling microscopy(STM) to observe spin-polarization of surface electron states, which yields spin-polarized STM(SP-STM). Ferromagnetic tips provide the non-contact atomic force microscopy to reversal short-range magnetic interaction such as exchange interaction. We call this kind of short-range magnetic force microscopy as exchang..., 一般社団法人電子情報通信学会, English
  • Spin-polarized electron injection through an Fe/InAs junction
    H Ohno; K Yoh; K Sueoka; K Mukasa; A Kawaharazuka; ME Ramsteiner, JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 42, 2A, L87, L89, Feb. 2003
    English
  • Observation of Surface Nano-magnetism by Exchange Force Microscopy
    HOSOI Hirotaka; SUEOKA Kazuhisa; MUKASA Koichi, Bulletin of the Japan Institute of Metals, 41, 12, 862, 863, 20 Dec. 2002
    The Japan Institute of Metals and Materials, Japanese
  • Magnetic domain structure of magnetic nano-disk
    YAMADA Y.; NAKAMURA M.; SUEOKA K.; MUKASA K., 日本応用磁気学会学術講演概要集 = Digest of ... annual conference on magnetics in Japan, 26, 0, 93, 93, 01 Sep. 2002
    Japanese
  • Fabrication and characterization of cantilevers for scanning magnetoresistance microscope IV
    NAKAMURA M.; TAKESAKI T.; SUEOKA K.; MUKASA K., 日本応用磁気学会学術講演概要集 = Digest of ... annual conference on magnetics in Japan, 26, 0, 409, 409, 01 Sep. 2002
    Japanese
  • Atomic scale observation of domain boundaries on c(2 x 2) Fe(001) thin film surfaces
    H Oka; A Subagyo; M Sawamura; K Sueoka; K Mukasa, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 41, 7B, 4969, 4972, Jul. 2002
    English
  • Restoration of scanning tunneling microscope images by means of two-dimensional maximum entropy method
    H Matsumoto; K Tokiwano; H Hosoi; K Sueoka; K Mukasa, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 41, 5A, 3092, 3098, May 2002
    English
  • Possibility of NC-AFM Imaging of Surface Magnetic Structure
    HOSOI Hirotaka; SUEOKA Kazuhisa; HAYAKAWA Kazunobu; MUKASA Koichi, Journal of the Surface Science Society of Japan, 23, 3, 158, 165, 10 Mar. 2002
    Many kinds of scanning probe microscopes have been proposed for imaging surface magnetic structures. Theoretical calculations predict that the detection of the short-range magnetic interaction such as exchange interaction reveals the magnetic structures on an atomic scale. The non-contact atomic force microscopy (NC-AFM) detecting the short-range magnetic interaction is called <I>exchange force microscopy (EFM)</I>. In order to detect the exchange interaction between a magnetic tip and a sample, we performed NC-AFM imaging of an antiferromagnet NiO(001) surface using a ferromagnetic Fe-coated tip. To discuss the interaction atomically resolved images obtained are analyzed by the superposition method. The results of the analysis demonstrates that the spin configuration revealed from the superimposed images coincides with the expected one of the NiO(001) surface. To evaluate the corrugation amplitude of the atoms, we introduced the topographic asymmetry, which indicates that the short-range magnetic interaction between the Fe-coated tip and sample can be detected by NC-AFM., 日本表面科学会, Japanese
  • Development of Exchange Force Microscopy
    Hosoi H; Sueoka K; Nakamura K; Hayakawa K; Mukasa K, Journal of Magnetics Society of Japan, 25, 10, 1507, 1515, 01 Oct. 2001
    Many kinds of scanning probe microscope have been proposed for imaging surface magnetic structures. Magnetic force microscope (MFM) is widely used for imaging magnetic structure. However, its spatial resolution is limited to a few tens of nanometers because the magnetic dipole interaction detected by MFM is long-range. Theoretical calculations predict that shortrange magnetic interactions such as the exchange interaction could enable non-contact atomic force microscope (NC-AFM) to image magnetic moments on an atomic scale. Recently, it was demonstrated that spinpolarized scanning tunneling ..., 社団法人日本磁気学会, Japanese
  • Two-dimensional Analysis of the Magnetic Microstructure of Media Using MFM Images
    Takekuma I; Haseyama M; Sueoka K; Mukasa K, Journal of Magnetics Society of Japan, 25, 10, 1535, 1540, 01 Oct. 2001
    This paper analyzes two-dimensional features of the magnetic microstructure of longitudinal thin-film media. Several MFM analyses of the magnetic cluster size have been presented, but the two-dimensional features of the clusters are not well understood. In order to determine these features, we focused on the distribution of magnetic poles at the boundaries of magnetic clusters, and quantitatively analyzed it by using two kinds of image processing methods: binarization and thinning methods. The results were as follows: (1) we found that some media showed dependence on the specific direction ..., 社団法人日本磁気学会, Japanese
  • 20aWD-11 Spin Electronic States of Nanowires under the STM Environment
    Sawamura M; Hosoi H; Subagyo A; Sueoka K; Mukasa K, Meeting abstracts of the Physical Society of Japan, 56, 2, 775, 775, 03 Sep. 2001
    社団法人日本物理学会, English
  • Fabrication and characterization of cantilevers for scanning magnetoresistive microscope III
    NAKAMURA M.; KIMURA M.; SUEOKA K.; MUKASA K., Journal of the Magnetics Society of Japan, 25, 0, 86, 86, 01 Sep. 2001
    Japanese
  • Spin electronic states and geometry of Fe nanowire : Comparison with Au, Pt, Cu, Na, Mg, Al, Si and Xe nanowires
    SAWAMURA M; HOSOI H; SUBAGYO A; KIMURA M; EILERES G; SUEOKA K; MUKASA K, 日本応用磁気学会学術講演概要集 = Digest of ... annual conference on magnetics in Japan, 25, 0, 258, 258, 01 Sep. 2001
    English
  • Scanning Tunneling Spectroscopy of $c(2{\times}2)$ Reconstructed Fe Thin-Film Surfaces
    Oka Hirofumi; Subagyo Agus; Sawamura Makoto; Sueoka Kazuhisa; Mukasa Kōichi, Jpn J Appl Phys, 40, 6, 4334, 4336, 30 Jun. 2001
    Fe thin films with flat surfaces are obtained on a MgO(001) substrate at a growth temperature of 550 K. The surfaces with atomically flat and wide terraces exhibit a $c(2{\times}2)$ reconstructed structure. To evaluate the effect of impurity atoms at the surface on the surface structures, scanning tunneling spectroscopy (STS), reflection high energy electron diffraction (RHEED) and X-ray photoelectron spectroscopy (XPS) studies were performed. The differential conductivity (${dI/dV}$) spectrum of the $c(2{\times}2)$ Fe(001) thin-film surfaces indicates an intense peak at the sample bias voltage of 0.4 V. Since there is no clear evidence of impurity adatoms forming such a surface structure, we expect that the topmost atoms are Fe, and that the observed peak originates from surface states., Publication Office, Japanese Journal of Applied Physics, Faculty of Science, University of Tokyo
  • Photoluminescence of GaAs tip apex excited by evanescent wave
    S Hattori; K Sueoka; Y Ohdaira; H Hori; K Mukasa, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 40, 6B, 4337, 4339, Jun. 2001
    English
  • Scanning tunneling spectroscopy of c(2 x 2) reconstructed Fe thin-film surfaces
    H Oka; A Subagyo; M Sawamura; K Sueoka; K Mukasa, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 40, 6B, 4334, 4336, Jun. 2001
    English
  • Fabrication and Characterization of Cantilevers for a Scanning Magnetoresistance Microscope
    KIMURA M.; NAKAMURA M.; SUEOKA K.; MUKASA K., Journal of the Magnetics Society of Japan, 25, 4, 1079, 1082, 01 Apr. 2001
    A variety of techniques have been provided to obtain quantitative measurement of the surface magnetic properties of materials with high spatial resolution Scanning magnetoresistance microscopy (SMRM) is a scanning probe technique in which a magnetoresistive (MR) sensor is used as a magnetic probe. It allows direct imaging of the magnetic flux in the sample. In previous work on SMRM, no feed-back system has been used to control the sample-sensor distance. Therefore, it was impossible to obtain topographic information on the sample. We made a cantilever with a MR sensor by means of photolithography, electron beam lithography, and micromachining. By using the feedback system of atomic force microscope, simultaneous measurement of the magnetic field and surface topography was realized., The Magnetics Society of Japan, Japanese
  • 28pYQ-1 Spin Electronic States of Nanowires under the STM Environment
    Sawamura M; Hosoi H; Kimura M; Eilers G; Subagyo A; Sueoka K; Mukasa K, Meeting abstracts of the Physical Society of Japan, 56, 1, 810, 810, 09 Mar. 2001
    社団法人日本物理学会, English
  • Fabrication of a Patterned Ferromagnetic Thin Film with an Si_3N_4 Membrane Mask
    KIMURA M.; YAMADA Y.; NAKANE R.; NAKAMURA M.; SUEOKA K.; MUKASA K., Journal of Magnetics Society of Japan, 25, 2, 91, 94, 01 Feb. 2001
    Spin-polarized scanning tunneling microscopy (SP-STM) is a promising technique for atomically resolved surface magnetic structure imaging. Since SP-STM is a surface-sensitive technique, the sample to be observed, such as a magnctic nanostructure, is required to have a well-defined clean surface. The magnetic sample preparation technique presented in this paper makes it easy to fabricate magnetic nanostructures in a vacuum. An Si_3N_4 membrane with submicron holes was used as a shadow mask for thin-film deposition. Conventional silicone processes were employed to make the Si_3N_4 membrane, and the shadow mask holes were formed on it using focused ion beam etching. The usability of this shadow mask was demonstrated by forming Co thin-film nanostructures on an Si substrate through the mask. The nanostructures were characterized by atomic force microscopy and magnetic force microscopy., 社団法人日本磁気学会, Japanese
  • Photoluminescence of GaAs Tip Apex Excited by Evanescent Wave.
    Hattori Satoshi; Sueoka Kazuhisa; Ohdaira Yasuo; Hori Hirokazu; Mukasa Koichi, Japanese Journal of Applied Physics, 40, 6, 4337, 4339, 2001
    To characterize the optical properties of a semiconductor tip apex or semiconductor nanoparticles attached to a tip apex, an experimental setup to detect the photoluminescence (PL) spectra of the specimens excited by the evanescent wave was constructed. The tip-prism surface distance dependency of the PL spectra was observed by means of a prism covered with conducting thin films which were used to define the origin of the separation by detecting the tunneling current. It was demonstrated that the PL intensity exponentially depends upon the separation., 公益社団法人 応用物理学会
  • Development of Spin-Dependent Scanning Tunneling Microscopy
    Sueoka K; Mukasa K, Journal of Magnetics Society of Japan, 24, 12, 1385, 1393, 01 Dec. 2000
    Several kinds of technique have been proposed for imaging surface magnetic structures, using the basic experimental concept of scanning probe microscopy(SPM). Magnetic force microscopy is the most commonly used type of SPM for magnetic imaging;however, its spatial resolution is limited to about 10 nm. To overcome this limitation, spin-polarized scanning tunneling microscopy (SP-STM) has been studied for about 10 years. A tunneling current flowing between a magnetic sample surface and a spin-sensitive probe is spin-oilarized. Spin-sensitive STM measurement of the spin-polarization makes it p..., 社団法人日本磁気学会, English
  • Temperature and rate dependence of the growth of Cu films on MgO(001)
    Eilers G; Matsuura M; Oka H; Subagyo A; Sueoka K; Mukasa K, Meeting abstracts of the Physical Society of Japan, 55, 2, 765, 765, 10 Sep. 2000
    社団法人日本物理学会, Japanese
  • Non-contact Atomic Force Microscopy of GaAs(110) surface
    Hosoi H; Uehara N; Sawamura M; Sueoka K; Mukasa K, Meeting abstracts of the Physical Society of Japan, 55, 2, 792, 792, 10 Sep. 2000
    社団法人日本物理学会, Japanese
  • Photoluminescence of GaAs tip apex excited by optical near-field
    Hattori S; Sueoka K; Hori H; Mukasa K, Meeting abstracts of the Physical Society of Japan, 55, 2, 93, 93, 10 Sep. 2000
    社団法人日本物理学会, Japanese
  • Two-dimensional analysis of magnetic microstructure of media
    TAKEKUMA I; HASEYAMA M; SUEOKA K; MUKASA K, 日本応用磁気学会学術講演概要集 = Digest of ... annual conference on magnetics in Japan, 24, 0, 11, 11, 01 Sep. 2000
    Japanese
  • Fabrication and characterization of cantilevers for scanning magnetoresistive microscope II
    KIMURA M.; NAKAMURA M.; SUEOKA K.; MUKASA K., 日本応用磁気学会学術講演概要集 = Digest of ... annual conference on magnetics in Japan, 24, 0, 118, 118, 01 Sep. 2000
    Japanese
  • Fabrication of patterned ferromagnetic thin film with thin film mask
    YAMADA Y; NAKANE R; KIMURA M; SUEOKA K; MUKASA K, 日本応用磁気学会学術講演概要集 = Digest of ... annual conference on magnetics in Japan, 24, 0, 179, 179, 01 Sep. 2000
    Japanese
  • レーザ溶接用ガスノズルの提案
    井加田 剛志; 菅 育正; 池田 正幸; 末岡 和久; 武笠 幸一; 大藤 仁志; 上遠野 久夫, 精密工学会大会学術講演会講演論文集, 2000, 2, 241, 241, 01 Sep. 2000
    Japanese
  • Genetic-Algorithm-Based Analysis of the Magnetic Microstructure of Media
    Takekuma I; Haseyama M; Sueoka K; Mukasa K, Journal of Magnetics Society of Japan, 24, 4-2, 303, 306, 15 Apr. 2000
    Magnetization fluctuation in the transition region is one of the important factors causing transition noise. The fluctuation is closely related to magnetic microstructures such as magnetic clusters, and it is therefore necessary to quantitatively analyze these clusters. This paper proposes an analysis method that can extract two-dimensional features of clusters. The proposed method is based on a genetic algorithm (GA), and investigates the distribution of the magnetic poles that exist at the boundaries of magnetic clusters. By considering the obtained distribution, we estimate the cluster s..., 社団法人日本磁気学会, Japanese
  • Design and Fabrication of Cantilever for Scanning Magnetoresistance Microscope
    NAKAMURA M.; KIMURA M.; SUEOKA K.; MUKASA K., Journal of the Magnetics Society of Japan, 24, 4, 771, 774, 15 Apr. 2000
    A variety of techniques have been proposed to measure surface magnetic properties using scanning probe microscopy. The most widely used is magnetic force microscopy (MFM). In many cases, however, it is hard to analyze MFM data quantitatively. A magnetoresistive (MR) device is also a candidate for such a sensor that can operate at room temperature with high sensitivity. Yamamoto et al. have demonstrated a scanning magnetoresistance microscope (SMRM) using a commercially available MR read-head for a hard disk. Since they held the MR head on a slider, there was no feedback system to control the distance between sample and sensor. We made a cantilever for the MR sensor to get the surface topography and magnetic properties simultaneously. Its magnetic field sensitivity with 10-mA sensing current is 90 μV/Oe, and our roughly estimated minimum field resolution is a few mOe (only Johnson noise is assumed with 10-kHz bandwidth at room temperature), which is much better than that of a scanning Hall probe microscope., The Magnetics Society of Japan, Japanese
  • Electron spin-relaxation times in p-type delta-doped GaAs/AlGaAs double heterostructures
    T Endo; K Sueoka; K Mukasa, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 39, 2A, 397, 401, Feb. 2000
    English
  • Scanning Tunneling Microscopy Observation of Epitaxial bcc-Fe(001) Surface.
    Subagyo Agus; Oka Hirofumi; Eilers Guido; Sueoka Kazuhisa; Mukasa Koichi, Japanese Journal of Applied Physics, 39, 6, 3777, 3779, 2000
    We report the first atomic-resolution scanning tunneling microscopy (STM) image of epitaxial bcc-Fe(001) films grown on MgO(001) substrates. A 50-\AA-thick Fe film grown at a growth temperature of 550 K formed square pyramidal islands with atomically flat terraces. The terraces were found to range between 5 nm and 20 nm in width separated by monoatomic high steps. The film exhibited a (1× 1) unreconstructed structure at a film thickness below 19 \AA; however, a reconstructed surface was found on thicker films. The atomic-resolution STM image and low energy electron diffraction (LEED) observation indicated that the reconstructed structure is a c(2× 2) structure., The Japan Society of Applied Physics
  • Electron Spin-Relaxation Times in p-type .DELTA.-doped GaAs/AlGaAs Double Heterostructures.
    Endo Toshihiro; Sueoka Kazuhisa; Mukasa Koichi, Japanese Journal of Applied Physics, 39, 2, 397, 401, 2000
    Optically pumped GaAs is a promising material for probes of spin-polarized scanning tunneling microscopy. To increase the accuracy of the measurement, it is necessary to increase the spin polarization of excited electrons and their spin-relaxation time. A δ-doped GaAs/AlGaAs double heterostructure shows a larger spin-relaxation time than bulk GaAs. It has been reported that in this structure the effect of the exchange interaction between the electrons and excitons can easily be reduced by spatially separating the electrons and holes. However, the dependency of the relaxation time on the structural details has not been experimentally examined. In this study, we determine the optimum well width of the δ-doped double heterostructure which yields a long spin-relaxation time using time-resolved photoluminescence measurement. Spin-relaxation times of the e<FONT SIZE="-1"><SUB>0</SUB></FONT>→hh<FONT SIZE="-1"><SUB>1</SUB></FONT> recombination and e<FONT SIZE="-1"><SUB>0</SUB></FONT>→lh<FONT SIZE="-1"><SUB>1</SUB></FONT> recombination are individually characterized. The e<FONT SIZE="-1"><SUB>0</SUB></FONT>→hh<FONT SIZE="-1"><SUB>1</SUB></FONT> recombination has the longer spin-relaxation time, and the longest relaxation time of τ<FONT SIZE="-1"><SUB>s</SUB></FONT>≅ 20 ns is observed for the structure with a well 90 nm in width., 公益社団法人 応用物理学会
  • Field emission characteristics from Si emitter formed by focused ion beams
    Tomomi Yoshimoto; Tatsuo Iwata; Kazuhisa Sueoka; Koichi Mukasa, Shinku/Journal of the Vacuum Society of Japan, 43, 8, 817, 819, 2000
    Nihon Shinku Kyokai, Japanese
  • An analysis of magnetic cluster using genetic algorithms
    TAKEKUMA I; HASEYAMA M; SUEOKA K; MUKASA K, 日本応用磁気学会学術講演概要集 = Digest of ... annual conference on magnetics in Japan, 23, 0, 307, 307, 01 Oct. 1999
    Japanese
  • Fabrication and characterization of cantilevers for scanning magnetoresistive microscope
    NAKAMURA M.; KIMURA M.; SUEOKA K.; MUKASA K., 日本応用磁気学会学術講演概要集 = Digest of ... annual conference on magnetics in Japan, 23, 0, 524, 524, 01 Oct. 1999
    Japanese
  • Surface observation of a potassium-doped C-60 thin film by scanning tunneling microscopy
    H Hosoi; S Nagashima; E Hatta; K Sueoka; K Mukasa, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 38, 9A, 5239, 5243, Sep. 1999
    English
  • Analysis of MFM Images as Stochastic Signals and Interpretation of their Variances
    Takekuma I; Yasui M; Haseyama M; Sueoka K; Mukasa K, Journal of Magnetics Society of Japan, 23, 4-2, 1073, 1076, 15 Apr. 1999
    Magnetic force microscopy (MFM) has been widely used to investigate magnetized states of recording media, and a method of analyzing MFM images as stochastic signals has been proposed. Through the analysis of the variance computed by this method, a parameter L/W was found. However, the relation between the variance variation and the recorded state of media is not well understood. In this study, in order to determine the relation, MFM output signals are simulated by using the micro-track model, and the variation in the variance around the transition region is considered. The relation between ..., 社団法人日本磁気学会, Japanese
  • A Simple Graphical Interpretation of MFM Images
    NAKAMURA M.; UJIIE H; HASEGAWA N.; KAZUNO T.; SUEOKA K.; MUKASA K., Journal of Magnetics Society of Japan, 23, 4, 1169, 1172, 15 Apr. 1999
    It si generally difficult to interpret MFM images. Information about the magnetic structure of the apex is needed to define the origin of a detected magnetic force. Magnetic dipole interaction affecting the magnetic states of the tip and samples should be considered. In some case, however, a simple analytical method is valid. We propose a new graphical method for interpreting the MFM image contrast, which based on the interaction lines mapping around 90° and 180° domain walls. MFM images of a cross-tie wall can be explained by using the proposed methods. Gaphical drawings of the MFM images are compaed with experimental MFM images of patterned Ni_<80>Fe_<20> thin films taken with a Ni_<80>Fe_<20>-coated tip., 社団法人日本磁気学会, Japanese
  • Scanning Thnneling Microscopy Study of Surface Structure and Magnetism of Fe Thin Films Grown on MgO (001).
    Subagyo Agus; Sueoka Kazuhisa; Mukasa Koichi; Hayakawa Kazunobu, Japanese Journal of Applied Physics, 38, 6, 3820, 3825, 1999
    Substrate preparation procedure dependence of the growth morphology and magnetic properties of 25 ML bcc-Fe(001) thin films epitaxially grown on MgO(001) substrates in a wide range of growth temperature was investigated by means of scanning tunneling microscopy (STM) and superconducting quantum interference device (SQUID). The growth morphology of Fe thin films was uniform both on a polished and on an annealed substrate, but nonuniform on a cleaved substrate. It was very difficult to obtain a flat Fe thin film on the cleaved substrate, and the film became discontinuous at or above a growth temperature of 493 K. At a growth temperature of 550 K, atomically defined terraces of Fe thin films were formed on the annealed substrate but were not formed on the polished substrate. A continuous film grown on the annealed substrate at a temperature of 593 K has a less magnetic anisotropy. The other continuous films have low coercivity of about 8 Oe and a biaxial magnetic anisotropy. The dependency of the growth morphology and magnetic properties of Fe thin films upon substrate preparation procedures concerning the presence of step-terraces on the substrate surface is discussed., 公益社団法人 応用物理学会
  • surface relaxation and exchange force on magnetic surfaces
    NAKMURA K; OGUCHI T; HASEGAWA H; SUEOKA K; HAYAKAWA K; MUKASA K, Meeting abstracts of the Physical Society of Japan, 53, 2, 396, 396, 05 Sep. 1998
    社団法人日本物理学会, Japanese
  • SP-STM obsevation of Fe thin films with optically pumped GaAs tips
    SUEOKA K; SUBAGYO A; MUKASA K; HAYAKAWA K, 日本応用磁気学会学術講演概要集 = Digest of ... annual conference on magnetics in Japan, 22, 0, 12, a-12-b, 01 Sep. 1998
    Japanese
  • STM observation of magnetic recording media with GaAs tip
    KODAMA H; UZUMAKI T; OSHIKI M; SUEOKA K; MUKASA K, 日本応用磁気学会学術講演概要集 = Digest of ... annual conference on magnetics in Japan, 22, 0, 13, a-13-b, 01 Sep. 1998
    Japanese
  • A simple graphical interpretation of MFM images
    NAKAMURA M.; SUEOKA K.; UJIIE H.; HASEGAWA N.; KAZUNO T.; MUKASA K., 日本応用磁気学会学術講演概要集 = Digest of ... annual conference on magnetics in Japan, 22, 0, 116, 116, 01 Sep. 1998
    Japanese
  • An analysis of MFM images of recording media as stochastic signals
    武隈 育子; 安井 雅彦; 末岡 和久; 長谷山 美紀; 武笠 幸一, 日本応用磁気学会学術講演概要集 = Digest of ... annual conference on magnetics in Japan, 22, 0, 474, 474, 01 Sep. 1998
    Japanese
  • A Method for Analyzing MFM Images as Stochastic Signals
    Takekuma I; Yasui M; Okumura Y; Akita M; Sueoka K; Haseyama M; Mukasa K, Journal of Magnetics Society of Japan, 22, 9, 1251, 1256, 01 Sep. 1998
    Magnetic force microscopy(MFM) is widely used to directly observe magnetized states with sub-micron resolution. The average profile, which is commonly used in the conventional quantitative analysis of MFM images, does not contain enough information to evaluate recording media. We introduce the concept of a stochastic process into MFM image analysis. By acquiring the statistical parameters-the average, the variance, and the histogram of the image-we reveal that the distribution of the fluctuation in the magnetic transition region is different from the Gaussian distribution. We also suggest a..., 社団法人日本磁気学会, Japanese
  • STM Study of a Thin GaAs Tip
    SUEOKA Kazuhisa; HOSOYAMA Naoki; SUBAGYO Agus; MUKASA Koichi; HAYAKAWA Kazunobu, Journal of the Surface Science Society of Japan, 19, 8, 522, 526, 10 Aug. 1998
    日本表面科学会, Japanese
  • Restoration of images obtained from the scanning tunneling microscope
    M Tsuchida; K Tokiwano; H Hosoi; K Sueoka; N Ohtomo; Y Tanaka; K Mukasa, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 37, 6A, 3500, 3505, Jun. 1998
    English
  • Restoration of images obtained from the scanning tunneling microscope
    M Tsuchida; K Tokiwano; H Hosoi; K Sueoka; N Ohtomo; Y Tanaka; K Mukasa, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 37, 6A, 3500, 3505, Jun. 1998
    English
  • An Application of the Small Mott Spin Analyzer to the SP-SEM
    Kuraoka Y; Sueoka K; Iwata T; Mukasa K; aihara R; Hayakawa K, Journal of Magnetics Society of Japan, 22, 4, 389, 392, 15 Apr. 1998
    A spin-polarized scanning electron microscope (SP-SEM) with a retarding-type Mott analyzer was developed. For SP-SEM applications, we improved the figureof merit of the polarimeter, which had been developed in our laboratory, and employed a newly designed secondary electron collector. To avoid the magnetic stray field generated by the magnetic objective lens, a magnetic shield whose shape was designed by means of the finite element method was attached to the lens, Using the SP-SEM system, we observed poin-dependent SEM images of the domain structure of a single Fe crystal (001) surface, and..., 社団法人日本磁気学会, Japanese
  • Dependence of exchange interaction between two Fe thin films on film-film separation II
    NAKAMURA K; OGUCHI T; HASEGAWA H; SUEOKA K; HAYAKAWA K; MUKASA K, Meeting abstracts of the Physical Society of Japan, 53, 1, 297, 297, 10 Mar. 1998
    社団法人日本物理学会, Japanese
  • Restoration of Images Obtained from the Scanning Tunneling Microscope.
    Tsuchida Masayoshi; Tokiwano Kazuo; Hosoi Hirotaka; Sueoka Kazuhisa; Ohtomo Norio; Tanaka Yukio; Mukasa Koichi, Japanese Journal of Applied Physics, 37, 6, 3500, 3505, 1998
    A new method for the restoration of images obtained from the scanning tunneling microscope (STM) is presented. We regard an image from the STM as a realization of a stochastic process and assume it to be composed of an underlying image and noise. The underlying image consists of smoothly varying gray levels representing the atomic profiles in the STM image. We express the underlying variation along an axis in terms of an "almost-periodic" function. We can determine the function by applying a recently developed procedure of data analysis, which consists of resolving the nonlinear least-squares method using the maximum entropy method of spectral analysis. This technique is applied to both modeled and actual data. The present method extracts the underlying image from the corrupted data and removes the horizontal striping effect due to 1/f<SUP>β</SUP> low-frequency fluctuation., The Japan Society of Applied Physics
  • STM Study of a Thin GaAs Tip.
    SUEOKA Kazuhisa; HOSOYAMA Naoki; SUBAGYO Agus; MUKASA Koichi; HAYAKAWA Kazunobu, J. Surf. Sci. Soc. Jpn., 19, 8, 522, 526, 1998
    A spin sensitive tip is needed to realize the spin-polarized STM, which can resolve the spin-polarization of surface density of states. GaAs and its related compound semiconductors are well known as spin-polarized electron sources and are also candidates for the spin probe. We made a GaAs thin film tip by cleavage. Since the GaAs film is thin enough, circular polarized light can illuminate through the tip and efficiently excite spin-polarized electrons near its apex. Because an atomically resolved Si(111) 7×7 surface was observed with the tip, the tip is mechanically stable. Optical responses of the tip were studied with Fe thin films grown on a MgO(001) surface. Using this magnetic thin film, we demonstrated that spin-dependent tunneling could be detected with the tip., The Surface Science Society of Japan, Japanese
  • Theoretical Study of the Exchange Interaction and the Exchange Force between Fe Films: Feasibility of Exchange Force Microscopy.
    Nakamura Kohji; Oguchi Tamio; Hasegawa Hideo; Sueoka Kazuhisa; Hayakawa Kazunobu; Mukasa Koichi, Japanese Journal of Applied Physics, 37, 12, 6575, 6579, 1998
    A theoretical study of the exchange interaction and the exchange force between two magnetic Fe(001) films based on a first-principles calculation is reported. Our calculations are carried out by varying the separation between the surface of two films from 1.4 to 5.0 Å. In these separations, we observed strong distance dependences of the exchange interaction and the exchange force. The variation in the exchange interaction and the exchange force relative to the atomic site on the surface are significant. Based on these results, the feasibility of exchange force microscopy (EFM) which probes the exchange force between the tip and the sample is discussed., 公益社団法人 応用物理学会
  • Statistical analysis of MFM images
    TAKEKUMA I; KUMAGAI M; YASUI M; OKUMURA Y; AKITA T; MAEDA M; SUEOKA K; HASEYAMA M; MUKASA K, 日本応用磁気学会学術講演概要集 = Digest of ... annual conference on magnetics in Japan, 21, 0, 1, 1, 01 Oct. 1997
    Japanese
  • An application of the small Mott spin analyzer to the SP-SEM
    KURAOKA Y; SUEOKA K; IWATA T; MUKASA K; AIHARA R; HAYAKAWA K, 日本応用磁気学会学術講演概要集 = Digest of ... annual conference on magnetics in Japan, 21, 0, 61, 61, 01 Oct. 1997
    Japanese
  • First-Principles Calculation of Magnetic Property of Fe tip
    NAKAMURA K; OHUCHI T; HASEGAWA H; SUEOKA K; HAYAKAWA K; MUKASA K, 日本応用磁気学会学術講演概要集 = Digest of ... annual conference on magnetics in Japan, 21, 0, 64, 64, 01 Oct. 1997
    Japanese
  • 8a-YH-4 Dependence of exchange interaction between two Fe thin films on film-film separation II
    Nakamura K; Oguchi T; Hasegawa H; Sueoka K; Hayakawa K; Mukasa K, Meeting abstracts of the Physical Society of Japan, 52, 2, 545, 545, 16 Sep. 1997
    社団法人日本物理学会, Japanese
  • GaAs-STM Probe Formed by Focused Ion Beam
    MORIBAYASHI Shigeru; SUEOKA Kazuhisa; TANAHASHI Kenji; MUKASA Koichi, Journal of the Surface Science Society of Japan, 18, 8, 485, 489, Aug. 1997
    Focused Ion Beam (FIB) technique is applicable to prepare a sharp tip for Scanning Tunneling Microscope (STM). Our simple calculation shows that radius of the FIB milled tip apex can be reduced to be smaller than the spot size of the FIB. In this study, a GaAs tip, which has a potential ability to resolve information about electron spin polarization in tunneling currents, was formed by means of the FIB. The FIB produces damaged layers on the semiconductor surface, which are thicker than those on metals and thus prevent electrons from tunneling through the layers. After the damaged tip was dipped in HCl solution which can selectively remove the damaged layer, Highly Oriented Pyrolytic Graphite (HOPG) surface atoms were observed and the I-V curves showed characteristics of the semiconductor., 日本表面科学会, Japanese
  • Relation between the MFM Image and the Magnetization Distribution of a Ferromagnetic Tip (Magnetism)
    Ishii I; Kanai Y; Sueoka K; Mukasa K, Journal of Magnetics Society of Japan, 21, 4-2, 409, 412, 15 Apr. 1997
    The relation between images obtained by magnetic force microscope (MFM) and the magnetization distribution of a ferromagnetic tip was investigated. Stray field from a ferrite magnetic recording head was measured by MFM, using a Co-coated ferromagnetic tip. Two-dimensional finite element analysis was carried out to compute the force derivative, where both the tip-sample magnetic interaction and the nonlinear magnetic properties of the ferromagnetic tip and the recording head were taken into account. Comparison of the MFM image and the calculated force derivative showed close agreement. The c..., 社団法人日本磁気学会, Japanese
  • 29a-L-6 Dependence of exchange interaction between two Fe thin films on film-film separation
    Nakamura K; Oguchi T; Hasegawa H; Sueoka K; Hayakawa K; Mukasa K, Meeting abstracts of the Physical Society of Japan, 52, 1, 470, 470, 17 Mar. 1997
    社団法人日本物理学会, Japanese
  • GaAs-STM Probe Formed by Focused Ion Beam.
    MORIBAYASHI Shigeru; SUEOKA Kazuhisa; TANAHASHI Kenji; MUKASA Koichi, J. Surf. Sci. Soc. Jpn., 18, 8, 485, 489, 1997
    Focused Ion Beam (FIB) technique is applicable to prepare a sharp tip for Scanning Tunneling Microscope (STM). Our simple calculation shows that radius of the FIB milled tip apex can be reduced to be smaller than the spot size of the FIB. In this study, a GaAs tip, which has a potential ability to resolve information about electron spin polarization in tunneling currents, was formed by means of the FIB. The FIB produces damaged layers on the semiconductor surface, which are thicker than those on metals and thus prevent electrons from tunneling through the layers. After the damaged tip was dipped in HCl solution which can selectively remove the damaged layer, Highly Oriented Pyrolytic Graphite (HOPG) surface atoms were observed and the I-V curves showed characteristics of the semiconductor., The Surface Science Society of Japan, Japanese
  • Relationship between Magnetization State of Ferromagnetic Tip and Observed Results in a Magnetic Force Microscope
    Kanai Yasushi; Ishii Izuru; Sueoka Kazuhisa; Mukasa Koichi, Bulletin of Niigata Institute of Technology, 1, 0, 17, 22, Dec. 1996
    This paper investigates the relationship between image obtained by Magnetic Force Microscope (MFM) and the Magnetization distribution in a ferromagnetic tip. Stray field of a ferrite recording head is measured by an MFM using Co coated ferromagnetic tip. Asymmetrical images are obtained with respect to the current flow. To understand the images obtained by MFM, finite element calculations are carried out and derivatives of force acting on the tip are obtained, where both tip-head magnetic interaction and nonlinearity of Co tip and head material are taken into account. By comparing the MFM image and calculated derivative of force, close agreement is found. The relationship between calculated magnetization states of Co tip and the MFM images is also discussed. We found that it is indispensable to understand the magnetization state of a ferromagnetic tip in order to understand the MFM images．, 新潟工科大学, Japanese
  • STM observation of laser-exposed Fe/GaAs by STM
    Arisawa Y; Hazama Y; Hosoyama N; Sueoka K; Asahi R; Taga Y; Hayakawa K; Mukasa K, Abstracts of the meeting of the Physical Society of Japan. Sectional meeting, 1996, 2, 639, 639, 13 Sep. 1996
    社団法人日本物理学会, Japanese
  • First Principles Calculation of Exchange Force in Magnetic Surfaces
    Nakamura K; Oguchi T; Hasegawa H; Sueoka K; Hayakawa K; Mukasa K, Abstracts of the meeting of the Physical Society of Japan. Sectional meeting, 1996, 3, 253, 253, 13 Sep. 1996
    社団法人日本物理学会, Japanese
  • Theoretical Calculation of Exchange Interaction between Fe Thin Films
    NAKAMURA K; OGUCHI T; HASEGAWA H; SUEOKA K; HAYAKAWA K; MUKASA K, 日本応用磁気学会学術講演概要集 = Digest of ... annual conference on magnetics in Japan, 20, 0, 185, 185, 01 Sep. 1996
    Japanese
  • Development of a semiconductor spin probe and STM observation of Fe ultrathin films
    SUEOKA K; ARISAWA Y; MURIBAYASHI S; HAYAKAWA K; MUKASA K, 日本応用磁気学会学術講演概要集 = Digest of ... annual conference on magnetics in Japan, 20, 0, 328, 328, 01 Sep. 1996
    Japanese
  • Development of a small Mott spin-analyzer(II)
    KURAOKA Y; YAMAKURA M; SUEOKA K; HAYAKAWA K; MUKASA K, 日本応用磁気学会学術講演概要集 = Digest of ... annual conference on magnetics in Japan, 20, 0, 329, 329, 01 Sep. 1996
    Japanese
  • Relationship between MFM image and magnetic tip(2)
    ISHII I; KANAI Y; SUEOKA K; MUKASA K, 日本応用磁気学会学術講演概要集 = Digest of ... annual conference on magnetics in Japan, 20, 0, 330, 330, 01 Sep. 1996
    Japanese
  • Measurement of Spin-Relaxation Times by Time-Resolved Photoluminescence
    KIMURA M; ENDO T; SUEOKA K; ARAISO T; MUKASA K; TAKAHASHI H, Journal of the Magnetics Society of Japan, 20, 2, 253, 256, 01 Apr. 1996
    Optically pumped p-type GaAs is a most promising material for the probes of spin-polarized scanning tunneling microscopes (SP-STMs). A long spin relaxation time is an important factor in the application, and it was reported that the δ-doped GaAs/AlGaAs double heterostructure has a longer spin relaxation time than that of bulk p-type GaAs.We studied the spin relaxation process in the structure by time-correlation single-photon counting (TCPC). It was confirmed that the relaxation time strongly depends on the dopant distribution., The Magnetics Society of Japan, Japanese
  • Development of a small Mott spin-analyzer
    KURAOKA Y; SASAKI M; SUEOKA K; IWATA T; ADACHI H; HAYAKAWA K; MUKASA K, 日本応用磁気学会学術講演概要集 = Digest of ... annual conference on magnetics in Japan, 19, 0, 153, 153, 01 Sep. 1995
    Japanese
  • Analysis of spin-polarized tunneling phenomena by STM
    ARISAWA Y; HAZAMA Y; SUEOKA K; HAYAKAWA K; MUKASA K, 日本応用磁気学会学術講演概要集 = Digest of ... annual conference on magnetics in Japan, 19, 0, 154, 154, 01 Sep. 1995
    Japanese
  • Electron spin relaxation time measurement via time-resolved photoluminescence
    ENDO T; KIMURA M; HASHIMOTO S; NOJIRI T; SUEOKA K; MUKASA K; TAKAHASHI H; ARAISO T, 日本応用磁気学会学術講演概要集 = Digest of ... annual conference on magnetics in Japan, 19, 0, 155, 155, 01 Sep. 1995
    Japanese
  • Relation between MFM images and state of magnetization of magnetic tip
    HATANAKA K; NAGAHAMA K; WATANABE J; IMAMURA T; SUEOKA K; MUKASA K, 日本応用磁気学会学術講演概要集 = Digest of ... annual conference on magnetics in Japan, 19, 0, 156, 156, 01 Sep. 1995
    Japanese
  • Study of Focused Ion Beams for Probe Tip Milling
    Sasaki Yasushi; Sueoka Kazuhisa; Iwata Tatsuo, Bulletin of the Faculty of Engineering, Hokkaido University, 174, 0, 41, 47, Jul. 1995
    北海道大学, Japanese
  • Probe Tip Formed by Focused Ion Beams
    Yasushi Sasaki; Takaaki Kamei; Tomomi Yoshimoto; Tatsuo Iwata; Kazuo Suzuki; Kazuhisa Sueoka; Koichi Mukasa, Shinku, 38, 3, 401, 403, 1995
    日本真空協会, English
  • On the development of the spin-polarized scanning tunneling microscope.
    MUKASA Koichi; SUEOKA Kazuhisa; HAYAKAWA Kazunobu, 應用物理, 63, 3, 263, 267, 10 Mar. 1994
    応用物理学会, Japanese
  • On the development of the spin-polarized scanning tunneling microscope
    MUKASA Koichi; SUEOKA Kazuhisa; HAYAKAWA Kazunobu, OYOBUTURI, 63, 3, 263, 267, 1994
    表面磁性の評価法として,走査トンネル顕微鏡 (STM) が使われようとしている. GaAs試料, Ni探針を用いたSTMで,両者のスピンの偏りに依存したトンネル電流の検出に成功した.これは,磁性体試料の磁気的状態に影響を与えることのない汎用的スピン偏極STMの実現が可能であることを示すものである.本稿ではこの検証実験について,スピン偏極に関するトンネル分光の流れとともに紹介する., The Japan Society of Applied Physics, Japanese
  • Exchange Interaction between Magnetic Moments of Ferromagnetic Sample and Tip: Possibility of Atomic-Resolution Images of Exchange Interactions using Exchange Force Microscopy.
    Mukasa Koichi; Hasegawa Hideo; Tazuke Yuichi; Sueoka Kazuhisa; Sasaki Makoto; Hayakawa Kazunobu, Japanese Journal of Applied Physics, 33, 5, 2692, 2695, 1994
    The exchange interaction and force acting between magnetic moments of a ferromagnetic sample and tip are calculated using the one-dimensional electron-gas model. It is suggested from an estimate of their magnitudes that an atomic-resolution image of exchange interaction of the transition-metal sample and tip can be obtained with the use of atomic force microscopy (AFM)., 公益社団法人 応用物理学会
  • Possibility of Observing Spin-Polarized Tunneling Current Using Scanning Tunneling Microscope with Optically Pumped GaAs
    Sueoka Kazuhisa; Mukasa K\={o}ichi; Hayakawa Kazunobu, Japanese Journal of Applied Physics, 32, 6, 2989, 2993, 1993
    A scanning tunneling microscope (STM) experiment demonstrating the spin-polarized tunneling effect was performed. A GaAs thin-film sample pumped by circularly polarized light, and a ferromagnetic polycrystalline Ni tip are used. The tunneling current is perturbed by modulating the power and polarization of the pumping light. The perturbation arises due to three dominant effects: the thermal expansion of the tip or sample, the variation in excited carrier concentration in GaAs and the spin-polarized tunneling effect. The spin-polarized effect can be distinguished by observing the current dependence on the bias. Well-adjusted pumping optics allows the separate detection of the spin-polarized signal, which depends upon the circular polarization of the light and the tip magnetization. The present experiment indicates the feasibility of a spin-polarized STM with a non-magnetic tip., 公益社団法人 応用物理学会
  • 新強磁性物質探索のための電子トンネル分光の研究
    武笠 幸一; 末岡 和久, 旭硝子財団研究報告, 61, p251, 260, 1992
    旭硝子財団, Japanese
■ Syllabus
  • 大学院共通授業科目（一般科目）：複合領域, 2024年, 修士課程, 大学院共通科目
  • 大学院共通授業科目（一般科目）：複合領域, 2024年, 修士課程, 大学院共通科目
  • 固体物性学特論, 2024年, 修士課程, 情報科学院
  • プロジェクトマネジメント特論, 2024年, 修士課程, 情報科学院
  • パーソナルスキル特論, 2024年, 修士課程, 情報科学院
  • 固体物性学特論, 2024年, 博士後期課程, 情報科学研究科
  • 固体物性学特論, 2024年, 博士後期課程, 情報科学院
  • プロジェクトマネジメント特論, 2024年, 博士後期課程, 情報科学研究科
  • プロジェクトマネジメント特論, 2024年, 博士後期課程, 情報科学院
  • パーソナルスキル特論, 2024年, 博士後期課程, 情報科学研究科
  • パーソナルスキル特論, 2024年, 博士後期課程, 情報科学院
  • 応用量子力学, 2024年, 学士課程, 工学部
  • 電気電子工学実験Ⅳ, 2024年, 学士課程, 工学部
  • 電気電子工学実験Ⅴ, 2024年, 学士課程, 工学部
  • 情報学 Ⅱ, 2024年, 学士課程, 全学教育
■ Research Themes
  • Development of in-situ TEM measurement system and its application to nanoelectronics
    Grants-in-Aid for Scientific Research
    2009 - 2011
    ARITA Masashi; TAKAHASHI Yasuo; SUEOKA Kazuhisa; SHIBAYAMA Tamaki
    In recent years, development of electronic devices is energetically investigated, where geometrical and magnetic mictro-and nano-structures contribute to the electronic properties. In this work, in-situ transmission electron microscopy (i. e. in-situ TEM) was introduced to these studies, where TEM image observations and electric measurements were simultaneously performed. To realize these experiments, special TEM holders were developed. One of them was a holder with a piezo actuator (i. e. TEM-STM holder), and the other was with an electromagnet system (named as a TEM-MF holder). Using the TEM-STM holder, formation and disappearance of a conductive filament inside the resistive RAM (ReRAM) layer was clearly observed. This result supports the filament model for ReRAM switching. On the other hand, the motion of the magnetic domain caused by the applied magnetic field generated by the TEM-MF holder was confirmed. Utility of in-situ TEM method was clearly demonstrated.
    Japan Society for the Promotion of Science, Grant-in-Aid for Scientific Research (C), Hokkaido University, Coinvestigator not use grants, Competitive research funding, 21560681
  • Spin blockade from spin channel to quantum dots and its application to qubit
    Grants-in-Aid for Scientific Research
    2008 - 2010
    YOH Kanji; SUEOKA Kazuhisa; NAKAZATO Hiromichi
    We have investigated surface reaction of Fe electrode and InAs substrate by thermodynamic calculation. We have fabricated a spin transistors with Fe electrode and verified current oscillation which agreed well with theoretical calculation. We have also fabricated an InAs nanowire spin transistor based on Au colloid and observed current oscillation which is presumably originates from spin-orbit interaction. In a spintransistor/quantum dot hybrid structure, we have theoretically demonstrated that spin polarization of 40% would be hard to verify quantum entanglement, but it would be appreciably large signal with 60% spin polarization and clear entanglement would be observable with 80% spin polarization in the spin channel.
    Japan Society for the Promotion of Science, Grant-in-Aid for Scientific Research (A), Hokkaido University, Coinvestigator not use grants, Competitive research funding, 20241033
  • Study on single electron tunneling by means of TEM/STM to develop single electron devices operated at room temperature
    Grants-in-Aid for Scientific Research(基盤研究(C))
    2006 - 2008
    有田 正志; 高橋 庸夫; 末岡 和久; 柴山 環樹
    省エネデバイスとして注目されている単電子デバイスの室温動作確認を念頭に,ピエゾ素子搭載型透過電子顕微鏡ホルダー(TEM/STMホルダー)およびその制御システムを開発した.先端10nm程度の先鋭電極間に数個のナノ粒子を挟み,その電気伝導特性を評価したところ低バイアス領域においてほとんど電流が流れないクーロンプロッケイド(CB(を観測できた。これは単電子トンネル現象(SET(に特徴的な現象である.数nmのナノ粒子を用いて室温動作SETデバイスの得られることを実験的に示すことができたといえる.
    Ministry of Education, Culture, Sports, Science and Technology, 基盤研究(C), 北海道大学, Coinvestigator not use grants, Competitive research funding, 18560640
  • RESEARCH ON BASIC TECHNOLOGIES FOR THE REALIZATION OF CATE CONTROLLED SPINTRANSISTOR
    Grants-in-Aid for Scientific Research(基盤研究(A))
    2005 - 2007
    Knaji YOH; 末岡 和久; 大野 宗一
    High quality magnetite (Fe_3O_4) was found to be grown on (100) InAs surface. Magnetite film has become a candidate of high efficiency spin injector to be applied to spin transistor. On the other hand, we have also demonstrated gate controlled spin current oscillation due to spin-orbit interaction in Datta-Das type spin transistor structure based on Fe electrode and InAs-based heterostructure transistor at room temperature. In order to justify the observed experimental results of our spin FET characteristics, we have performed Monte Carlo Simulation taking account of Dyakonov - Perel mechan...
    Ministry of Education, Culture, Sports, Science and Technology, 基盤研究(A), 北海道大学, Coinvestigator not use grants, Competitive research funding, 17206028
  • 局所計測を目指したナノオーダ極微プローブの開発
    科学研究費補助金(萌芽研究)
    2005 - 2006
    細井 浩貴; 末岡 和久; 石井 睦
    これまでに開発した先端にFeを持つ磁性体ナノプローブ作製技術を用いたCNT探針の作製に関する研究を行った。CNTを成長させるために重要な条件には、成長温度や時間、材料ガスの流量と成分比などがあるが、この中で成長に大きく影響するのが成長温度であることがわかった。また、探針先端部に形成するFeの構造もCNT成長に大きな影響を与えることがわかった。磁性体ナノプローブを作製する場合には、磁性体部分の磁気特性を形状にて制御するために、アスペクト比を高くする必要があった。しかし、CNTを成長させる場合には、形状そのものよりも、磁性体の体積を小さくすることがポイントであることがわかった。この結果、Feを持つ磁性体ナノプローブ作製技術を応用して、CNT探針を作製できるようになった。CNT探針を用いた原子分解能測定への応用を考え、大気中ではなく超高真空環境での使用を前提としたプロセス、すなわち、ナノ磁性体の作製からCNT成長までの一貫して行うことのできるプロセスの可能性を探索した。成長のベースとなるFeを極微量蒸着したタングステン探針を超高真空チャンバ内に設置し、これまでの条件よりも低圧環境でのCNT成長を試みた。その結果、微量ではあるが、CNTが成長することが明らかとなった。現在、成長条件を再検討することで、CNTの長さと量の制御を試みている。これまでに磁性体ナノプローブを用いた磁気力顕微鏡...
    文部科学省, 萌芽研究, 北海道大学, Coinvestigator not use grants, Competitive research funding, 17651053
  • Atomic resolved imaging of exchange force interaction force by magnetic resonance scanning force microscopy
    Grants-in-Aid for Scientific Research(基盤研究(B))
    2003 - 2005
    Koichi MUKASA; 松本 和彦; 加茂 直樹; 有田 正志; 末岡 和久; 石井 睦
    We have developed a novel scanning probe microscope (SPM) system which enables to realize magnetic resonance scanning force microscopy (MR-SFM). Up to now, we have succeeded in obtaining an atomic resolved image of Si(111)-7x7 with scanning tunneling microscopy (STM) mode and we confirmed that the developed microscope cell has an adequate rigidity. We composed a optical interferometer system and detected the signal of interferometer between the edge of optical fiber and cantilever. In addition, we confirmed that Q-factor of the cantilever is increasing with falling in temperature. However, ...
    Ministry of Education, Culture, Sports, Science and Technology, 基盤研究(B), 北海道大学, Coinvestigator not use grants, Competitive research funding, 15310080
  • 金属-半導体局所トンネルスピン注入
    科学研究費補助金(若手研究(A))
    2002 - 2004
    末岡 和久
    本研究は、半導体から金属あるいは金属から半導体への局所的なトンネルスピン注入を行うための知見を得ることを目的とした。金属-半導体トンネル接合において、強磁性体金属から半導体へ注入された電子のスピン状態を、エレクトロルミネッセンス測定から調べた。金属-半導体トンネル接合のへき開面からの発光測定を行うことで、薄膜面内異方向性を有する強磁性薄膜からの注入電子の偏極測定を実現した。AlAsを障壁とした磁性体金属-PIN構造では、印加磁場に依存したスピン偏極度を観測した。走査型トンネル顕微鏡(STM)を用いて局所的にスピン注入を行う実験に用いるために、スピン偏極した非占有準位が表面準位として表面に局在する強磁性体表面に関する研究を行った。MgO(001)表面に上に成長したFeおよびCr薄膜の表面において、C(2x2)構造をとった場合、高エネルギー側にシフトする表面状態を見出した。この状態はC(2x2)を構成する原子と原子の間で強く観測されることから、局所的に閉じ込められた状態であると考えることができる。この状態に選択的にスピン注入を行うことを試みた。Fe薄膜では円偏光により励起したスピン偏極電子をこの局所スピン偏極表面準位へ注入することができ、それにより表面のスピン状態に依存したスピン依存STM像が得られることを示した。さらに、欠陥などの局所的な構造の違いで表面のスピン状態が異なる試料...
    文部科学省, 若手研究(A), 北海道大学, Principal investigator, Competitive research funding, 14702033
  • 強磁性体/半導体接合を用いたスピントランジスタの研究
    科学研究費補助金(特定領域研究)
    2003 - 2003
    陽 完治; 末岡 和久
    本年度は、(1)SIMS観察およびTEM観察により、スピン注入効率の測定に大きな影響を与える鉄薄膜/インジウム砒素界面状態の薄膜形成温度依存性の探索をおこない、(2)電子発光の円偏光測定評価の背景となる峡ギャップ半導体自身の円偏光測特性に与える原因の探索を行った。その結果、鉄薄膜/インジウム砒素界面は摂氏100度前後以上で界面反応が進みスピン注入効率をさまたげること、インジウム砒素自身の与える電子発光の円偏光測定への寄与としてゼーマン効果、価電子帯の磁気消失があることが分かった。これらの結果に基づき室温においてインジウム砒素上に鉄薄膜を形成した強磁性体/半導体接合によるスピン注入効率を見積もった結果、最大でおよそ40%となることが分かった。スピントランジスタの動作の実証を目指しインジウム砒素チャンネルを有するスピントランジスタに最適なヘテロ構造の結晶成長、高効率スピン注入の結果を生かしたデバイス構造の作製を進めている。
    文部科学省, 特定領域研究, 北海道大学, Coinvestigator not use grants, Competitive research funding, 15034201
  • Fabrication of Semiconductor Spin Device -Integration of Spin Transistor and Quantum Dots -
    Grants-in-Aid for Scientific Research(基盤研究(A))
    2002 - 2003
    Kanji YOH; 雨宮 好仁; 末岡 和久
    Spin injection from ferromagnet into semiconductor has been investigated and high efficiency spin injection was verified. We have also confirmed the spin transistor operation based on the spin injection technique in Fe/InAs hybrid structure. Itemized research results are listed below.(1)Circular polarization measurements of electroluminescence from Fe/InAs spin diode revealed that the degree of circular polarization of 18-20% and spin injection efficiency of 36-40% is possible.(2)Surface reaction at the Fe/InAs interface has been investigated using Secondary Ion Mass Spectroscopy (SIMS), Tr...
    Ministry of Education, Culture, Sports, Science and Technology, 基盤研究(A), 北海道大学, Coinvestigator not use grants, Competitive research funding, 14205042
  • カーボンナノチューブのスピンプローブへの応用
    科学研究費補助金(萌芽研究)
    2002 - 2003
    武笠 幸一; 松本 和彦; 加茂 直樹; 末岡 和久
    メタンガスを主成分とした原料ガスとBEリソなどを利用してパターンニングした触媒薄膜を用いて、単層カーボンナノチューブのCVDによる成長条件の最適化をした。また、タングステン探針、ニッケル針等の先端近傍に同様の条件を用いてカーボンナノチューブの成長を試みた。さらに、磁性グラニュラ薄膜がカーボンナノチューブを成長する際の触媒となりうることを示すことに成功した。これにより磁性体薄膜と接点を持つカーボンナノチューブプローブが作製できる可能性が示唆された。シリコン探針上に成長したカーボンナノチューブを用いて、非接触原子間力顕微鏡(NC-AFM)測定を行い、Si(111)7×7表面観察から、単層カーボンナノチューブの探針ではコーナーホールは分解できるが、アドアトムを分解することが難しいことが分かった。また接触電位差測定では低い仕事関数の探針であることが示され、先端部分が仕事関数の低いカーボンナノチューブの特性を反映していることを示した。先端部分のからの電界放射電子のスピン偏極度測定を行うために、低加速電圧タイプのモット分析器を用いた電界放射電子のスピン計測装置の組み立てを行った。また、探針先端に取り付けたカーボンナノチューブから低電圧での電界放射を確認し、カーボンナノチューブ先端からの電界放射電子のスピン偏極度測定系の構築を完了した。さらに、スピン偏極走査型トンネル顕微鏡のスピンプローブ...
    文部科学省, 萌芽研究, 北海道大学, Coinvestigator not use grants, Competitive research funding, 14655014
  • Scanning magneto resistance microscopy and its applications
    Grants-in-Aid for Scientific Research(基盤研究(A))
    2001 - 2003
    Koichi MUKASA; 有田 正志; 武藤 俊一; 末岡 和久
    Scanning Probe Microscopy (SPM) is the one of the key tools for promoting the research field called nano-technology, in which high spatial resolution is required to evaluate characteristics of nano-structures and manipulate each of them. SPM has wide variety of applications associating with different kinds of probe-sample interactions. In this research, we investigated new application of SPM with high functional SPM probes equipped with miniaturized sensors fabricated by mean of Micro-Electro-Mechanical Systems (MEMS) technology and ferromagnetic thin films fabrication techniques.As a first...
    Ministry of Education, Culture, Sports, Science and Technology, 基盤研究(A), 北海道大学, Coinvestigator not use grants, Competitive research funding, 13355018
  • Fabrication of spin-injection transistor and its application to quantum computing devices
    Grants-in-Aid for Scientific Research(基盤研究(A))
    2000 - 2001
    Kanji YOH; 雨宮 好仁; 末岡 和久
    We have verified large spin-orbit coupling in InAs quantum well structure which was grown on InAs substrate by analyzing Shubnikov-de Haas oscillation. The obtained spin-orbit interaction coefficient was 【similar or equal】 2.7x10^<-11>eVm. The number was found to be much greater than that of GaAs or InGaAs on InP and almost comparable to the previous experiments where measured InAs heterostructures were associated with possible effects from interface states or possible residual strain or possible interplay of several sublevels. The present result verified that these possible effects has min...
    Ministry of Education, Culture, Sports, Science and Technology, 基盤研究(A), 北海道大学, Coinvestigator not use grants, Competitive research funding, 12305019
  • 半導体スピンプローブにおけるスピン制御と応用
    科学研究費補助金(特定領域研究(A))
    1999 - 1999
    末岡 和久; 児玉 宏喜; 堀 裕和; 岩田 達矢
    計画書に書いた実施予定測定対象を選ばない汎用のスピン偏極走査型トンネル顕微鏡には、試料との磁気双極子相互作用の小さな探針が必要とされる。本研究では、スピン偏極電子が励起されたGaAsに注目し、その基礎物性と応用に関する研究を行った。1.円偏光エバネッセント光の発生とGaAs探針先端部の局所スピン偏極電子励起GaAs半導体プローブ先端部での偏極電子状態について研究を行う必要がある。先端部での局所励起を実現するためにエバネッセント光を利用する。円偏光したエバネッセント光を発生するために、2つの直交する直線偏光を2つの直交する方向にプリズムに入射し、プリズム上に周期的な回転エバネッセント場を発生させる光学系の構築を行った。またインチワームを用いた粗動機構、分光器により先端部のルミネセンス測定装置、プリズム表面と探針先端の距離を制御するための制御回路を作成した。探針先端部での発光は確認できたが、室温での実験では発光効率が悪く円偏光解析まで至っていないが、若干の改良により円偏光解析が可能となる。2.σドープGaAsヘテロ構造内でのスピン緩和の測定半導体内での小数キャリアのスピン緩和時間を制御することはSP-STMのスピンプローブ応用に関してだけはなく、スピンエレクトロニクスへの応用に関しても重要である。σドープGaAs/AlGaAs構造を作成し、井戸構造とスピン緩和時間の関係について実...
    文部科学省, 特定領域研究(A), 北海道大学, Principal investigator, Competitive research funding, 11125101
  • スピン渦状態の解析と応用
    科学研究費補助金(奨励研究(A))
    1998 - 1999
    末岡 和久
    本研究では、磁区構造の一つであるスピン渦状態を磁気記録は応用するための基礎研究である。主として、マイクロ・マグネティックスによる磁区構造解析手法の検討、LLG方程式に基づく磁区構シミュレーションの検討、プロローブ顕微鏡を用いた磁気マウンド作製方法方法の検討、電子線リソグラフによる磁気パターンの作成、スピン偏極SEMおよびMFMによる評価を行った。マイクロ・マグネティックスによる解析では、スピン渦状態に対する解析解を得ることができ、これまでに報告されている微細磁性体結晶の観察結果を説明した。この解析手法では軸対象である構造条件を仮しているために、ディスク形状以外の、例えば多角形の、スピン渦状態の解析ができない。一般形式の磁区構造の解析を行うために、LLG方程式に基づく計算シュミレーションを行った。規模の小さい計算ソフトを完成させ2次元での計算を可能にした。作成したプログラムでは正方形の境界条件を持つ薄膜のスピン渦解を得ることに成功した。実際に磁性体においてスピン渦状態を実現するための一つの方法として、微細磁性体結晶を利用する方法がある。本研究ではリソグラフ技術とエッチング技術を応用した作成方法も検討し、作成を試みた。プローブ顕微鏡を用いた磁気マウンド作成方法について検討を行った。CoをスパッタリングによりSi深針上に蒸着する。酸化膜を付けたSi基板上に深針を近づけ数msから数百...
    文部科学省, 奨励研究(A), 北海道大学, Principal investigator, Competitive research funding, 10750001
  • Study of the exchange force and the magnetic force between tip and sample
    Grants-in-Aid for Scientific Research(基盤研究(B))
    1997 - 1998
    Kohji NAKAMURA; 末岡 和久; 武笠 幸一; 早川 和延
    Magnetic force microscopy (MFM), which detects the force arising from an interaction between magnetic dipoles of a tip and a sample, is a successful scanning probe technique for observing magnetic structures such as magnetic domain structures. However, it does not enable determination of the magnetic structure on an atomic scale since the magnetic dipole interaction is a long-range one. The typical tip-sample separations in MFM are on the order of more than 10nm and the spatial resolution is on the order of l0nm to l00nm. An improvement of the resolution might be made by probing the short-r...
    Ministry of Education, Culture, Sports, Science and Technology, 基盤研究(B), 北海道大学, Coinvestigator not use grants, Competitive research funding, 09450014
  • 小型スピン分析器の開発と応用
    科学研究費補助金(基盤研究(C))
    1997 - 1998
    武笠 幸一; 末岡 和久; 早川 和延
    本研究では、汎用性の高い小型Mott分析器を設計・製作し、これを用いたNEA-GaAs光励起電子線のスピン偏極度測定および電子スピンによる磁性体試料観察を行った。従来のスピン分析器では高電圧、超高真空、サイズなどのため取り扱いが難しいが、このスピン分析器は電極および絶縁構造を最適化することで装置を小型化し、印加電圧20kV〜60kVで動作する。又、静電レンズ系、スピン偏極電子銃を新たに開発し、小型Mott分析器と組み合わせてスピン偏極電子線測定システムを創出した。NEA-GaAs光励起電子線をスピン偏極電子線測定システムにて測定したところ、スピン偏極度の変化にしたがい散乱電子の左右非対称性が変化した。以上により小型Mott分析器の有用性が示され、スピン偏極測定技術を確立した。この技術を磁性体試料表面近傍の電子スピン検出による磁区構造観察に応用し、小型Mott分析器を走査型電子顕微鏡に接続したスピンSEMシステムを試作した。この装置は設置スペースが小さく、又製作コストも低い。このスピンSEMシステムを用いていくつかの磁性体表面を観察したところ、電子スピンによる磁区像を得た。以上により、本スピンSEMの磁性記録領域への適用可能性が示された。本研究により開発を行った小型モット分析器は、形状が小型であり、電気回路系なども便であることから、走査型電子顕微鏡をはじめとする種々の表面分析装...
    文部科学省, 基盤研究(C), 北海道大学, Coinvestigator not use grants, Competitive research funding, 09650025
  • 交換相互作用力を活用した顕微鏡の基本設計
    科学研究費補助金(基盤研究(B))
    1996 - 1997
    早川 和延; 中村 浩次; 末岡 和久; 武笠 幸一
    物質表面の磁性を原子レベルで評価するための新たな顕微鏡「交換相互作用力顕微鏡」の開発を進めてきた。これは原子間力顕微鏡(AFM)をさらに拡張し、深針と試料の電子スピンに依存した交換相互作用力を活用する。本研究では、実験技術開発の着手に先立ち以下の考察を行った。(1)理論的研究から探針・試料間に働く交換相互作用の評価:探針・試料間の交換相互作用力の力の大きさを評価する目的で、2枚のbccFe(001)薄膜系モデルを用いて第一原理計算から評価した。薄膜間距離d/aが0.5〜1.7の領域で交換相互作用エネルギーが生じることがわかった。ここでaはFeの格子定数(2.83∃)である。交換相互作用力は、d/a>1.0で10^<-9>N、1.0Nであった。現在すでに商品として販売されている原子間力顕微鏡の力測定感度は10^<-12>〜10^<-13>Nであることから、本研究で注目している交換相互作用力の測定が力の大きさでは可能であるとの結論を得た。また、交換相互作用力を活用することにより、表面の磁気構造を原子レベルで観察することができることがわかった。(2)探針・試料間の交換相互作用力の測定法およびEFM実機の基本設計の指針:上記(1)の理論的評価により、交換相互作用力を測定するには探針・試料間距離を非常に小さい領域で制御する必要があることがわかった。しか...
    文部科学省, 基盤研究(B), 北海道大学, Coinvestigator not use grants, Competitive research funding, 08455016
  • 磁気力顕微鏡における探針磁気特性の研究
    科学研究費補助金(奨励研究(A))
    1995 - 1995
    末岡 和久
    磁気力顕微鏡(MFM)の測定データを解釈をするためのMFM探針磁気特性について、標準磁気ヘッドの漏洩磁界の測定、ハードディスク用のメディアの記録ビット構造の測定結果より検討を行った。また、探針の磁気構造および磁気異方性、磁気モーメントの大きさを見積もるためにSQUIDおよび透過型電子顕微鏡を用いた評価を試みた。標準磁気ヘッドは本研究においてMFM探針評価を行うために設計・作製したものである。探針にはシリコンマイクロカンチレバ-上にコバルトをおよそ100nm蒸着したものを用いた。約8000Gauss磁場中で探針の軸方向と探針軸方向に垂直な方向に対してそれぞれ磁化し測定・評価を行った。1.標準磁気ヘッドの測定では、二つの異なる磁化方向の探針ではそれぞれ違ったMFM観察像が得られ、漏洩磁場が大きくなるとこの磁場による磁化反転が起きることが確認された。また、探針に垂直に磁化した探針では理論的に予想される磁場勾配分布とは異なる測定データが得られた。2.探針方向に磁化したものでは、理論的に予想される実験結果が得られた。一方、垂直に磁化を試みた探針では、得られる像が探針を磁化する度に異なり、探針方向磁化のものと同じデータが得られることもあった。これらの測定は磁化の大きさを変えた実験も行った。3.SQUIDの測定では、探針垂直方向は探針方向より磁化しにくいことが分かったが、探針方向に磁化容易...
    文部科学省, 奨励研究(A), 北海道大学, Principal investigator, Competitive research funding, 07750333
  • 走査型トンネル顕微鏡におけるスピン偏極トンネル現象に関する研究
    科学研究費補助金(重点領域研究)
    1995 - 1995
    武笠 幸一; 岩田 達夫; 末岡 和久; 廣田 栄一; 早川 和延
    走査プローブ顕微鏡(SPM)を開発し、これによりトンネル現象を解明することを目的としている。1.スピン偏極STM(SP-STM)については、GaAs、Niの組み合せで探針および試料のスピン偏極度に依存するトンネル電流が検出された。2.超高真空STM(HUV STM)をスピン偏極測定用に開発し、SNが非常に良くなり、STSが観測できた。エネルギーバンド構造ならびにスピン偏極のバイアス依存性が測定され、遷移金属のエネルギー構造との関係が解析された。3.SP-STMの探針のスピン偏極を予め把握しておく必要性から、モット・スピン検出器を開発した。量子井戸構造をMBEで作製し、FIB(集束イオンビーム)で探針状に加工し、モット・スピン検出器によりスピン偏極度を計測することにする。4.SPMの他の1つとして本研究グループが考えたのは、探針および試料スピン間に働く交換相互作用を計測する交換力顕微鏡(EFM)を考え、理論的検討を行った。井戸型ポテンシヤルの簡単なモデル計測を行い、AFMで計測可能な範囲内にあることが分かった。5.EFMの実験的検出を行うための実験パラメータを厳密に知ることを目的に、第1原理よりの密度汎関数法を用いて、3原子層および5原子層の探針あるいは試料のモデルについて計算を行った。探針、試料がスピンアップ、スピンアップの系について計算値が出された。
    文部科学省, 重点領域研究, 北海道大学, Coinvestigator not use grants, Competitive research funding, 07225201
  • A Study on Spin-Polarized Tunneling Phenomena and its Applications.
    Grants-in-Aid for Scientific Research(一般研究(B))
    1994 - 1995
    Koichi MUKASA; 末岡 和久; 廣田 榮一; 早川 和延
    We have studied the quantum tunneling phenomena that are the basic research of developing SP-STM.Our SP-STM can observe micro magnetic states of surfaces without an affection of the tip.(1) We succeeded in observing the spin polarized tunneling current between GaAs sample and Ni tip by STM in 1992.(2) The UHV-STM system has been developed and it becomes clear that the tunneling current depends on the polarity of the incident light to the GaAs sample and the magnetization of the Ni tip. A photovoltaic effect was observed and STS was measured, so we can understand the energy band structure an...
    Ministry of Education, Culture, Sports, Science and Technology, 一般研究(B), 北海道大学, Coinvestigator not use grants, Competitive research funding, 06452116
  • The Development of Spin-Polarized STM with Atomic Resolution
    Grants-in-Aid for Scientific Research(試験研究(B))
    1994 - 1995
    Koichi MUKASA; 飯塚 雅博; 数野 忠雄; 岩田 達夫; 末岡 和久; 早川 和延
    The research purpose is developing an SP-STM.(1) In 1992 we succeeded in observing the spin polarized tunneling current which depends on the circularity of the incident light to GaAs samples and plarization of Ni tips. This means the possiblitiy of developing SP-STM.(2) We have developed UHV SP-STM with GaAs and transition metals.(3) Using the UHV STM we measured STS and the current spin polarization against tip bias for Ni and Fe in which energy band structure reflected.(4) We have studied the basic research on spin tuneling phenomena by UHV STM and as a result it has been confirmed that w...
    Ministry of Education, Culture, Sports, Science and Technology, 試験研究(B), 北海道大学, Coinvestigator not use grants, Competitive research funding, 06555007
  • STMによる局所的スピン偏極トンネル現象に関する研究
    科学研究費補助金(奨励研究(A))
    1994 - 1994
    末岡 和久
    GaAs薄膜とNi探針を用いた走査型トンネル顕微鏡によるスピン偏極トンネル電子の検出実験を超高真空中で行うとともに、清浄表面を用いた検出実験の基準としてGaAsの劈開面のNi探針にいよる観察を試みたまた,将来GaAsを探針化するために集束イオンビーム加工装置を用いた探針加工の実験も行った。超高真空環境下におけるGaAs薄膜-Ni探針のSTM実験では,これまでに行って来た大気中の実験と比較してスピン依存性電流の安定性及び検出再現性がよく,これまでに調べることのできなかったスピン依存電流のバイアス依存性を測定ができるようになった。光照射より生じる電流電圧特性のバイアスシフトと0バイアスにおける光電流が測定され、トンネル電流がゼロになる近傍で大きなスピン依存トンネル電流が観測された。また、大きく観測されたバイアス領域よりも負バイアス側に0.2〜0.4eVにシフトした点でスピン依存性トンネル電流の位相反転が観測された。これは、これまでに光電子分光等で観測されているNiスピン偏極度の符号反転のエネルギー領域に対応すると予想されるが、反転が観測されるエネルギー値が試料表面状態の違いによって生じるバイアスシフト量の違い依存してしまうため、現時点ではNiエネルギーバンドとの詳しい対応づけはできない。この問題を解決すべくGaAs試料の劈開面を用いた実験系の作成をした。超高真空STMに劈開用の軸...
    文部科学省, 奨励研究(A), 北海道大学, Principal investigator, Competitive research funding, 06750021
  • 走査型トンネル顕微鏡におけるスピン偏極トンネル現象に関する研究
    科学研究費補助金(重点領域研究)
    1994 - 1994
    武笠 幸一; 岩田 達夫; 末岡 和久; 廣田 榮一; 早川 和延
    1992年大気中STMで、GaAs薄膜試料-Ni探針でスピン偏極トンネル電流の検出に成功した。(1)本年度は超高真空の系に実験を移行し、定量的評価が可能となった。結果としてS/Nの良いスピン偏極電流が測定され、探針磁化およびGaAs スピン偏極度に依存することが明確となった。超高真空用STMユニットを用いて、10^<-6> Paで測定可能となた。この系に偏極光学系および制御系を作製設置した(2)STS測定において、大部分は光電子分光の測定結果で説明がつくが、表面準位を介したと思われるトンネル現象が観測され、メカニズムについては今後の問題である。(3)このGaAs薄膜の実験においては表面処理上の問題で原子分解能が得られていないが、GaAs単結晶のへき開面よりのスピン偏極トンネル電子を原子分解能で検出する実験がスタートしている。STM真空チャンバー中でへき開する治具を作製し、(110)単結晶面を出し、Ni探針でGaおよびAs原子像が得られている。Ga、Asでは状態密度が異なるため偏極度のちがいが検出されることが期待される。Ni探針でのGaAs原子像の観察は初めてのデータであるが、スピン偏極電流は現在検出されていない。
    文部科学省, 重点領域研究, 北海道大学, Coinvestigator not use grants, Competitive research funding, 06236202
  • 走査型トンネル顕微鏡におけるスピン偏極トンネル現象に関する研究
    科学研究費補助金(重点領域研究)
    1993 - 1993
    武笠 幸一; 末岡 和久; 岩田 達夫; 廣田 榮一; 早川 和延
    (1)大気中STMで、GaAsエピタキシャル薄膜試料およびNi探針の系においてトンネル電流が、GaAs伝導帯中に光励起された電子のスピン偏極度およびNi探針の磁化に依存することを検証した。これは汎用的SP-STMが可能であることを示し、原子分解能で磁性体試料のスピン偏極度が測定可能ということである。現在、表面の不安定性を除くために、超高真空STMに実験を移すことを始めている。(K.Sueoka et al:Japan.J.Appl.Phys.,32(6-B),2989(1993))(2)スピン偏極度を同定した半導体探針を用いることを考え、探針より電界放射により電子を引き出し、スピン偏極度をモット・スピン分析器で測定することにし、40KVの球状加速電界型モットスピン分析器について電子軌道シミュレーション、設計、作製を行い、現在測定が出来るようになった。(佐々木 誠他:日本応用磁気学会投稿中)(3)絶縁物試料に対してはSTMが適用できない。試料表面スピン、探針スピン間に働く力をAFMで検出することを考えた(交換力顕微鏡:EFM)。遷移金属同志の交換力を理論的に検討し、10^<-10>Nのオーダにあることが分かり、これはAFMの測定範囲内にあることになる。(K.Mukasa et al:Japan.J.Appl.Phys.投稿中)
    文部科学省, 重点領域研究, 北海道大学, Coinvestigator not use grants, Competitive research funding, 05245201
■ Industrial Property Rights
  • 試料中の被検出物質の検出方法
    Patent right, 武笠 幸一; 松本 和彦; 石井 睦; 武田 晴治; 澤村 誠; アグス スバギョ; 細井 浩貴; 末岡 和久; 喜田 宏; 迫田 義博, 独立行政法人科学技術振興機構, 独立行政法人産業技術総合研究所
    特願2010-238822, 25 Oct. 2010
    特開2011-064692, 31 Mar. 2011
    201103011253413692
  • 試料中の被検出物質の検出方法
    Patent right, 武笠 幸一; 松本 和彦; 石井 睦; 武田 晴治; 澤村 誠; アグス スバギョ; 細井 浩貴; 末岡 和久; 喜田 宏; 迫田 義博, 独立行政法人科学技術振興機構, 独立行政法人産業技術総合研究所
    特願2010-238816, 25 Oct. 2010
    特開2011-064691, 31 Mar. 2011
    201103058002323755
  • カーボンナノチューブ電界効果トランジスタおよびその製造方法
    Patent right, 武田 晴治; 武笠 幸一; 石井 睦; 尾崎 弘一; 澤村 誠; 細井 浩貴; 服部 聡史; 山田 良樹; 末岡 和久, 国立大学法人北海道大学
    特願2008-508550, 28 Mar. 2007
    特許第4528986号
    18 Jun. 2010
    201103073955933339
  • センサおよび検出方法
    Patent right, アグス スバギョ; 末岡 和久, 国立大学法人 北海道大学
    特願2008-095251, 01 Apr. 2008
    特開2009-250633, 29 Oct. 2009
    200903031410165080
  • カーボンナノチューブ電界効果トランジスタおよびその製造方法
    Patent right, アグス スバギョ; 中村 基訓; 末岡 和久; 武笠 幸一, 国立大学法人 北海道大学
    特願2008-179445, 09 Jul. 2008
    特開2009-044139, 26 Feb. 2009
    200903076363421417
  • 電磁波吸収体
    Patent right, 武笠 幸一; 綱渕 輝幸; 末岡 和久, 国立大学法人 北海道大学
    特願2005-168389, 08 Jun. 2005
    特開2005-328070, 24 Nov. 2005
    特許第4235735号
    26 Dec. 2008
    200903034757076990
  • カーボンナノチューブ電界効果トランジスタおよびその製造方法
    Patent right, 武田 晴治; 武笠 幸一; 石井 睦; 尾崎 弘一; 澤村 誠; 細井 浩貴; 服部 聡史; 山田 良樹; 末岡 和久, 国立大学法人 北海道大学
    JP2007056580, 28 Mar. 2007
    WO2007-114140, 11 Oct. 2007
    200903034271541195
  • ナノプローブおよびその製造方法
    Patent right, 細井 浩貴; 末岡 和久; 武笠 幸一, 独立行政法人科学技術振興機構, 国立大学法人 北海道大学
    JP2006325969, 26 Dec. 2006
    WO2007-077842, 12 Jul. 2007
    200903073063104135
  • スピン記録方法および装置
    Patent right, 武笠 幸一; 廣田 榮一; 細井 浩貴; 末岡 和久, 国立大学法人 北海道大学
    特願2005-380347, 28 Dec. 2005
    特開2007-179710, 12 Jul. 2007
    200903050874504265
  • 劈開方法および劈開装置
    Patent right, 細井 浩貴; 末岡 和久; 武笠 幸一, 独立行政法人科学技術振興機構, 国立大学法人 北海道大学
    特願2005-356296, 09 Dec. 2005
    特開2007-160537, 28 Jun. 2007
    200903080284686941
  • バイオセンサ装置
    Patent right, 武笠 幸一; 末岡 和久; 武田 晴治; 服部 聡史; 山田 良樹; 澤村 誠; 尾崎 弘一; 石井 睦; 中村 基訓; 細井 浩貴, ミツミ電機株式会社, 武笠 幸一, 末岡 和久, 土方 健二, 株式会社 エスシーテック
    JP2006311871, 13 Jun. 2006
    WO2006-134942, 21 Dec. 2006
    200903064092819390
  • 繊維状固体炭素集合体の製造方法
    Patent right, 武笠 幸一; 綱渕 輝幸; 末岡 和久, 国立大学法人 北海道大学
    特願2002-328231, 12 Nov. 2002
    特開2004-161521, 10 Jun. 2004
    特許第3876313号
    10 Nov. 2006
    201103050967091554
  • カーボンナノチューブ電界効果トランジスタ
    Patent right, 武田 晴治; 服部 聡史; 石井 睦; 武笠 幸一; 澤村 誠; 細井 浩貴; 山田 良樹; 尾崎 弘一; 末岡 和久, 国立大学法人 北海道大学
    JP2006304167, 03 Mar. 2006
    WO2006-103872, 05 Oct. 2006
    200903056997642067
  • 電磁波吸収体
    Patent right, 武笠 幸一; 綱渕 輝幸; 末岡 和久, 国立大学法人 北海道大学
    特願2002-367057, 18 Dec. 2002
    特開2004-104063, 02 Apr. 2004
    特許第3772187号
    24 Feb. 2006
    200903081885163160
  • 電子スピン分析器
    Patent right, 武笠 幸一; 池田 正幸; 末岡 和久; 武藤 征一; 上遠野 久夫; 上田 映介, 国立大学法人 北海道大学
    特願2000-133700, 02 May 2000
    特開2001-319611, 16 Nov. 2001
    特許第3757263号
    13 Jan. 2006
    200903067111178537
  • 単一電子型トランジスタ、電界効果型トランジスタ、センサー、センサーの製造方法ならびに検出方法
    Patent right, 武笠 幸一; 松本 和彦; 石井 睦; 武田 晴治; 澤村 誠; アグス スバギョ; 細井 浩貴; 末岡 和久; 喜田 宏; 迫田 義博, 独立行政法人科学技術振興機構, 独立行政法人産業技術総合研究所
    特願2004-037866, 16 Feb. 2004
    特開2005-229017, 25 Aug. 2005
    200903090045166010
  • バイオセンサー
    Patent right, 松本 和彦; 武笠 幸一; 末岡 和久; 澤村 誠; アグス スバギョ; 細井 浩貴; 武田 晴治, 独立行政法人 科学技術振興機構, 独立行政法人産業技術総合研究所
    特願2003-146480, 23 May 2003
    特開2004-347532, 09 Dec. 2004
    200903097875594671
  • 周波数逓倍方法及び周波数逓倍器
    Patent right, 渡辺 秀樹; 澤村 誠; 末岡 和久; 武笠 幸一; 中根 了昌, 北海道大学長
    特願2001-012644, 22 Jan. 2001
    特開2002-217646, 02 Aug. 2002
    特許第3584281号
    13 Aug. 2004
    200903037729510617
  • 繊維状固体炭素集合体およびその製造方法
    Patent right, 武笠 幸一; 綱渕 輝幸; 末岡 和久, 北海道大学長
    特願2002-328231, 12 Nov. 2002
    特開2004-161521, 10 Jun. 2004
    200903004018351430
  • 走査型プローブ顕微鏡
    Patent right, 武笠 幸一; 末岡 和久; 加茂 直樹; 細井 浩貴; 澤村 誠, 北海道大学長
    特願2001-192149, 26 Jun. 2001
    特開2003-004619, 08 Jan. 2003
    特許第3557459号
    28 May 2004
    200903033037859010
  • プローブ及びその製造方法並びにプローブを有する顕微鏡及びテスタ
    Patent right, 武笠 幸一; 末岡 和久; 木村 道哉; 澤村 誠; 細井 浩貴, 北海道大学長
    特願2001-058528, 02 Mar. 2001
    特開2002-257507, 11 Sep. 2002
    特許第3527947号
    05 Mar. 2004
    200903012362568874
  • 磁気記憶素子、磁気メモリ、磁気記録方法、磁気記憶素子の製造方法、及び磁気メモリの製造方法
    Patent right, 武笠 幸一; 澤村 誠; 末岡 和久; 廣田 榮一; 中根 了昌; 中村 基訓, 北海道大学長
    特願2001-150456, 21 May 2001
    特開2002-343943, 29 Nov. 2002
    特許第3482469号
    17 Oct. 2003
    200903066600015482
  • 走査型磁気検出装置、及び走査型磁気検出装置用深針
    Patent right, 武笠 幸一; 澤村 誠; 末岡 和久; 廣田 榮一, 北海道大学長
    特願2001-059440, 05 Mar. 2001
    特開2002-257703, 11 Sep. 2002
    特許第3472828号
    19 Sep. 2003
    200903065761360019
  • DNAスピンマッピング・医療方法及びその装置
    Patent right, 武笠 幸一; 細井 浩貴; 下山 雄平; 末岡 和久; 澤村 誠, 科学技術振興事業団
    特願2001-334218, 31 Oct. 2001
    特開2003-139676, 14 May 2003
    200903086745431221
  • スピンプローブによる遺伝子操作方法及びその装置
    Patent right, 澤村 誠; 武笠 幸一; 末岡 和久, 科学技術振興事業団
    特願2001-322989, 22 Oct. 2001
    特開2003-125768, 07 May 2003
    200903009745578180
  • 観測画像信号解析のための濃淡画像処理方法
    Patent right, 長谷山 美紀; 武笠 幸一; 末岡 和久; 武隈 育子; 本多 博之, 北海道大学長
    特願2001-068723, 12 Mar. 2001
    特開2002-269541, 20 Sep. 2002
    特許第3416736号
    11 Apr. 2003
    200903010360064590
  • スピンデバイス及びその製造方法
    Patent right, 武笠 幸一; 陽 完治; 末岡 和久; 大野 啓, 北海道大学長
    特願2001-257373, 28 Aug. 2001
    特開2003-060211, 28 Feb. 2003
    200903041864138849
  • レーザ溶接ヘッド制御システムおよびこれを具えるレーザ溶接ヘッド
    Patent right, 武笠 幸一; 池田 正幸; 末岡 和久; 上田 映介; 上遠野 久夫; 武藤 征一, 北海道大学長
    特願2000-138283, 11 May 2000
    特開2001-321971, 20 Nov. 2001
    特許第3385362号
    10 Jan. 2003
    200903007530073076
  • レーザ溶接方法、レーザ溶接装置及びレーザ溶接用ガスシールド装置
    Patent right, 武笠 幸一; 池田 正幸; 末岡 和久; 上田 映介; 上遠野 久夫; 武藤 征一, 北海道大学長
    特願2000-138438, 11 May 2000
    特開2001-321976, 20 Nov. 2001
    特許第3385363号
    10 Jan. 2003
    200903096104407687
  • レーザ溶接方法及びレーザ溶接装置
    Patent right, 武笠 幸一; 池田 正幸; 末岡 和久; 上田 映介; 上遠野 久夫; 武藤 征一, 北海道大学長
    特願2000-135559, 09 May 2000
    特開2001-314985, 13 Nov. 2001
    特許第3385361号
    10 Jan. 2003
    201103050691838510
  • 散乱ターゲット保持機構及び電子スピン分析器
    Patent right, 武笠 幸一; 池田 正幸; 末岡 和久; 武藤 征一; 上遠野 久夫; 上田 映介, 北海道大学長
    特願2000-130224, 28 Apr. 2000
    特開2001-311702, 09 Nov. 2001
    特許第3383842号
    27 Dec. 2002
    200903005980189055
  • 磁気記録媒体の磁化状態評価方法
    Patent right, 長谷山 美紀; 武笠 幸一; 末岡 和久; 武隈 育子, 長谷山 美紀, 株式会社産鋼スチール, 株式会社菅製作所, ムトウ建設工業株式会社, 北海道電力株式会社
    特願平11-134716, 14 May 1999
    特開2000-322580
    特許第3074309号
    09 Jun. 2000
    200903068409534499
  • 交換相互作用力の測定方法および交換相互作用力による磁気特性の評価方法
    Patent right, 武笠 幸一; 早川 和延; 末岡 和久; 中村 浩次; 田附 雄一; 長谷川 秀夫; 小口 多美夫, 北海道大学長
    特願平9-085148, 03 Apr. 1997
    特開平10-282122, 23 Oct. 1998
    特許第3057222号
    21 Apr. 2000
    200903051298084995
  • 交換相互作用力の測定装置
    Patent right, 武笠 幸一; 早川 和延; 末岡 和久; 中村 浩次; 田附 雄一; 長谷川 秀夫; 小口 多美夫, 北海道大学長
    特願平9-097132, 15 Apr. 1997
    特開平10-288620, 27 Oct. 1998
    特許第3210961号
    200903010730151188